The invention discloses a method and
system for testing a direct-current offset compensation circuit of an optical transceiving driving
chip and a medium, and relates to the technical field of photoelectric
integrated circuit testing, and the method comprises the following steps: carrying out the
time alignment of a test waveform and an offset track of the optical transceiving driving
chip, extracting the phase
dislocation amount and the amplitude kick amount between beats, and carrying out the calculation of the
phase offset amount and the amplitude kick amount; a continuous change result is mapped into a
time sequence conflict observation band which is used for identifying a beat overlapping region; and on the basis of the phase
dislocation trend of the
time sequence conflict observation band, determining a beat overlapping point of the
direct current offset compensation loop, and generating an overlapping beat index according to the duration of amplitude kick and the polarity direction for identifying an interference node. According to the method,
millisecond-level beat observation and
microsecond-level overlapping identification are realized in a test stage, interference nodes are accurately extracted, a
coupling strength graph is constructed, and by combining beat rearrangement and an energy unloading strategy, nonlinear oscillation is inhibited, oscillation and overload risks are reduced,
eye pattern quality and error code stability are improved, and
chip test precision and robustness are enhanced.