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42007 results about "Computational physics" patented technology

Computational physics is the study and implementation of numerical analysis to solve problems in physics for which a quantitative theory already exists. Historically, computational physics was the first application of modern computers in science, and is now a subset of computational science.

A System and Method for Modelling System Behaviour

A method of modelling system behaviour of a physical system, the method including, in one or more electronic processing devices obtaining quantified system data measured for the physical system, the quantified system data being at least partially indicative of the system behaviour for at least a time period, forming at least one population of model units, each model unit including model parameters and at least part of a model, the model parameters being at least partially based on the quantified system data, each model including one or more mathematical equations for modelling system behaviour, for each model unit calculating at least one solution trajectory for at least part of the at least one time period; determining a fitness value based at least in part on the at least one solution trajectory; and, selecting a combination of model units using the fitness values of each model unit, the combination of model units representing a collective model that models the system behaviour.
Owner:EVOLVING MACHINE INTELLIGENCE

Method to determine optical proximity correction and assist feature rules which account for variations in mask dimensions

Optical proximity correction (OPC) and assist feature rules are generated using a process window (PW) analysis. A reference pitch is chosen and the mask bias is found that optimizes the process window. This can be done using standard process window analysis or through a weighted process window (WPW) analysis which accounts for focus and dose distributions that are expected in a real process. The WPW analysis gives not only the optimum mask bias, but also the center focus and dose conditions for the optimum process centering. A series of other pitches and mask biases are then analyzed by finding the common process window with the reference pitch. For the standard PW analysis, a common process window is found. For the WPW analysis, the WPW is computed at the center focus and dose conditions found for the reference pitch. If mask or lens errors are to be accounted for, then multiple structures can be included in the analysis. Once the common process windows for the mask features of interest have been computed, functional fits to the data can be found. Once the functional forms have been found for each of the OPC parameters, the rules table can be determined by solving for the spacings of interest in the design.
Owner:GLOBALFOUNDRIES U S INC

Systems and Methods for Providing Maximum Photovoltaic Peak Power Tracking

A micropower Maximum Power Point Tracker (μMPPT) suitable for use in low power applications to maximize the power output for a solar-power cell array. In one embodiment, a μMPPT comprises an electrical circuit which includes a microprocessor / microcontroller used to execute the μMPPT control algorithm, and a modulator controller to control the pulse width or frequency to a high speed switch. In addition, the electrical circuit may include an analog-to-digital (A / D) converter usable to measure the input voltage from a connected solar array, the current through an inductor of the circuit, and the voltage of an attached energy store / load. In another embodiment, the μMPPT may operates in at least two modes depending on the energy store / loads conditions.
Owner:AMBIENT CONTROL SYST

Illumination of integrated analytical systems

An analytical device including an optically opaque cladding, a sequencing layer including a substrate disposed below the cladding, and a waveguide assembly for receiving optical illumination and introducing illumination into the device. The illumination may be received from a top, a side edge, and a bottom of the device. The waveguide assembly may include a nanoscale aperture disposed in the substrate and extending through the cladding. The aperture defines a reaction cell for receiving a set of reactants. In various aspects, the device includes a sensor element and the illumination pathway is through the sensor element. Waveguides and illumination devices, such as plasmonic illumination devices, are also disclosed. Methods for forming and operating the devices are also disclosed.
Owner:PACIFIC BIOSCIENCES

Method for lithography model calibration

A method for separately calibrating an optical model and a resist model of lithography process using information derived from in-situ aerial image measurements to improve the calibration of both the optical model and the resist model components of the lithography simulation model. Aerial images produced by an exposure tool are measured using an image sensor array loaded into the exposure tool. Multiple embodiments of measuring aerial image information and using the measured aerial image information to calibrate the optical model and the resist model are disclosed. The method of the invention creates more accurate and separable optical and resist models, leading to better predictability of the pattern transfer process from mask to wafer, more accurate verification of circuit patterns and how they will actually print in production, and more accurate model-based process control in the wafer fabrication facility.
Owner:ASML NETHERLANDS BV

Method and apparatus for averaged luminance and uniformity correction in an amoled display

A method for the correction of average luminance or luminance uniformity variations in an active-matrix OLED display, comprising:a) providing an active-matrix OLED display;b) determining at a first time a first offset voltage and a first gain relationship between the voltage and the current passing through one or more light-emitting elements;c) receiving a signal for driving the light-emitting elements after step b), correcting the signal by employing the first offset voltage and gain relationship values to compute a linear correction for the light-emitting elements to form a corrected signal, and driving the display with the corrected signal;d) determining at a time after the first time an updated offset voltage and an updated gain relationship between the voltage and the current passing through the light-emitting elements; ande) receiving a signal for driving the one or more light-emitting elements after step d), correcting the signal by employing the updated offset voltage and gain relationship values to compute a linear correction for the light-emitting elements to form an updated corrected signal, and driving the display with the updated corrected signal.
Owner:GLOBAL OLED TECH

Noise pattern acquisition device and position detection apparatus provided therewith

A noise pattern acquisition device includes: a geomagnetic sensor; a coordinate estimation unit configured to estimate current position coordinates; and a geomagnetic noise pattern management unit configured to, when an abnormality occurs in a magnetic field strength detected by the geomagnetic sensor during movement of the noise pattern acquisition device, store in a geomagnetic noise pattern storage unit a geomagnetic noise pattern which is a pattern representing a time-series change of the magnetic field strength detected by the geomagnetic sensor. This makes it possible to not only acquire a geomagnetic noise pattern but also detect a proper position with a simple structure and process at reduced cost.
Owner:PANASONIC INTELLECTUAL PROPERTY CORP OF AMERICA

Methods for Full Parallax Compressed Light Field 3D Imaging Systems

A compressed light field imaging system is described. The light field 3D data is analyzed to determine optimal subset of light field samples to be (acquired) rendered, while the remaining samples are generated using multi-reference depth-image based rendering. The light field is encoded and transmitted to the display. The 3D display directly reconstructs the light field and avoids data expansion that usually occurs in conventional imaging systems. The present invention enables the realization of full parallax 3D compressed imaging system that achieves high compression performance while minimizing memory and computational requirements.
Owner:OSTENDO TECH INC
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