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684 results about "Linearly polarized light" patented technology

Receiving and transmitting coaxial laser radar optical system

The invention provides a transmitting-receiving coaxial laser radar optical system, and relates to the technical field of laser radars. The optical system comprises a transmitting assembly, a polarization splitting prism, a quarter-wave plate, a common beam expanding lens group, a micro-lens array, a common lens and a receiving assembly which are arranged in sequence. Laser emitted by the emitting assembly enters the polarization splitting prism, and at the moment, a light beam is linearly polarized light, can pass through the polarization splitting prism and then pass through the quarter-wave plate to reach the shared beam expanding lens group to be collimated and expanded, and finally is emitted for illumination through the micro-lens array and the shared lens; the emergent laser beam is irradiated to an object to return an optical signal, and the returned optical signal is returned to the polarization splitting prism along an original optical path and is reflected into the receiving assembly to be received and processed; according to the invention, the beam splitter prism, the beam expander group and the micro lens array are shared, and the shared lenses are the same and share the lens group, so that the purpose of saving the manufacturing cost of the laser radar is achieved; the method is suitable for automobile automatic driving, distance detection and the like.
Owner:GUILIN UNIV OF ELECTRONIC TECH

Dual-wavelength narrow-linewidth laser output device and method

The invention relates to the technical field of laser, in particular to a dual-wavelength narrow-linewidth laser output device and method.The dual-wavelength narrow-linewidth laser output device comprises a semiconductor laser unit emitting linearly polarized light beams, and a light beam conversion lens is used for achieving conversion of semiconductor laser fast-axis light beams and semiconductor laser slow-axis light beams; the light beam conversion lens is used for collimating and compressing a semiconductor laser fast axis divergence angle, and the slow axis collimating lens is used for collimating and compressing a semiconductor laser slow axis divergence angle; the linearly polarized light beam is divided into a first light beam and a second light beam through the rectangular prism; the first light beam sequentially passes through a first volume Bragg grating, a first reflector, a half-wave plate and a polarization beam combiner; the second light beam sequentially passes through a second volume Bragg grating, a second reflector and a polarization beam combiner; the dual-wavelength narrow-linewidth semiconductor laser can solve the problems of precise regulation and control and power amplification of the central wavelength of the dual-wavelength narrow-linewidth semiconductor laser, has power expansibility, and realizes improvement of laser power by stacking a plurality of laser units in the vertical direction.
Owner:CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI

Surface defect detection device and method based on polarized optical dark field imaging

The invention discloses a surface defect detection device and method based on polarized optical dark field imaging, and belongs to the technical field of industrial defect imaging detection, the device comprises a polarization camera, an imaging lens, a polarization annular LED light source and a sample to be detected which are coaxially arranged; wherein the polarization camera and the imaging lens form a polarization imaging system, the polarization annular LED light source emits linearly polarized light with an inclination angle, and the linearly polarized light is reflected and scattered on a sample to be detected; the linearly polarized light enters the surface of a to-be-detected sample, a small amount of reflection and most of scattered light of the to-be-detected sample are collected by the imaging lens and the polarization camera through a circular hole in the center of the polarization annular LED light source, and finally imaging is achieved. The defect depth can be calculated according to the defect width and the defect inclination angle, so that the defect depth is inversed by the low-frequency linear polarization degree, and the problem that the defect depth information cannot be effectively extracted in the prior art is solved.
Owner:UNIV OF SCI & TECH OF CHINA

Liquid guided laser processing device and method based on double-beam phase adjustment

The invention discloses a liquid guide laser processing device and method based on double-beam phase adjustment, belongs to the technical field of laser processing, and aims to reduce the width of a laser beam. The device comprises a laser light source, a first polarization state modulator, a beam splitter, a spatial light modulator, a second polarization state modulator, a polarization beam combiner and a coupler. A laser light source emits linearly polarized light, the linearly polarized light is converted into circularly polarized light through a first polarization state modulator, then the circularly polarized light is separated into first linearly polarized light and second linearly polarized light through a light beam separator, and on a second linearly polarized light transmission light path, a spatial light modulator adjusts the marginal region phase of the circularly polarized light to enable the marginal region phase to differ from the marginal region phase of the first linearly polarized light by a half cycle. And the second polarization state modulator adjusts the polarization direction to be the same as that of the first linearly polarized light, the polarization beam combiner combines the two beams of light, the coupler couples the combined laser beams to the liquid jet flow, and the liquid jet flow acts on the workpiece to be machined, so that optimization of the diameter of the laser beams is achieved.
Owner:SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI

Reflection-type interference film thickness measuring method and system for eliminating back scattering of transparent substrate

The invention relates to the field of optical measurement, in particular to a reflective interference film thickness measurement method and system for eliminating back scattering of a transparent substrate, and the method comprises the following steps: transmitting a light beam through a low-coherence-length broadband light source, and forming linearly polarized light through polarization modulation; focusing the light beam to the surface of the film through a confocal optical system; collecting reflection interference signals of the upper surface and the lower surface of the film; spatial filtering, low-coherence gating and polarization control are used for cooperatively inhibiting back scattering of the substrate. And processing the acquired interference signal, and calculating to obtain film thickness information. According to the invention, triple inhibition mechanisms are adopted for synergistic effect, and the method comprises the following steps: spatial filtering: shielding out-of-focus back reflected light through a confocal small hole; low-coherence gating: using a short coherence length to naturally suppress a reflected signal beyond a coherence range; and polarization control: further weakening stray light interference through polarization state matching, and effectively suppressing back scattering of the substrate.
Owner:SUZHOU XIZHI TECHNOLOGY CO LTD

EUV mask blanks inspection equipment

To provide an EUV mask blanks inspection device capable of effectively detecting defects in a multilayer film with irradiation other than EUV. [Solution] The EUV mask blank inspection device 11 includes a support 15 that supports an EUV mask blank 14 having a multilayer film that reflects EUV light, an optical system 22 that guides linearly polarized light beam 16a that is incident perpendicularly on the multilayer film to the EUV mask blank 14, a light receiving element that separates and receives linearly polarized light beam 16b that is reflected perpendicularly from the multilayer film, and a displacement mechanism 21 that displaces light beam 16a relative to the EUV mask blank 14.
Owner:NANOSYSTEM SOLUTIONS INC

All-dielectric adjustable optical tweezers based on composite phase super lens

The invention relates to full-dielectric adjustable optical tweezers based on a composite phase superlens, and belongs to the technical field of optical tweezers. Two regulation modes of geometric phase and transmission phase are integrated into a dielectric metasurface periodic structure, and a circular lens surface is combined according to a specific mapping and arrangement mode. The super lens can excite two different output electric fields under the input of linearly polarized light due to the regulation and control of a composite phase, and the two electric fields can independently exist under the input of circularly polarized light with opposite chirality. Therefore, by adjusting the polarization type of the incident light source of the super lens, free switching of multiple optical capturing modes of particles in a field can be realized. Compared with the existing optical tweezers, the control mode can be flexibly adjusted on the premise that the structure of the device is not changed, and more diversified particle capturing requirements can be met. The high-flexibility and easy-to-integrate micro-nano structure can provide powerful guarantee for the performance of a compact composite optical capturing device.
Owner:BEIJING UNIV OF POSTS & TELECOMM

Method and device for extracting light spot centroid of four-quadrant detector

The invention belongs to the technical field of laser spot positioning, and discloses a method and a device for extracting a spot centroid of a four-quadrant detector. A first linearly polarized light beam and a second linearly polarized light beam which are consistent in wavelength and orthogonal in polarization are generated through an emission optical system, the two linearly polarized light beams are modulated, different modulation frequencies are given to the two linearly polarized light beams, and the two linearly polarized light beams are combined into one beam of composite light to be emitted; receiving the composite light by using a receiving optical system; separating the composite light into first linearly polarized light and second linearly polarized light by using a polarization bifocus prism, and enabling the two beams of light to respectively form focuses which are staggered front and back; a four-quadrant detector is used for receiving a pre-focus light spot and a post-focus light spot, and the four-quadrant detector is arranged at the middle position of the two focuses; a signal processing system is used for processing signals output by the four-quadrant detector, and light spot centroid information is obtained through calculation. According to the invention, the weak signal detection efficiency of the four-quadrant detector is improved, and the precision of light spot position calculation is improved.
Owner:WUHAN UNIV

Ultrahigh time resolution camera time characteristic detection device and method

The invention relates to the technical field of optical precision measurement, in particular to an ultra-high time resolution camera time characteristic detection device and method, and the device comprises a laser source which is used for generating pulse laser; the polarization modulation element is arranged on an emergent light path of the laser source and is used for modulating the pulse laser into circularly polarized light; the spectroscope is arranged on an emergent light path of the polarization modulation element and is used for decomposing the circularly polarized light into a first linearly polarized light beam and a second linearly polarized light beam; the first optical path unit is used for guiding the first linearly polarized light beam to the cylindrical optical element along a fixed optical path; the second optical path unit is used for adjusting the optical path of the second linearly polarized light beam and guiding the second linearly polarized light beam to the cylindrical optical element; and the cylindrical optical element is used for receiving the first linearly polarized light beam and the second linearly polarized light beam and respectively projecting the first linearly polarized light beam and the second linearly polarized light beam to an imaging surface of a camera to be detected to form two spatially separated light spots. The objective of the invention is to improve camera time characteristic calibration precision and efficiency.
Owner:LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS

Single-layer metasurface near-far field asymmetric image display device and method

The invention discloses a single-layer metasurface near-far field asymmetric image display device and method, and relates to the technical field of metasurface optics. The metasurface is formed by periodically arranging diatomic super units composed of direction-insensitive atomic nano-columns and direction-sensitive atomic nano-columns, and asymmetric image display of a near field and a far field is achieved by decoupling polarization and phases of forward and reverse incident light. When the same linearly polarized light enters from the forward direction and the reverse direction respectively, the metasurface can generate different or the same holographic image in a far field and generate a binary image or no image in a near field, and three-channel image display (two holograms and one binary image or two binary images and one hologram) can be realized by controlling the incident light direction and the super-unit structure parameters. The method does not need a multi-layer structure, simplifies the design, expands an image display channel, and can be applied to the fields of optical anti-counterfeiting, information encryption and the like.
Owner:UNIV OF JINAN

Polarization adjustable spin decoupling metasurface based on perovskite material

The invention provides a polarization adjustable spin decoupling metasurface based on a perovskite material. The metasurface is characterized in that the metasurface is of a three-layer structure, namely a perovskite and metal pattern layer (1), an intermediate dielectric layer (2) and a reflection bottom layer (3) from top to bottom in sequence. When the perovskite is in a metal state, the designed metasurface can independently adjust left-handed and right-handed circularly polarized light; when the perovskite is in an insulated state, the designed metasurface can independently adjust x and y linear polarized light; by switching the state of the perovskite, the phases of the circularly polarized light and the linearly polarized light can be regulated and controlled at the same time, so that different functions are realized. The optical metasurface designed by the invention has huge potential in a terahertz frequency band, and can be widely applied to beam shaping, holographic imaging, information encryption, super lenses and the like.
Owner:GUILIN UNIV OF ELECTRONIC TECH

Light attenuation assembly, optical module, optical device and related equipment

The invention discloses a light attenuation assembly, an optical module, an optical device and related equipment. The light attenuation assembly comprises a half-wave plate, a first polarization beam splitter and a second polarization beam splitter which are sequentially arranged along a light path. The half-wave plate is used for converting the first linearly polarized light into second linearly polarized light, and the second linearly polarized light can be decomposed into third linearly polarized light and fourth linearly polarized light of which the polarization directions are perpendicular to each other; the first polarization beam splitter is used for dividing incident second linearly polarized light into third linearly polarized light and fourth linearly polarized light, reflecting the third linearly polarized light to the second polarization beam splitter, and transmitting and filtering the fourth linearly polarized light at the same time; and the second polarization beam splitter is used for reflecting and outputting the third linearly polarized light and transmitting and filtering the residual fourth linearly polarized light. Through the light attenuation assembly, the quality of the output laser beam can be improved.
Owner:SHENZHEN SICARRIER IND MACHINES CO LTD

Differential interference optical system for semiconductor conductive particle detection task

The invention relates to the technical field of microscopic optical imaging, and discloses a semiconductor conductive particle detection task-oriented differential interference optical system, which comprises an objective lens group and a differential interference module, the objective lens group comprises a front group, a middle group and a rear group which are arranged in sequence; the front group is used for ensuring a large aperture angle and less introduction of spherical aberration and chromatic aberration, the middle group is used for compensating various aberrations introduced by the front group, and the rear group is used for correcting field curvature; the differential interference module comprises a Nomarski prism, a polarizer and an analyzer which are arranged in sequence; the Nomarski prism is used for splitting and combining the linearly polarized light beams; the polarization analyzer is used for converting linearly polarized light which passes through the Nomarski prism and is orthogonal in polarization direction into linearly polarized light with the same polarization direction; the system further comprises a beam splitter and a barrel lens group. According to the invention, long working distance and large numerical aperture can be realized in the visible light wave band, the light path design is optimized so as to reduce aberration introduction, and the anti-interference capability to weak signals is enhanced.
Owner:SOUTHEAST UNIV +1

Display substrate and display device

A display substrate and a display device are provided. The display substrate includes a light emitting element disposed on a base substrate, and an encapsulation layer, a connection layer, a light extraction layer, a polarization conversion layer and a polarization layer stacked sequentially at a light exiting side of the light emitting element. The light extraction layer is configured to convert at least a portion of light emitted by the light emitting element incident onto the light extraction layer into circularly polarized light with a set rotational direction to pass through the light extraction layer. The polarization conversion layer is configured to convert the circularly polarized light passing through the light extraction layer into linearly polarized light, with a polarization direction parallel to a direction of a light transmission axis of the polarization layer; the connection layer is configured to bond the light extraction layer to the encapsulation layer.
Owner:BOE TECHNOLOGY GROUP CO LTD

Wideband snapshot-type polarization interferometry imaging system and method for detecting breast tumors

This invention relates to the field of optical imaging and detection technology, specifically providing a broadband snapshot-type polarization interferometry imaging detection system and method for breast tumors. A broadband light source illuminates a breast tumor tissue sample. The reflected signal light is collected and collimated by a pre-optical system, then sequentially passes through a first and a second ray shaping unit for two shearing and two polarization state transformations, resulting in two beams of linearly polarized light and two beams of circularly polarized light. These beams are imaged by an imaging lens to an area array detector to obtain a polarization interferogram, which is then demodulated to obtain all Stokes parameters of the breast tumor tissue sample. This invention achieves broadband snapshot imaging of breast tumors with all Stokes parameters without using an analyzer, doubling the light throughput compared to traditional polarization imaging instruments using analyzers. Furthermore, this invention has advantages such as compact structure, no moving parts, easy assembly and adjustment, and no need for image registration.
Owner:CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI

Janus transflective array antenna based on beam deflection theory

The invention discloses a Janus transflective array antenna based on a beam deflection theory, and relates to the field of electromagnetism, in particular to the technical field of microwave radio frequency. The positions of the top patch and the bottom patch are adjusted through the adjusting unit, so that the PB phase can cover the 360-degree phase. When linear polarization is incident in the forward direction, independent and adjustable left-hand circularly polarized wave beams can be generated in a transmission space and a reflection space at the same time, the function of a transflective array antenna is shown, when linear polarization is incident in the backward direction, right-hand circularly polarized wave beams can be generated only in the transmission space, and radiation wave beams can be generated in the forward direction and the backward direction, which is the function of a Janus antenna.
Owner:CHINA SHIP DEV & DESIGN CENT

Rheological-birefringence combined in-situ testing device and method based on chopper rotation frequency signal

The invention discloses a rheology-birefringence combined in-situ testing device and method based on chopper rotation frequency signals, belongs to the technical field of optical testing, and aims to solve the technical problems that an existing Spark-FB device is low in measurement accuracy and limits application scenes. The laser emitter emits a light beam along a set angle (forming an angle of 45 degrees with the horizontal plane), the light beam is converted into linearly polarized light through the polarizer, and an optical signal is modulated through the rotating chopper; the modulated light beam penetrates through a polymer sample to which a shear flow field is applied by a commercial rheometer, and transmission light carrying optical anisotropy information of the sample sequentially passes through a 1 / 4 wave plate and a polarization analyzer, and is finally received by a photoelectric detector and transmitted to a lock-in amplifier for analysis. According to the invention, an independent datum reference signal is provided through the chopper, decoupling and combination of a commercial rheometer and a birefringence light path are realized, and synchronous and accurate in-situ measurement of rheological and optical properties of a high polymer material under a deformation condition can be realized.
Owner:CHANGCHUN INSTITUTE OF APPLIED CHEMISTRY CHINESE ACADEMY OF SCIENCES

Two-degree-of-freedom displacement simultaneous measurement system and method based on orbital angular momentum beam interferometer

The invention discloses a two-degree-of-freedom displacement simultaneous measurement system and method based on an orbital angular momentum beam interferometer. The system comprises a laser; the light field regulation and control module is used for converting the linearly polarized light into a light beam with orbital angular momentum; an optical isolator; a first beam splitter; a second beam splitter; the third beam splitter is used for combining the first reference light beam and the first measurement light beam to generate conjugate interference; a fourth beam splitter; a fifth beam splitter; the sixth beam splitter is used for combining the second reference light beam and the second measurement light beam to generate conjugate interference; a seventh beam splitter; a first reflector; a second reflector; a third reflector; a first Weive prism; a second Weive prism; a reflection grating; and the image acquisition and processing module is used for acquiring a petal-shaped interference pattern formed by conjugate interference. The system is compact in structure and high in demodulation sensitivity, and can realize non-contact and high-resolution synchronous two-degree-of-freedom measurement.
Owner:NANJING NORMAL UNIVERSITY

Metal workpiece three-dimensional measurement method and system based on adaptive polarization projection

The invention relates to a metal workpiece three-dimensional measurement method and system based on adaptive polarization projection, and the method comprises the steps: obtaining linearly polarized light projected by a projector, and enabling the polarization state information of the linearly polarized light to be embedded into a four-step phase shift sine stripe model, and obtaining a global polarization coding stripe image; obtaining a uniform horizontal polarization response image, comparing the gray value of each pixel in the uniform horizontal polarization response image with a set threshold value, constructing a binary depolarization model according to a comparison result, and mapping the binary depolarization model to a projector coordinate system to obtain a depolarization model in the projector coordinate system; encoding values of corresponding pixel coordinates in the global polarization encoding stripe image are modulated through a depolarization model, and an adaptive polarization encoding image is obtained; and obtaining a modulated stripe image and carrying out phase calculation to realize three-dimensional measurement of the metal workpiece. According to the method disclosed by the invention, the efficiency and precision of measuring the complex metal workpiece are improved while the robust stability is ensured.
Owner:EAST CHINA JIAOTONG UNIVERSITY

Device and method for calibrating wavelength of spectrometer

The invention provides a device and method for calibrating the wavelength of a spectrometer, and belongs to the technical field of optics, and the device comprises a light source module which is used for outputting wide-spectrum continuous light; the collimation module is used for outputting collimated light based on the wide-spectrum continuous light; the polarizer is used for generating linearly polarized light based on the collimated light; the rotating platform is used for placing a wave plate; the polarization analyzer is located in the light beam output direction of the wave plate; the focusing module is used for converging the light beams output by the polarization analyzer to the spectrograph; the spectrograph is used for detecting the energy of the input light beam so as to output corresponding optical data; the optical data comprises pixels and light intensity data of the input light beam; and a processor for determining a ratio of maximum response discrete light intensity data to minimum response discrete light intensity data based on the optical data, determining a peak center pixel position based on the ratio, and calibrating the spectrometer wavelength based on the pixel position. According to the invention, the technical problem of low accuracy of the wavelength calibration result of the existing spectrograph wavelength calibration method can be solved.
Owner:UNION OPTIC

Measuring device and measuring method for phase retardation of micro-nano-sized wave plate

The invention provides a device and a method for measuring the phase retardation of a micro-nano-sized wave plate, which are used for solving the problems that an existing method for measuring the phase retardation of the wave plate cannot characterize and measure the wave plate in the micro-nano size, optical detection equipment is expensive, an overall experimental measurement scheme is complicated to operate, the system universality is poor, and the measurement cost is high. And the instability of the measurement result of the measurement scheme for deducing the phase retardation of the wave plate based on the Mueller matrix is relatively high. Light emitted by the tunable light source is modulated by the integrating sphere to form unpolarized light, the unpolarized light is shaped into a planar light beam through the shaping reflection unit, and the planar light beam is normally incident to the first linear polarizer so as to emit completely linearly polarized light with different polarization angles; meanwhile, the second linear polarizer is arranged between the microscope objective and the sleeve lens, interference of factors such as light intensity jitter, system transmittance and wave plate rotation positioning precision on a measurement result is reduced by adjusting the deflection angle of the second linear polarizer, and the measurement precision is effectively guaranteed.
Owner:XIAN INST OF OPTICS & PRECISION MECHANICS CHINESE ACAD OF SCI

Calculation spectral imaging system based on spectral response enhancement of color detector

The invention discloses a spectral imaging calculation system based on spectral response enhancement of a color detector, and belongs to the technical field of spectral imaging, the spectral imaging calculation system comprises a birefringence light splitting module and a color detector, the birefringence light splitting module comprises a polarizer, a birefringence crystal and a polarization analyzer, the polarizer, the birefringent crystal, the polarization analyzer and the color detector are sequentially and coaxially arranged along an optical axis; the color detector is also electrically connected with a signal processing module; incident light is converted into linearly polarized light through the polarizer, the linearly polarized light is decomposed into o light and e light through the birefringent crystal, and the o light and the e light are combined into emergent light through the polarization analyzer. The emergent light passes through a color detector to obtain a measurement signal; and the signal processing module receives the measurement signal and reconstructs a spectral image in combination with the spectral response matrix of the birefringence light splitting module and the spectral response function of the color detector. The spectral response characteristics of multiple color channels of the color image sensor are combined with the birefringence color development polarization principle, the rank of a spectral response matrix is expanded, and the spectral resolution and the imaging precision are improved, so that the spectral information of a substance is more accurately acquired and analyzed.
Owner:WUHAN UNIV

Acoustic signal measuring device and method based on asymmetric interference preposed time difference

The invention provides an acoustic signal measurement device and method based on asymmetric interference preposed time difference. The device comprises an asymmetric interference measurement light path and an acoustic transduction sensing part. Wherein the asymmetric interference measurement light path comprises a light source, a front selection part, a polarization beam splitting system, a rear selection part, a photoelectric detection part and a data acquisition part; the acoustic transduction sensing part comprises a first acoustic signal sensing channel and a second acoustic signal sensing channel, and each channel is composed of an optical time delayer and an acoustic transducer. Light emitted by the light source becomes linearly polarized light after passing through the front selection device, is divided into two light beams with orthogonal polarization directions by the polarization beam splitting system, is reflected by the acoustic transducer, generates different time delays through different optical time delayers, and then is combined to enter the rear selection device. After phase modulation and polarization state post selection, the two orthogonal component light beams form asymmetric interference meeting a weak value amplification condition at a photoelectric detection end, and an acoustic signal is reconstructed from a time difference signal measured by interference through an inverse solution algorithm.
Owner:CHONGQING UNIV OF POSTS & TELECOMM +1

Display device and manufacturing method thereof

The invention discloses a display device and a manufacturing method thereof. The display device comprises a display panel, a liquid crystal box and a linearly polarized light rotating structure arranged between the display panel and the liquid crystal box, the liquid crystal box is arranged on the light emitting side of the display panel, and the liquid crystal box comprises a first substrate, a second substrate, a lens set, a first orientation layer, a liquid crystal layer and a second orientation layer, the lens group is located between the first substrate and the second substrate, a plurality of lenses of the lens group extend in the first direction, the orientation direction of the first orientation layer and the orientation direction of the second orientation layer are parallel to the first direction, and an included angle is formed between the polarization direction of linearly polarized light emitted from the display panel and the first direction. The linearly polarized light rotating structure is configured to rotate the polarization direction of the emergent light to be parallel to the first direction. Due to the fact that the arrangement direction of the liquid crystal molecules needs to be parallel to the polarization direction, the arrangement direction of the liquid crystal molecules can be parallel to the first direction, arrangement of the liquid crystal molecules has better consistency, and occurrence of liquid crystal molecule misalignment is reduced to a great extent.
Owner:LEIA INC +1

Magnetic field sensing system based on polarization interference

The invention provides a magnetic field sensing system based on polarization interference. A polarizer and an electro-optical modulator modulate an incoherent optical signal into two beams of linearly polarized light with different polarization states; the delay polarization adjustment module performs phase delay processing on the corresponding wavelength linear polarized light and performs polarization adjustment on another wavelength linear polarized light, and then the polarized light is combined by a polarization beam combiner and transmitted to the magneto-optical crystal; under the action of an external magnetic field, the polarization state of the beam-combined light changes when the beam-combined light passes through the magneto-optical crystal; the polarization analyzer guides the combined light with the changed polarization state to the same polarization direction, so that the intensity of the combined light is changed; the photoelectric detector carries out square law detection on the combined light with the changed intensity to obtain six paths of electric signals; the processor generates four polarization interferences based on the six paths of electric signals, two vernier envelopes are obtained, and the size of the external magnetic field is determined according to the frequency width of split valleys appearing in the lower envelope after the two vernier envelopes are superposed. The device is high in sensitivity and adjustable in measurement range and sensitivity.
Owner:CHONGQING UNIV

Vector vortex super lens for directional selective edge detection and imaging system with same

PendingCN121541385ALensEdge mapsEdge extraction
The invention discloses a vector vortex super lens for directional selective edge detection and an imaging system with the vector vortex super lens, and the vector vortex super lens comprises a substrate and a nano-structure unit on the substrate. The nano-structure units are arranged on the substrate according to specific phase distribution to form a nano-structure unit array; x-line polarized light carrying sample information passes through the vector vortex super lens to generate left-handed and right-handed emergent light, the two paths of emergent light are superposed to obtain an edge image carrying polarization information, and a vector edge detection function is realized. The vector vortex super lens provided by the invention has the edge extraction capability of dynamic adjustment as required, and can realize real-time directional edge detection only by rotating the polarization analyzer without other hardware modification or digital post-processing.
Owner:NANJING UNIV

Asymmetric double-nanopore metasurface refractive index sensor, preparation method and detection method

The invention provides an asymmetric double-nanopore metasurface refractive index sensor, a preparation method and a detection method, and relates to the technical field of refractive index detection. The dielectric layer is formed on the surface of the substrate, a plurality of asymmetric nano-pore unit structures are formed in the dielectric layer, each asymmetric nano-pore unit structure comprises a first nano-pore and a second nano-pore, and the first nano-pore and the second nano-pore have different radiuses and / or different relative positions; structural symmetry is destroyed, and a quasi-continuum bound state resonance mode is formed; the asymmetric double-nanopore metasurface refractive index sensor is configured to generate double formants corresponding to a preset working wavelength under excitation of linear polarized light.
Owner:INST OF OPTICS & ELECTRONICS CHINESE ACAD OF SCI

Dual-wavelength polarization tuning interference spectrum frequency discrimination device and synchronous frequency locking method

The invention discloses a dual-wavelength polarization tuning interference spectrum frequency discrimination device and a synchronous frequency locking method, and the method specifically comprises the steps: enabling a polarization Michelson interferometer to divide incident laser into two beams of linearly polarized light through a plurality of achromatic wave plates and a polarization splitting prism, and enabling the two beams of linearly polarized light to form dual-wavelength circularly polarized light for output after the two beams of linearly polarized light are reflected and combined; the output light is divided into two beams after passing through a light splitting module, and the two beams are respectively collected and processed into a four-quadrant synchronous phase-shifting interferogram by a polarization camera after passing through an achromatic lens, and the wavefront phase difference is calculated in real time; the other beam is compensated by the rotary linear polarizer and then is received by the detector; through the corresponding relation between the wavefront phase difference and the rotation angle, the rotation linear polarizer is driven in real time to carry out phase compensation, so that polarization tuning and frequency locking are realized; meanwhile, a piezoelectric mirror bracket control signal is obtained through calculation, and interferometer parallelism error correction is carried out. According to the invention, synchronous real-time monitoring and active feedback locking of dual-wavelength interference signals can be realized, and the system has the advantages of high tuning resolution and accurate data.
Owner:ZHEJIANG UNIV

Textile fabric with controllable orientation pattern and detection method thereof

The invention discloses a textile fabric with controllable orientation patterns and a detection method of the textile fabric, reflection images of the fabric at different polarization angles are captured by utilizing a rotary linearly polarized light source and an orthogonal polarization camera through polarized image sequence acquisition, so that the directional reflection characteristics of fluff are comprehensively recorded, and the detection accuracy is improved. Normal brightness change caused by the geometric direction of the villus and abnormal response of real flaws are distinguished, and on this basis, in the recognition and segmentation of the flawed area, the real flawed area is effectively isolated and interference of the villus directivity chromatic aberration is avoided by detecting a pixel cluster which is low in modulation depth and has a dominant polarization angle deviating from the peripheral trend; and finally performing type identification and result output on the flaws in flaw classification and output, thereby solving the problems of false alarm and missing alarm caused by fluff directivity chromatic aberration in principle, separating normal optical change from the flaws through polarization response characteristics, and remarkably improving the accuracy and reliability of automatic quality inspection of the fluff textile fabric.
Owner:SHANTOU GUANGHUA TEXTILE CO LTD

Aerial suspension imaging optical system based on polarized light control and reflection optical structure

The invention discloses an air suspension imaging optical system based on polarized light control and a reflection optical structure. The air suspension imaging optical system comprises an image source assembly; a polarization light splitting module, a polarization state conversion module and a reflection module; linearly polarized light emitted by the image source assembly is sequentially reflected or transmitted by the polarization beam splitting module, enters the polarization state conversion module to change the polarization state, is focused by the reflection module, returns, is converted into linearly polarized light through the polarization state conversion module again, and is transmitted or reflected through the polarization beam splitting assembly. A naked eye visible suspension real image without a physical medium is formed in the imaging area; through the above structure, the image light realizes high-efficiency light path turn-back and direction selection through a polarization control path, high-luminous-efficiency and high-quality aerial imaging is realized, and finally, an aerial real image which is visible to naked eyes and free of a medium is formed at a specific spatial position in the air; the system does not need to depend on a traditional imaging medium, and has the advantages of compact structure, high luminous efficiency utilization rate and good imaging brightness and definition.
Owner:HUIZHI WORLD (HANGZHOU) TECHNOLOGY CO LTD