64 results about "Active surface" patented technology

An optical system, such as in a microlithographic projection exposure apparatus, comprising at least one optical element and a heating device for heating the optical element. The heating device comprises a plurality of heating segments to which electric current can be applied in order to generate heat. A continuous thermally induced deformation profile of the optical active surface having a deformation amplitude of at least 1λ can be adjusted by the heating segments so that the integral of the Fourier decomposition over at least one decadic spatial wavelength range is less than 10 mλ.

The utility model discloses a magnetic steel positioning mechanism of a decorative ring assembly, which comprises a large support, a decorative ring assembly arranged on the large support and rotatably connected with the large support, and a stepping motor driving the decorative ring assembly to rotate, the stepping motor is fixed on the large support, one end of the decorative ring assembly is fixedly provided with a rotating shaft, and the other end of the decorative ring assembly is fixedly provided with a magnet. The rotating shaft is provided with a magnetic steel assembly, and the large support is fixedly provided with a Hall sensor module matched with the magnetic steel assembly. According to the utility model, the acting surfaces of the decorative ring assembly are switched through the stepping motor, so that different shapes are presented, different light requirements are met, a dynamic effect of rotation of the decorative ring assembly is generated when the decorative ring assembly rotates, and compared with a single light effect of sequential lighting of a conventional light source, the light effect is richer.

Methods and systems for performing spectroscopic ellipsometry (SE) measurements of semiconductor structures based on data sets resolved in wavelength, azimuth angle, and angle of incidence are presented herein. In some embodiments, machine learning based measurement models are trained to infer estimated values of one or more parameters of interest characterizing a structure under measurement based on SE measurement data resolved in wavelength, azimuth angle, and angle of incidence. In some other embodiments, regression is performed on a physics based measurement model to estimate values of one or more parameters of interest characterizing a structure under measurement. A dispersive element in the collection beam path disperses collected light across the active surface of a detector to resolve collected light according to wavelength and one angular dimension. Furthermore, multiple images are collected by the detector to resolve collected light across the other angular dimension.

An electronic device includes a substrate and a die having an active surface disposed on the substrate. A sensor is in communication with the active surface of the die and a ring is disposed on the die and encircles the sensor. The ring includes a cylindrical wall and a cap, where the cylindrical wall has an open top and the cap has a partial circular shape that extends beyond each side of the cylindrical wall, A cover is disposed on the cap such that the cover closes off the open top of the ring to form a cavity inside the ring to prevent foreign substance from entering the cavity. A mold compound covers the die and the cover, and abuts an outer surface of the cylindrical wall.

An electronic package is provided and includes: a first circuit structure having a first surface, a second surface, and a first circuit layer; an electronic component set including a first electronic component having a first active surface and a first inactive surface, and a second electronic component having a second active surface and a second inactive surface, wherein the first inactive surface of the first electronic component is disposed on the first surface, and the second inactive surface of the second electronic component is offsetly attached to the first active surface; a packaging layer having a first packaging surface and a second packaging surface and covering the electronic component set; a second circuit structure disposed on the first packaging surface and electrically connected to the first circuit layer, the first active surface and the second active surface, respectively; and an optoelectronic component disposed on the second circuit structure.

An integrated fan-out (InFO) package includes a die, an encapsulant, and a horn antenna. The die has an active surface and a rear surface opposite to the active surface. The encapsulant laterally encapsulates the die. The horn antenna is electrically connected to the die. The horn antenna includes a top wall and a bottom wall respectively located on two opposite sides of the die and the encapsulant. A portion of the top wall is located within a span of the active surface of the die. A portion of the bottom wall is located within a span of the rear surface of the die.

Apparatuses may include a device substrate including a microelectronic device and bond pads proximate to an active surface of the device substrate. A package substrate may be secured to the device substrate, the package substrate configured to route signals to and from the bond pads. A ball grid array may be supported on, and electrically connected to, the package substrate. Each ball of the ball grid array positioned and configured to carry one of a high-bandwidth data signal or a high-frequency clock signal is located laterally or longitudinally adjacent to no more than two other balls of the ball grid array configured to carry another of a high-bandwidth data signal or a high-frequency clock signal.

The present invention provides a head-mounted display device for virtual reality, comprising a first display, a first lens, a second lens, a spectroscopic coating, and a second display. The active surface of the first display generates a first display image beam. The first lens has a first surface facing the active surface of the first display, and a second surface opposite to the first surface. The second lens has a third surface and a fourth surface opposite to each other. The spectroscopic coating is arranged between the second surface of the first lens and the third surface of the second lens. The third surface of the second lens and the second surface of the first lens are bonded to each other through the spectroscopic coating. The second display has a fourth surface with an active surface facing the second lens. The active surface of the second display generates a second display image beam.

To provide a cathode arc vapor deposition apparatus.SOLUTION: There is provided a device that comprises: a target which has a surface as an active surface for evaporation; a confinement part which confines an outer border of the target surface; an anode which has an electron reception surface, and encircles the target and confinement part at an axial distance before a target plane and the active surface; and a magnetic guide system which provides a magnetic field with the target surface parallel with at least an outer region of the target surface with lines of magnetic force inclined in parallel with or at an acute angle α to the target surface and is defined within a surface region, wherein the lines of magnetic force enter the target surface at α≤45°. The confinement part and anode are formed in a closed geometric shape and electrically insulated from each other and the target, and an inner border of the electron reception surface is defined with at least one of a radial direction having a radial distance from the middle of the target, an axial distance from the target surface to an upper border of the confinement part, and an axial distance from the target surface to a lower border of the electron reception surface.SELECTED DRAWING: Figure 1

1. The name of the product of this design: Actuator for active reflecting surface of radio telescope. 2. Purpose of this design product: used to adjust the active surface shape of a radio telescope. 3. The design key point of this appearance design product lies in the shape of the product. 4. The picture or photo that best illustrates the design points: three-dimensional picture.

The invention provides an optical path structure and electronic equipment, and relates to the technical field of optical signal communication. The optical path structure comprises an optical chip, a circuit base plate and a substrate. The circuit base plate is provided with a window area; the active surface of the optical chip is welded at the edge of the window area on the circuit bottom plate, and the optical chip is electrically connected with the circuit bottom plate; in the arrangement direction perpendicular to the plane of the circuit base plate, part of the optical waveguide on the end face of the optical chip is located in the projection area of the window area. Wherein the signal transmission direction of the optical chip is parallel to the plane of the circuit base plate; the target surface of the substrate is bonded and fixed on the bottom surface of the optical chip. According to the invention, the optical chip is inversely welded on the edge of the window area of the windowing on the circuit base plate, so that part of the optical waveguide can perform signal transmission in the window area in the plane direction of the circuit base plate, thereby reducing the space size required in the setting direction when the grating coupler is used for coupling, effectively improving the integration level of the device, and improving the reliability of the device. And the integration difficulty of the device is reduced.

Method for detecting discontinuities in a medium and system for implementing said method, said method comprising the step of defining a transmission sequence, wherein a plurality of transmitting transducers selected among the transducers of a probe are uniformly and randomly located on the active surface of said probe, and a time offset defined for each transmitting transducer is uniformly and randomly located within a predetermined transmission duration. Subsequently, said transmission sequence is transmitted in said medium by said plurality of transmitting transducers, the received signals are received and recorded, and said received signals are processed with a focusing law adapted to said transmitting transducers, and using said time offsets so as to thus derive a detection level.

An electronic package and an electronic package module, the electronic package comprising: a first circuit structure having a first surface, a second surface and a first circuit layer; the electronic component group comprises a first electronic component and a second electronic component, the first electronic component is connected to the first surface through a first non-acting surface of the first electronic component, and the second electronic component is arranged on the first acting surface in a bias mode through a second non-acting surface of the second electronic component; the packaging layer covers the electronic component group; the second circuit structure is arranged on the first packaging surface and is electrically connected with the first circuit layer, the first acting surface and the second acting surface respectively; and the photoelectric element is arranged on the second circuit structure. Through the implementation of the optical electronic module, the area of the electronic packaging piece serving as the optical engine can be greatly reduced, so that the number of the optical engines contained in the common packaging optical electronic module is increased, and the information transmission quantity of the electronic module is further improved.

Methods and systems for performing spectroscopic ellipsometry (SE) measurements of semiconductor structures based on data sets resolved in wavelength, azimuth angle, and angle of incidence are presented herein. In some embodiments, machine learning based measurement models are trained to infer estimated values of one or more parameters of interest characterizing a structure under measurement based on SE measurement data resolved in wavelength, azimuth angle, and angle of incidence. In some other embodiments, regression is performed on a physics based measurement model to estimate values of one or more parameters of interest characterizing a structure under measurement. A dispersive element in the collection beam path disperses collected light across the active surface of a detector to resolve collected light according to wavelength and one angular dimension. Furthermore, multiple images are collected by the detector to resolve collected light across the other angular dimension.

The head-up display comprises an electro-optical display (102) and a first mirror (108, 110, 120), wherein an image (106) can be generated by means of the electro-optical display (102), which can be reflected via the first mirror (108, 110, 120) against a combiner (101), thus enabling a beam path (S) from the electro-optical display (102) to the combiner (101), and thus allowing an observer of the head-up display to perceive both the image (106) generated by the electro-optical display as a virtual image (107) and the environment behind the combiner (101) when looking at the combiner (101), and the first mirror (108, 110, 120) is designed to be rotatable about a rotation axis (109, 111, 123) to change the position of the virtual image. is, wherein the axis of rotation (109, 111, 123) is arranged outside the optical center (122) of the first mirror (108, 110, 120), characterized in that the axis of rotation (109, 111,123) is shifted from the optical center (122) of the first mirror (108, 110, 120) in front of an active surface (121) of the first mirror (108, 110, 120).

Disclosed in one example is an apparatus including a substrate, a sensor over the substrate including an active surface and a sensor bond pad, a molding layer over the substrate and covering sides of the sensor, the molding layer having a molding height relative to a top surface of the substrate that is greater than a height of the active surface of the sensor relative to the top surface of the substrate, and a lidding layer over the molding layer and over the active surface. The lidding layer and the molding layer form a space over the active surface of the sensor that defines a flow channel.

Disclosed is a method including the steps of defining a transmission sequence, in which a plurality of transmit transducers is uniformly and randomly selected among the transducers of a probe on the active surface of the probe and a time offset is uniformly and randomly defined for each transmit transducer over a predetermined transmission duration. Subsequently, the transmission sequence is transmitted in the medium by the plurality of transmit transducers, the reception signals are received and recorded and they are processed with a focal law suitable for the transmit transducers and the time offsets used in order to thus derive a level of detection.

The utility model provides an optical packaging structure, comprising an active device which is provided with an active surface and a passive surface which are oppositely arranged; a light sensor bonded to the passive surface of the active device; and the spacer is located on the passive surface of the active device, and the light sensor is located in a space defined by the spacer and the active device. The utility model aims to provide an optical packaging structure so as to improve the sensing accuracy of the optical packaging structure and reduce the size of the optical packaging structure.

A WBGA package and a method of manufacturing a WBGA package are provided. The WBGA package includes a first substrate having a first through hole and a second substrate having a second through hole over the first through hole of the first substrate. The WBGA package also includes an electronic component having an active surface over the second through hole of the second substrate.

The present invention refers to a detector and a method for obtaining Kikuchi images by using electron backscatter diffraction (EBSD) or transmission Kikuchi diffraction (TKD) technique. In particular, the present invention refers to a detector comprising a detector body, a detector head with a scintillation screen and a photodetector with a active surface for detecting Kikuchi patterns, and means configured to move the detector head with respect to the detector body. The method comprises obtaining a first and a second Kikuchi pattern, and moving the detector head after obtaining the first Kikuchi pattern and prior obtaining the second Kikuchi pattern.

The specification relates to a luminescence microscope comprising a first light source for generating an input light beam, a light modulator comprising a first active surface and a second active surface, for modulating the phase and / or amplitude of the light incident on the respective active surface, an objective lens for focusing the light into a sample so that an light intensity distribution is formed in the sample, wherein the luminescence microscope comprises a first beam displacement element for polarization-dependent generation of a first output light beam and / or a second output light beam forming an angle of less than 90°, wherein the first beam displacement element is arranged such that that the first output light beam impinges on the first active surface and the second output light beam impinges on the second active surface and a method for imaging a sample or for localizing or tracking emitters in the sample.

The invention discloses a counterweight supporting structure for adjusting the surface shape of a reflecting mirror, and the structure comprises an insert which is connected in a reflecting mirror body, and a ball socket structure is formed in the insert; the support is connected with the bottom plate through screws; the differential structure comprises a ball head sliding block, and a ball head of the ball head sliding block is matched with the ball socket structure; and the balance weight structure can form a lever fulcrum to provide radial supporting force for the reflector body. According to the balance weight supporting structure for adjusting the surface shape of the reflecting mirror, on one hand, the radial supporting force on the mirror body can be adjusted through the balance weight structure, and the gravity influence of the mirror body is completely balanced; on the other hand, the axial displacement can be finely adjusted through a differential thread structure, the adjusting precision is superior to 1 micron, and the high-low point surface shape defect of the mirror surface can be made up; compared with an existing balance weight structure or a surface-shaped active adjusting structure, the two-way adjusting composite function is achieved, and meanwhile the structure is simpler, the supporting state is stable, the adjusting precision is high, and operation is easy and convenient.

A diamond turning station having a drum able to be rotated about an axis C and a diamond tip. A piece to be machined P is installed on the drum as follows: the piece to be machined P is offset by a distance D from the rotation axis of the drum; the piece to be machined P is placed so that there is a mean angle Theta between the axis C and a cutting profile corresponding to the active surfaces, the angle Theta being as follows: Theta=arccos (D / Ry), where Ry is a radius of curvature required in the long direction of the microstructures. Next, the diamond tip is moved along the cutting profile of the microstructures, while actuating the rotation of the drum, so as to machine all the microstructures on the surface of the piece to be machined P.

A light guide plate, a backlight module and a display device are provided. The light guide plate is configured to be coupled to a light source. The light guide plate includes a light-emitting surface, a bottom surface, a light-incident surface, plural stripe-shaped microstructures and plural light guiding microstructures. The bottom surface is opposite to the light-emitting surface. The light-incident surface is connected between the light-emitting surface and the bottom surface. The stripe-shaped microstructures are disposed on the at least one of the light-emitting surface and the bottom surface, and each of the stripe-shaped microstructures has two opposing side surfaces and an active surface. The side surfaces are respectively connected to two opposite sides of the active surface. The light-guiding microstructures are disposed between any adjacent two of the stripe-shaped microstructures and arranged along an extending direction of each of the stripe-shaped microstructures.

A system for compensating for the distortion of a wavefront of one portion at least of an incident light beam comprises: —an adaptive optic for providing, via reflection from an active surface, a corrected light beam; —a mode splitter for providing a plurality of output light beams belonging to a family of target modes; —a photonic device that is optically coupled to the mode splitter, the photonic device being configured to deliver: i. a useful light beam; ii. quantities representative of the characteristics of the output light beams; —a controller of the adaptive optic, the controller being connected to the photonic device and to the adaptive optic, the controller being configured to, on the basis of the quantities, adjust the deformation of the active surface.

Disclosed is an apparatus and method of forming, including a supporting structure, a sensor on the supporting structure, a pair of columns on the supporting structure at opposite sides of the sensor, the pair of columns having a column height relative to a top surface of the supporting structure, the column height being higher than a height of the active surface of the sensor relative to the top surface of the supporting structure, and a lidding layer on the pair of columns and over the active surface, the lidding layer being supported at opposite ends by the pair of columns. The active surface of the sensor, the lidding layer and the pair of columns form an opening above at least more than about half of the active surface of the sensor, and the supporting structure, the sensor, the lidding layer and the pair of columns together form a flow cell.

An aerosol-generator for an aerosol-generating device is provided, the aerosol-generator including: a surface acoustic wave atomiser including a substrate including an active surface defining at least one atomisation region, and at least one transducer positioned on the active surface of the substrate configured to generate surface acoustic waves on the active surface of the substrate; and a supply element arranged to supply a liquid aerosol-forming substrate to the at least one atomisation region, the supply element including a plurality of interconnected channels extending through the substrate between at least one inlet configured to receive a supply of the at least one liquid aerosol-forming substrate and at least one outlet positioned within the at least one atomisation region of the active surface of the substrate.

The application provides an optical element surface shape regulation and control method based on a KAN neural network, and relates to the technical field of optical element surface shape regulation and control. The method comprises the following steps: establishing an APDL parameterized finite element model of an optical element and a corresponding multi-point support system; performing finite element simulation through an APDL batch processing mode, obtaining corresponding optical surface deformation data, fitting to obtain Zernike polynomial coefficients, and constructing a sample data set; building a KAN neural network model, training the model by using the sample data set, and establishing a nonlinear mapping relationship from support force input to Zernike coefficient output; constructing an optimization objective function; and performing reverse optimization on the input support force by using a gradient optimization algorithm to obtain an optimal support force distribution for realizing target Zernike term adjustment. The application provides a high-precision, strong-decoupling and low-cost method for active surface shape correction of a high-precision optical system.

Presented herein are methods and systems for performing spectral ellipsometry (SE) measurements of semiconductor structures based on data sets resolved by wavelength, azimuth, and incidence angles. In some embodiments, a machine learning-based measurement model is trained to infer estimated values of one or more parameters of interest characterizing a measured structure based on SE measurement data resolved by wavelength, azimuth, and incident angle. In some other embodiments, regression is performed on a physics-based measurement model to estimate values of one or more parameters of interest characterizing the measured structure. A dispersing element in the concentrated beam path disperses the collected light across an active surface of the detector to resolve the collected light according to a wavelength and an angular dimension. In addition, a plurality of images are collected by the detector to resolve the collected light across another angular size.

Methods of identifying damaged microelectronic devices are described. A method includes applying a detection material to an active surface of a wafer. The detection material includes an additive configured to yield a visible reaction to heat or infrared or near-infrared light. The method may further include focusing a laser beam into an interior portion of the wafer through a second surface of the wafer opposite the active surface to form a modified layer along a separation region extending between adjacent microelectronic devices. The method may also include inspecting the detection material for visible reactions. The method may further include identifying reactions that indicate exposure to heat or infrared or near-infrared light over a pre-determined threshold. Protective tape, backgrind tapes, and methods of manufacturing a microelectronic device are also described.