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342 results about "Avalanche photodiode" patented technology
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An avalanche photodiode (APD) is a highly sensitive semiconductor electronic device that exploits the photoelectric effect to convert light to electricity. From a functional standpoint, they can be regarded as the semiconductor analog of photomultipliers. By applying a high reverse bias voltage (typically 100–200 V in silicon), APDs show an internal current gain effect (around 100) due to impact ionization (avalanche effect).
The invention provides a bias voltage providing circuit of an avalanche photodiode and a PON gateway, and relates to the technical field of optical communication. The bias voltage providing circuit of the avalanche photodiode comprises a bias voltage input unit, a bias voltage control input processing unit and an avalanche photodiode protection unit. When the illumination intensity of the target avalanche photodiode exceeds the preset illumination intensity, the photo-generated current of the target avalanche photodiode exceeds the preset current, and the avalanche photodiode protection unit responds to the situation that the photo-generated current of the target avalanche photodiode exceeds the preset current. The diode bias voltage applied to the target avalanche photodiode is reduced, so that the photo-generated current of the target avalanche photodiode is reduced, and overload protection of the target avalanche photodiode is completed. Based on the above content, the problem that the target avalanche photodiode is easy to damage due to overload in the prior art can be improved.
A photoelectric conversion apparatus includes a plurality of avalanche photodiodes. Each of the plurality of avalanche photodiodes includes an avalanche multiplication unit formed by a first semiconductor region of a first conductivity type that is arranged at a first depth, and a second semiconductor region of a second conductivity type different from the first conductivity type and which is arranged at a second depth deeper than the first depth. A fourth semiconductor region at least one of a conductivity type and an impurity concentration of which is different from those of a third semiconductor region of the second conductivity type is arranged at a position shallower than the third semiconductor region, and a depth of a boundary portion between the third semiconductor region and the fourth semiconductor region is deeper than that of the avalanche multiplication unit.
A visualizationsystem for dynamically visualizing an eye includes a laser module operable for outputting a primary laser beam along a beam axis, a beam splitter positioned in the beam axis and configured to direct a first beam portion along the beam axis and a second beam portion along a detection axis that is orthogonal to the beam axis. A microelectromechanical system (MEMS) scanner is arranged on the beam axis and configured, in response to the first beam portion, to output a scanning laser along a visualization path. An avalanche photodiode (APD) detector receives the second beam portion. A 4F correlator optical system has a spatial filter arranged along the visualization path. An optional optical flat may be disposed between the eye and the 4F correlator optical system to achieve stereo parallax.
The invention provides a single-photondetector gating signal generation system and generation method. The system comprises a bias voltage source; the gating circuit is provided with a first sine branch and a second sine branch, the first sine branch is configured to output a first sine voltagesignal, and the second sine branch is configured to output a second sine voltagesignal; the frequency of the first sinusoidal voltage signal is greater than that of the second sinusoidal voltage signal; the second sinusoidal voltage signal, the first sinusoidal voltage signal and the bias voltage signal are matched to generate a gating signal acting on the avalanche photodiode; based on the period of the first sinusoidal voltage signal, the gating signal has an amplitude greater than a preset value in a continuous first number of periods, and the gating signal does not have an amplitude greater than the preset value in a subsequent continuous second number of periods. The generated gating signal can accelerate the carrier removal process from the physical mechanism level, the post-pulse probability is suppressed, the required dead time is effectively shortened, and the data rate of the detector is further improved.
The invention provides a detection system and method for an avalanche photodiode, and the system comprises an arbitrary signal generator, a laser, an adjustable attenuator, a time-to-digital converter and a test processor, the first output end of the arbitrary signal generator is connected with the laser, the laser is connected with the adjustable attenuator, and outputs a light pulse to the adjustable attenuator; the adjustable attenuator inputs the attenuated optical signal to the input end of the avalanche photodiode to be tested; a second output end of the arbitrary signal generator is connected with a time-to-digital converter; the time-to-digital converter receives an output signal of the avalanche photodiode to be tested; the test processor is connected with a to-be-tested avalanche photodiode and is used for debugging and configuring parameters of the to-be-tested avalanche photodiode; a to-be-detected avalanche photodiode is placed on the detection tool, and the detection tool and the semiconductor refrigerator are packaged together. According to the invention, the compatibility and integration degree of the system can be improved, the stability of the system is improved, and the sensitivity to detected photons is high.
The invention provides an FSO multi-sensor fusion method based on unscented Kalman filtering and an RBF neural network, and the method comprises the steps: carrying out the unscented Kalman filtering time updating, and carrying out the measurement of a noisecovariance adjustment mechanism and an event triggering mechanism based on light intensity self-adaption; the unscented Kalman filter measures and adjusts confidence weights of the infrared camera and the four-quadrant detector according to the channel state provided by the avalanche photodiode, and processes data output by the infrared camera and the four-quadrant detector according to the confidence weights; then, the posterior state estimation of the unscented Kalman filter at the current moment is output, and a position component is extracted and transmitted. Normalized light intensity reflecting channel quality is used as a key state to carry out synchronous estimation, an RBF neural network is used to carry out dynamic modeling and compensation on nonlinear errors of a four-quadrant detector, and a self-adaptive unscented Kalman filtering framework with a line learning capability is constructed. And finally, a virtual sensor output with high update rate, high precision and high sensitivity is generated.
The photoelectric conversion device includes a semiconductor layer provided with an avalanche photodiode, and an interconnection structure layer provided on a side of a first surface of the semiconductor layer. The interconnection structure layer includes an interconnection structure made of a metal material and overlapping with the avalanche multiplication region of the avalanche photodiode in a plan view. The interconnection structure includes a first interconnection, a second interconnection disposed farther from the first surface than the first interconnection, and a contact electrode electrically connecting the first interconnection and the second interconnection. An opening is provided in the first interconnection in a portion overlapping with the avalanche multiplication region in the plan view. The second interconnection is disposed so as to overlap an entire of the opening in the plan view. The contact electrode is arranged around the opening in the plan view.
A radiationdetector includes: a scintillator including a pair of end surfaces opposing each other in a first direction and one side surface coupling the end surfaces; a semiconductorphotodetector including a semiconductor substrate; and a wiring member electrically connected to the semiconductorphotodetector. A length of the scintillator in the first direction is longer than that of the scintillator in a second direction orthogonal to the one side surface. A length of the one side surface in the first direction is longer than a width of the one side surface in a third direction. The semiconductor substrate includes a plurality of photodetection regions disposed in a first portion and first electrodes and a second electrode disposed in a second portion. Each of the photodetection regions includes a plurality of avalanche photodiodes arranged to operate in Geiger mode and a plurality of quenching resistors.
A semiconductor element including an array in which a plurality of avalanche photodiodes is arranged includes a plurality of first electrodes configured to receive supply of a first voltage to be used by the plurality of avalanche photodiodes from outside, and at least one second electrode configured to receive supply of a second voltage from outside different from the first voltage. The plurality of first electrodes and the at least one second electrode are disposed outside the array. The at least one second electrode is disposed between one and another one of the plurality of first electrodes.
Photoelectric conversion devices and apparatuses are disclosed. An apparatus in which a photoelectric conversion unit is disposed on a semiconductor substrate including a first surface and a second surface on an opposite side of the first surface. The photoelectric conversion unit includes: a first region of a first conductivity type, the first region constituting a part of the first surface and being connected to a detection circuit configured to detect an avalanche breakdown; a second region of the first conductivity type, the second region disposed away from the first region; a third region of a second conductivity type opposite to the first conductivity type, the third region being disposed at a position closer to the second surface than the first region and the second region; and a fourth region disposed between the first region and the second region. The second and third regions serve as avalanche photodiodes. The first region and the second region are configured to be conductive to each other via the fourth region.
A controller for an avalanche photodiode sensor, including circuitry configured to: control a latch circuit to store one or more least significant bits of a counter value of a counter circuit at the end of a first frame, wherein the counter circuit is configured to count exposure time intervals of a frame in which an avalanche photodiode pixel has generated a light detection event; enable readout of the one or more least significant bits from the latch circuit in a second frame following the first frame; and enable readout of one or more most significant bits of the counter value from the counter circuit in the second frame.
A photodetector (90) having an exposure surface (91) has a first photodiode array (1) having a first light entry surface (11) and a second photodiode array (2) having a second light entry surface (21). The first photodiode array (1) has an avalanche photodiode (10). The second photodiode array (2) has a non-amplifying photodiode (10). The first light entry surface (11) and the second light entry surface (21) form sub-surfaces of the exposure surface (91).
A photodetector device includes an avalanche photodiode array substrate 10 formed from compound semiconductor. A plurality of avalanche photodiodes 20 arranged to operate in a Geiger mode are two-dimensionally arranged on the avalanche photodiode array substrate 10. A circuit substrate 50 includes a plurality of output units 30 which are connected to each other in parallel to form at least one channel 40. Each of the output units 30 includes a passive quenching element 31 and a capacitative element 32. The passive quenching element 31 is connected in series to at least one of the plurality of avalanche photodiodes 20. The capacitative element 32 is connected in series to at least one of the avalanche photodiodes 20 and is connected in parallel to the passive quenching element 31.
In a signalprocessing circuit, an input terminal is configured to receive an analog signal output from an avalanche photodiode operating in Geiger mode. A comparison circuit outputs a signal based on a component exceeding a threshold among components a signal input to the comparison circuit. The adjustment circuit includes an AC coupling unit, a level shifter unit, and a reference value adjustment unit. The AC coupling unit establishes AC coupling between the input terminal and the comparison circuit. The level shifter unit adjusts the voltage of the signal input to the comparison circuit to a value lower than a reverse biasvoltage applied to the avalanche photodiode. The reference value adjustment unit adjusts the reference value of the signal input to the comparison circuit.
The application relates to an avalanche diode single-photondetector and a preparation method thereof, in particular to a quantum dot-vertical linear avalanche diode single-photondetector and a preparation method thereof, and solves the problems of low detection efficiency of the existing single-photondetector and high preparation difficulty, high cost and limited effect of the existing method. + The detector comprises a detector N + substrate, a back electrode grown on the lower surface thereof, a plurality of quantum dot-vertical linear units arranged at intervals on the upper surface thereof, a passivation layer and a front electrode; the quantum dot-vertical linear unit comprises a semiconductor vertical linear structure, a porous nanomaterial layer and a quantum dot material layer; the semiconductor vertical linear structure is grown on the upper surface of the detector N + substrate; the porous nanomaterial layer covers the semiconductor vertical linear structure; the quantum dot material layer covers the porous nanomaterial layer; the passivation layer is filled between the quantum dot-vertical linear units; and the front electrode is grown on the part of the quantum dot-vertical linear unit extending out of the passivation layer.
A four-dimensional (4D) light-detection-and-ranging sensor using frequency modulated continuous wave is provided with an ultra-high velocity resolution. At a transmitting terminal, the hybrid waveform of a driving laser is used to minimize the phase noise generated by a distributed-feedback laser during wavelength scanning. The hybrid waveform is obtained by combining direct-current signal (not modulated) and alternating-current (AC) signal. The AC signal is a predistorted triangle or AC waveform for extracting location. The continuous wave (CW) extracts velocity. At a receiving terminal, a radar radio-frequency receiver is combined with an avalanche photodiode (APD) with multiple layers accumulated in series to obtain excellent responsivity and saturated current. The mixed waveform coordinated with the APD prevents Doppler shift frequency from being contaminated by low-frequency flickernoise. Thus, a good-quality 4D image is provided; and the use of the APD improves the pixel contrast between the object and background.
A photodetector 1 includes a light detection element 22, a comparison unit 9, a time measurement unit 11, and an energy monitor unit 12. The light detection element 22 includes a plurality of APDs 4 which operate in a non-linear region and are connected in parallel with each other. The comparison part 9 includes a plurality of comparators 16. The threshold values of the plurality of comparators 16 are different from each other. The time measurement unit 11 outputs, on the basis of one output signal SC among a plurality of output signals SC respectively outputted from the plurality of comparators 16, first information A1 indicating a time from a predetermined timing to when the one output signal SC is inputted. The energy monitor unit 12 generates second information A2 indicating the magnitude of the energy of the light pulse incident on the light detection element 22 on the basis of the plurality of output signals SC.
Disclosed herein are avalanche photodiodes (APDs) particularly useful for high-sensitivity Geiger-mode APDs formed using an array of micro-cells. The photodetector is formed on a semiconductor substrate of indiumphosphide (InP) having epitaxial layers, including indiumgalliumarsenide (InGaAs) as the photodetecting layer, with n-doped InP to one side, and layers of InP incorporating p-doped regions on the opposite side. The p-doped regions may serve to define an array of micro-cells, which may be arranged in a hexagonal pattern. A well may be etched through the epitaxial structures, allowing an electrode that contacts the n-doped InP layer and another that contacts the p-doped InP regions to be patterned on the same side of the detector. Flip-chip bonding techniques can then attach the semiconductorwafer to a stronger support substrate, which may additionally be configured with electronic circuitry positioned to electrically contact the electrodes on the semiconductorwafer surface.
A single Geiger avalanche photodiode pixel interconnected with a readout circuit is decomposed to form M * M parallel pixel structures, the M * M parallel pixel structures are connected to a single pixel input stage of the readout circuit, and the time complementation relation between pixel avalanche events is utilized to enlarge the pixel avalanche events. The detection probability of the array single-photondetector pixel is improved, the photon detection dynamic range is expanded, the upper limit of the pixel photon saturation counting rate of the array single-photon detector can be remarkably improved, and the method is applied to the fields of high-dynamic-range laser three-dimensional imaging, space laser communication and the like.