3results about How to "Reduce coherence" patented technology

The present application relates to a kind of new near hemispherical probe and its preparation method, the near hemispherical probe can retain the excellent electrical characteristics of three-dimensional spherical structure, the area of collection electrode is small under the same electrode spacing, and the capacitance is low, and charge collection efficiency is almost independent of θ.Hemispherical electrode has good sealing, completely isolates detection sensitive area from substrate, dark current is not affected by wafer thickness, and extremely low noise is conducive to low-energy X-ray or low-energy particle detection.

The application relates to a speckle-eliminating laser projector, which comprises a plurality of laser light sources, a light mixing assembly, a speckle-eliminating sheet, a projection chip and a projection lens arranged along a light path in sequence, the laser light sources are used for emitting RGB light, the light mixing assembly is used for mixing the RGB light into white light, the speckle-eliminating sheet is used for eliminating the speckle of the white light, the speckle-eliminating sheet is formed by splicing a plurality of light adjusting units, and the speckle-eliminating sheet comprises an incident light surface, and the incident light surface is formed with array-arranged microlenses. The application helps to improve the imaging effect of the laser projector.

The application provides a partial-coherence vortex beam topological charge measuring device and method based on light intensity analysis, which comprises the following steps: a solid laser emits laser light; a linear polarizer selects horizontal direction polarized light; a first lens focuses the polarized light; a frosted glass scatters the focused light to obtain incoherent light; a second lens collimates the partial-coherent light; a Gaussian filter shapes the collimated light to obtain a Gaussian Schell mode beam; a spatial light modulator modulates the Gaussian Schell mode beam to obtain a first Gaussian Schell mode vortex beam; a screening unit screens the first Gaussian Schell mode vortex beam to obtain a second Gaussian Schell mode vortex beam; a fifth lens focuses the second Gaussian Schell mode vortex beam to obtain a third Gaussian Schell mode vortex beam; and a charge-coupled device collects the light intensity diagram of the third Gaussian Schell mode vortex beam, and the size and sign of the topological charge are obtained according to the light intensity diagram. The size and sign of the topological charge of the Gaussian Schell mode vortex beam are analyzed through the light intensity diagram.