102 results about "Maximum intensity" patented technology

The invention discloses a correction method for saturation spectral line intensity in a laser spectrum, and relates to the technical field of spectral data analysis, the method comprises the following steps: identifying saturation characteristics in the spectrum, determining a saturation point based on an intensity threshold, and recording the original intensity of the saturation point; determining a target spectrum peak wavelength range containing a saturation point; eliminating saturation points from the wavelength range of the target spectrum peak, and retaining unsaturation points; fitting the unsaturated point through a nonlinear function to obtain the maximum fitting strength; if the maximum fitting strength is lower than the original strength, performing strength correction by adopting a linear extension mode by taking an unsaturated point as a reference, and otherwise, performing strength correction directly based on a fitting model; and outputting the corrected spectral intensity data, and calculating the maximum intensity of the spectral peak and the integral area of the spectral peak. According to the method, the accuracy of saturation judgment and the reliability of a correction result are improved, and a direct intensity data basis and core derivative parameters are provided for quantitative analysis.

The invention discloses a sparse view angle 3D-DSA reconstruction method based on a three-dimensional Poisson generative model. The method comprises the following steps: obtaining pairing data of a sparse view angle 2D-DSA projection drawing and a 3D-DSA reconstruction image; extracting features of a projection image by using a projection domain encoder, then converting features of two-dimensional projection into a three-dimensional image domain according to a geometrical relationship of the cone beam CT, and then obtaining a prior image by using an image decoder; the method comprises the following steps: constructing a three-dimensional Poisson generation model, adding noise to a three-dimensional image patch in a training stage to obtain a disturbance image, outputting a network reconstruction image by taking a prior image as a condition and the three-dimensional image patch before noise addition as a target image, and calculating loss of the output image and the target image to update network parameters; the mean square error loss and the mean square error loss of the maximum intensity projection images of the three orthogonal planes are used during loss calculation; in the sampling stage, random noise is used as input, a prior image is used as a condition, noise of a noise image is continuously denoised within a limited step length, and finally a reconstructed 3D-DSA image is obtained.

It is disclosed a method processing imaging data of a patient having cancer, for instance lymphoma, comprising:—Providing three-dimensional imaging data of the patient,—computing from said three-dimensional imaging data, at least one two-dimensional Maximum Intensity Projection image. corresponding to the projection of the maximum intensity of the three-dimensional imaging data along one direction onto one plane,—extracting a mask of the MIP image corresponding to cancerous lesions by application of a trained model. Using the extracted mask it is possible to compute one or more cancer prognosis indicators.

The invention discloses an environmental physical security detection method, which relates to the technical field of information security, realizes multi-dimensional data acquisition by comprehensively using a thermal imager, a spectrum analyzer and an X-ray machine through the steps S1 to S5, overcomes the blind area of traditional manual detection, and ensures comprehensive identification of hidden secret stealing equipment. And secondly, through de-noising and standardization processing, the accuracy and reliability of the data are enhanced, and the risk of false alarm and missing alarm is reduced. In the feature extraction stage, key parameters such as a mean value Tm, a standard deviation Ts, a maximum frequency Fmax, a maximum intensity Imax and an edge feature Es are utilized to construct a scientific anomaly detection formula, so that the calculation of an anomaly detection index Da is more accurate, and potential safety hazards can be effectively identified. In addition, through matching of a secondary verification mechanism and historical data, the credibility of the detection result is further improved, so that a solid technical support is provided for security protection of a secret-related environment.

The invention discloses a laser point cloud loopback detection method and device based on a complex scene and electronic equipment, and relates to the field of automatic driving, and the method comprises the steps: obtaining the intensity information of a point cloud; carrying out loopback detection according to the intensity information of the point cloud; wherein the step of obtaining the intensity information of the point cloud comprises the substeps of dividing the point cloud top view into a plurality of areas based on each frame of the point cloud top view; each region is represented by the maximum intensity value of the midpoint of the region, and a descriptor of the two-dimensional matrix is generated; loopback detection according to the intensity information of the point cloud comprises the following steps: judging whether the frames are loopback frames or not according to matching with the descriptors; the method further comprises the following steps: acquiring Euclidean distance threshold information; and according to the Euclidean distance threshold information, correcting a result of judging whether the frames are loopback frames or not.

A coated member of the present invention includes a substrate and a hard coating film that is formed on the surface of the substrate and includes a nitride or carbonitride of a metal element. A content of Al is 65 atom % or more and 85 atom % or less, a content of Cr is 15 atom % or more and 35 atom % or less, and a total content of Al and Cr is 90 atom % or more and 100 atom % or less in a total amount of the metal element and metalloid element contained in the hard coating film, and in an intensity profile obtained from a selected area diffraction pattern of a transmission electron microscope, a crystal plane exhibiting a maximum peak intensity is different between a vicinity of the substrate and a vicinity of the surface, in the vicinity of the substrate, a peak corresponding to a (111) plane or a (200) plane of a face-centered cubic lattice structure exhibits a maximum intensity, and in the vicinity of the surface, a peak intensity corresponding to a (220) plane is 0.6 times or more a larger one of a peak intensity corresponding to the (200) plane and a peak intensity corresponding to the (111) plane of the face-centered cubic lattice structure.

A scanning measuring device (1) of an ultrasonic examination apparatus (Z) comprises a transmission probe (110) and a reception probe (121) installed on an opposite side of the transmission probe (110) with respect to an examination object, wherein the transmission probe (110) emits the ultrasonic beam by applying a voltage waveform of a repetitive wave packet comprising a wave packet with a wave number of 2 or more thereto, the scanning measuring device drives the transmission probe (110) at an excitation frequency higher than a resonance frequency of the transmission probe (110), the control device 2 comprises a signal processing unit (250), the signal processing unit (250) comprises a filter unit (240) which reduces at least a maximum intensity frequency component of a reception signal of the reception probe (121), and the filter unit (240) has a peripheral frequency component,which is a component other than the maximum intensity frequency component, in a fundamental wave range that includes the maximum intensity frequency component.,

The invention discloses a plant factory spectrum dynamic generation method, and belongs to the technical field of plant factories. A plant factory spectrum dynamic generation method comprises the steps that S1, a target spectrum is determined, and the target spectrum is determined by a scientific research or production target; s2, decomposing and analyzing the target spectrum to obtain one or more peak values; s3, according to the peak value and a stored LED light emitting characteristic database, determining the type of the LED lamp beads forming the target spectrum; s4, according to the target intensity of each spectrum in the target spectrum, the corresponding maximum intensity in the system and the total light intensity, the control quantity of each LED lamp bead is calculated; s5, controlling a corresponding hardware circuit through a software instruction, and driving an LED lamp bead to output a target spectrum; the invention aims to solve the problems that in the prior art, the spectrum of a traditional lamp is fixed, different types of lamps need to be replaced if the spectrum needs to be adjusted, the operation is tedious, the cost is high, and the dynamic and rapid spectrum adjustment requirement is difficult to meet.

In one embodiment, the optoelectronic semiconductor chip (1) comprises a semiconductor layer sequence (2) having an active region (23) for generating radiation having a wavelength L of maximum intensity. The mirror (3) comprises a cover layer (31). The cover layer (31) is made of a radiation-permeable material and has an optical thickness of between 0.5 L and 3 L, including a boundary value. Between two and ten intermediate layers (32, 33, 34, 35) of the mirrors (3) are followed by the cover layer (31) in a direction away from the semiconductor layer sequence (2), wherein a boundary value is included. The intermediate layers (32, 33, 34, 35) alternately have a high refractive index and a low refractive index. The optical thickness of the at least one intermediate layer (32, 33, 34, 35) is not equal to L / 4. At least one metal layer (39) of the mirror (3) is followed by the intermediate layer (32, 33, 34, 35) in a direction away from the semiconductor layer sequence (2) as a reflective layer.

The application discloses a correction method for saturated spectral line intensity in laser spectroscopy, and relates to the technical field of spectral data analysis, wherein saturated characteristics in a spectrum are identified, a saturated point is determined based on an intensity threshold, and the original intensity of the saturated point is recorded; the wavelength range of a target spectral peak containing the saturated point is determined; the saturated point is removed from the wavelength range of the target spectral peak, and the unsaturated point is reserved; the unsaturated point is fitted through a nonlinear function, and the maximum intensity of the fitting is obtained; if the maximum intensity of the fitting is lower than the original intensity, the intensity is corrected in a linear extension mode based on the unsaturated point, otherwise, the intensity is directly corrected based on the fitting model; the corrected spectral intensity data are output, and the maximum intensity of the spectral peak and the integral area of the spectral peak are calculated. The application improves the accuracy of saturated determination and the reliability of correction results, and provides direct intensity data basis and core derivative parameters for quantitative analysis.

The present invention relates to a negative electrode material for a secondary battery having excellent initial charge / discharge efficiency, and more specifically, to a negative electrode material for a secondary battery comprising a matrix, a composite oxide containing a doping element and silicon, or a mixture thereof, the doping element is selected from more than one of silicon oxide, alkali metal, alkaline earth metal and transition metal; and silicon nanocrystals dispersed and trapped in the matrix; an X-ray diffraction pattern using a CuK [alpha] ray includes a first peak having a diffraction angle 2 [theta] in the range of 20.3-21.3 DEG, a second peak having a diffraction angle 2 [theta] in the range of 26-27 DEG, a third peak having a diffraction angle 2 [theta] in the range of 28-29 DEG, and a fourth peak having a diffraction angle 2 [theta] in the range of 30.5-31.5 DEG. And an intensity ratio (I2 / I4) between the maximum intensity (I2) of the second peak and the maximum intensity (I4) of the fourth peak satisfies 1 to 20.

The present invention provides a particle beam therapy device and an accelerator, which can adjust the intensity of the particle beam using an appropriate adjustment method while increasing the scanning speed of the particle beam. The accelerator (3) sets the parameters of the ion source device (60) based on at least one layer of the tumor (14) to adjust the intensity of the particle beam (B). At this time, when the maximum intensity of the particle beam (B) required in the layer to be irradiated is low, the ion source device (60) can generate particles in a state where the parameters are suppressed to cope with low intensity, for example, with reference to layers (L2) and (L3) of (a) of FIG. 7 . Thus, the parameters in the ion source device (60) can be suppressed to an appropriate size. Thus, the scanning speed of the particle beam (B) can be increased while adjusting the intensity of the particle beam (B) using an appropriate adjustment method.

The invention provides a disinfection lighting device configured to provide device light along a main optical axis, said disinfection lighting device comprising: a first solid-state light source configured to emit white light: a second solid-state light source configured to emit violet light having a dominant peak wavelength in a wavelength range from 380 to 420 nm: a collimator configured to collimate said white light along the main optical axis into a white light beam having a first spatial light distribution having a first Full Width Half Maximum (FWHM1): a batwing optic configured to shape said violet light along the main optical axis into a batwing shaped light distribution, wherein the batwing shaped light distribution has a maximum intensity at an angle (α) with respect to said main optical axis: wherein said angle (α) of a maximum intensity of the batwing shaped light distribution is outside said first Full Width Half Maximum (FWHM1) of the first spatial light distribution of the white light beam.

The invention relates to the technical field of image fusion processing, and discloses a multi-source fundus lesion image characteristic-based image collaborative fusion processing method, which comprises the following steps of: performing scale normalization processing on a color fundus image and tomography data through resampling to obtain a standard color fundus image and standard tomography data; the method comprises the following steps: respectively fitting an inner boundary membrane curved surface for standard tomography data, expanding to a plane, performing maximum intensity projection according to a preset layer thickness range, and generating a two-dimensional structure layer image; extracting a normalized gray matrix of the standard color fundus image, combining the normalized gray matrix with the normalized two-dimensional structure layer image, and constructing a quaternion matrix containing color and structure information; performing pyramid decomposition on the quaternion matrix to obtain a pyramid high-frequency layer and a pyramid low-frequency layer; and determining the focus energy weight based on the gradient significance of the standard color fundus image and the standard tomography data and the local energy of the high-frequency layer and the low-frequency layer of the pyramid.

The invention relates to a light guide for a light module of a motor vehicle headlight, comprising a light entry side and a light exit side (300), the light exit side (300) being formed by an associated outcoupling surface comprising at least one first outcoupling region (310) and one second outcoupling region (310, 320), the first outcoupling region (310) being smoothly designed and the second outcoupling region (320) being provided with a roughness and being designed such that the first outcoupling region (310) and the second outcoupling region (320) can be coupled to the first outcoupling region (310), and the second outcoupling region (320) being designed such that the first outcoupling region (310) and the second outcoupling region (320) can be coupled to the second outcoupling region (320). The second coupling-out region (320) is formed by at least two sub-regions (321, 322) having different roughness from each other according to VDI 3400: 1975-06, the sub-regions (321, 322) being arranged such that the roughness increases starting from the first coupling-out region, the sub-region (321, 322) having a lower roughness being directly adjacent to the first coupling-out region (310), and the sub-region (321, 322) having a lower roughness being directly adjacent to the first coupling-out region (310). Therefore, a gradual transition from the maximum intensity area to the peripheral area can be generated in the light distribution.

The invention discloses a current measuring device and a circuit monitoring system, and relates to the field of current detection, a fluxgate iron core and a Rogowski coil in the device are both of a circular ring structure, are arranged in parallel in the axis direction and are spaced by a preset distance, and the central axes of the fluxgate iron core and the Rogowski coil are coaxial; the magnetization module is used for magnetizing the fluxgate iron core so that the magnetization intensity of the fluxgate iron core reaches a preset maximum intensity value; and the processing module is also connected with the Rogowski coil and is used for performing fusion processing on a first sampling signal output by the fluxgate iron core through the winding and a second sampling signal output by the Rogowski coil to correspondingly obtain a measurement signal when a wire through which the current to be measured flows passes through the centers of the fluxgate iron core and the Rogowski coil. According to the scheme, the fluxgate iron core and the winding of the fluxgate iron core are combined with the Rogowski coil, and accurate measurement of current in a broadband range is facilitated through respective sampling and subsequent signal fusion.

The present invention provides a light-emitting device (1000), comprising: (i) n laser light sources (10), (ii) focusing optics (20), and (iii) a luminescent body (200), wherein: (A) the n laser light sources (10) are configured to generate laser light source light (11); wherein the focusing optics (20) are configured to focus the laser light source light (11) into a focused beam (21) of the laser light source light (11); wherein n≥2; (B) the luminescent body (200) comprises a luminescent material (210), wherein the luminescent body (200) is configured to be in an optical receiving relationship with the n laser light sources (10), wherein the luminescent material (210) is configured to convert at least a part of the laser light source light (11) into luminescent material light (211); (C) the n laser light sources (10) and the focusing optics (20) are configured to provide a spot (300) of the laser light source light (11) on the luminescent body (200) in an operating mode; wherein k groups of spots (300) each have a separately selected number m of spots (300), wherein two or more spots (300) within each group have partial overlap, wherein 2≤m≤n and 1≤k<n; and (D) wherein a first spot region (310) is defined by 10%-100% of the maximum intensity of the spot (300), wherein for at least one spot (300) within at least one of the k groups, it is applicable to overlap with at least another first spot region within the range of 5%-80% of its first spot region (310).

A coated cutting tool is provided with a hard coating film on a base material. The hard coating film is composed of a nitride or carbonitride containing 50 at% to 70 at% (inclusive) of Al, 20 at% to 50 at% (inclusive) of Cr, and 4 at% to 15 at% (inclusive) of Si with respect to the total amount of metal including semimetal. The atomic ratio (at%) A of a metal element including a semimetal and the atomic ratio (at%) B of nitrogen in the hard coating satisfy 1.07 lt; b / Alt; 1.30, 1.30. The hard coating film exhibits a maximum peak intensity caused by a (200) plane or a (111) plane of a cubic crystal in an intensity distribution determined from an X-ray diffraction pattern or a selected area diffraction pattern of a transmission electron microscope, and does not have a peak mainly composed of a hexagonal crystal in the intensity distribution determined from the selected area diffraction pattern.

A light transmissive substrate that transforms light having a Lambertian distribution includes a substrate having a plurality of microstructures on a first surface, where each of the plurality of microstructures comprises an array of folded micro-pyramid microstructures, wherein each folded micro-pyramid microstructure comprises a base section with a roof angle and a recess being formed in a shape of a micro-pyramid and comprising a recess roof angle, wherein light having a Lambertian distribution that enters the first surface of the substrate is transformed into light having a distribution with a maximum intensity at an angle away from nadir and a minimum intensity at nadir that exits a second surface of the substrate.

A desk illuminating device with reduced sense of oppression and light flicker is provided. The desk illuminating device has a light source and a light guide portion including a light guide plate and guiding light emitted from the light source, wherein the light guide plate has a light incident surface for light from the light source to be incident, a first main surface that emits light incident from the light incident surface, and a second main surface opposite the first main surface, the first main surface is arranged substantially perpendicular to a setting surface of the desk illuminating device, when an axis that passes through the center of the first main surface and is perpendicular to the setting surface is set as a vertical axis, a direction parallel to the setting surface is set as 0° vertical in a surface that contains the vertical axis and is perpendicular to the setting surface, an angle upward compared to the parallel direction is set as a positive angle, and an angle downward compared to the parallel direction is set as a negative angle, an angle that becomes the maximum intensity in the light distribution of light emitted from the first main surface is 90° or more and less than 0°.

To provide a multilayer reflective film-provided substrate in which the thickness of a diffusion layer in the multilayer reflective film when heated is less likely to change. A multilayer reflective film-provided substrate for reflective mask blank, comprising a substrate, and a multilayer reflective film to reflect EUV light, wherein the multilayer reflective film has a structure such that low refractive index layers and high refractive index layers are alternately stacked; and in a diffraction chart obtained by X-ray diffraction measurement, a crystallite size calculated from a diffraction peak with a maximum intensity attributable to the low refractive index layers is more than 3.1 nm.

A lighting device includes a light source for emitting primary light, which is configured as a laser; and a light conversion unit including a light conversion element having at least one light-converting ceramic material, a front side, and a back side, a substrate which is directly or indirectly connected to the back side of the light conversion element, and a connector between the light conversion element and the substrate. The light conversion element is adapted to be illuminated with the primary light and to emit secondary light with a wavelength or wavelength range altered relative to the primary light. The primary light has a wavelength of less than 650 nm and the secondary light has a maximum intensity of emission at a wavelength of more than 650 nm.

The invention relates to a measurement arrangement (100) for measuring concentration of gold in a sample (102). The measurement arrangement (100) comprises: a sample container (104a, 104b); an X-ray radiation source unit (106) configured to produce a radiation beam (112); a primary filter (108) arranged between the X-ray radiation source unit (106) and the sample container (104a, 104b) so that the primary filter (108) is in a close vicinity to the sample container (104a, 104b), wherein the primary filter (108) is configured to act as a filter and as a secondary target configured to excite a first fluorescence radiation (114) in response to an irradiation of the primary filter (108) with the radiation beam (112); and a radiation detector unit (110) configured to obtain a second fluorescence radiation (116) being characteristic to gold in response to an irradiation of the sample (102) with the first fluorescence radiation (114), wherein the second fluorescence radiation (116) is obtained from a direction (202) substantially perpendicular to the direction (204) of the maximum intensity of the radiation beam (112). The invention relates also to a method for measuring concentration of gold in a sample (102).

A single crystal diamond material comprising a single crystal diamond and an altered portion present on the outer periphery of the single crystal diamond, wherein the nitrogen atom content in the single crystal diamond is 1 ppm or more and 2000 ppm or less based on the atomic number, and the single crystal diamond material has a core electron excitation spectrum of the altered portion obtained by electron energy loss spectroscopy using a transmission electron microscope, in which an energy loss of π exists in a range of 285 eV±5 eV. * Maximum intensity of the peak Iπ * and the energy loss is in the range of 291±5 eV. * Maximum intensity of the peak Iσ * Ratio to Iπ * / Iσ * is 0.15 or more, and in the altered portion, the percentage {N1 / (N1+N2)}×100 of the number N1 of primary carbon atoms to the sum N1+N2 of the number N1 of primary carbon atoms constituting amorphous carbon and the number N2 of secondary carbon atoms constituting graphite is 90% or more.

The present disclosure is related to systems and methods for image processing. The method includes obtaining an original image. The original image includes at least one blood vessel region and at least one scalp region. The method includes determining an intermediate image by removing the at least one scalp region from the original image. The method includes generating at least one target image by performing a maximum intensity projection operation on the intermediate image. The at least one target image represents the at least one blood vessel region in the original image.

Method for controlling the distance (14) between the workpiece (9) and the processing optics (8) during cutting, drilling, and ablation of various materials with minimal side effects on non-irradiated areas, wherein the workpiece (9) is irradiated by a pulsed laser (7) with an intensity that generates plasma emission, wherein the strength of the plasma emission is detected, stored, and evaluated in such a way that the distance (14) of the processing optics to the workpiece surface is varied (15) until a local minimum (3) is reached near the maximum intensity of the plasma emission (target position) and sharp cuts and ablation channels are produced, characterized in that the detection of the strength of the plasma emission is carried out by means of a detection system (10) consisting of filters and photodetectors, wherein a spectrometer can also be used instead of a filter.

A sensor device (10) comprises a pixel array (1011) having a plurality of pixels (51) each being configured to receive light and to perform photoelectric conversion to generate an electrical signal indicating the intensity of the received light, a plurality of event detecting sections (52) that are configured to receive the electrical signals from each of the plurality of pixels (51) and to generate event data that indicate as an event the occurrence of a change of the intensities of light received at the respective pixel (51) above an event threshold, and a selection section (100) that is configured to receive the electrical signals generated by a group (511) of adjacent pixels (51), to determine from the electrical signals at which pixel (51) of the group (511) the largest intensity has been received, and to enable generation of event data for the pixel (51) of the group that did receive the largest intensity while disabling generation of event data for the other pixels (51) of the group.

The invention discloses a method for eliminating autocorrelation artifacts of a polarization sensitive optical coherence tomography image. Comprising the following steps: carrying out sample detection by using a PS-OCT (Polarization Sensitive Optical Coherence Tomography) system to obtain interference signals of two polarization channels; performing inverse Fourier transform on the interference signal of one channel to obtain an airspace signal of the interference signal; finding a self-correlation horizontal fringe artifact signal with the maximum intensity in the interference signals of the airspace, and setting the intensities of other positions to be zero; calculating an unwrapping phase of the self-correlation artifact in each A-scan, and taking a minimum value of the unwrapping phase as a reference phase; interpolating the spectral phases of the original interference signals of the two polarization channels according to a reference phase; and performing inverse Fourier transform and polarization parameter calculation to obtain an OCT intensity image and a polarization image with autocorrelation artifacts eliminated. According to the image phase information-based self-correlation artifact removal method, the self-correlation artifacts in the PS-OCT image can be effectively eliminated, additional hardware facilities do not need to be introduced, and the method is simple and effective.

A method of compensating for focus drift in a microscopy system includes receiving data representing a reference light signal reflected from a sample and received by an image sensor, identifying from the data a peak of the reference light signal, the peak having a maximum intensity value for the reference light signal, extracting a sub-region having a center from the data, the center being located at the peak, calculating a first harmonic of a Fourier transform of the extracted sub-region, estimating a peak position of the reference light signal based on a phase of the first harmonic, and moving the lens system of the microscopy system or the sample in the axial direction using the translation stage based on the estimated position. Also, a system compensating for focus drift in a microscopy system according to the above method.

A light-emitting device having a high luminance region and a low luminance region in a light-emitting surface is provided, which has high visibility in each of the regions. A light-emitting device comprising: a first region and a second region configured to emit light having different luminances when the light-emitting device is turned on, wherein the luminance La of the first region is higher than the luminance Lb of the second region, an emission spectrum of the light emitted from the first region has a maximum intensity Ia max in a wavelength range of 400 nm to 500 nm, an intensity Ia 507 at a wavelength of 507 nm and an intensity Ia 555 at a wavelength of 555 nm, an emission spectrum of the light emitted by the second region has an intensity Ib 507at a wavelength of 507 nm and an intensity Ib 555 at a wavelength of 555 nm, and relative intensities Ira 507 , Ira 555 , Irb 507 and Irb 555 can be obtained by measuring the intensities Ia 507 , Ia 555 , Ib 507 and Ib 555 each by the maximum intensity Ia max be divided, with the relative intensity Ira 507 is lower than the relative intensity Irb 507 and the relative intensity Ira 555 is higher than the relative intensity Irb 555 .