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608results about "Optical measurements" patented technology

Wavefront reconstruction method for improving dynamic range of Shack-Hartmann wavefront sensor

The invention discloses a wavefront reconstruction method for improving the dynamic range of a Shack-Hartmann wavefront sensor. Belongs to the technical field of wavefront detection. According to the method, a new Shack-Hartmann wavefront detection method is needed, the effective dynamic range of a Shack-Hartmann sensor can be expanded on the premise that the hardware complexity is not remarkably increased, local mismatching accumulation can be avoided through a reasonable matching strategy, and the detection accuracy is improved. Therefore, high-precision and high-reliability wavefront reconstruction can be realized in a large-amplitude wavefront distortion scene. Comprising the following steps: S1, detecting by a Shack-Hartmann wavefront sensor to obtain a light spot distribution diagram H (x, y); s2, extracting a light spot centroid pixel-level position through a matched filtering algorithm; s3, calculating the sub-pixel-level position of the mass center of the light spot through Gaussian interpolation; s4, a mass center-subaperture matching relation is established through a Kuhn-Munkres algorithm; and S5, calculating the wavefront slope according to the corresponding relationship between the centroid and the sub-aperture, and then recovering the wavefront according to the wavefront slope.
Owner:CHANGGUANG SATELLITE TECH CO LTD

Spectrometer wavelength calibration method, device, equipment and medium

The invention provides a spectrograph wavelength calibration method, device and equipment and a medium, and the method comprises the steps: obtaining the spectral data of a spectrograph at different temperatures, and obtaining the spectral data of the spectrograph at different temperatures according to the pixel positions of a characteristic wavelength point at different temperatures and the pixel position of the characteristic wavelength point at a preset reference temperature; determining the pixel position offset of the characteristic wavelength point at different temperatures, and calibrating the wavelength of the spectrograph according to the pixel position offset of the characteristic wavelength point at different temperatures; in the process of calibrating the wavelength of the spectrograph, the wavelength drift caused by the pixel position offset of the characteristic wavelength point at different temperatures is fully considered, the output error of the wavelength of the spectrograph is reduced, and the wavelength output accuracy of the spectrograph is improved.
Owner:CHONGQING CHUANYI AUTOMATION CO LTD

Self-calibrating atomic wavemeter

The invention relates to a self-calibration atomic wavelength meter. The self-calibration atomic wavelength meter comprises a saturated absorption spectrum light path for locking a detection laser frequency on a cesium atom energy level transition line based on a saturated absorption spectrum; the double-peak spectrum light path scans the frequency of a coupled laser after the frequency of the detection laser is locked by a saturated absorption spectrum, and when the detection laser and the coupled laser jointly act on alkali metal atoms and are subjected to resonance excitation, an electromagnetic induced transparency effect is generated; when the detection laser is detuned, the detection laser and the combined laser jointly act on the alkali metal atoms to generate non-resonance excitation, a double-peak EIT spectrum with Doppler frequency shift is generated, and the wavelength measurement of the current detection laser can be completed based on the linear relation between the double-peak spectrum interval and the detuning amount of the detection laser. In addition, the double-peak spectrum interval is compared with the atomic energy level transition frequency, the difference between the double-peak spectrum interval and the atomic energy level transition frequency serves as an error signal to be fed back to the control end of the detection laser, the frequency of the detection laser is tuned to the reference frequency standard, and calibration of the wavemeter can be achieved.
Owner:NAT UNIV OF DEFENSE TECH

Weak measurement high-sensitivity interval compensation method and system for zero calibration

The invention relates to a zero calibration weak measurement high-sensitivity interval compensation method and system, and the method comprises the steps: collecting the light intensity data of two paths and four channels in a zero input state, solving the asymmetry caused by the loss difference of the channels through a weak measurement method, and carrying out the calculation of the asymmetry. And correcting the post-selection state and the compensation sensitivity of the system according to the intensity difference of the output projection to the horizontal polarization state and the vertical polarization state, calculating the phase offset of a high-sensitivity interval according to the loss difference of the four channels, generating a compensation phase, and modulating the center of the high-sensitivity interval to a working point. Compared with the prior art, high-sensitivity loss and high-sensitivity interval offset caused by system asymmetry can be corrected through phase compensation and post-selection state correction, it is ensured that a measurement system always works in an optimal sensitivity interval, the measurement sensitivity and stability of a photoelectric detection system under weak measurement are improved, and the measurement accuracy is improved. The method is suitable for application scenes with strict requirements on tiny signal detection.
Owner:上海量感智能科技有限公司

Shack-Hartmann wavefront detector centroid calculation method and related equipment

The invention discloses a Shack-Hartmann wavefront detector centroid calculation method and related equipment, and relates to the field of optical measurement, and the method comprises the steps: obtaining a light spot array grayscale image, detecting the local maximum value of each light spot, and dividing sub-aperture image regions corresponding to micro lenses one by one according to the local maximum value; extracting a gray matrix of each sub-aperture image region, respectively determining one-dimensional regions of a light spot main lobe in row and column directions, and intersecting to obtain a main lobe region; a main lobe area is deducted from the sub-aperture image area to form a threshold calculation area, and the maximum gray value of the threshold calculation area is selected as a threshold; and performing threshold reduction on pixels in the sub-aperture image area, setting a negative value to zero, and calculating the position of the mass center of the light spot based on the processed image. According to the method, sub-aperture adaptive threshold and local background removal are realized, weak light spot information loss caused by a unified threshold is avoided, and the precision of centroid calculation and wavefront restoration is improved.
Owner:SICHUAN ZHONGFEI HECHUANG TECHNOLOGY CO LTD

Method for measuring coherence length of correlation structure light beams of Shell model

The invention relates to a method for measuring the coherence length of a Shell model correlation structure light beam, which belongs to the field of laser space coherence measurement, and comprises the following steps: S1, calculating the coherence lengths # imgabs0 # and # imgabs1 # in x and y directions by using the analytic relationship between the coherence length of the Shell model correlation structure light beam and the spatial coherence modulus; s2, a double-aperture mask is arranged on a light beam shaping transmission path of the laser processing system, the aperture positions are symmetrical, the distance d is adjustable, and after light beams are focused, intensity signals # imgabs2 are collected at a focal plane detector; and S3, extracting an intensity signal # imgabs3 # to obtain a double-aperture interferogram, performing Fourier transform on the interferogram, establishing a corresponding relation between a low-frequency component in a frequency spectrum and a characteristic frequency of an aperture spacing d, and calculating to obtain a spatial coherence modulus # imgabs4 #. According to the invention, based on partially coherent light dual-aperture interference and Fourier spectrum analysis, a direct analytical relationship between the spatial coherence degree and the coherence length is established, and a new way is provided for beam quality control in laser processing.
Owner:TAIYUAN UNIVERSITY OF SCIENCE AND TECHNOLOGY

Wide-range narrow-linewidth laser wavelength and linewidth measuring system

The invention relates to the technical field of laser light source measurement, and discloses a wide-range narrow-linewidth laser wavelength and linewidth measurement system, which can be flexibly matched with the center frequency of laser to be measured through the arrangement of a tunable laser, breaks through the strict limitation of the existing beat frequency method on the center frequency, effectively expands the measurement range, and improves the measurement accuracy. By combining the synergistic effect of the absorption cell and the locking loop, the system stability is improved, the measurement precision of narrow linewidth laser is guaranteed, the integration time can be flexibly adapted without tedious adjustment of a delay optical path or change of parameters of acquisition equipment through the cooperation of the optical modulator and the delay optical fiber, the problem of inconsistent measurement resolution under different integration time is avoided, and the measurement accuracy is improved. And the accuracy of short-time measurement is obviously improved. The system integrates wavelength and line width measurement functions, can measure line width, center wavelength and long-time frequency stability of to-be-measured laser, is reasonable in structural design, retains the advantage of high precision of a beat frequency method, overcomes the defects that an existing method is narrow in measurement range and inconvenient to adjust integral time, and improves the measurement accuracy of the to-be-measured laser. And the measurement requirements of wide-range and narrow-linewidth laser are met.
Owner:XIAN INST OF OPTICS & PRECISION MECHANICS CHINESE ACAD OF SCI

Optical measurement device and system

The present disclosure discloses an optical measurement device and system, the device comprising a light splitting module comprising at least one optical element plated with an optical film, the transmittance and / or reflectance of the optical film monotonically changing with wavelength within a measurement band range; the at least two image sensors are respectively arranged at the downstream of the light path of the light splitting module, at least one of the at least two image sensors is configured to receive the light beam output by the optical thin film and generate image information, and the image information is used for obtaining a two-dimensional wavelength distribution diagram of the to-be-detected sample. According to the embodiment provided by the invention, the wavelength measurement time is effectively shortened through the innovative combination of the optical film of which the transmittance and / or the reflectivity monotonically changes along with the wavelength in the measurement waveband range and the dual-path synchronous imaging architecture.
Owner:GOVION TECHNOLOGY (SUZHOU) CO LTD

Slit spectral imaging method based on filtering phase reconstruction and grating spectrometer

The invention provides a slit-type spectral imaging method based on filtering phase reconstruction and a grating spectrometer. The method comprises the following steps: measuring wavefront aberration of a slit-type grating imaging spectrometer before slit filtering by using a wavefront sensor; based on a slit filtering principle, reconstructing a phase function after slit filtering by using wavefront aberration before slit filtering; and capturing a slit image, and reconstructing the slit image by using the reconstructed filtered phase function of the slit to obtain a final reconstructed image. According to the method, effective recovery of the slit imaging data of the grating spectrometer based on the slit is realized, the influence of optical aberration and image noise on the spectrum and spatial resolution of the spectrometer is effectively eliminated, and the slit imaging quality is remarkably improved and is close to the diffraction limit.
Owner:PUTIAN UNIV

Complex light field-oriented high-resolution wavefront measurement method and device, electronic equipment and storage medium

The invention relates to a high-resolution wavefront measurement method and device for a complex light field, electronic equipment and a storage medium, and the method comprises the steps: obtaining an observation image representing the to-be-measured wavefront intensity distribution based on to-be-measured light waves passing through a scattering sheet; obtaining initial complex amplitude space distribution corresponding to the wavefront to be measured based on the observation image; and inputting the initial complex amplitude space distribution and the observation image into a target function, taking the complex amplitude space distribution under the condition that the numerical value of the target function is minimum as the complex amplitude space distribution corresponding to the wavefront to be measured, and performing wavefront inversion by minimizing the target function to obtain the wavefront to be measured. The objective function comprises a data fidelity term, a spatial smoothness constraint term and a spatial spectrum bandwidth constraint term of the wavefront to be measured. And for a complex light field with strong aberration, turbulent flow or high-order singular points, the high-resolution wavefront is quickly reconstructed. Object information recording and imaging can be supported under the defocus condition, and the method is further suitable for application requirements of rapid and high-throughput detection and the like.
Owner:TSINGHUA UNIVERSITY

Large dynamic range Hartmann sensor defocus measurement method and device

The invention discloses a large dynamic range Hartmann sensor out-of-focus measurement method and device, and belongs to the technical field of wavefront detection, and the method calculates the out-of-focus amount by measuring the change of the distance from a sub-light spot to the center of a light spot array, thereby achieving the out-of-focus measurement of an ultra-large dynamic range. According to the method, under the condition that the defocusing amount is too large and the sub-light spots cross the sub-apertures, the defocusing amount is estimated by measuring the distance variation of the sub-light spots to the center of the light spot array. According to the method, the defocusing amount is calculated by analyzing the position change of the sub light spots and calculating the distance difference between the sub light spots and the center of the target surface, so that the limitation of the traditional Hartmann measurement method on the dynamic range is overcome. According to the method, the light spot distance is used as a measurement basis, and the out-of-focus range capable of being detected by the Hartmann sensor is remarkably expanded. The estimation mode based on the light spot distance is suitable for the situation that sub-light spots cross sub-apertures, and an efficient and reliable defocus measurement scheme is provided for a large optical system.
Owner:INST OF OPTICS & ELECTRONICS CHINESE ACAD OF SCI

Beat frequency comparison device mediated by optical frequency comb

The invention discloses a beat frequency comparison device mediated by an optical frequency comb. The beat frequency comparison device comprises the optical frequency comb, a first frequency stabilized laser, a first beat frequency device, a first frequency mixer, a first high-pass filter, a second frequency stabilized laser, a second beat frequency device, a second frequency mixer, a second high-pass filter, a DDS signal generator, a third frequency mixer and a low-pass filter. Frequency-stabilized lasers output by the first frequency-stabilized laser and the second frequency-stabilized laser and an optical frequency comb output by the optical frequency comb are subjected to beat frequency in the first beat frequency device and the second beat frequency device respectively, and first beat frequency and second beat frequency are obtained; the first beat frequency and the second beat frequency are mixed with the carrier envelope offset frequency of the optical frequency comb, and a first sum frequency and a second sum frequency are filtered out; the first sum frequency obtains a synthetic frequency through direct digital frequency synthesis; the second sum frequency and the synthetic frequency are mixed in the third mixer, and then the difference frequency is filtered out through the low-pass filter. According to the invention, beat frequency comparison of frequency-stabilized lasers with different wavelengths can be realized, and the influence of the stability of the optical frequency comb is avoided.
Owner:BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA

Engineering site self-regulation laser protective eyeshade based on sensor technology and artificial intelligence

The invention belongs to the technical field of laser protective eyeshades, particularly relates to an engineering field self-regulation laser protective eyeshade based on a sensor technology and artificial intelligence, and is used for solving the problems that an existing protective eyeshade solution cannot adapt to a dynamically changing laser environment, color distortion interferes with user vision and the environmental interference is high. According to the invention, by fusing a sensor technology and an adaptive dynamic control algorithm, the color rendition capability and the anti-interference capability of a visible light wave band are remarkably improved while millisecond-level laser threat response is realized, so that the technical bottlenecks of strong visual and environmental interference and the like of traditional protection equipment in engineering field application are solved; the device is especially suitable for complex construction scenes with high-frequency mechanical vibration and multi-wavelength laser cross operation.
Owner:SOUTHWEST JIAOTONG UNIV

Multi-parameter laser photoelectric signal intelligent grading early warning device

The utility model discloses a multi-parameter laser photoelectric signal intelligent grading early warning device, which comprises a monitoring module provided with a laser power monitoring circuit, a wavelength monitoring circuit and a light spot quality monitoring circuit, a data acquisition and transmission module provided with a data acquisition circuit and a data transmission circuit, and a data processing module, the system is provided with a core processor circuit and a storage circuit, the grading early warning module is provided with a sound-light alarm circuit and a communication alarm circuit, and the user interaction module is provided with a display interface circuit and an operation control circuit. Therefore, multi-parameter monitoring, intelligent grading early warning and efficient data processing and interaction can be realized, the running state of the laser system can be comprehensively reflected, timely and accurate early warning can be realized, the monitoring efficiency is improved, the operation complexity is reduced, and safe and stable running of laser equipment is guaranteed.
Owner:SHENZHEN UNIV

Method for wavefront correction in a semiconductor technology plant

The invention relates to a method for wavefront correction in a semiconductor technology system (1), in which method a plurality of objects (13) are successively exposed by the semiconductor technology system (1), in which method the wavefront of the semiconductor technology system (1) is measured at at least two measuring times (42, 44) and a value for the wavefront disturbance is determined in each case, and in which method the wavefront of the semiconductor technology system (1) is corrected at at least one first correction time (46, 47, 49, 52, 56), wherein the at least one first correction time (46, 47, 49, 52, 56) is determined as a function of the values ​​determined for the wavefront disturbance at the at least two measuring times (42, 44).
Owner:CARL ZEISS SMT GMBH

Deep learning wavefront phase reconstruction method for Shack-Hartmann wavefront sensor with flexible reference base point

The invention discloses a deep learning wavefront phase reconstruction method for a Shack-Hartmann wavefront sensor with a flexible reference base point, and belongs to the technical field of wavefront detection. The method comprises the following steps: constructing a simulation data set containing error-free and error-containing image pairs by simulating atmospheric turbulence wavefront distortion, sensor camera position errors, system non-common-path errors and a deformable mirror influence function; constructing a two-arm CSwinUnet network, taking the image pair as input, and outputting a wavefront phase error; the network adopts a CSwinin-Transform block and a cross attention mechanism to extract features, and multi-scale information is fused in combination with jump connection; before training, threshold processing and normalization are carried out on an image, and an Adam optimizer and a mean square error loss function are adopted for training. According to the method, high-precision and high-resolution wavefront reconstruction can be realized, the method has millisecond-level operation speed, and the wavefront detection capability of the adaptive optical system is remarkably improved.
Owner:INST OF OPTICS & ELECTRONICS CHINESE ACAD OF SCI

Machine vision multichannel CPO light engine automatic calibration method and system

The invention relates to the technical field of optics, in particular to a multi-channel CPO optical engine automatic calibration method and system for machine vision, and the method comprises the steps: building an optical-mechanical-electrical coupling state space model based on a vector diffraction theory and a four-order ABCD optical path transfer matrix; performing multi-scale grating dot matrix pattern projection through a tunable structure grating and a sequential control light source, and synchronously acquiring temperature and attitude data to obtain an observation frame; local complex amplitude reconstruction and splicing are realized by adopting sparse phase retrieval and a block Fourier frequency domain splicing method, and a space-wavelength-temperature three-dimensional error tensor is generated; calculating an optimal compensation vector by applying a self-adaptive extended Kalman filter and a Bayesian forgetting coefficient; and dynamically rewriting a digital-to-analog conversion look-up table according to the compensation vector to realize electric, thermal and optical closed-loop adjustment. According to the method provided by the invention, stable and high-precision automatic calibration of the CPO light engine can be realized.
Owner:WUHAN DAM TECH CO LTD

Optical referencing from optical references with variable perturbative drift rates

Systems and methods provide optical referencing in an optical system including a plurality of optical devices with variable perturbative drift rates. A method includes, subsequent to determining a tuning rate of one or more interrogator devices, which are tunable, and subsequent to locking the plurality of optical devices including the one or more interrogator devices, detecting a drift in spectrum of the optical system based on a perturbation; and tracking the drift based on variable perturbative drift rates of each of the plurality of optical devices which are each exposed to the perturbation.
Owner:CIENA CORP

Atmospheric turbulence wavefront reconstruction method based on attention-learnable activation cooperation mechanism

The invention belongs to the field of atmospheric turbulence wavefront aberration detection, and discloses an atmospheric turbulence wavefront reconstruction method based on an attention-learnable activation cooperation mechanism. The objective of the invention is to solve the problems that the modeling of a full connection layer is difficult due to phase high-order nonlinear coupling of an existing end-to-end neural network in wavefront phase reconstruction, the feature extraction capability of a traditional convolution architecture is insufficient, and the reconstruction error of a Zernike coefficient is unbalanced. The method provided by the invention comprises the steps of collecting in-focus and out-of-focus images of light spots and corresponding distortion phases to construct a training data set, constructing high-precision mapping of high-order aberration characteristics based on an attention encoder and a Colmogorov-Anodel network through a learnable activation function, and performing high-precision mapping on the high-order aberration characteristics through a learning activation function. And optimizing network parameters by using an error weighted root mean square loss function, and finally deploying the neural network which is completely trained to realize high-speed reasoning. The method provided by the invention provides a high-precision and high-speed scheme for atmospheric turbulence distortion wavefront aberration detection.
Owner:GUANGDONG UNIV OF TECH

System and method for real-time inflight measurements of aero-optical quantities using an onboard wavefront sensor

A system and a method for measuring, correcting, and implementing real-time adjustments for aero-optical effects for vehicle-based optical systems used in high speed or turbulent scenarios are provided. The system and method may include obtaining, via an imaging system, a wavefront measurement of air flow in a high speed or turbulent environment. The imaging system may include a wavefront sensor and optical components within a module and configured for manipulating a laser beam, and an optical window for transmitting the laser beam in-and-out through the optical window (e.g., in a beam director or “turret”). The imaging system may comprise, outside the module, a reflector or mirror positioned along an optical axis and configured to receive and reflect the laser beam from the optical window. The method may include determining wavefront distortions of the laser beam based on the wavefront measurement and determining optical degradation based on the wavefront distortions.
Owner:METROLASER INC

3D Light Field Detector, Sensor and Methods of Fabrication Thereof

The present disclosure concerns a light field detector for converting a vector of an 5 electromagnetic radiation into a chromatic output, comprising at least one azimuth detector on a transparent substrate and the at least one azimuth detector comprising at least two luminescent nanocrystal pixels having different emission wavelengths relative to each other. The present disclosure also concerns a light field sensor comprising the light field detector thereof and methods of fabricating the light field 10 detector.
Owner:NATIONAL UNIVERSITY OF SINGAPORE

Speckle wavelength measuring device with miniaturization and strong anti-interference

The invention is suitable for the technical field of wavelength measurement, and provides a speckle wavelength measurement device with miniaturization and strong anti-interference, which comprises a single-mode fiber, a dislocation welding multimode fiber, a CCD (Charge Coupled Device) camera and a computer which are sequentially arranged along a light path, the single-mode optical fiber is connected with the dislocation welding multimode optical fiber; the dislocation welding multimode optical fiber is formed by a first short multimode optical fiber and a second short multimode optical fiber through axial dislocation welding. The CCD camera is connected with the dislocation welding multimode optical fiber; and the computer is connected with the CCD camera and is used for processing the speckle pattern acquired by the CCD camera. The device is small in size, and the stability, the anti-interference performance and the resolution ratio of a measurement system can be effectively improved.
Owner:JILIN UNIVERSITY

Device for measuring sodium light wavelength by adopting biprism interference

The utility model discloses a device for measuring sodium light wavelength by adopting biprism interference, which relates to the technical field of optical experiment technology, and comprises an optical bench, a convergent lens is arranged on the optical bench, a carriage is arranged at the bottom of the convergent lens, a moving mechanism is arranged on the optical bench, the moving mechanism is used for controlling the carriage to move, and the convergent lens is arranged on the moving mechanism. According to the utility model, the moving mechanism is arranged, the convergent lens can be controlled to move through the arranged moving mechanism, and a stepping motor is adopted as a driving motor, so that the moving distance is more accurate; and meanwhile, the steering engine is mounted on the single-slit zero setting screw of the slit bracket, and the single slit is adjusted through the steering engine, so that the accuracy of later experimental data measurement is improved.
Owner:HUBEI UNIV

Coherence tomography wavefront measuring device and method based on optical fiber interconnection and point diffraction

The invention belongs to the field of optical measurement and detection, and particularly relates to a coherence tomography wavefront measurement device and method based on optical fiber interconnection and point diffraction, the measurement device separates a fundamental mode and a high-order mode of test light through a few-mode optical fiber, the fundamental mode generates a reference spherical wave through point diffraction to serve as reference light, and the high-order mode serves as the test light; after the test light and the reference light are subjected to optical fiber coupling interference, an interference pattern is obtained by a detector, and wavefront error measurement and optimization are realized through wavefront calculation and correction. The method has high precision and high stability, and can realize rapid closed-loop feedback correction.
Owner:CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI

Colorimetric range sensor system and method with spherical calibration object

A method provides distance calibration data to a colorimetric range sensor system having a colorimetric range sensor optical pen configured to focus different wavelengths at different distances along a distance measurement axis. The colorimetric range sensor optical pen is arranged in a certain relationship relative to a spherical calibration object having a nominal spherical calibration surface. The relative movement of the colorimetric range sensor optical pen with respect to the nominal spherical calibration surface is controlled to perform a helical scan of a portion of the nominal spherical calibration surface. Distance indication data is determined to correspond to the distance between the colorimetric range sensor optical pen and a surface point on the nominal spherical calibration surface when the helical scan is performed. Distance calibration data for the colorimetric range sensor system is determined based on the distance indication data.
Owner:MITUTOYO CORP

OPTICAL COMPONENT AND WAVE SURFACE ANALYZER COMPRISING SUCH AN OPTICAL COMPONENT

An optical component (1) comprises a diffraction grating and a microlens array that are hexagonal and angularly offset from each other by 10° to 50°. Such an optical component is particularly well-suited for use in a wavefront analyzer. The wavefront analyzer can alternatively have two configurations, in which the distance between the optical component and an image sensor is close to f / 2 or 3·f / 2, where f is the focal length of the microlenses (11). Such a wavefront analyzer can be compact, easy to use, and compatible with a wide range of wavelength values ​​for the electromagnetic radiation to be analyzed. (Shorthand figure: Figure 1)
Owner:OFFICE NAT DETUDES & DE RECH AEROSPATIALES

Single-photon spectrometer and method for determining a wavelength of at least one photon

PCT designated stageWO2026125090A2Optical measurementsRadiation pyrometry
The invention relates to a single-photon spectrometer (10) having at least one dispersion element (40) which has a first optical dispersion, and having a photon detector (30) which is arranged to detect at least one photon (15) which has passed through the dispersion element (40), and having a time-of-flight meter (60) which is designed to automatically measure a propagation time (t) of the at least one photon (15) through the dispersion element (40), wherein the photon detector (30) is designed to automatically determine a wavelength (λ) of the at least one photon (15) from the propagation time (t).
Owner:PHYSIKALISCH TECHNISCHE BUNDESANSTALT

Atmospheric characterization systems and methods

The present disclosure is of an atmospheric characterization system that has a central processing board that has a first and a second communication interface. Further, the atmospheric characterization system further has a first precision temperature sensor that is communicatively coupled to the central processing board via the first communication interface and positioned a distance from a first side of the processing board, wherein the precision temperature measures a first temperature and transfers data indicative of the first temperature to the central processing board. In addition, the atmospheric characterization system has a second precision temperature sensor that is communicatively coupled to the central processing board via the second communication interface and positioned the distance from a second opposing side of the processing board such that the first precision temperature sensor and the second precision temperature sensor are equidistance from the processing board and a distance between the first precision sensor and the second precision sensor is a predetermined distance, r, and the second precision temperature sensor measures a second temperature and transfers data indicative of the second temperature to the central processing board simultaneously with the transferring of the first temperature. Additionally, the atmospheric characterization system has a processor that receives the first temperature and the second temperature and calculates a value indicative of atmospheric turbulence based upon the first temperature and the second temperature, wherein the value indicative of the atmospheric turbulence is used for designing, modifying, calibrating, or correcting an optical system.
Owner:BLUEHALO LLC

Distributed phase detection device and method with large dynamic measurement range

The invention provides a distributed phase detection device and method with a large dynamic measurement range. The device comprises a first laser, a second laser, a first pulse modulation and frequency shift module, a second frequency shift module and a receiving module, wherein the first laser is used for generating a signal with the frequency of 0; the second laser is used for generating a signal with frequency; the first pulse modulation and frequency shift module is used for generating a detection light pulse containing two frequencies based on the signal with the frequency of 0 and the signal with the frequency of 0; the detection light pulse is used for being injected into a to-be-detected optical fiber to generate Rayleigh backscattered light with two frequencies; the second frequency shift module is used for generating a signal containing the frequency Y. based on the signal containing the frequency Y. The receiving module is used for receiving Rayleigh backscattered light with two frequencies, a signal with the frequency of 1, and a beat frequency signal of the signal with the frequency of 1; the beat frequency signal is used for phase detection; the receiving module comprises a coherent receiver and a data acquisition module. According to the device provided by the embodiment of the invention, two sets of coherent receivers and acquisition modules required in a traditional dual-wavelength scheme are simplified into one set, and the hardware complexity and equipment cost of the system are remarkably reduced while an equivalent measurement function is maintained.
Owner:BEIJING UNIV OF POSTS & TELECOMM

Frequency detection pixel

Frequency Detection Pixel This description concerns a pixel (PIX2) comprising a first node (202), a second node (200) configured to receive a first DC potential (Vdd2), and a plurality of acquisition channels (CH1, CH2), each comprising: a photodiode (PD1, PD2) adapted to detect radiation (SIGL) in a first wavelength range; a capacitive element (Cc1, Cc2) coupling the photodiode to the first node (202); and a resistive element (R1, R2) coupling a first terminal (K1, K2) of the photodiode (PD1, PD2) to the second node (200). Figure for the abstract: Fig. 2
Owner:COMMISSARIAT A LENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES