The invention relates to the technical field of defect detection, in particular to a defect detection method and
system based on a
microwave frequency
crystal resonator, and the method comprises the steps: forming a
microwave probe through a
microwave frequency
crystal resonator array, placing a to-be-detected material below the
microwave probe, and setting a scanning area and scanning step lengths in two directions on the surface of the material; controlling the probe to perform point-by-point scanning according to step length, and collecting a plurality of reflection coefficients of each sampling point to form an
echo signal matrix; performing
singular value decomposition on the matrix, applying an adjustable coefficient to a first
singular value and a second
singular value, and adaptively selecting an optimal coefficient according to
imaging quality to reconstruct an
echo signal; performing two-dimensional
Fourier transform on the reconstructed matrix, constructing a
spatial filter in combination with probe spacing and defect depth to perform
phase compensation, performing two-dimensional
Fourier transform to obtain a defect image, and performing threshold segmentation on the defect image to obtain a
binary image only containing defects; and analyzing the connected regions to obtain the
gravity center position of each defect and the defect area determined by the pixel number and the
single pixel area. The problems of serious
clutter interference, insufficient defect imaging
contrast ratio, difficulty in quantitative evaluation of
defect size and the like in the existing
microwave detection can be solved.