Connection flux statistical information extraction method and VLSI structure
A technology of statistical information and extraction method, applied in the field of connectivity statistical information extraction method and VLSI structure, can solve problems such as the inability to meet high-speed real-time image processing, achieve obvious speed advantages, avoid recording, and save memory space.
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[0052] refer to figure 2 , the concrete process of the present invention is:
[0053] 1) Image input: choose four-connected or eight-connected configuration.
[0054] 2) Line buffer: Receive the image binary data input from the input terminal, and output the binary data of two adjacent lines of the image in parallel through the buffer function of RAM_BUFFER.
[0055] 3) Line scanning: scan the binary data array of the image, and scan two lines of the image at the same time each time, that is, each line will be scanned twice, the first time as the current line, the second time as the previous line, and the line During the scanning process, a 2X2 scanning template is used, such as figure 2 As shown, the template moves to the right column by column during the scanning process.
[0056] Mark the run and record: when the binary data of the previous line of the 2X2 scanning template is 01, a new run is generated in the previous line; when the binary data of the previous line of...
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