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3839results about "Angle measurement" patented technology

Method and apparatus for determining absolute position of a tip of an elongate object on a plane surface with invariant features

A method and apparatus for determining a pose of an elongate object and an absolute position of its tip while the tip is in contact with a plane surface having invariant features. The surface and features are illuminated with a probe radiation and a scattered portion, e.g., the back-scattered portion, of the probe radiation returning from the plane surface and the feature to the elongate object at an angle τ with respect to an axis of the object is detected. The pose is derived from a response of the scattered portion to the surface and the features and the absolute position of the tip on the surface is obtained from the pose and knowledge about the feature. The probe radiation can be directed from the object to the surface at an angle σ to the axis of the object in the form of a scan beam. The scan beam can be made to follow a scan pattern with the aid of a scanning arrangement with one or more arms and one or more uniaxial or biaxial scanners. Angle τ can also be varied, e.g., with the aid of a separate or the same scanning arrangement as used to direct probe radiation to the surface. The object can be a pointer, a robotic arm, a cane or a jotting implement such as a pen, and the features can be edges, micro-structure or macro-structure belonging to, deposited on or attached to the surface which the tip of the object is contacting.
Owner:ELECTRONICS SCRIPTING PRODS

Apparatus and method for determining orientation parameters of an elongate object

An apparatus and method employing principles of stereo vision for determining one or more orientation parameters and especially the second and third Euler angles θ, ψ of an elongate object whose tip is contacting a surface at a contact point. The apparatus has a projector mounted on the elongate object for illuminating the surface with a probe radiation in a known pattern from a first point of view and a detector mounted on the elongate object for detecting a scattered portion of the probe radiation returning from the surface to the elongate object from a second point of view. The orientation parameters are determined from a difference between the projected and detected probe radiation such as the difference between the shape of the feature produced by the projected probe radiation and the shape of the feature detected by the detector. The pattern of probe radiation is chosen to provide information for determination of the one or more orientation parameters and can include asymmetric patterns such as lines, ellipses, rectangles, polygons or the symmetric cases including circles, squares and regular polygons. To produce the patterns the projector can use a scanning arrangement or a structured light optic such as a holographic, diffractive, refractive or reflective element and any combinations thereof. The apparatus is suitable for determining the orientation of a jotting implement such as a pen, pencil or stylus.
Owner:ELECTRONICS SCRIPTING PRODS

Apparatus and method for determining an inclination of an elongate object contacting a plane surface

An apparatus and method for determining an inclination angle θ between an axis of an elongate object such as a cane, a pointer or a jotting implement such as a pen, pencil, stylus or the like and a normal to a plane surface at times when a tip of the elongate object is contacting that plane surface. The apparatus has an emitter mounted on the object for illuminating the plane surface with a probe radiation at an angle σ with respect to the axis of the object. The apparatus also has a detector mounted on the elongate object for detecting a radiation characteristic of a scattered portion of the probe radiation returning from the plane surface and a computing unit for deriving the inclination angle θ from the radiation characteristic. A scanning arrangement, such as a uniaxial or biaxial scanner, or a light guiding optic can be used for varying angle σ, and the probe radiation can be emitted in the form of a scan beam. Preferably, the emitter and detector of the scattered portion of the probe radiation are integrated and the scattered portion of the probe radiation whose characteristic is being measured is the back-scattered portion. The radiation characteristic detected by the detector can be the intensity, polarization, time-of-flight or any combination thereof.
Owner:ELECTRONICS SCRIPTING PRODS

Camera based six degree-of-freedom target measuring and target tracking device with rotatable mirror

An embodiment may comprise a camera based target coordinate measuring system or apparatus for use in measuring the position of objects in manner that preserves a high level of accuracy. This high level of measurement accuracy is usually only associated with more expensive laser based devices. Many different arrangements are possible. Other embodiments may comprise related methods of using a camera based target coordinate measuring method for use in measuring the position of objects. Many variations on the methods are possible. For example, a camera based coordinate measuring system for use in measuring the position of a target relative to at least one frame of reference without requiring use of a laser range finder for measuring distance may comprise at least three or more light sources located on a target wherein the light sources are located on the target at known three-dimensional coordinates relative to each other; at least one rotatable mirror rotatable on about a first axis and a second axis; a camera located to receive light emitted by the light sources that is reflected off the minor; two angular measuring devices to measure the angles of rotation of the mirror about the first and second axes; and a processor for determining up to three positional degrees of freedom and up to three rotational degrees of freedom of the target.
Owner:FARO TECH INC
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