The invention relates to a measuring arrangement for the interferometric determination of the
surface shape of a
test object, wherein a test wave generated from
electromagnetic radiation and reflected at the
test object can be superimposed with a
reference wave not reflected at the
test object, with a reference element (110, 210, 310, 410) having a
reference surface (112, 212, 312, 412) which, in the
optical beam path, splits off the
reference wave from the test wave before it strikes the test object (120, 220, 320, 420) by reflection, and at least one
beam shaping surface (111, 211, 311, 411, 413, 414) located in the
optical beam path in front of the
reference surface, wherein this
beam shaping surface is designed as an aspherical
distortion correction surface such that a
distortion occurring in a predetermined
reference plane of the measuring arrangement is reduced. The invention further relates to a method for manufacturing an optical element for such a measuring arrangement.