2300results about "Electric pulse generator" patented technology

An output drive circuit includes: a totem-pole output including: a high-side transistor (HST) with drain and source, an output stage power supply voltage applied to the drain, the source connected to the first node (N1); and a low-side transistor with source and drain, a ground voltage applied to the source, the drain connected to N1; and a bootstrap part including a capacitor supplying charge to a gate of HST when on, the charge being charged when HST is off, and one terminal of the bootstrap part connected to N1, the output drive circuit further including: a first transistor (T1) that conducts when HST is to be on, T1 connected between a drive circuit power supply voltage and the gate of HST; and a second transistor conducting when HST is to be turned on, the second transistor connected between the other terminal of the capacitor and HST gate.

The invention relates to an output control method and system for a pulse power supply, and the method comprises the following steps: collecting the output voltage waveform of the pulse power supply, and obtaining an output voltage sampling sequence; carrying out wavelet transform decomposition on the voltage waveform characteristic coefficient, and extracting the voltage waveform characteristic coefficient; self-adaptive threshold segmentation is carried out based on the feature coefficient, and pulse edge feature points are identified; generating a waveform compensation parameter sequence through dynamic compensation calculation; modulating a PWM (Pulse Width Modulation) control signal by using the sequence to obtain an optimized PWM waveform sequence; finally, the parameters of the drive circuit are adjusted based on the optimized PWM sequence, stable control over the output voltage waveform is achieved, and the technical problems that a traditional pulse power supply mostly adopts a PWM control strategy with fixed parameters, output fluctuation caused by load abrupt change, temperature drift and device aging factors is difficult to cope with, and waveform distortion is caused are solved.

In an example, a level shifter includes a low side having first and second inputs. The level shifter also includes a high side, where the high side has a latch having first and second terminals. The high side also includes a current comparator including first and second current mirrors. The high side includes isolation circuitry including first and second transistors, in which the first transistor has a first control terminal, the second transistor has a second control terminal, the first transistor is coupled between the first terminal and the first current mirror, the second transistor is coupled between the second terminal and the second current mirror, the first control terminal is coupled to the second current mirror, and the second control terminal is coupled to the first current mirror.

A multi-modulus divider includes a prescaler and a finite state machine. The prescaler includes a combinational logic circuit programmable to divide a frequency of an input clock signal by a first value or a second value. The multi-modulus divider includes a first flip-flop having a data input coupled to an output of the prescaler and an output coupled to an input of the finite state machine. The multi-modulus divider includes a second flip-flop having a data input coupled to the finite state machine such that the data input is configured to receive a programming signal output by the finite state machine and associated with programming the combinational logic circuit. The multi-modulus divider includes a third flip-flop having a data input coupled to an output of the second flip-flop. The third-flip flop also has an output coupled to the combinational logic circuit.

The embodiment of the invention provides an excitation signal generation method and system and a digital eddy current sensor, and the method comprises the steps: outputting a square wave signal through a pulse width modulation assembly of a microcontroller unit, and enabling the frequency and resolution of the square wave signal to be adaptive to eddy current probes with different inductance values; inputting the square wave signal into a low-pass filter for filtering, and setting the cut-off frequency of the low-pass filter, the suppression times of higher harmonics and the attenuation slope so as to output a sine wave signal with a target total harmonic distortion range; the amplitude of the sine wave signal is collected in real time, and the pulse width modulation duty ratio and the passband gain of a low-pass filter are dynamically adjusted in combination with a digital control algorithm, so that the sine wave signal is subjected to self-adaptive adjustment and correction and is output; and taking the sine wave signal as an excitation source of an eddy current probe, and driving the eddy current probe to carry out nondestructive testing. According to the invention, the excitation signal which gives consideration to high-frequency signal generation, deep harmonic suppression and digital adaptive adjustment can be generated.

An amplification circuit is configured to differentially amplify an input signal and a reference voltage to generate an output signal when a clock signal has a first logic level. The amplification circuit is configured to precharge the output signal when the clock signal has a second logic level. The amplification circuit is configured to adjust a current driving force that precharges the output signal based on the reference voltage.

The embodiment of the invention discloses a delay-locked loop circuit, a clock generator, a chip and electronic equipment, and belongs to the technical field of integrated circuits. The delay-locked loop circuit includes: a digital control circuit for transmitting a first adjustment code adapted to adjust the number of delay units in a coarse adjustment phase, and determining whether to adjust the first adjustment code based on a first feedback signal; in the fine adjustment stage, a third adjustment code suitable for adjusting the delay attribute parameter of the delay unit is sent, and whether the third adjustment code is adjusted or not is determined based on the second feedback signal; in the locking phase, transmitting a second adjustment code suitable for adjusting the control voltage of the delay unit, and determining whether to adjust the second adjustment code based on the third feedback signal; and the phase detection unit is used for sending the first feedback signal, the second feedback signal and the third feedback signal to the digital control circuit. A hybrid circuit of digital design and analog design is provided, high-precision clock phase adjustment is achieved, and an output clock in a wide frequency range can also be achieved.

A method for validating operation of a driver integrated circuit includes providing a signal using an output node. The signal is provided using multiple set points in response to a change in state of an input signal. Each set point corresponds to a different phase of a multi-phase transition of the signal. The method includes providing a timer value at an end of a phase of the multi-phase transition and determining whether the signal is in a target signal range of the phase based on the timer value at the end of the phase, a predetermined value defining the target signal range of the phase, and a predetermined time limit for the phase. A current through the output node may be provided using the multiple set points, and a voltage on the output node may have the multi-phase transition.

The disclosure relates to an electronic circuit to verify the integrity of a switch. The circuit comprises a voltage comparator and decoupling switch. The decoupling switch configured receive the driving signal having a first logic value to enable the monitoring of the comparison voltage and is configured to receive the monitoring enable signal having a first logic value to command the opening of the decoupling switch. The electronic circuit is configured to generate the output monitoring signal having a first logic value in an event that the switch is an open circuit and having a second logic value in an event that the switch is a short circuit.

Certain aspects are directed towards an interpolator and / or a clock generator. An example interpolator generally includes: a first capacitive element; a first current source; a first switch coupled between the first capacitive element and the first current source; a second current source; a second switch coupled between the first capacitive element and the second current source; and a first comparison circuit having an input coupled to the first capacitive element.

An apparatus includes a transmitter, a voltage regulator, an isolator, and a test controller. The transmitter has an input, an output, and a first supply voltage terminal. The input couples to the apparatus' input terminal. The voltage regulator's input couples to a second supply voltage terminal. The voltage regulator's output couples to the first supply terminal. The first terminal of the isolator couples to the output of the transmitter. A first test controller terminal couples to the second supply voltage terminal. A second test controller terminal couples to the input terminal of the apparatus. The first control output couples to the control input of the voltage regulator. The test controller changes a logic state of a control signal at the first control output from a first logic state to a second logic state.

Disclosed is a test aid unit that is installed between automatic test equipment (ATE) and a device under test (DUT), generates a test data signal according to a data processing and transmission / reception rate of the DUT in response to a control signal transmitted from the ATE, transmits the test data signal to the DUT, self-tests a test result signal transmitted from the DUT, and transmits the test result to the ATE. The test aid unit includes a clock signal divider, an integrated digital logic unit, a transmitter, and a receiver.

The invention discloses an anti-radiation hardening digital controlled oscillator, a clock data recovery circuit and equipment, and the digital controlled oscillator is characterized in that an anti-radiation hardening circuit unit is connected between a digital-to-analog converter (DAC) and a voltage-controlled oscillator (VCO), and comprises a voltage copying unit and a multiplexer; the voltage copying unit is used for copying a control voltage signal output by the digital-to-analog converter DAC, generating a copying voltage signal, sending the copying voltage signal to the multiplexer, and switching the output of the multiplexer from the control voltage signal to the copying voltage signal when the digital-to-analog converter DAC is subjected to single-particle bombardment. The DCO type clock data recovery circuit aims at solving the problem that a traditional DCO type clock data recovery circuit is prone to being affected by single particles when running in a radiation environment, single particle function interruption is generated, and consequently a space task fails, and the radiation hardening capacity of the DCO type clock data recovery circuit running in the radiation environment is improved.

The invention relates to the technical field of integrated circuit design, in particular to a latch circuit capable of effectively self-recovering three-node data flipping and a chip. The circuit comprises a pull-up tube part, a pull-down tube part, a signal inverting part, a clock control inverting part, a transmission tube part and a transmission gate part. According to the latch circuit capable of effectively self-recovering three-node data flipping provided by the invention, the eight storage nodes S1 to S8 are correspondingly reinforced by adopting a means of combining polarity reinforcement and source isolation reinforcement, and are matched with the signal inverting part, the clock control inverting part, the transmission tube part and the transmission gate part for use, so that the circuit has complete SNU, DNU and TNU self-recovery capability, and the reliability of the circuit is improved. And the power consumption is low. According to the invention, the problem that the existing circuit cannot reduce the power consumption under the condition of resisting SNU, DNU and TNU at the same time is solved.

The embodiment of the invention provides a clock generation circuit and a memory, an ith clock generation sub-circuit is used for carrying out sampling processing and latching processing on an ith register input signal according to an inverted clock signal to generate an ith register signal; performing first logic processing on the ith register signal and the delay clock signal to generate an ith target clock signal; the jth clock generation sub-circuit is used for sampling and latching a (j-1) th register signal according to a preset clock signal to generate a jth register signal; and performing second logic processing on the jth register signal and the delayed clock signal to generate a jth target clock signal.

In one embodiment, a method includes: receiving, in a level shifter, an input signal from a first voltage domain that operates according to a first supply voltage; level shifting the input signal to at least one level-shifted signal having a second voltage greater than the first supply voltage; based on the at least one level-shifted signal, generating a first pulse signal and a second pulse signal; latching the first pulse signal through a latch circuit to form an output signal; and outputting the output signal to a second voltage domain, the second voltage domain to operate according to a second supply voltage greater than the first supply voltage.

A circuit includes a phase selector to generate an injection clock signal having an injection phase based on a phase of a digitally controlled oscillator clock signal generated within a phase-locking feedback loop. An injection-locked oscillator (ILO), coupled to an output of the phase selector, generates an ILO clock signal that is convertible to provide a feedback clock signal of the circuit. Logic, coupled between an output of the ILO and the phase selector, to, at each predetermined number of cycles of the DCO clock signal, cause the phase selector to output a phase shift in the injection clock signal that causes the ILO clock signal to comprise a rotated phase, relative to the injection phase, and that prevents a glitch in the injection clock signal.

An integrated circuit includes first bit cells, second bit cells, and clock cells. Each of first bit cells is arranged in one of multiple first cell rows having a first row height. Each of the second bit cells is arranged in one of multiple second cells rows having a second row height different from the first row height. The second bit cells extend to pass the first bit cells in a first direction. The clock cells are arranged in peripheral regions of a multi-bit flip flop cell in the first cell rows. The first and second bit cells and the clock cells are included in the multi-bit flip flop cell.

A semiconductor device is provided. The semiconductor device includes: an equalizer circuit configured to output a first control signal corresponding to a first bit of original two-bit data and a second control signal corresponding to a second bit of the original two-bit data; and a driver circuit including a plurality of pull-up transistors connected between an output node and a first power node configured to provide a first power supply voltage, and a plurality of pull-down transistors connected between the output node and a second power node configured to provide a second power supply voltage, wherein the second power supply voltage is lower than the first power supply voltage, and the driver circuit is connected to the equalizer circuit in series. The plurality of pull-up transistors includes a first pull-up transistor and a second pull-up transistor connected to each other in parallel, between the first power node and the output node, and a third pull-up transistor and a fourth pull-up transistor connected to each other in series, between the first power node and the output node.

Load disconnect techniques for boost converters. In an example, a power converter includes a driver circuit, a control circuit, and a comparator circuit. During normal boost operation (VIN<VOUT), the comparator circuit disables the control circuit and enables the driver circuit, which in turn fully turns on a high-side switching element during high-side on-phase. In contrast, during start-up operation or an output short-to-ground condition (VIN≥VOUT), the comparator circuit disables the driver circuit and enables the control circuit, which in turn controls the gate voltage of the high-side switching element, so the current through the switching element is regulated, and the switching node voltage is regulated to about a threshold voltage higher than VIN. In this manner, the comparator circuit controls the driver circuit and the control circuit, which in turn allow the boost converter to operate in a normal fashion even when VIN is higher than VOUT.

A clock signal generation device and a clock signal generation method thereof are provided. 【Solution means】When the analog clock signal generator circuit does not provide the output clock signal CLK3, the control circuit controls the multiplexer circuit 108 to selectively output the oscillator signal CLK2 to the analog clock signal generator circuit, and controls the clock path circuit to stop the transmission of the input clock signal CLK1.

A control method of a hybrid power switch having at least a first switching device connected in parallel with a second switching device is provided. A first gate signal is provided to the first switching device for turning on and turning off the first switching device. A second gate signal is provided to the second switching device for turning on and turning off the second switching device. A first delay time is stablished between the turning on of the first switching device and the turning on of the second switching device, and a second delay time is established between the turning off of the first switching device and the turning off of the second switching device. The temperature of the first switching device is determined, and at least one of the first and second delay times is modified depending on such temperature.

The invention relates to an anti-radiation D flip-flop based on interconnection line crosstalk calculation. The anti-radiation D flip-flop comprises a cascade structure of a master latch module and a slave latch module, the primary latch module converts an input signal into a dual-node redundant signal through a first interconnection line crosstalk circuit (CC1), and logic storage of triggering high output only by dual high input is realized by capacitive coupling of L1-L3 and L2-L3; the slave latch module generates redundant signals L4 / L5 through a second interconnection line crosstalk circuit, and error correction is carried out on CC2 output and direct transmission signals in combination with a Muller C unit. The D flip-flop only needs 16 transistors with the minimum size, and the number of the transistors is reduced by 67% compared with that of a traditional TMR; asynchronous reset is supported, and the L3 / L6 is forced to be charged to a high level during reset; the capacitive coupling strength is controlled through metal layer wiring, and the reliability of a spaceflight electronic system in a radiation environment is remarkably improved.

According to one implementation, a pulse generator circuit includes a flip-flop receiving an input clock signal, and one or more delay elements where the circuit is configured to adjust a pulse width of an output clock signal independent of a clock period of the input clock signal. According to another implementation, a pulse generator circuit includes a flip-flop receiving an input clock signal, and one or more delay elements where the circuit is configured to adjust a pulse width of an output clock signal. The flip-flop is configured to transmit a flip-flop output signal to the one or more delay elements where the flip-flop output signal includes a state of the flip-flop. The one or more delay elements are configured to delay the flip-flop output signal by a delay period and transmit the delayed flip-flop output to a reset input.

Circuits and methods are provided for an input hysteresis buffer that includes a voltage limiting unit, a voltage detecting unit connected to the voltage limiting unit, and a supply tracking bias unit connected to the voltage detecting unit. The voltage liming unit comprises a first voltage limiting unit and a second voltage limiting unit. The voltage detecting unit comprises a first voltage detecting unit configured to detect the presence of a first threshold voltage in an input signal, and a second voltage detecting unit configured to detect the presence of a second threshold voltage in the input signal. The supply tracking bias unit is configured to supply a control signal to the voltage detecting unit.

A dynamic flip-flop circuit with a feedback loop includes a input tristate circuit configured to receive a data signal and a clock signal to output a tristate output data signal. The dynamic flip-flop circuit also includes a feedforward circuit configured to receive the tristate output data signal as input to output a feedforward output data signal. The dynamic flip-flop circuit also includes a feedback loop circuit configured to connect the output of the feedforward circuit and the output of the input tristate circuit. The feedback loop circuit includes a transmission gate circuit that is partially on.

The demodulation circuit includes a waveform regulator, a first counter, a second counter, and an SR latch. The waveform regulator generates a regulated modulation signal according to a pair of differential isolated modulation signals, which is generated according to a modulation of an input data signal with a carrier clock signal. The first counter counts cycles of the regulated modulation signal so as to generate a set signal. The second counter counts cycles of a reference clock signal so as to generate a reset signal. The SR latch includes a set terminal for receiving the set signal, a reset terminal for receiving the reset signal, and an output terminal for outputting a demodulated output signal. The SR latch is triggered by the set signal to pull up the demodulated output signal, and is triggered by the reset signal to pull down the demodulated output signal.

Provided are a duty cycle calibration circuit and method, a chip, and an electronic device. In the duty cycle calibration circuit, through a counting clock signal having a higher clock signal frequency than a calibration clock signal, a counting unit is configured to acquire a number of counting pulses generated in a high-level state and a low-level state of the calibration clock signal within a preset counting period, so as to obtain an actual duty cycle of the calibration clock signal. Compared with a method of acquiring a duty cycle of a calibration clock signal by comparing the calibration clock signal with a reference clock signal, inaccurate measurement of the duty cycle of the calibration clock signal after the reference clock signal is affected can be overcome. Therefore, accuracy of measurement of the duty cycle can be improved, and precision of calibration of the duty cycle can be improved accordingly.

Embodiments disclosed herein relate to device testing using scan chains including various flip-flop devices in a multi-bit flip-flop configuration. A circuit device included herein includes a first flip-flop sub-circuit and a second flip-flop sub-circuit. The first flip-flop sub-circuit is coupled to receive a clock signal and an input, and the second flip-flop circuit is coupled to the first flip-flop sub-circuit. The first flip-flop sub-circuit includes an input sub-circuit, a first latch sub-circuit, a first latch tristate, a second latch sub-circuit, and a first output inverter. The second latch sub-circuit includes a first transmission gate, a first inverter, and a second inverter. The second flip-flop sub-circuit includes a second transmission gate, a first clock tristate, a third latch sub-circuit, a second latch tristate, a fourth latch sub-circuit, and a second output inverter. The fourth latch sub-circuit includes a third transmission gate, a third inverter, and a fourth inverter.

A method may include generating, using an oscillator, a first signal having a frequency based on a current, generating, based on a second signal, a first portion of the current, the first portion of the current having a first frequency characteristic, and generating, based on the second signal, a second portion of the current, the second portion of the current having a second frequency characteristic. A gain of the first frequency characteristic may change based on a frequency of the second signal. The first frequency characteristic may include a first gain at a first frequency, and a second gain at a second frequency. The first gain may be greater than the second gain, and the second frequency may be greater than the first frequency. A phase of the first frequency characteristic may change based on a frequency of the second signal.