The invention discloses a connection flux statistical information extraction method and a VLSI (Very Large Scale Integration) structure. The connection flux statistical information extraction method comprises the following steps: simultaneously scanning two adjacent rows of a binary image; judging whether a connected area exists between the current row and the previous row; if yes, merging the area, connected with the current row, in the previous row into the current row according to an equivalent run pair merging rule; meanwhile, marking the area, not connected with the current row, in the previous row as an ended area, and outputting the information of the ended area; then updating the run number of the connected area in the current row; when the current row is the last one, according to the equivalent run pair merging rule, merging the connected area in the current row, then marking the merged and obtained area as the ended area, and outputting the information of the ended area, so as to obtain the connection flux statistical information. The connection flux statistical information extraction method disclosed by the invention can quickly process the binary image and extract the connection flux statistical information of the binary image, and is low in hardware resource consumption.