The invention relates to the technical field of
integrated circuit test and calibration, and discloses a
chip test and calibration method and a
chip tester. The
chip test calibration method is applied to a chip test module and specifically comprises the following steps that S101, a starting
signal sent by a user terminal is received, environment initialization operation is executed, and after initialization is completed, a
system automatically enters a standby mode and waits for an external trigger
signal or a user instruction; and S102, synchronously capturing input and output
signal waveforms of the tested chip at a preset sampling frequency through a high-precision
current sensor and a
voltage sampling circuit. Through a dynamic parameter acquisition and real-time compensation technology, a
voltage reference error is effectively reduced, the
temperature control precision is superior to + / -0.3 DEG C, signal
distortion caused by environmental interference is effectively inhibited, a multi-dimensional calibration model is combined with
time domain,
frequency domain and statistical characteristic analysis, nonlinear errors and
system drift can be dynamically corrected, and the
system performance is improved. And the attenuation error of a test signal transmission path is lower than 0.02 dB.