The utility model discloses a nanometer displacement measuring device which comprises a measuring casing and a test piece, one end of the measuring casing is provided with a
grating, the inner wall of the measuring casing beside the
grating is provided with a reflector, one side of the reflector is sequentially provided with an interference field, an optical amplification imaging
system and a
phase plate, one end of the reflector is provided with an
image sensor, and the
image sensor is connected with the measuring casing. The
grating is arranged on the inner wall of the measuring casing, the
image sensor is arranged on the inner wall of the measuring casing, a reflecting mirror is arranged on the inner wall, beside the grating, of the measuring casing, and an interference field, an optical amplification imaging
system and a
phase plate are further sequentially arranged on one side of the reflecting mirror, and the reflecting mirror, the interference field, the optical amplification imaging
system, the
phase plate and the image sensor are sequentially arranged on the inner wall, beside the grating, of the measuring casing. The
phase difference of a transparent object is converted into the intensity difference, so that the contrast difference is highlighted, meanwhile, high-precision measurement is performed by utilizing the interference principle, the tiny difference of the surface height of a sample can be accurately measured, the displacement resolution below 1 nanometer can be realized, the debugging is simple, and the stability is good.