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590results about "Polarisation spectroscopy" patented technology

Transmission type Mueller matrix spectrum ellipsometer and measuring method thereof

The invention discloses a transmission type Mueller matrix spectrum ellipsometer and a measuring method thereof. The transmission type Mueller matrix spectrum ellipsometer measuring method comprises the following steps: projecting modulation rays produced by a partial arm on the surface of a to-be-tested sample, a check partial arm demodulates and receives the rays reflected (or transmitted) by the to-be-tested sample, by proceeding harmonic wave analysis to a tested spectrum, computing and acquiring the full Mueller matrix information of the to-be-tested sample, further through arithmetic of nonlinear regression, liberty matching, and the like, and fitting and extracting information of an optical constant, characteristic, morphology, size and the like of the to-be-tested sample. An ellipsometer comprises the partial arm (comprises light source, a lens group, a polarizer, and a compensator driven by a servo motor),the to-be-tested sample and the check partial arm (comprises the compensator driven by a servo motor, an analyzer the lens group and a spectrograph. The transmission type Mueller matrix spectrum ellipsometer and the measuring method thereof can achieve all kinds of materials and components with information phoelectron functions, and online measurement of all kinds of nano-structures in nano-fabrication, so that transmission type Mueller matrix spectrum ellipsometer and the measuring method thereof have the advantages of being capable of possessing non-destructive property, fast, and low in cost.
Owner:WUHAN EOPTICS TECH CO LTD

Multispectral, multifusion, laser-polarimetric optical imaging system

A multi-energy polarization imaging method consisting of a multi-fusion, dual-rotating retarder/multiple-energy complete Mueller matrix-based polarimeter and dual-energy capabilities, has been invented. The term multifusion describes the use of several imaging functions altogether such as polarimetric imaging, dual-energy subtraction, multifocal imaging and other. By substracting polarimetric parameters such as degree of polarization, degree of linear polarization, degree of circular polarization, respectively, obtained with interrogation light beams of wavelengths λ1 and λ2, he system, enhanced imaging is obtained. The system includes a light source for illuminating a target with a first quantity of light having a first wavelength and a second quantity of light having a second wavelength, the first and second wavelengths being different. A polarization-state generator generates a polarization state for each of the first and second quantities of light, and includes a first polarizer through which the first and second quantities of light are transmitted before entering a first waveplate. A polarization-state receiver evaluates a resulting polarization state of the first and second quantities of light following illumination of the target, the polarization-state receiver including a second waveplate through which the first and second quantittes of light are transmitted before entering a second polarizer. An optical image-capture device captures a first image of the target illuminated by the first quantity of light and a second image of the target illuminated by the second quantity of light. A processing unit assigns a weighting factor to at least one of the first and second images and evaluates a weighted difference between the first and second images to generate a multi-energy image of the target.
Owner:THE UNIVERSITY OF AKRON

Spectrum polarization detection device and method for synchronous polarization modulation interference imaging

The invention discloses a spectrum polarization detection device and a method for synchronous polarization modulation interference imaging. The spectrum polarization detection device comprises a preposed polarization imaging system, an image plane interference imaging spectrometer and a signal processing system which are arranged on the same optical axis in sequence. Incident light forms four groups of light beams with different polarization state information through a polarization element and the light beams are separated on a space of a back focal plane of a microlens array. The separated light beams shoot into a lateral cutting beam splitter after passing through a collimator objective lens and are divided into two crosswise, and optical path difference information is brought in. Two branches of emergent light passes through a postpositional imaging objective lens, a target image with interference information and polarization state information is obtained on a target face of a detector, and the target image is transformed into an electrical signal and enters a signal processing system. Fourier transform is carried out, and light intensity information, spectral information and complete Stokes polarization information of a two-dimensional space of each target point are obtained. The spectrum polarization detection device for synchronous polarization modulation interference imaging has the advantages of being high spectral resolution, high in signal to noise ratio and simultaneous in complete Stokes polarization information and can be used for spectrum detection of a narrow band or a wide band.
Owner:NANJING UNIV OF SCI & TECH

Polarization analysis unit, calibration method and optimization therefor

Measurements at multiple distinct polarization measurement states are taken to define the polarization state of an input, for example to calculate a Stokes vector. High accuracy and/or capability of frequent recalibration are needed, due to the sensitivity of measurement to retardation of the input signal. A multiple measurement technique takes a set of spatially and/or temporally distinct intensity measurements through distinct waveplates and polarizers. These can be optimized as to orientation and retardation using initial choices and also using tunable elements, especially controllable birefringence elements. A device matrix defines the response of the device at each of the measurement states. The matrix can be corrected using an iterative technique to revise the device matrix, potentially by automated recalibration. Two input signals (or preferably the same signal before and after a polarization transform) that are known to have a common polarization attribute or other attribute relationship are measured and the common attribute and/or attribute relationship is derived for each and compared. The device matrix is revised, for example by iterative correction or by random search of candidates to improve the accuracy of the device matrix. Optional tunable spectral and temporal discrimination provide additional functions.
Owner:OPTELLIOS
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