30 results about "Angular distribution" patented technology

The invention relates to the technical field of muon imaging, in particular to a cosmic ray muon distribution three-dimensional reconstruction method and system.The method comprises the steps that a monitoring environment is built, an object to be detected is placed at the circle center of an annular guide rail, two lifting platforms are fixed to the annular guide rail, supporting frames are installed on the lifting platforms respectively, and detector panels are arranged on the supporting frames; detecting position information left when muons penetrate through a detector panel, calculating muon tracks and muon flux to obtain angular distribution, and establishing point-surface images of the angular distribution and flux distribution of the muons based on the muon tracks; performing weighted summation to obtain a face-to-face image; and compressing Monte Carlo output muon position information by using an auto-encoder, obtaining momentum, time and position information of muons, and extracting angular distribution in a preset area for classifying the angular distribution and the position information according to the interval. The method is suitable for various use scenes, belongs to passive detection, does not generate radioactive contamination, and can replace industrial CT with radioactive contamination in a specific scene.

The invention relates to an isotropic thermal neutron radiation field angle distribution uniformity control device and method, and the device is characterized in that a particle accelerator is used for emitting a high-energy charged particle beam with a beam position; the beryllium target is placed along the emission line of the high-energy charged particle beam, and the high-energy charged particle beam bombards the beryllium target to generate charges; the insulation isolation gasket is wound on the outer side of the beryllium target and prevents the charges from being led out from the outside through the beryllium target; and the adjusting assembly is connected with the beryllium target and used for acquiring the electric charge quantity on the beryllium target, and is connected with the particle accelerator and used for adjusting the angle of the high-energy charged particle beam irradiating to the beryllium target. According to the invention, the purposes of preventing the charges from being exported outwards based on the insulation isolation gasket and obtaining the charge quantity by the adjusting assembly to adjust the particle accelerator are achieved, so that after the insulation isolation gasket with low cost is used for isolation, the charge quantity is detected to adjust the particle accelerator, and the technical effect of effectively saving the cost is achieved.

The invention discloses a pulse gamma radiation field calculation method and device based on solution of electron angle distribution, and the method comprises the steps: obtaining the dose values of different-angle electron incident dose sheet arrays, and solving the optimal incident electron angle distribution in the process of the different-angle electron incident dose sheet arrays; constructing an analog electron source by using the solved optimal incident electron angle distribution so as to obtain the position, energy and direction information of gamma particles at the shell of the pulse gamma device, and constructing an analog gamma source; based on the constructed simulation gamma source, a plurality of examples are operated in Geant4, and a simulated pulse gamma radiation field is calculated, so that the problem of radiation field calculation distortion caused by neglecting an accelerator pinch process in an existing approximate source method and the problem of long calculation time of an existing simulation electronic targeting method are solved; when the method is used for simulating and calculating the pulse gamma radiation field, the simulation accuracy is high, and the calculation speed is high.

Variable-angle ellipsometry is performed using a high speed polarization state modulator, a photodetector, and a digital micromirror device or spinning disk to encode the angle of incidence of light with a high sampling rate in a time domain or frequency domain. A variable-angle ellipsometer uses a high speed, axially stationary polarization state modulator, such as a photoelastic modulator, and a high speed detector, such as a photodiode, for high speed data acquisition. To acquire data at a plurality of incident angles, a lens is used to generate a large incident angle distribution along an optical axis that is at an oblique angle of incidence and discrete or combinations of incident angles of light are selected in a sequence in the time domain or modulated over a plurality of incident angles in the frequency domain.

The invention belongs to the technical field of proton radiation therapy planning, and provides a planning method and system for realizing proton arc therapy, and the method comprises the steps: calculating the corresponding rotation speed of a rack during the delivery of each irradiation field beam spot based on a proton multi-field intensity modulated therapy plan; based on the calculation result, the angle distribution of the irradiation fields is optimized and adjusted, so that the rotation speed of the rack in each irradiation field is close to the constant speed, and the speed fluctuation is effectively reduced; and on the basis that the rack is approximately rotated at a constant speed, a self-adaptive beam intensity control system is designed, so that the rack is rotated at a constant speed in the whole treatment process. According to the technical scheme, the mechanical burden of the rack is relieved, the treatment time is remarkably shortened, the overall treatment efficiency is improved, and a new technical breakthrough and development direction is brought to the field of proton treatment.

The present invention discloses a method for reconstructing the spatial and angular distribution of fluorescent molecules based on high-dimensional and efficient deconvolution. Through a newly designed spatial angular back-projection operator and iterative framework, the spatial and angular distribution of fluorescent molecules can be reconstructed more quickly using polarized fluorescence microscopy data. While maintaining noise suppression and the spatial resolution and angular distribution accuracy of the reconstruction results, the number of iterations can be reduced to 1, significantly reducing reconstruction time and memory usage costs. Therefore, the present invention effectively designs a high-dimensional and efficient deconvolution algorithm for reconstructing the spatial angular distribution of molecules from polarized fluorescence microscopy data, solving the problems of the existing methods with a large number of iterations, long calculation time, and high computational cost, and providing powerful algorithmic support for subsequent larger-scale and higher-dimensional fluorescent molecular structure research.

A method for improving imaging of a feature on a mask to a substrate during scanning operation of a lithographic apparatus. The method includes obtaining a dynamic pupil representing evolution of an angular distribution of radiation exposing a mask during a scanning operation of a lithographic apparatus and determining a variation of shift of a feature at a substrate during the scanning operation due to interaction of the dynamic pupil with the mask. The method includes configuring a mask parameter and / or or a control parameter of the lithographic apparatus to reduce the variation of shift of the feature.

To determine the imaging quality of the optical system (13) when illuminated by the illumination light (1) within the entrance pupil or exit pupil (11) to be measured, the test structure (5) is initially arranged in the object plane (4) of the optical system (13) and an illumination angular distribution is specified for illuminating the test structure (5) with the illumination light (1). The test structure (5) is illuminated at different distance positions (z m ) of the test structure (5). The intensity I(x, y, z m ) of the illumination light (1) is measured in the image plane (15) of the optical system (13). The spatial image measured in this way is compared with the simulated spatial image, the fitting parameters of the function set used to describe the simulated spatial image are adjusted, and the wavefront of the optical system (13) is determined on the basis of the result of minimizing the difference. The specified illumination angular distribution corresponds to a sub-aperture (10 i ) within the entrance pupil (11) to be measured. For another specified sub-aperture, the steps from "specify" to "determine" are repeated. The wavefront of the optical system is determined by combining the results obtained for the measurement sub-apertures (10 i ) within the entrance pupil (11) to be measured.

An X-ray source is disclosed, comprising: an electron source configured to provide an electron beam; an aperture configured to limit the angular distribution of the electron beam; a secondary emission limiting aperture configured to limit the angular distribution of the secondary X-ray emission, wherein the electron beam causes secondary X-ray emission to be emitted from a region surrounding the aperture; a first deflector located downstream of the electron beam limiting aperture and configured to deflect the electron beam toward the secondary emission limiting aperture; a target located downstream of the secondary emission limiting aperture and configured to generate primary X-ray emission through interaction with the electron beam; and an exit window located to transmit the primary X-ray emission, wherein the secondary emission is prevented from reaching the exit window by the secondary emission limiting aperture. A corresponding method is also disclosed.

The present invention discloses a method for obtaining the energy spectrum and angular distribution of a deuterium-tritium neutron source. The method adopts a D-T neutron radiation field measurement system based on a SiC detector, can simultaneously measure the companion particles of the two reactions, can distinguish them in the energy spectrum, and obtain the counting rates of alpha particles and protons; takes into account the influence of the D-D reaction caused by target deposition in the D-T reaction, obtains the energy spectrum and angular distribution of the D-T and D-D neutron sources, and effectively improves the accuracy of the energy spectrum and angular distribution; the method of the present invention has no requirements for target tube-related parameters such as a pipeline and a grating for the companion particles, is simple to operate, only needs to measure a set of data to obtain the energy spectrum distribution in the entire space, does not need to measure different angles one by one, and can measure all D-T neutron sources; and the method of the present invention can be applied to a DC beam or pulsed beam D-T accelerator neutron source with a reserved companion particle channel, especially when there is deuterium beam deposition on the target, and can more accurately obtain the energy spectrum and angular distribution of the D-T neutron source.

A radio wave reflector includes a first flat surface and first inclined surface that reflect radio waves. The first inclined surface is connected to at least part of the outer edges of the first flat surface and is inclined with respect to the first flat surface. The areas of the first flat surface and first inclined surface have a relationship in which the difference between the maximum value of the strengths of reflected waves from the first flat surface and that for the first inclined surface is equal to or smaller than a predetermined value. In an angular distribution of reflected waves with respect to a normal passing through the center of the first flat surface, the first inclined surface is inclined with respect to the first flat surface so that an overlap is formed between angular ranges in which their respective reflected waves have a predetermined strength or higher.

The invention discloses a Compton scattering imaging device based on focusing collimation and a defect detection method. The Compton scattering imaging device comprises a ray source used for generating X-rays or gamma-rays with certain energy and angle distribution; the front collimator is used for collimating rays output by the ray source to form a beam to perform point-by-point scanning on a measured object; the rear collimator with the focusing structure is formed by splicing a plurality of focusing collimation structures which are distributed and arranged, effective light-passing axes of the focusing collimation structures are converged in the same focusing area, and the rear collimator with the focusing structure is used for receiving scattering signals generated in the effective light-passing axis direction within the range of the focusing area with the set depth of the measured object; the focusing area covers the scanning point; the large-area detector is used for receiving the scattering signal output by the rear collimator and converting the scattering signal into an analog electric signal; and the electronics acquisition system is used for receiving the analog electric signal, converting the analog electric signal into a digital signal, processing the digital signal and transmitting the processed digital signal to the upper computer to generate an internal structure image of the measured object. According to the invention, the spatial resolution capability is greatly improved.

The invention relates to a device for replicating a hologram from a master hologram. The device preferably comprises an intensity-modulating unit and a beam-shaping unit, wherein the intensity-modulating unit is configured for setting the intensity distribution of a light wave with which the beam-shaping unit is subsequently irradiated. The beam-shaping unit is configured for generating a free-form wave with a spatially varying angular distribution for illuminating the master hologram, wherein the angular distribution of the free-form wave can be predetermined by the intensity distribution of the light wave from the intensity-modulating unit incident on the beam-shaping unit.

The present invention proposes a multi-sound source localization method using the angular distribution information of the signal time-frequency points. The first step is to obtain the azimuth and elevation information of the time-frequency points of the sound field microphone recording signal. The second step is to divide each frame of the recorded signal into sub-bands in the frequency domain, and construct an azimuth set and an elevation set of the time-frequency points in each sub-band. The third step is to divide the value ranges of the azimuth and elevation angles into intervals, and establish azimuth and elevation sub-intervals. The fourth step is to divide the azimuth and elevation angles of each sub-band time-frequency point into corresponding angle sub-intervals, and construct an azimuth set and an elevation set of different angle sub-intervals in each sub-band. The fifth step is to retain the azimuth sub-interval set and the elevation sub-interval set with the largest number of angles. The sub-interval sets of azimuth and elevation are merged respectively. Finally, kernel density estimation is performed on the angles in the two sets, and the angle value corresponding to the peak value in the obtained angle distribution curve is an estimated value of the sound source wave arrival direction.

Variable-angle ellipsometry is performed using a high speed polarization state modulator, a photodetector, and a digital micromirror device or spinning disk to encode the angle of incidence of light with a high sampling rate in a time domain or frequency domain. A variable-angle ellipsometer uses a high speed, axially stationary polarization state modulator, such as a photoelastic modulator, and a high speed detector, such as a photodiode, for high speed data acquisition. To acquire data at a plurality of incident angles, a lens is used to generate a large incident angle distribution along an optical axis that is at an oblique angle of incidence and discrete or combinations of incident angles of light are selected in a sequence in the time domain or modulated over a plurality of incident angles in the frequency domain.

The present application discloses a method and apparatus for processing radar point cloud data, a mobile platform, and a storage medium. The data processing method includes: obtaining a first point cloud and a second point cloud collected by a radar corresponding to two different poses; obtaining an estimated angle range and a first sampling range, and determining a plurality of initial evaluation values according to the first point cloud, the second point cloud, the first sampling range, and a plurality of angles within the estimated angle range, where the estimated angle range is an estimated range of the angle change between the first point cloud and the second point cloud, and the first sampling range is the angular distribution range of the point cloud in the first point cloud and the second point cloud; obtaining a plurality of matching degrees according to the plurality of initial evaluation values, where the matching degree represents the angular matching relationship between the first point cloud and the second point cloud; obtaining a final angle according to the plurality of matching degrees; obtaining a final evaluation value of the final angle, and obtaining a displacement vector according to the final evaluation value; and positioning the radar and / or controlling the radar to adjust the pose according to the final angle and the displacement vector.

The utility model relates to the technical field of nuclear radiation, in particular to a neutron angle correlation distribution information acquisition system, which comprises a neutron detector, a time position sensitive detector module, a time flight measurement module, a synchronous trigger control module, a signal processing module, a data acquisition module and a spherical support frame, the system adopts a structure in which multiple neutron detectors are uniformly distributed, is combined with a time position sensitive detector module and a time flight measurement module, is distributed on a spherical framework, and can collect neutron angle correlation distribution in a 4pi space angle, including neutron energy, time and angle; and angle distribution, time difference distribution, energy association, event counting and direction association information are obtained, and data information support is provided for radionuclide identification.

The present application discloses a docking method and an electronic device for a tractor and a towed target, belonging to the field of intelligent driving technology. A docking device and a target are provided on the towed target, and a detection device for detecting the target is provided on the tractor. The docking method includes: when the tractor reaches the docking starting position, acquiring a target ray detected by a radar and emitted; calculating an angular distribution state of the target ray relative to the central axis of the radar; and controlling the traveling direction of the tractor based on the angular distribution state to achieve docking of the tractor and the towed target. By acquiring the target ray detected by the radar provided on the tractor and emitted, the deflection angle of the tractor relative to the towed target can be determined through the included angle between the target ray and the central axis of the radar. By adjusting the movement direction of the tractor, the deflection angle can be adjusted, enabling the tractor and the towed target to be successfully docked.

The invention relates to a spectrometer device (130) for obtaining at least one item of spectral information about at least one object (110) by means of spectral measurement, the spectrometer device (130) comprising: (1) at least one sample interface (132), the sample interface (132) being configured to define a measurement pose of the object (110), in particular during the spectral measurement, the measuring surface further defines an x-y plane and thereby defines an x-axis and a y-axis; (2) at least one light emitting element (138) wherein the light emitting element (138) is configured for emitting illumination light (140) onto the at least one object (110) in order to generate detection light (142) from the at least one object (110); (3) at least one detector (144), where the detector (144) comprises a plurality of light sensitive elements (164), where each of the light sensitive elements (164) is configured to generate at least one detector (144) signal when the detection light (142) is received from the object (110) in order to obtain the spectral information item; wherein the spectrometer device (130) is configured such that the received detection light (142) of at least two light-sensitive elements (164) of the plurality of light-sensitive elements (164) each exhibit an angular distribution over the sample interface, and wherein at least two angular distributions of the at least two light-sensitive elements (164) at least partially overlap.

The invention discloses a method and a device for detecting obstacles in a laser radar blind area, a medium and equipment, and the method comprises the steps: determining the model of a laser radar main body, and enabling an angle region scanned by the laser radar to be a concentric fan-shaped or circular region; obtaining a non-blind area laser radar point cloud and removing noise to obtain effective point cloud data; an angle distribution array is constructed, elements of the angle distribution array are point cloud numbers in one-to-one correspondence with the angle intervals, the angle distribution array is traversed and indexed, and the point cloud numbers of the elements are counted; and if an angle interval corresponding to the number of the elements in the array is judged to be an obstacle angle interval, outputting an angle value of the obstacle angle interval. The obstacle is determined through the number of the point clouds in the angle interval, the distance and angle distribution between the obstacle and the laser radar are obtained, and the distance and angle distribution can be used as reference information for the robot to avoid the obstacle later.

There is provided an illumination uniformity correction apparatus for use in an illumination system comprising at least a first and a second transmissive correction plate. The transmissive correction plates are arranged to be moveable relatively to each other. At least one of the at least first and second transmissive correction plates comprising a varying parameter profile configured to make a local angular redistribution of radiation transmitted through said at least one transmissive correction plate.

The invention relates to a method for the replication of a hologram into a replication assembly with an exposure module. The exposure module has at least one light source and a master element comprising a master hologram to be replicated, and is designed to bring the replication assembly into optical contact with the master element. The at least one light source exposes the master hologram to obtain a replicated hologram on a region of the replication assembly. The method comprises providing a beam-shaping unit, setting an intensity distribution of a light wave with which the beam-shaping unit is irradiated, and generating a free-form wave by means of the beam-shaping unit with a spatially variable angular distribution, wherein the angular distribution is specified by the intensity distribution of the light wave. The invention further relates to a method for determining an intensity distribution of a light wave, an intensity-modulating unit for exposing a master hologram to a desired free-form wave, and the use thereof for replicating a master hologram in a replication assembly.

The invention relates to a spectrometer device (130) for obtaining at least one item of spectral information about at least one object (110) by means of spectral measurement, the spectrometer device (130) comprising: (1) at least one sample interface (132), the sample interface (132) defining a measurement surface, the measurement surface being configured to define a measurement pose of the object (110), the measurement pose being configured to define a measurement pose of the object (110); wherein the measurement surface further defines an x-y plane and thereby defines an x-axis (134) and a y-axis (136), in particular during spectral measurement; (2) at least one light emitting element (138), where the light emitting element (138) is configured to emit illumination light (140) to illuminate the at least one object (110) in order to generate detection light (142) from the at least one object (110), where the incident illumination light (140) has an angular distribution over the sample interface (132) that results in an angular distribution of specular Fresnel reflected light over the sample interface (132); wherein the angle is an angle between a projection of a projection of a specified light ray of the light, described by the respective angular distribution, in the x-z plane and a projection of a normal on the measurement surface, in the x-z plane, the angle is an angle between a projection of a specified light projection of the light described by the corresponding angle distribution in the y-z plane and a projection of a normal on the measurement surface in the y-z plane; (3) at least one detector (144), where the detector (144) is configured to generate at least one detector signal when detection light (142) is received from the object (110) in order to obtain a spectral information item, where the detection light (142) received by the detector (144) has an angular distribution over the sample interface (132); wherein the spectrometer device (130) is configured for at least partially separating the angular distribution and the angular distribution.

Disclosed is an X-ray source comprising: an electron source configured to provide an electron beam; an aperture configured to limit an angular distribution of the electron beam, where the electron beam causes emission of secondary X-ray radiation from a region around the aperture; a secondary radiation limiting aperture configured to limit an angular distribution of secondary X-ray radiation, where the secondary radiation limiting aperture is disposed downstream of the electron beam limiting aperture; a first deflector configured to deflect the electron beam toward the secondary radiation limiting aperture; a target disposed downstream of the secondary radiation limiting aperture and configured to generate primary X-ray radiation by interacting with the electron beam; and an exit window arranged to transmit the primary X-ray radiation; wherein secondary radiation is prevented from reaching the exit window by the secondary radiation limiting aperture. A corresponding method is also disclosed.

The invention discloses a fluorescence molecule space and angle distribution reconstruction method based on high-dimension efficient deconvolution, and the method can achieve the faster reconstruction of the space and angle distribution of fluorescence molecules through the data of a polarization fluorescence microscope through a newly designed space angle back projection operator and an iteration frame. Under the condition that the resolution and angle distribution accuracy of noise suppression and reconstruction results in space are kept, the number of iterations is reduced to one, and the reconstruction time and the memory occupation cost are remarkably reduced. Therefore, the high-dimensional efficient deconvolution algorithm for reconstructing molecular space angle distribution from polarized fluorescence microscopic data is effectively designed, the problems that an existing method is large in iteration frequency, long in calculation time and high in calculation cost are solved, and powerful algorithm support is provided for follow-up larger-scale and higher-dimensional fluorescent molecular structure research.

The invention relates to a device for replicating a holograms from a master hologram. The device preferably comprises an intensity-modulating unit and a beam-shaping unit, wherein the intensity-modulating unit is configured for adjusting an intensity distribution of a light wave with which the beam-shaping unit is subsequently irradiated. The beam-shaping unit is configured for generating a free-form wave having a spatially variable angular distribution for exposure of the master hologram, wherein the angular distribution of the free-form wave can be specified by the intensity distribution of the light wave from the intensity-modulating unit, which is incident on the beam-shaping unit.

The invention relates to an electron imaging apparatus (23) configured to be connected to an energy analyzer apparatus. The electron imaging apparatus comprises a receiving aperture (22), a control unit, and a field generating unit (65). The receiving aperture is configured for receiving electrons from a focal volume (200) which form an electron beam (25). The control unit is configured for providing a control signal to the field generating unit based on a desired height of the electron beam in an energy dispersive direction (y) of the energy analyzer apparatus at a proximal end (90) of the electron imaging apparatus and a desired angular distribution (α p ) in the energy dispersive direction at the proximal end. The field generating unit is configured for generating at least one electrostatic, magnetic, or electrostatic and magnetic field based on the at least one control signal such that the at least one electrostatic, magnetic, or electrostatic and magnetic field is configured for exerting a force on the electrons of the electron beam in the energy dispersive direction such that a height of the electron beam in the energy dispersive direction at the proximal end corresponds to the desired height in the energy dispersive direction at the proximal end and an angular distribution in the energy dispersive direction at the proximal end corresponds to the desired angular distribution in the energy dispersive direction at the proximal end.

A transmission-type X-ray source is disclosed, comprising an electron source for providing an electron beam; a target configured to generate X-ray radiation by interaction with the electron beam; an X-ray transparent exit window; a plurality of electron beam limiting apertures, each configured to limit an angular distribution of the electron beam; a secondary radiation limiting aperture; a first deflector arranged to deflect the electron beam from the secondary radiation limiting aperture towards the target; a second optional deflector arranged to deflect the electron beam from a selected one of the electron beam limiting apertures towards the secondary radiation limiting aperture; and an aperture selector configured to make the selected one of the electron beam limiting apertures and the electron beam path coincide; wherein each of the electron beam limiting apertures and the secondary radiation limiting aperture are arranged so that there is no direct line of sight for secondary X-ray radiation from the electron beam limiting apertures to the exit window. The aperture selector may comprise a third deflector arranged to deflect the electron beam towards the selected one of the electron beam limiting apertures, or an actuator arranged to bring the selected one of the electron beam limiting apertures into the electron beam path.

The application provides a particle size distribution detection device for particles, comprising a first vibrating screen assembly, a first optical structure, a first tray and a first screen; the first optical structure is used for emitting first laser to irradiate particles to be detected in a detection space, generating a first detection signal; the first tray is used for weighing the first mass of the particles to be detected; a second vibrating screen assembly is formed with a second detection space, used for obtaining the second mass of part of the particles to be detected passing through the first screen, and generating a second detection signal according to the part of the particles to be detected; a controller is used for obtaining the light intensity angle distribution of the first detection light according to the first detection signal, obtaining the light intensity angle distribution of the second detection light according to the second detection signal, and obtaining the particle size-volume distribution information of at least part of the particles to be detected according to the light intensity angle distribution, the first mass and the second mass based on a normal distribution curve. The application also provides a particle size distribution detection method.

An apparatus comprising a multilayer structure configured to reflect electromagnetic radiation. The apparatus comprises a sensor configured to detect an angular distribution of the electromagnetic radiation after reflection from the multilayer structure. The apparatus comprises a processor configured to generate a first function at least partially based on the angular distribution of the electromagnetic radiation detected by the sensor. The processor is configured to compare the first function to a plurality of known functions associated with a plurality of known angular reflectivity profiles to identify a second function from the plurality of known functions that is most similar to the first function. The processor is configured to determine an angular reflectivity profile of the multilayer structure at least partially based on a known angular reflectivity profile that is associated with the second function.