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8253 results about "Ray" patented technology

In optics a ray is an idealized model of light, obtained by choosing a line that is perpendicular to the wavefronts of the actual light, and that points in the direction of energy flow. Rays are used to model the propagation of light through an optical system, by dividing the real light field up into discrete rays that can be computationally propagated through the system by the techniques of ray tracing. This allows even very complex optical systems to be analyzed mathematically or simulated by computer. Ray tracing uses approximate solutions to Maxwell's equations that are valid as long as the light waves propagate through and around objects whose dimensions are much greater than the light's wavelength. Ray theory (geometrical optics) does not describe phenomena such as interference and diffraction, which require wave theory (involving the relative phase of the rays).

Multi-parameter X-ray computed tomography

The present invention relates to the field of x-ray imaging. More particularly, embodiments of the invention relate to methods, systems, and apparatus for imaging, which can be used in a wide range of applications, including medical imaging, security screening, and industrial non-destructive testing to name a few. Specifically provided as embodiments of the invention are systems for x-ray imaging comprising: a) a first collimator-and-detector assembly having a first operable configuration to provide at least one first dataset comprising primary x-ray signals as a majority component of its data capable of being presented as a first image of an object subjected to x-ray imaging; b) a second collimator-and-detector assembly having a second operable configuration or wherein the first collimator-and-detector assembly is adjustable to a second configuration to provide at least one second dataset comprising primary and dark-field x-ray signals as a majority component of its data capable of being presented as a second image of the object; and c) a computer operably coupled with the collimator-and-detector assemblies comprising a computer readable medium embedded with processing means for combining the first dataset and the second dataset to extract the dark-field x-ray signals and produce a target image having higher contrast quality than the images based on the first or second dataset alone. Such systems can be configured to comprise at least two collimator-and-detector assemblies or configurations differing with respect to collimator height, collimator aperture, imaging geometry, or distance between an object subjected to the imaging and the collimator-and-detector assembly.
Owner:VIRGINIA TECH INTPROP INC

Measuring device and method for target line-of-sight angel offset and distance

The invention provides a measuring device and method for the target line-of-sight angel offset and distance. The device is composed of a four-quadrant avalanche photodetector, a receiving and sending optical unit, a noise compensation circuit, a four-circuit front amplification circuit, a video amplification circuit, an automatic gain amplification circuit, a peak keeping circuit, an AD conversion circuit, a laser, a dominant wave sampling circuit, a summing circuit, a time identifying circuit, a time test circuit and a digital processing circuit, wherein the receiving and sending optical unit enables narrow pulse laser rays emitted by the laser to be converged on the photoelectric detector to form echo light spots after target reflection, photovoltaic conversion of the four-quadrant avalanche photodetector, front amplification, video amplification and automatic gain amplification are conducted, narrow-pulse peak keeping is conducted, transmission of the AD conversion circuit is conducted, and the digital processing circuit extracts the digital line-of-sight angel offset; summing is conducted on the four-circuit front amplification circuit, the dominant wave sampling circuit is combined, the time identifying circuit determines laser emitting and echo coming and returning time, the time is transmitted to the time identifying circuit to be measured, and the digital processing circuit decodes the corresponding distance.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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