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20454 results about "Instrumentation" patented technology

Instrumentation is a collective term for measuring instruments that are used for indicating, measuring and recording physical quantities such as flow, temperature, level, distance, angle, or pressure. The term has its origins in the art and science of scientific instrument-making.

Smart recognition apparatus and method

A qualifying connection for an instrument attaches to a source of electrosurgery energy to and the instrument and has first and second parts coupled to the instrument and the source, respectively. Optical couplings on the connection transmit invisible energy to identify the instrument and are proximate on the first and second parts. A light modifier on the first part is proximal to the second part for modification of radiation in the infrared wavelengths so infrared transmitters encode signals and non contact coded proximity detectors on the second part are the coupled detectors. Non contact coded proximity detectors respond to modified infrared light establishing an Nth bit identification code. An infrared light supply in the source pass from the transmitters across the communicating couplings for encoding signals by modification of the infrared light with a light modifier. Mechanical attachments include conjugating male and female portions physically extending between the parts for mating engagement. The attachments juxtaposition the parts when the attachments geometrically conjugate to geographically positioning the couplings proximate for communicating. The attachments have one or more conductors for delivery of high frequency energy from the source to the instrument. A cable fits between the first part of the connection and the instrument and has electrical conductors for carrying energy passing through the first part of the connection from the source to the instrument. An identifying circuit couples to the second part and responds to invisible light optically communicated across the couplings for verifying the type of instrument connected by the cable to the source.
Owner:COVIDIEN AG

Method of making a cutting instrument having integrated sensors

A cutting instrument including a metal blade has a recess formed therein and a semiconductor substrate affixed to the blade in the recess. The semiconductor substrate includes at least one sensor formed thereon. The sensor formed on the semiconductor substrate may comprise at least one or an array of a strain sensors, pressure sensors, nerve sensors, temperature sensors, density sensors, accelerometers, and gyroscopes. The cutting instrument may also further include a handle wherein the blade is affixed to the handle and the semiconductor substrate is electrically coupled to the handle. The handle may then be coupled, either physically or by wireless transmission, to a computer that is adapted to display information to a person using the cutting instrument based on signals generated by one or more of the sensors formed on the semiconductor substrate. The computer or handle may also be adapted to store data based on the signals generated by one or more of the sensors. A method of making said cutting instrument includes the steps of at least one sensor being formed on a semiconductor wafer and a layer of photoresist being applied on a top side of the semiconductor wafer according to a pattern that matches the defined shape of the semiconductor substrate. The portion of the semiconductor wafer not covered by the photoresist is removed and thereafter the photoresist is removed from the semiconductor wafer, thereby leaving the semiconductor substrate having a defined shape and at least one sensor formed thereon. The semiconductor substrate having a defined shape and at least one sensor formed thereon is then affixed to a metal blade in a recess formed in said blade.
Owner:VERIMETRA

Methods and Scatterometers, Lithographic Systems, and Lithographic Processing Cells

In a method of determining the focus of a lithographic apparatus used in a lithographic process on a substrate, the lithographic process is used to form a structure on the substrate, the structure having at least one feature which has an asymmetry in the printed profile which varies as a function of the focus of the lithographic apparatus on the substrate. A first image of the periodic structure is formed and detected while illuminating the structure with a first beam of radiation. The first image is formed using a first part of non-zero order diffracted radiation. A second image of the periodic structure is foamed and detected while illuminating the structure with a second beam of radiation. The second image is formed using a second part of the non-zero order diffracted radiation which is symmetrically opposite to the first part in a diffraction spectrum. The ratio of the intensities of the measured first and second portions of the spectra is determined and used to determine the asymmetry in the profile of the periodic structure and/or to provide an indication of the focus on the substrate. In the same instrument, an intensity variation across the detected portion is determined as a measure of process-induced variation across the structure. A region of the structure with unwanted process variation can be identified and excluded from a measurement of the structure.
Owner:ASML NETHERLANDS BV

Surgical Instrument Having A Multiple Rate Directional Switching Mechanism

A surgical instrument having a remotely controllable user interface, and a firing drive configured to generate a rotary firing motion upon a first actuation of the remotely controllable user interface and a rotary refraction motion upon an other actuation of remotely controllable user interface. The instrument includes a first drive member, wherein remotely controllable user interface is selectively engageable with the first drive member, and a second drive member, wherein the remotely controllable user interface is selectively engageable with the second drive member. The instrument also includes an elongate shaft assembly operably engaged with the first drive member and the second drive member. The instrument further includes an end effector coupled to the elongate shaft assembly. The end effector includes an elongate channel configured to operably support a staple cartridge therein, and an anvil movably coupled to the elongate channel. The end effector also includes a cutting member operably supported within the elongate channel, wherein the cutting member is operably engaged with the elongate shaft assembly. The instrument is such that when the remotely controllable user interface operates the first drive member, the first actuation advances the cutting member a first distance, wherein, when the remotely controllable user interface operates the second drive member, the other actuation retracts the cutting member a second distance, and wherein the second distance is greater than the first distance.
Owner:CILAG GMBH INT
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