Systems and methods for phase measurements
Patent Information
- Authority / Receiving Office
- US · United States
- Current Assignee / Owner
- MASSACHUSETTS INST OF TECH
- Publication Date
- 2005-05-19
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
CROSS REFERENCES TO RELATED APPLICATIONS
[0001] The present application is a continuation-in-part of U.S. patent application Ser. No. 10 / 823,389, filed Apr. 13, 2004, which is a continuation-in-part of U.S. patent application Ser. No. 10 / 024,455, filed Dec. 18, 2001, and claims the benefit of U.S. Provisional Application No. 60 / 479,732, filed Jun. 19, 2003. The entire contents of the above applications are incorporated herein by reference in their entirety.GOVERNMENT SUPPORT
[0002] The invention was supported, in whole or in part, by a Grant No. P41-RR02594 from the National Institutes for Health. The Government has certain rights in the invention.BACKGROUND OF THE INVENTION
[0003] Phase-based optical interferometric techniques are widely employed in optical distance measurements in which sub-wavelength distance sensitivity is required. Optical distance is defined as the product of the refractive index and the length. However, most such techniques are limited by an issue which is wi...