6077 results about "Facula" patented technology

A beam scanning-type display device used as a head-mounted display (HMD) or a head-up display (HUD) includes a light source (101) which emits a beam, a scanning unit (103) which performs scanning using the beam emitted from the light source (101), a deflecting unit (104) which deflects the beam used for the scanning by the scanning unit (103) in the direction toward an eye of a user, and a wavefront shape changing unit (102) which changes the wavefront shape of the beam from the light source (101) so that the beam spot size falls within the predetermined allowable range, and emits the beam to the wavefront shape changing unit (102).

The present invention relates to the apparatus, system and method for dicing of semiconductor wafers using an ultrafast laser pulse of femtosecond and picosecond pulse widths directly from the ultrafast laser oscillator without an amplifier. Thin and ultrathin simiconductor wafers below 250 micrometer thickness, are diced using diode pumped, solid state mode locked ultrafast laser pulses from oscillator without amplification. The invention disclosed has means to avoid/reduce the cumulative heating effect and to avoid machine quality degrading in multi shot ablation. Also the disclosed invention provides means to change the polarization state of the laser beam to reduce the focused spot size, and improve the machining efficiency and quality. The disclosed invention provides a cost effective and stable system for high volume manufacturing applications. An ultrafast laser oscillator can be a called as femtosecond laser oscillator or a picosecond laser oscillator depending on the pulse width of the laser beam generated.

A method for the treatment of skin including the steps of determining the skin depth for energy absorption necessary for treatment; and generating a spot size for energy impinging on the skin to provide a desired amount of energy to the desired depth for treatment. In one embodiment the selected spot size has a small diameter. In another embodiment the spot diameter is narrower than the spacing between adjacent hairs on the skin. In another aspect the invention relates to an apparatus for the treatment of skin including a source of energy; and a means for selecting a spot size for energy from the source impinging on the skin to provide a desired amount of energy to a desired depth for treatment. In another embodiment the apparatus includes an interlock to prevent the laser from producing light unless the source is positioned to irradiate only the skin.

A beam extraction process (interruption and restart) is appropriately performed when a failure occurs during irradiation of a spot group. A charged particle irradiation system includes a synchrotron 12 and a scanning irradiation unit 15 that scans an ion beam extracted from the synchrotron over a subject. The extraction of the ion beam from the synchrotron is stopped on the basis of a beam extraction stop command. Scanning magnets 5A and 5B are controlled to change a point (spot) to be irradiated with the ion beam, while the extraction of the ion beam is stopped. The extraction of the ion beam from the synchrotron is restarted after the change of the spot to be irradiated. When a relatively minor failure in which continuous irradiation would be possible occurs during irradiation of a certain spot with the beam, the extraction of the beam is not immediately stopped.

A flow cytometer includes an optical flow cell through which particles to be characterized on the basis of at least their respective side-scatter characteristics are caused to flow seriatim. A plane-polarized laser beam produced by a laser diode is used to irradiate the particles as they pass through a focused elliptical spot having its minor axis oriented parallel to the particle flow path. Initially, the plane of polarization of the laser beam extends perpendicular to the path of particles through the flow cell. A half-wave plate or the like is positioned in the laser beam path to rotate the plane of polarization of the laser beam so that it is aligned with the path of particles before it irradiated particles moving along such path.

A compact and versatile multi-spot inspection imaging system employs an objective for focusing an array of radiation beams to a surface and a second reflective or refractive objective having a large numerical aperture for collecting scattered radiation from the array of illuminated spots. The scattered radiation from each illuminated spot is focused to a corresponding optical fiber channel so that information about a scattering may be conveyed to a corresponding detector in a remote detector array for processing. For patterned surface inspection, a cross-shaped filter is rotated along with the surface to reduce the effects of diffraction by Manhattan geometry. A spatial filter in the shape of an annular aperture may also be employed to reduce scattering from patterns such as arrays on the surface. In another embodiment, different portions of the same objective may be used for focusing the illumination beams onto the surface and for collecting the scattered radiation from the illuminated spots simultaneously. In another embodiment, a one-dimensional array of illumination beams are directed at an oblique angle to the surface to illuminate a line of illuminated spots at an angle to the plane of incidence. Radiation scattered from the spots are collected along directions perpendicular to the line of spots or in a double dark field configuration.

The invention relates to a laser facula measuring device and a measuring method thereof. The device consists of a DMD micro-mirror array, a digital camera, an exposure control unit and a picture digital processor. The exposure control unit is provided with two output ends which respectively output signals to control the DMD micro-mirror array and the digital camera; and the input end of the picture digital processor is connected with the video signal output end of the digital camera. In the method, DMD micro-mirror array components are utilized, so the characteristics of an incident light path can be changed at different times and in different regions so as to accurately control the exposure process and obtain a laser beam detection image with high dynamic range; and by means of data processing, diameter, ellipticity, position, center, three-dimensional outline, power, and other parameters of the facula can be obtained. As the whole process happens within a short time, the defect that the position and the energy state of the laser facula changes as time goes by can be avoided, and light beam quality of the laser beam can be more accurately measured.

A method and system for exposing a light sensitive material using device for forming a row of spots of light onto the light sensitive material located on a focal plane, device for modulating each of the spots according to imaging data so that at any point of time, the row of spots forms a data pattern according to the imaging data, device for generating relative motion between the imaging mechanism and the light sensitive material on the focal plane, the direction of motion substantially parallel to the direction of the row of spots on the light sensitive material; and data synchronizing device for shifting the imaging data into the modulating device at a rate determined by the speed of relative motion to maintain the image of any data pattern substantially stationary on the light sensitive material.

The invention provides a galvanometer system correction device and a correction method thereof, and relates to the technical field of precision laser processing equipment. A honeycomb panel is arranged in the middle of the outer frame of a bearing platform, a base plate for corrective is absorbed on the honeycomb panel, and the vacuum chamber of the honeycomb panel is connected with a dust collector; a PSD sensor for measuring the actual output light spot center position of the laser of a galvanometer system is arranged on the vacuum absorption bearing platform; a CCD image acquisition device is arranged above the base plate for correcting, and then is provided with a light intensity regulating module and an image acquisition board card; and a visual measurement algorithm module is arranged. The invention can effectively inhibit the precision drift of the galvanometer system, improve the efficiency of the galvanometer system when in correction model updating and in real-time correction calculation operation, improve the automatic degree of equipment, reduce the labor intensity of an operator, greatly improve the processing precision of equipment, product quality and production efficiency, has simple structure and unique principle and method, and is particularly suitable for precision laser processing equipment to use.

A plurality of stretches of laser weld are executed on a structure to be welded by means of a device for focusing and orientation of the laser beam, which is associated to a component element of a manipulator robot. The focusing head is kept in the proximity of, but not closely adjacent to, the different areas to be welded and can consequently follow a simplified path, whilst the device for orientation of the laser beam aims the latter on the different areas of the structure to be welded, so that the speed of travel of the laser beam spot along the longitudinal direction of the weld stretch is independent from the speed of travel of the robot end element.

The invention discloses a super-resolution fluorescence microscopy method based on tangential polarization, comprising the following steps: carrying out 0-2pi vortex phase coding focus on tangential polarization exciting light, and obtaining an exciting spot below a diffraction limit on a fluorescence sample; adjusting tangential polarization STED laser and the phase coding tangential polarization exciting light to realize confluence and co-axis, focusing on the fluorescence sample to form a circle bread-shaped focusing spot the central point of which coincides with the central point of the exciting spot; adjusting the operating power of the STED laser to cause the area of a luminous point in the exciting spot to reach the super-resolution ratio; and collecting fluorescence emitted from the luminous point and carrying out detection processing to obtain a microimage with the super-resolution ratio. The invention also discloses a device for realizing the super-resolution fluorescence microscopy method based on tangential polarization. In the invention, on the premise of ensuring the super-resolution ratio, the working power of the STED is reduced greatly, thereby lowering bleaching of the sample and avoiding damage for the sample.

The invention relates to a lens for LED street lamp. A concave pit is provided in the middle of a first side face of the lens and allowing LED to be arranged therein, and the pit wall of the concave pit forms an incident face; an arcing bulge in the middle of a second side face of the lens forms an emergent face with the shape of pillow; and a totally reflecting face is circumferentially provided around the concave pit on the first side face of the lens. The invention also relates to a LED street lamp, which comprises a frame, and a lighting module arranged on the frame, wherein the lighting module comprises a thermal radiator, a substrate with a LED array, a PCB board with a through-hole array and a lens cap with a lens array. The substrate is provided on the undersurface of the thermal radiator, PCB board is provided on the outer surface of the substrate and connected with each LCD electrode, the lens cap is provided at the outer side of the PCB board, LEDs pass through the through-holes on the PCB board to be accommodated in the concave pit corresponding to the lens, and the lens array is formed by arranging and combining a plurality of above mentioned lenses. The invention can control the distribution of light to form rectangular light spot. The light in the effective illuminated zone is very uniform and there is no parasitic light outside the zone.

The invention discloses a method for processing a blind hole by laser. The method combines fixed point UV laser impulse and UV laser spiral line or concentric circle scanning and is used for one-step blind hole processing or multi-step blind hole processing on multilayer circuit board. The method divides the UV laser blind hole drilling process into two parts, namely a part with an area near the circle center of the blind hole not more than UV laser spot diameter and a part with an area more than the UV laser spot diameter. Fixed point UV laser impulse is adopted to drill the blind hole, so as to remove material in the region with an area near the circle center not more than UV laser spot diameter; then UV laser spiral line or centric circle scanning method is adopted to move outside, so as to remove the material in the region with an area near the circle center more than UV laser spot diameter until meeting set blind hole size; and one-step blind hole or multi-step blind hole processing is drilled by UV laser through two steps or more steps. The method can ensure processing quality consistency of each blind hole, can greatly reduce bottom unevenness of the blind hole, and also can improve margin quality of blind hole processing.

The invention discloses a heliostat tracking error correction method. Based on the characteristics that a heliostat tracking deviation angle has small variation in a short time and the tracking deviation angles at the same moment in the adjacent days have small variation, an image collecting and processing system is adopted to detect and obtain the tracking deviation angles of a certain heliostat at multiple moments in the whole day, or the tracking deviation angles obtained by the heliostat at multiple moments in one day or previous days are taken as the intraday tracking deviation angle; an intraday tracking deviation curve of the heliostat is obtained by the interpolation; according to the tracking deviation curve, the current angle of the heliostat is corrected to ensure that the facula of the heliostat can basically accurately be projected to a target position. The invention obtains the tracking deviation angles at multiple moments by detection of heliostat tracking error many days a year or many times a day; the everyday corresponding tracking deviation curve of each heliostat can be found by one-year or multiple-year tracking deviation angle data analysis treatment and curve fitting; and thus, the facula of the heliostat can be projected to the target position more accurately.

The invention provides a measuring device and method for the target line-of-sight angel offset and distance. The device is composed of a four-quadrant avalanche photodetector, a receiving and sending optical unit, a noise compensation circuit, a four-circuit front amplification circuit, a video amplification circuit, an automatic gain amplification circuit, a peak keeping circuit, an AD conversion circuit, a laser, a dominant wave sampling circuit, a summing circuit, a time identifying circuit, a time test circuit and a digital processing circuit, wherein the receiving and sending optical unit enables narrow pulse laser rays emitted by the laser to be converged on the photoelectric detector to form echo light spots after target reflection, photovoltaic conversion of the four-quadrant avalanche photodetector, front amplification, video amplification and automatic gain amplification are conducted, narrow-pulse peak keeping is conducted, transmission of the AD conversion circuit is conducted, and the digital processing circuit extracts the digital line-of-sight angel offset; summing is conducted on the four-circuit front amplification circuit, the dominant wave sampling circuit is combined, the time identifying circuit determines laser emitting and echo coming and returning time, the time is transmitted to the time identifying circuit to be measured, and the digital processing circuit decodes the corresponding distance.

The invention relates to laser melting rapid forming method in the metal parts precinct and its installation. The method includes that setting CAD geometric model, doing stratification variance and laying powder layer by layer to the CAD geometric mode, adopting laser with high power density and high light speed factor of merit to form focusing facula with the diameter which is from thirty millimeter to fifty millimeter by focusing of beams system, melting the metal or alloy powder layer by layer, piling to a metallurgy unite, and forming to a compact solid mass. The installation is made up of semiconductor pumping YAG laser or fiber laser, focusing of beams system, shaped part jar, and powder jar. The semiconductor pumping YAG laser or fiber laser is light path connected to the focusing of beams system, and focalized and scanned at the shaped part jar. The shaped part jar is connected to the powder jar by powder laying roller. The powder laying roller is connected to the driving motor. And the driving motor is connected to the computer. The advantages of the invention are that the beam mode is good; mechanical features of the processed metal parts is well; the dimensional precision and the surface finish are high; and its range of application is wide.

The present invention relates to a beam reshaping device for a plane array semiconductor laser. The device includes a fast axis collimating lens, a slow axis collimating lens, a ladder lens, a first parallelepiped prism unit, and a second parallelepiped prism unit. The beam emitted by the plane array semiconductor laser passes through the fast axis collimating lens and the slow axis collimating lens, and lowers the divergence angle of the fast axis and the divergence angle of the slow axis. The irradiance interspace between bars can be eliminated by the ladder lens and can be compressed in the direction of the fast axis. Finally, part of beam can be moved parallel along the fast axis direction by the first parallelepiped prism unit and the second parallelepiped prism unit, and then be moved along the slow axis direction. Through the above process, the beam is realigned, and the purpose that the quality of the fast axis beam and the quality of the slow axis beam tend to be coincident is reached. The realigned beam can get high-power high-brightness facula after being focused. The optical apparatus used in the present invention is easy to be produced and convenient to be adjusted with simple structure.