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118 results about "Overlay" patented technology

In a general computing sense, overlaying means "the process of transferring a block of program code or other data into main memory, replacing what is already stored". Overlaying is a programming method that allows programs to be larger than the computer's main memory. An embedded system would normally use overlays because of the limitation of physical memory, which is internal memory for a system-on-chip, and the lack of virtual memory facilities.

Multi-granularity data cascade updating method and device based on dynamic topological graph and medium

The invention discloses a multi-granularity data cascade updating method and device based on a dynamic topological graph and a medium, and relates to the technical field of data processing. The method maintains a multi-level data dependency model (DAG) in memory. The system recursively updates a target node by monitoring the change of a source node and utilizing an incremental propagation algorithm. For a high-concurrency scene needing isolation verification, the method introduces an overlay shadow topology mechanism: on the premise of not destroying a main graph structure and not copying a total graph, only instantiating a shadow copy of an affected node based on a Context ID, and constructing an overlay Mapping pointing to a father node; when the propagation path is calculated, the numerical value of the shadow node is preferentially read based on the context, and the propagation path of the original node is logically blocked in the current context. The invention further provides a path convergence mechanism and rendering frame synchronization technology based on topology in-degree, and the problems of resource competition, data consistency and front-end rendering flicker under the complex dependence network are effectively solved.
Owner:BEIJING DATANG SITUO INFORMATION TECHNOLOGY CO LTD

Overlay-based heatmaps for dynamic graphical user interfaces

Techniques for implementing and utilizing overlay-based heatmaps for dynamic graphical user interfaces are described. A heatmap service obtains event data associated with interaction events originated from users utilizing a graphical user interface (GUI) of an application. The interaction events are correlated with identifiers of the associated GUI element for which the interaction events correspond to. This data is used to generate dynamic heatmaps, via an overlay on top of a webpage, that place heatmap visualization elements on top of the corresponding GUI elements.
Owner:AMAZON TECH INC

Photoetching plate, overlay error measurement method and medium

The invention relates to the technical field of chip manufacturing, in particular to a photoetching plate, an overlay error measurement method and a medium, and aims to improve the accuracy of overlay error measurement. The photoetching plate comprises a first grating mark group and a second grating mark group, the first grating mark group is used for measuring the overlay error, and the second grating mark group is used for correcting the overlay error generated by the overlay error measuring system including the photoetching plate; therefore, a more accurate overlay error value can be obtained after overlay error measurement and correction based on the photoetching plate.
Owner:张江国家实验室

Overlay bitmaps for indexing and querying data

Embodiments of the present disclosure include techniques for encoding data locations in a database using bit maps. In one embodiment, a plurality of bit maps are generated for unique values in a column of a table. The bit maps may be ordered in columns, where columns correspond to unique values a particular table column. Bit maps for each comprise a first binary value when table value in a corresponding row matches a corresponding bit map unique value. Bit map values are set to a second binary value opposite the first binary value when the bit map unique value does not match the table row value for previous bit maps and don't care values for subsequent bit maps. In one embodiment, the bit maps are ordered by bit density.
Owner:SAP SE

An integrated circuit overlay error measurement method based on information fusion

The application provides an integrated circuit overlay error measurement method based on information fusion, which is characterized in that, for a given diffraction or scattering type overlay error measurement mark, model-based overlay error measurement (MBO), experience-based overlay error measurement (EBO), model / model hybrid measurement (MBO+MBO) and model / experience hybrid measurement (EBO+MBO) are used to extract overlay error values. Based on the calculation of electromagnetic field simulation means, the measurement distribution and its uncertainty of different methods are estimated, the prior knowledge is provided to eliminate abnormal measurement results, and the fusion decision basis is provided. Further, the different measurement extraction calculation results obtained by the actual measurement signal are fused by using a hierarchical information fusion method to obtain the final overlay error result. The method provided by the application can realize high-credibility extraction and calculation of overlay error, and is suitable for overlay error measurement under non-ideal measurement conditions.
Owner:NANJING UNIV OF AERONAUTICS & ASTRONAUTICS +1

Key FOBS with same common core PCBA and with custom overlays having dome and NFC antenna

A set of key fobs includes a first key fob having a first printed circuit board assembly, and a first overlay. The first overlay has a first dome, and a first near field communication antenna integrated into the first dome. The second key fob includes a second key fob having a second printed circuit board assembly, and a second overlay. The second overlay has a second dome, and a second near field communication antenna integrated into the second dome. The first printed circuit board assembly is identical to the second printed circuit board assembly, such that the first printed circuit board assembly may be replaced by the second printed circuit board assembly. The first key fob has a first style, and the second key fob has a second style different than the first style.
Owner:STRATTEC SECURITY CORP

Multi-modal deep learning network-based overlay mark asymmetry compensation method and apparatus

The present application provides a multi-modal deep learning network-based overlay mark asymmetry compensation method and apparatus. Manufacturing data of different modalities is acquired and then inputted into a multi-modal deep learning network for processing, so as to obtain a prediction error of overlay mark asymmetry, wherein the multi-modal deep learning network performs feature extraction on the manufacturing data of different modalities, performs feature fusion on vector features corresponding to different modalities, and associates and combines physical parameters of actual production in a manufacturing process with parameters observed by a device, so as to obtain the prediction error of overlay mark asymmetry, thereby compensating for an actual overlay mark in actual production. By introducing a multi-modal learning network, a variety of data features are fully mined and utilized, the generalization ability of a model is enhanced, and the intelligence of the device is realized by means of the machine learning technology, thereby providing an effective traceability and localization solution for process problems in wafer production.
Owner:MZ OPTOELECTRONIC TECHNOLOGY (SHANGHAI) CO LTD

Method and apparatus for correcting overlay error, method and apparatus for detecting alignment of wafer

The disclosure provides a method and device for correcting overlay error, and a method and device for detecting alignment of a wafer. After a machine determines a first overlay error value between a first alignment mark of a wafer to be detected layer and a second alignment mark of a target layer, the first overlay error value obtained by measurement is corrected based on a measurement error parameter to obtain a more accurate second overlay error value. Due to the correction of the measurement error parameter, the error caused by the asymmetry or defects of the first alignment mark in the second overlay error value is eliminated, the accuracy of the overlay error value obtained by the machine is improved, and the machine can perform alignment detection and other processes according to the accurate overlay error value.
Owner:CHANGXIN MEMORY TECH INC

Data writing method, storage control chip and flash memory device

The embodiment of the invention relates to the field of storage device application, and discloses a data writing method, a storage control chip and flash memory device.The method comprises the steps that writing requests are obtained, and rough programming and fine programming are conducted on data contained in each writing request so that the data can be written into a flash memory medium, the moment when the flash memory device receives the first write request is earlier than the moment when the flash memory device receives the second write request; and when the first write request and the second write request have an overlay write conflict, performing rough programming and fine programming on the data contained in the second write request again based on the moment when fine programming of the data is completed, so as to write the data contained in the second write request into the flash memory medium again. According to the method and the device, rough programming and fine programming can be performed on the data contained in the two write requests, namely the old write request and the new write request, which have overwrite conflicts, the deadlock condition is avoided, and the data finally written into the flash memory medium can be the data contained in the new write request, so that data order preservation is realized.
Owner:DAPUSTOR CORP

System for forecasting expected credit defaults in accordance with IFRS 9 using machine learning and explainable analyses with regulatory audit trails

ActiveDE202026100348U1FinanceData OriginOverlay
A computer-implemented system (100) for forecasting expected credit losses (ECL) in accordance with IFRS 9 using machine learning and explainable analytics with monitoring audit trails, comprising at least one processor and at least one memory that stores instructions which, when executed, cause the system (100) to operate: a data acquisition interface (1) configured to receive portfolio, customer, risk, repayment, collateral and macroeconomic data from one or more internal and external sources (9); a data management and quality engine (2) configured to perform validation, matching, missing value handling, anomaly detection and data origin marking for the received data; a staging and segmentation engine (3) configured to determine the staging and segmentation in accordance with IFRS 9 for risks based on rules and / or learned risk signals; a feature engineering and feature store module (4) configured to generate, version, and store features that are aligned with observation window and report data; an ECL predictive engine for machine learning (5) configured to train and / or execute predictive models to estimate PD, LGD and EAD and to calculate the 12-month ECL and lifetime ECL under forward-looking scenarios; an explainable analysis engine (6) configured to generate local and global explanation outputs that identify factor contributions to at least staging and ECL outputs, and that produces human-readable explanation codes; an overlay and management customization workflow module (7) configured to apply post-model overlays with documented justifications and approval controls; and a monitoring audit trail and reporting engine (8) configured to generate a timestamped audit record that captures input versions, transformation origin, feature versions, model versions, scenario assumptions, overlays, user actions and report outputs.
Owner:KAKKAR SAURABH

A flow table aging method, device, apparatus, and program product

ActiveCN120750826BTransmissionOverlayTablespace
The present application relates to the technical field of network chip, and particularly relates to a flow table aging method, device, equipment and program product, the method comprises: obtaining a target flow table to be managed, and representing the activation state of each table entry in the target flow table by a binary bitmap configured by hardware logic; timing polling the binary bitmap to identify and delete the inactivated table entry in the target flow table; when there is a new table entry in the target flow table, according to the table entry occupation of the hash bucket corresponding to the new table entry and the value of the overlay permission control bit carried by the new table entry, it is decided whether to overlay the inactivated table entry with the same hash address as the new table entry in the target flow table. The present application improves the flow table space utilization, and can effectively cope with the table entry management demand under the high-speed network environment.
Owner:WUXI STARS MICRO SYSTEM TECHNOLOGIES CO LTD

Automatically directing custom compute operational flows through a heterogeneous overlay and cloud compute infrastructure

A heterogeneous overlay network and cloud compute infrastructure comprises different tiers of PoPs that are configurable to provide different amounts of cloud computing. To facilitate the programming (configuration) of compute and caching operations throughout the heterogeneous network, a control mechanism and methodology are provided for automatically directing the flow of custom compute and caching operations using configurable “operations chains.” A representative operation chain comprises a configuration file that specifies a traffic flow, and a set of operations and their relative ordering. A particular operation chain defines an initial operation that typically starts at a given edge machine in the heterogeneous network and then, as needed, one or more additional locations and their associated machines may then be used to facilitate processing of the operation chain.
Owner:AKAMAI TECHNOLOGIES INC

Graphical overlay method

PendingUS20260124537A1Video gamesGraphicsOverlay
The present disclosure provides a method of providing a graphical overlay on a display of a computing device to a user in a gameplay environment as well as a corresponding device and non-transitory computer-readable medium. The gameplay environment comprises a plurality of non-user players, a user player under the control of the user, and a virtual object that the user player can interact with. The method comprises providing, on the display of the computing device, a first marker indicating a direction from which a virtual object will be received by a user player in the gameplay environment, and providing, on the display of the computing device, a second marker indicating a direction in which the virtual object is to be passed by the user player in the gameplay environment.
Owner:MI HIEPA SCOUT LTD

Systems and methods for testing advanced process control (APC) strategies in a facility

PendingUS20260186456A1OverlayUser input
Various embodiments described herein relate to systems and methods for testing Advanced Process Control (APC) strategies in a facility. In this regard, snapshots of a model predictive controller which is under operation in the facility is captured. Using the snapshots, a digital twin of a process unit is initialized. Then, a tuning overlay is rendered via a user interface. Further, inputs from a user via the user interface is received for fields in the tuning overlay. The inputs are associated with at least one APC strategy that is to be tested for the process unit. Based on the inputs, the at least one APC strategy is tested using the digital twin of the process unit. In response to the testing, results for the at least one APC strategy are rendered on the user interface. Also, based on the results, at least one operation of the process unit is modified.
Owner:HONEYWELL INTERNATIONAL INC

Gaming machine and method including an accumulator-based value transfer bonus

Disclosed are a gaming machine and method for implementing a bonus game including an accumulator and two types of overlay symbols. The overlay symbols, one value-bearing and the other not, are superimposed onto an array of cells, each cell including a symbol-bearing reel. During a series of bonus spins, the overlay symbols are repositioned, potentially shifting out of the array. If a value-bearing overlay symbol exits the array, its value is added to the accumulator. The core interaction of this bonus occurs when a reel symbol lands in a cell occupied by one of the overlay symbols. If the overlay symbol is a value-bearing overlay symbol, its value transfers to the newly landed symbol. If the overlay symbol does not bear a value, the current value of the accumulator transfers to the newly landed symbol. At bonus game end, a prize based on all of the transferred values is awarded.
Owner:LNW GAMING INC

Overlapping automatic examination system and method suitable for three-dimensional PCB (Printed Circuit Board)

The invention provides an overlapping automatic review system and method suitable for a three-dimensional PCB, the system comprises a user interaction module, a data extraction engine, a core review engine and a result generation and report module, and the method comprises the following steps: receiving review configuration information input by a user; extracting related design data from the PCB design file according to the examination type; executing overlapping review operation, including performing electrical rule conformity judgment on wires and shapes in the same layer and / or adjacent layers of the PCB; and generating and outputting an examination result. The inspection types include high-voltage circuit breakdown inspection, Kelvin connection identification, digital signal crosstalk inspection, radio frequency circuit green oil windowing inspection and crystal oscillator adjacent layer digging inspection. According to the method, efficient three-dimensional stacking inspection is realized through a spatial index optimization algorithm, the problems of single inspection dimension, low efficiency and lack of special electrical rule inspection in the prior art are solved, and the reliability and the inspection efficiency of PCB design are remarkably improved.
Owner:HEFEI UNIV OF TECH

Hold and spin revival systems and methods in electronic gaming

An electronic gaming system is provided. The electronic gaming system may include at least one memory and at least one processor in communication with the at least one memory. The at least one processor may be configured to generate and display a first bonus game outcome based on a first plurality of randomly determined overlay spin outcomes, the first bonus game outcome including one or more cash-on-reel (COR) symbols displayed in respective matrix positions of a game matrix, for each displayed COR symbol, randomly determine a corresponding reverse-side symbol and replace each displayed COR symbol with the corresponding reverse-side symbol, and if the displayed reverse-side symbols include at least a threshold number of revival symbols, generate and display a second bonus game outcome based on a second plurality of randomly determined overlay spin outcomes.
Owner:ARISTOCRAT TECHNOLOGIES INC

Overlay error measurement method, system and device, program product and storage medium

The invention discloses an overlay error measurement method, system and device, a program product and a storage medium, and the method comprises the steps: obtaining a first reference overlay error of a product wafer and a reference wafer in a first state, the first reference overlay error is an overlay error between a first front-layer overlay mark on a product wafer and a second front-layer overlay mark on a reference wafer; acquiring a second reference overlay error between the product wafer in the second state and the reference wafer in the first state, wherein the second reference overlay error is an overlay error between a current-layer overlay mark on the product wafer and a second previous-layer overlay mark on the reference wafer; and according to the deviation between the first reference overlay error and the second reference overlay error, obtaining the overlay error of the current layer overlay mark and the first previous layer overlay mark of the product wafer. According to the embodiment of the invention, the obtained overlay error is not limited by the longitudinal distance between the first previous-layer overlay mark and the current-layer overlay mark, and the difficulty of obtaining the overlay error is reduced.
Owner:SEMICON MFG INT (SHANGHAI) CORP

Systems and methods for generating intelligent overlays for interactive displays

PendingCN122642022AOverlayEvent data
The technology described herein relates to a computer-implemented method for generating smart overlays in an interactive display. The method can include receiving a plurality of real-time event data comprising a plurality of real-time event actions; receiving a plurality of user data comprising a plurality of user actions; capturing one or more real-time user interactions with the interactive display; generating a unique relevance threshold using the plurality of real-time event actions, the plurality of user actions, and the one or more real-time user interactions upon receiving the plurality of real-time event data and the one or more real-time user interactions; generating, in real-time, at least one unique smart overlay having a relevance that exceeds the unique relevance threshold; and updating, in real-time, the interactive display with the at least one unique smart overlay.
Owner:STAT LLC

Controlling substrate stress uniformity based on overlay error measurement.

PendingJP2026525197AOverlayAlgorithm
The method includes obtaining first data indicating the overlay error of a substrate using a processing device. The method further includes generating second data indicating the first stress uniformity of the substrate based on the first data. The method further includes performing corrective actions based on the second data.
Owner:APPLIED MATERIALS INC

Substrate stress uniformity management based on overlap error measurement

A method includes obtaining, by a processing device, first data indicative of an overlap error of a substrate. The method further includes generating second data indicative of a first stress uniformity of the substrate based on the first data. The method further includes performing a corrective action based on the second data.
Owner:APPLIED MATERIALS INC

File management method based on raid card, storage medium and computer device

The application discloses a file management method based on a RAID card, a storage medium and computer equipment. The method comprises the following steps: creating a lower RAID volume and an upper RAID volume of an Overlay volume based on a RAID card; writing basic common files into the lower RAID volume, wherein the data in the basic common files is associated with corresponding logical block addresses; and storing an initial mapping table in the upper RAID volume, wherein the upper RAID volume is also used for storing modified data of the basic common files, the mapping table is used for mapping the logical block addresses associated with the data in the Overlay volume, and the modification state of each logical block address is recorded. Through the above method, the application can realize the logical block address level Overlay based on the RAID hardware, is favorable for reducing the space waste of the existing software implemented file system, enables the newly created Overlay volume to quickly locate and access data, improves the read-write performance of the Overlay, can be compatible with various file systems, and has wide applicability.
Owner:SUZHOU DAPU MICROELECTRONICS TECH CO LTD

Adaptive smart group litho compensation method and apparatus

The application discloses a self-adaptive intelligent grouping overlay compensation method and device, the method comprises the following steps: after starting the automatic batch combination processing, overlay compensation information maps corresponding to each wafer in a lot are acquired; the CPE in the lot is classified to obtain different types of groups; for each group, the wafers that can be combined in the group are determined according to the overlay compensation information maps of the wafers in the group, and the CPE groups after combination are obtained, each CPE group comprises one or more wafers; all the CPE groups in the lot are taken as the same batch for exposure processing, and the overlay compensation parameters of each CPE group are dynamically switched in the exposure processing. By using the application scheme, self-adaptive intelligent grouping overlay compensation without batch disassembly in a lot can be realized, and the exposure capacity in mass production manufacturing is improved.
Owner:SEMICON MFG SOUTH CHINA CORP +1

Overlay metrology with enhanced overlay targets

PCT designated stageWO2026037590A1Photomechanical apparatusOverlayDigital holographic microscopy
Measuring overlay using enhanced overlay targets is described. Multiple dimensional (e.g., x and y components) of an overlay measurement may be acquired in parallel in a digital holographic microscope (for example) system using non-cartesian overlay targets (e.g., overlay targets with structures oriented at angles other than typical ninety degree x and y orientations, but within forty five degrees of a radiation axis). This scheme enables single-shot acquisition of the multiple dimensional components of the overlay measurement (e.g., a full overlay vector). A processor is configured to deconstruct data from the single-shot acquisition (based on the orientation of the overlay targets) into the x and y components of an overlay value. Or the non-cartesian targets may be oriented to correspond to patterned features of interest in a substrate such that the single shot acquisition directly provides an overlay value relative to those features of interest.
Owner:ASML NETHERLANDS BV

Dynamic allocation of compute resources for highlight generation in cloud gaming systems

In various examples, compute resources may be allocated for highlight generation in cloud gaming systems. Systems and methods are disclosed that distribute, between and among various devices, processing including user interface generation and overlay, analysis of game streams for actionable events, generation of highlights, storage of highlights, and sharing of highlights. The distribution of processing or compute resources within the cloud gaming system may be dependent on system information of various devices and / or networks. Recordings, snapshots, and / or other highlights may be generated within the cloud gaming system using the determined distribution of compute resources.
Owner:NVIDIA CORP

Interactive overlay on preexisting video system and method

The invention relates to a computer-implemented method for generating and rendering interactive digital content to enhance viewer engagement and accurately measure viewer interaction. This method involves receiving a unique identifier for a video stored on a video hosting server and creating a record associated with this video in a data store. A unique URL is determined for the viewer to access this interactive content, which includes the video and overlaid animated images. These animated images appear at specified times and locations over the video, requiring viewer interaction, such as clicks or taps, to be tracked and recorded. The method further allows for the generation of a web page displaying this interactive content, capturing viewer interactions. and optionally offering a reward based on these interactions. This novel approach ensures an engaging viewer experience while providing a reliable measure of viewer attention and interaction with the digital content.
Owner:CAFIERO MICHAEL

Multi-pitch grid overlay target for scanning overlay metrology

An overlay metrology system with pitches in multiple directions in a single cell is disclosed. The overlay target may, according to a metrology recipe, include a multi-layer structure on two or more layers of a cell of the sample. The multi-layer structure may include structures in each layer having one or more pitches in one or more directions of periodicity. The multi-layer structure may include structures with a first pitch in a first direction, a second pitch in a second direction, a third pitch in the first direction, and a fourth pitch in the second direction. At least one of the first pitch or the third pitch may be different than at least one of the second pitch or the fourth pitch.
Owner:KLA CORP

Indexing in graph-based models

An overlay system is provided that includes a storage element and processing circuitry. The storage element stores an executable graph-based model that includes node templates, node instances, and index nodes. Each node template is associated with one or more node instances and one or more index nodes. Further, each index node includes index records. The processing circuitry receives a contextualized stimulus associated with the overlay system and identifies one or more index records that include an index value indicated by the contextualized stimulus. Based on the identified one or more index records, the processing circuitry further identifies one or more node instances required for stimulus processing. Further, the processing circuitry executes an operation associated with the stimulus based on the identified one or more node instances and each node template associated with the identified one or more node instances.
Owner:INFOSYS LTD +1