Optoelectronic measuring device (1) for frequency-resolved measurement of the intensity of
electromagnetic radiation (10), comprising multiple measurement channels (M1, M2, ..., M m ), wherein a first of the measurement channels (M1) has a first
spectral sensitivity and another of the measurement channels (M2, ..., M m ) exhibits another
spectral sensitivity that differs from the first
spectral sensitivity, and several collimators (K1, K2, ..., K k ) to collimate the
electromagnetic radiation (10), wherein - through each of the collimators (K1, K2, ..., K k ) a separate
optical path to one or more of the measurement channels (M1, M2, ..., M m ) runs and each of the measurement channels (M1, M2, ..., M m ) is arranged, an intensity of the collimators (K1, K2, ..., K) is arranged, an intensity of the collimators (K1, K2, ..., K k ) collimated
electromagnetic radiation (10) to measure, - the optoelectronic measuring device (1) more collimators (K1, K2, ..., K k ) as measuring channels (M1, M2, ..., M m ) includes, and - the optoelectronic measuring device (1) comprises a
radiation distribution means (3) which is set up and arranged to direct the electromagnetic
radiation (10) onto the collimators (K1, K2, ..., K k ) to distribute, wherein the
radiation distribution means (3) comprises a scattering element and / or an
optical fiber.