Eureka-AI is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Eureka AI

1140results about How to "Reduce decrease" patented technology

VLAN frame format

In a network device such as a network switch having a port coupled to a communications medium dedicated to a single virtual local area network and another port coupled to a communications medium shared among multiple virtual local area networks for transmitting data frames between the dedicated communications medium and the shared communications medium, a method of identifying the virtual network associated with each data frame received by the network switch when transmitting the data frames over the shared communications medium. The method comprises receiving data frames from the dedicated communications medium coupled to one port, and, with respect to each data frame so received, inserting a new type field and a virtual network identifier field. The contents of the new type field indicate the data frame comprises a virtual network identifier field. The method further includes placing a value in the virtual network identifier field identifying the virtual network associated with the data frame and transmitting the data frame over the shared communications medium. Upon receipt of the data frames from over the shared communications medium, another network device can discern from the virtual network identifier field in each data frame the virtual network from which the data frames were received and determine whether to forward the data frames accordingly.

Device for the generative manufacturing of three-dimensional components

ActiveUS20130108726A1Efficient and cost-effective operationEfficiently formedManufacturing platforms/substratesConfectioneryEngineeringMonochrome
The invention relates to a device for producing products having individual geometries, comprising a substrate carrier device, a material application device for applying material, preferably above the substrate carrier device, which material application device can be moved relative to the substrate carrier device, and a control device which is coupled to the material application device for signaling. According to the invention, the material application device is coupled to an input interface for signaling and for selection of a first or a second application mode, the control device and the application device being designed such as to produce, in the first application mode, a three-dimensional product on the surface of a substrate plate by way of an additive production method, said substrate plate being connected to the substrate carrier device. According to the additive production method, a curable material is applied in consecutive layers, one or more predetermined regions are selectively cured after or during each application of a layer, the predetermined regions being bonded to one or more regions of the underlying layer. The predetermined region(s) is/are predetermined by a cross-section geometry of the product in the respective layer and is/are stored in the control device, and the curable material is applied in a plurality of consecutive layers to produce the three-dimensional product. The control device and the application device are further designed such that in the second mode of application one or more colors are applied to predetermined regions of a print substrate material connected to the substrate carrier device to produce a monochrome or polychrome print.

Method and system for computer aided manufacturing measurement analysis

The invention relates to a computer-based method and system to facilitate quality control for manufactured assemblies based on computer aided design (CAD) files. The instant invention mitigates the problems encountered with large CAD files by decomposing each of such files into a multi-file format. A large CAD file is thereby broken-down into smaller files that organize the information contained in the larger file. The organization is performed in such a way that the information pertinent to the measurement process is segregated into a different smaller file than the information not needed to calculate measurements. Thus, the computer running the computation accesses a smaller file containing a higher percentage of required information. Additionally, assisting the user in coordinating a match-up between the physical surfaces being measured and the proper associated CAD model version of that surface further increases the handling speed. In particular, the instant invention uses selection regions for each surface. A selection region consists of the representation of a three-dimensional rectangle region just large enough to enclose each individual surface. A selection region indexes each surface. Thus, when a measurement point is taken, a list of surface regions is automatically scanned in order to determine which region contains that point. The corresponding distance of that measurement point to the surface is then calculated.
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products