16results about "Multiplier circuit arrangements" patented technology

To provide an electron detector and a charged particle detector that can improve the quality of electrical signals. [Solution] The electron detector 5 comprises an electron detection unit 53 including a first electrode 52, a resin sheet 59 positioned on one side in the Z direction relative to the first electrode 52, a second electrode 54 facing the first electrode 52 via the resin sheet 59, an insulating substrate 61 positioned on one side in the Z direction relative to the second electrode 54 and supporting the electron detection unit 53, the resin sheet 59 and the second electrode 54, an output unit 55 positioned on one side in the Z direction relative to the insulating substrate 61, electrically connected to the second electrode 54 and outputting an electrical signal, and a support unit 62 supporting the output unit 55 such that the output unit 55 and the second electrode 54 face each other via the insulating substrate 61 and a space SP1 is formed between the output unit 55 and the insulating substrate 61.

An elementary particle detector including dynodes capable of converting an elementary particle into an electron avalanche, conductive grids capable of being crossed by accelerated electrons, and each being defined by a unique electrical potential, each unique electrical potential being chosen so that the unique electrical potential of the conductive grid is strictly lower than the unique electrical potential applied to the conductive grid which follows it along the detection direction, at least one signal sensor capable of measuring an electrical signal produced by the accelerated electrons when they cross the conductive grids, and a control unit configured to determine, from the electrical signal, a conversion dynode at which the conversion of the elementary particle has taken place. The invention also relates to a method for detecting elementary particles.

The invention relates to the technical field of image intensifiers, and particularly discloses an audio noise suppression device and method for an automatic gating type image intensifier, and the device comprises a voltage stabilization power supply circuit module, a microprocessor, a low-voltage pulse circuit module, a gating gate circuit module, and a cathode output circuit module. The input end of the voltage-stabilizing power supply circuit module is connected with a 2-4VDC power supply, and the output end of the voltage-stabilizing power supply circuit module outputs 3.3 VDC power supply voltage and is connected with a power supply input pin and a grounding pin of the microprocessor; a PWM output pin of the microprocessor is connected with an input signal end of the low-voltage pulse circuit module; the signal output end of the low-voltage pulse circuit module is connected with the control input end of the gating gate circuit module; the high-voltage power supply input end of the gating gate circuit module is connected with high-voltage alternating current, and the high-voltage pulse signal output end of the gating gate circuit module is connected with the input end of the cathode output circuit module; and the output end of the cathode output circuit module is connected with the photoelectric cathode of the image intensifier single tube.

In a photoelectric conversion device, the potential control unit controls electric potentials applied to the meta-surface. The meta-surface includes a plurality of patterns which are space away from each other. The plurality of patterns include an antenna portion and at least one bias portion. The antenna portion extends in a predetermined direction and emits the electron in response to incidence of the electromagnetic wave. The potential control unit switches a first state and a second state by controlling the electric potentials applied to the plurality of patterns. In the first state, a component of an electric field from the bias portion toward the antenna portion in a predetermined direction is positive. In the second state, a component of an electric field from the bias portion toward the antenna portion in the predetermined direction is negative.

An electron detector according to the present invention comprises an electron detection unit that includes a first electrode, a resin sheet that is provided on one side in the Z direction relative to the first electrode, a second electrode that is opposite the first electrode with the resin sheet therebetween, an insulating substrate that is provided on the one side in the Z direction relative to the second electrode and supports the electron detection unit, the resin sheet, and the second electrode, an output unit that is provided on the one side in the Z direction relative to the insulating substrate, is electrically connected to the second electrode, and outputs an electrical signal, and a support part that supports the output unit such that the output unit and the second electrode are opposite with the insulating substrate therebetween and a space is formed between the output unit and the insulating substrate.

The application discloses a voltage division system, a photomultiplier tube and a detector, relates to the technical field of radiation detection, and solves the problem that the prior art voltage division system cannot meet the requirements of small size and high temperature resistance. The voltage division system comprises a substrate module, the substrate module is provided with a resistance mounting area and / or an active device mounting area, the resistance mounting area is provided with resistance paste with a preset thickness and high-temperature curing, the active device mounting area is provided with an active device die, and the active device die is packaged in a first space formed by the first adhesive and the substrate module, and the first adhesive is a high-temperature-resistant material. The voltage division system is uniquely designed for the resistance and the active device, realizes the effects of small size and high temperature resistance, can work for a long time in a high-temperature environment above 200 DEG C through tests, and can effectively extend the depth of oil exploration and exploitation when applied in the field of oil exploitation.

Provided are an automatic analyzer and an optical measurement method for correcting a variation in the multiplication factor of a photoelectric element with high accuracy. The automatic analyzer comprises: a photoelectric element which generates electrons by light and outputs a current signal; a voltage application unit which applies a voltage to the photoelectric element; and a processing unit which corrects a variation in the multiplication factor of the photoelectric element, wherein the photoelectric element outputs a pulse signal as the current signal, and the processing unit corrects the variation in the multiplication factor on the basis of the pulse area of the pulse signal.

A signal processing circuit according to the present invention comprises a processing unit that: has a photoelectric surface that emits electrons in response to incident light; converts, into a digital signal at a prescribed sampling frequency, a target signal corresponding to an output signal from a vacuum tube sensor that outputs an output signal corresponding to the amount of incident light; and derives an output value for each prescribed measurement period. The processing unit is configured such that when deriving the output value of a measurement period, the processing unit can execute an abnormal value handling process in which the number of pieces of data corresponding to the pulse width of an abnormal value signal appearing in the target signal are excluded in descending order of the signal value from a plurality of pieces of data included in the target signal in the measurement period, and the output value is derived from the remaining plurality of pieces of data.

The invention relates to a mass spectrometry technology, and particularly provides an electron multiplier, a mass spectrometry system and a mass spectrometry method, the electron multiplier comprises a multi-stage dynode, a collector and a power supply, and the power supply applies voltage to the dynode and the collector; the power supply is connected with the voltage division circuit, and the voltage division circuit is connected with the third dynode to the Nth dynode; the switching unit is used for switching the working mode of the voltage division circuit, the voltage division circuit applies positive bias voltage to the third-stage dynode to the Nth-stage dynode in the detection mode, and the voltage applied to the third-stage dynode to the Nth-stage dynode is the same in the cleaning mode. The cleaning device has the advantages of good cleaning effect, convenience and the like.

A sample analyzer, a photometer and a photometric system. The sample analyzer (2000) comprises a light source (100), a photometer (600) and a processor (500); the photometer (600) comprises a photoelectric conversion assembly (401) and a signal processing assembly (400); the photoelectric conversion assembly (401) comprises a photomultiplier tube (200) and a voltage divider circuit (300), an input end node of the voltage divider circuit (300) being connected to the cathode of the photomultiplier tube (200), and an output end node of the voltage divider circuit (300) being connected to the anode of the photomultiplier tube (200). N+1 voltage divider nodes are sequentially arranged between the input end node and the output end node, and the N+1 voltage divider nodes are respectively and sequentially connected to a photoelectron focusing electrode and N dynodes of the photomultiplier tube (200), such that voltage divider branches between two adjacent nodes form N+2 divided voltages; at least one of the divided voltage corresponding to the input end node, the divided voltage corresponding to the voltage divider node N+1, and the divided voltage corresponding to the voltage divider node N is configured to be less than the divided voltages corresponding to the other voltage divider nodes.

A sample analyzer, a photometer, and a photometric system. The sample analyzer (2000) comprises a light source (100), a photometer (600), and a processor (500); the photometer (600) comprises a photoelectric conversion assembly (401) and a signal processing assembly (400); the photoelectric conversion assembly (401) comprises a photomultiplier tube (200) and a voltage divider circuit (300); an input end node of the voltage divider circuit (300) is connected to a cathode of the photomultiplier tube (200); an output end node of the voltage divider circuit (300) is connected to an anode of the photomultiplier tube (200); N+1 voltage divider nodes are sequentially arranged between the input end node and the output end node; the N+1 voltage divider nodes are respectively connected to a photoelectron focusing electrode and N dynodes of the photomultiplier tube (200) in sequence, and voltage divider branches between adjacent nodes form N+2 divided voltages; at least one of the divided voltage corresponding to the input end node, the divided voltage corresponding to the voltage divider node N+1, and the divided voltage corresponding to the voltage divider node N is configured to be less than the divided voltages corresponding to the other voltage divider nodes.

To provide an ion detector capable of determining a component to be ionized with high sensitivity without depending on the polarity of ions.SOLUTION: An ion detector (24) includes a conversion dynode (241), a secondary electron multiplier (242), and a DC voltage application unit (243) that applies a DC voltage between the conversion dynode (241) and the secondary electron multiplier (242), in which a part or all of a surface of the conversion dynode (241) including an ion collision surface (2410) with which ions collide is made of a material containing one or more elements of titanium, vanadium, and chromium at a higher density than iron and aluminum.SELECTED DRAWING: Figure 1

A mass spectrometer that includes an MCP detector selects and analyzes a calibrant compound that has a first isotope and a second isotope with a known abundance ratio. The mass spectrometer measures the intensity of the first isotope that produces multiple-ion strikes at the MCP detector and the intensity of the second isotope that produces single-ion strikes at the MCP detector while the bias voltage of the MCP detector is stepped through a sequence of one or more different voltages. At each step, the ratio of the measured intensities is compared to the known abundance ratio for the two isotopes. When the measured ratio is within a predetermined threshold of the known abundance ratio, an optimum voltage for the MCP detector is calculated using one or more measured ratios calculated for voltages of the sequence of voltages.

To provide an electron detector and a charged particle detector that can improve the quality of electrical signals. [Solution] The electron detector 1 comprises an electron detection unit 2 that detects incident electrons and outputs an electrical signal, and a housing 4 that houses the electron detection unit 2. The electron detection unit 2 includes an AD21 that detects electrons, a wiring board 31 on which the AD21 is mounted and is positioned on one side in the Z direction relative to the AD21, and an amplifier 24 that amplifies the detection signal output from the AD21. The housing 4 has an opening 41a facing the AD21 on the other side in the Z direction relative to the AD21, a first metal part 41 facing the electron detection unit 2 on the other side relative to the AD21, and a second metal part 42 that surrounds the side surface 31c of the wiring board 31.

Disclosed is a method of calculating heat output using in-core instrumentation, the method including: measuring a core inlet temperature and a core exit temperature using the in-core instrumentation; and calculating heat output Q of a core using the following equation, the in-core instrumentation including: a first thermocouple that measures the core inlet temperature; and a second thermocouple that measures the core exit temperature.

Disclosed is a method of calculating heat output using in-core instrumentation, the method including: measuring a core inlet temperature and a core exit temperature using the in-core instrumentation; and calculating heat output Q of a core using the following equation, the in-core instrumentation including: a first thermocouple that measures the core inlet temperature; and a second thermocouple that measures the core exit temperature. Q=C×m×Th−Tc where, Q is a heat quantity, C is a specific heat, m is a mass flow rate, Th is a core exit temperature, and Tc is a core inlet temperature.