13634 results about "Operational amplifier" patented technology

An integrated semiconductor memory device with an array of memory cells MC using magnetic tunnel junction (MTJ) cells is disclosed. A sense amplifier SA that is connected to a bit line BL for data readout of a selected memory cell MC is arranged using an operational amplifier OP. The operational amplifier OP has an inverting input terminal which is connected to the bit line BL and a non-inverting input terminal, to which a potentially fixed constant voltage VC is given. A PMOS transistor Q31 is provided, which can also do double-duty as a current source load. This PMOS transistor has its drain and gate that are connected to the inverting input terminal, and a source as connected to an output terminal of the operational amplifier OP whereby the transistor is under feedback control in response to an output of the operational amplifier OP so that a clamped voltage potential of the bit lime BL is fixed to the voltage VC.

A power supply driver circuit with low power losses and desired response characteristics with respect to changes in output and its miniaturization is provided. In a driver IC constituting a switched-mode power supply equipment controlling the switching, by pulse width modulation, of first and second power transistors passing a current in a coil, and outputting a voltage bucked or boosted from an input voltage, current sensing with desired responsiveness is enabled by providing a switching transistor between an inverted input terminal and a non-inverted input terminal of an operational amplifier, preventing, while the second power transistor is ON, the generation of a potential which is undefined when first power transistor is ON, i.e. when the second power transistor is OFF, and maintaining a node potential in a state in which the potential is well defined.

The present invention discloses a testing circuit and method for thin film transistor display array, for testing the yield of thin film transistor array. The testing circuit comprising: An array tester, a test panel (DUT), a sense amplifier array. The sense amplifier is composed by a plurality of trans- impedance amplifier unit and a plurality of parasitic capacitance discharge circuit unit. Every sense amplifier includes: a trans-impedance amplifier, which is implemented by an operational amplifier, two switches and an operation capacitance, the trans-impedance amplifier is used to form an integrated circuit, the output is transmitted to a sampling / hold circuit via a switch; a parasitic capacitance discharge circuit is used to form a discharge rout for the charge of the parasitic capacitance.

An integrated current-to-voltage conversion circuit converts a first current to an output voltage representative of the first current. The circuit includes a first contact pad and second and third contact pads capable of being coupled across a first resistor. A first operational amplifier has a first input coupled to the first contact pad for producing a first voltage thereat, a second input for receiving a reference voltage, and a first output coupled to the third contact pad. A second voltage appears at the third contact pad. A second operational amplifier has a second output at which a third voltage appears, a first input coupled to the second output, and a second input coupled to the second contact pad. The output voltage is substantially equal to the difference between the second and third voltages.

A three-dimensional (3-D) interactive display and method of forming the same, includes a transparent capaciflector (TC) camera formed on a transparent shield layer on the screen surface. A first dielectric layer is formed on the shield layer. A first wire layer is formed on the first dielectric layer. A second dielectric layer is formed on the first wire layer. A second wire layer is formed on the second dielectric layer. Wires on the first wire layer and second wire layer are grouped into groups of parallel wires with a turnaround at one end of each group and a sensor pad at the opposite end. An operational amplifier is connected to each of the sensor pads and the shield pad biases the pads and receives a signal from connected sensor pads in response to intrusion of a probe. The signal is proportional to probe location with respect to the monitor screen.

A testing circuit and method for thin film transistor display array, for testing the yield of a thin film transistor array is provided. The testing circuit includes an array tester, a test panel (DUT) and a sense amplifier array. The sense amplifier is composed of a plurality of trans-impedance amplifier units and a plurality of parasitic capacitance discharge circuit units. Every sense amplifier includes a trans-impedance amplifier, which is implemented by an operational amplifier, two switches and an operation capacitance. The trans-impedance amplifier is used to form an integrated circuit and the output is transmitted to a sampling / hold circuit via a switch. Also included is a parasitic capacitance discharge circuit that is used to form a discharge route for the charge of the parasitic capacitance.

A dual loop voltage regulation circuit of power supply chip is provided, comprising a capacitor for providing a voltage signal, a comparator for comparing a first reference voltage signal and the voltage signal to output forward or backward trigger signal, a first switch triggered by a forward trigger signal, a second switch triggered by a backward trigger signal, a first operational amplifier generating a first drive signal while the first and second switches are on, a first transistor switch triggered to be on by a first drive signal to provide a current source loop, a third switch triggered by a forward trigger signal, a fourth switch triggered by a backward trigger signal, a second operational amplifier generating a second drive signal while the third and fourth switches are on, and a second transistor switch triggered to be on by a second drive signal to provide a current sink loop.

A CMOS imager includes an array of active pixel sensors, wherein each pixel is associated with a respective column in the array. The imager also includes multiple circuits for reading out values of pixels from the active sensor array. Each readout circuit can be associated with a respective pair of columns in the array and can include first and second sample-and-hold circuits. The first and second sample-and-hold circuits are associated, respectively, with first and second columns of pixels in the array. Each readout circuit also includes an operational amplifier-based charge sensing circuit that selectively provides an amplified differential output signal based on signals sampled either by the first sample-and-hold circuit or the second sample-and-hold circuit. The readout circuit also has an analog-to-digital converter for converting the differential output to a corresponding digital signal using a successive approximation technique. Use of the readout circuit can increase the parallel structure of the overall chip, thereby reducing the bandwidth which each readout circuit must be capable of handling.

A bandgap circuit comprising a current generation circuit and a current replication circuit is provided herein. The output current of the current generation circuit is generated as a weighted sum of two currents. The circuit configuration of the current generation circuit allows it to function at low power supply voltages, e.g., on the order of 1 V. The current replication circuit includes an operational amplifier, which when configured in conjunction with MOS cascode current sources and the current generation circuit, significantly increases the accuracy and insensitivity to power supply noise of the bandgap circuit output current. A resistor may be included between the bandgap circuit output node and ground for generating a reference voltage with increased accuracy and insensitivity to power supply noise.

A programmable voltage generator has software-programmable registers that may be decoded to generate control bits that turn on select transistors that control a variable resistor network. An external power voltage is input to a regulator transistor, which has a channel resistance controlled by a gate voltage. The channel resistance of the regulator transistor produces a regulated voltage as an output. An op amp compares a reference voltage to a feedback voltage to generate the gate voltage. The feedback voltage is taken from a tap within the variable resistor network. The variable resistor network has select transistors that select one resistor between the regulated voltage and an upper node, and that select one resistor between a lower node and ground. Switches select a tap within a series of resistors between the upper and lower nodes. Y (fine) control bits select the tap while X (coarse) control bits enable select transistors.

A low power delta-sigma analog to digital converter 10 for converting current mode signals without an amplifier includes an integration capacitor 26, a comparator 30, and a first switch 24 in parallel with one another and coupled to an integration node 28. A FET 20 and the first switch are disposed in series between a dump capacitor 25 and the integration node. A second switch 27 operates to discharge the dump capacitor, and an output of the comparator controls both switches in opposition. Preferably, no op-amps are included in the circuit, and current is supplied by an imaging component 5. In a first comparator state, the first capacitor charges, the first switch is open and the second switch is closed, and the dump capacitor discharges. In a comparator second state, the first switch is closed and the second switch is open, and the integration capacitor transfers a fixed amount of charge into the dump capacitor through an injection FET operating in saturation.

A repeater station 10 detects whether or not an abnormality exists in each of signal light and monitor light having arrived from a terminal station 1 or a repeater station 20, and controls, according to the result of detection, operations of optical amplifiers 11 and 12 and the monitor light. In the case where both of the signal light and monitor light arriving from the terminal station 1 via the optical transmission line for the downstream direction are abnormal, the optical amplifier 11 for the downstream direction stops its amplifying operation by itself, whereas a monitor control apparatus 13 stops the amplifying operation of the other optical amplifier for the upstream direction and also stops transmitting the monitor light to the terminal station 1 in the upstream direction.

Embodiments of the present invention relate to a low voltage differential signal driver (LVDS) circuit which comprises a current source, logic controlled switches for controlling the driver's output, an electronic load circuit coupled across the circuit, and a common-mode resistor feedback circuit coupled across the circuit, in parallel with the RC load, for tuning the driver's impedance. The driver is enabled to operate without op-amps and achieves optimum performance at 1.8 v supply voltages.

An EER amplifier for amplifying an RF signal includes: (II) a first RF amplifier for amplifying the phase portion of the signal; (III) an EER modulator for amplifying the envelope or baseband portion of the signal, including: A) a high frequency operational amplifier; B) a power amplifier; C) a feedback control loop including: (1) a current-to-voltage conversion amplifier having an input coupled to a current monitoring output of the power amplifier and an output, (2) an input buffer amplifier having an input coupled to receive the envelope signal and an output; (3) a summing amplifier having: (a) an input coupled to the outputs of: (a) the current-to-voltage conversion amplifier and (b) the input buffer amplifier, and (b) an output coupled to the current control input of the power amplifier.

A capacitive load driving circuit which includes an operational amplifier, a pulse width modulator, a digital power amplifier, a first filter, a first feedback circuit and a second feedback circuit. The operational amplifier outputs a differential signal between a signal fed back to the inverting input terminal and an input signal inputted to the non-inverting input terminal. The pulse width modulator pulse width-modulates output from the operational amplifier and outputs a digital signal. The digital power amplifier amplifies power of the digital signal. The first filter smooths output of the digital power amplifier and inputs the smoothed signal to the capacitive load as the driving signal. The first feedback circuit feeds back the driving signal outputted from the first filter to the inverting input terminal of the operational amplifier. The second feedback circuit feeds back a signal outputted from the digital power amplifier, which signal includes a phase which is advanced relative to the driving signal, to the inverting input terminal of the operational amplifier.

A low power (and lower cost) implementation for amplifier used in delivering a stimulation pulse is provided according to embodiments through use of a pre-charge period for each pulse. For example, a voltage at a variable output terminal of a digital-to-analog converter is increased on the leading edge of PULSE and INVERTCLK signals to result in an output of an operational amplifier increasing to a predetermined voltage prior to output of a stimulation pulse, according to an embodiment. A shunt path may be implemented to shunt current away from a load during the pre-charge period.

In a burst-mode, high-speed spread-spectrum communications system, faster convergence of a receiver's automatic gain control (AGC) circuit reduces the time required to bring a received signal within the operating range of an operation amplifier and other radio-frequency and digital sections of the receiving system. A gain control circuit includes a coarse-gain feedback loop and a fine-gain feedback loop to improve convergence speed and at the same time maintain the stability of the AGC circuit. The coarse-gain feedback loop quickly brings the received signal, using a large gain signal, to the desired operating range. The fine-gain feedback loop uses a smaller gain signal to gradually smooth the received signal to avoid saturation on the A / D converters.

A pipelined analog-to-digital converter (ADC) (30) with improved precision is disclosed. The pipelined ADC (30) includes a sequence of stages (20), each of which includes a sample-and-hold circuit (22), an analog-to-digital converter (23), and the functions of a digital-to-analog converter (DAC) (25), an adder (24), and a gain stage (27) at which a residue signal (RES) is generated for application to the next stage (20) in the sequence. A multiplying DAC (28) performs the functions of the DAC (25), adder (24), and gain stage (27) in the stage (20), and is based on an operational amplifier (29). Sample capacitors (C10, C20) and reference capacitors (C122, C222) receive the analog input from the sample-and-hold circuit (22) in a sample phase; parallel capacitors (C121, C221) are provided to maintain constant circuit gain. Extended reference voltages (VREFPX, VREFNX) at levels that exceed the output range (V0+, V0−) of the operational amplifier (29) are applied to the reference capacitors, in response to the digital output of the analog-to-digital converter (23) in its stage (20). The reference capacitors (C12, C22) are scaled according to the extent to which the extended reference voltages (VREFPX, VREFNX) exceed the op amp output levels (V0+, V0−). The effects of noise on the reference voltages (VREFPX, VREFNX) on the residue signal (RES) are thus greatly reduced.

The present invention provides solutions to simplify and reduce the resources needed for manufacturing liquid crystal display modules. Failure of mid-process steps during mass production can result in significant costs. According to certain embodiments of the present invention, a WOA display panel architecture requires fewer LCM resources or has no PCB. Although the COG process and WOA method provide higher reliability in temporary LCD production, the costs associated with the space required for wires on the PCB or display panel for larger panel sizes remains expensive. Larger panel sizes also requires an increased number of driver ICs to construct a flat display panel. Similarly, the number of wires connecting each driver IC to a timing controller IC, gamma operational amplifier IC and DC-to-DC converter IC creates spacing problems that translate into higher production costs. These problems can be solved by certain embodiments of the present invention.

A pulse-width modulation (PWM) amplifier is adapted to a class-D amplifier in which an analog input signal is subjected to integration, pulse-width modulation, and switched amplification, wherein a glitch elimination circuit eliminates noise from a pulse-width modulated signal, from which a high pulse signal and a low pulse signal are isolated such that each pulse is delayed by a dead time at the leading-edge timing thereof. When both of them are simultaneously set to a high level, one of them is reduced in level. In response to the occurrence of clipping, an integration constant applied to an operational amplifier is automatically changed from a primary integration constant to a secondary integration constant. When the clipped state is sustained for a prescribed time, an inversion pulse is compulsorily introduced into the pulse-width modulated signal.

In aspects of the invention, at normal operation, an operational amplifier circuit has feedback applied from the output thereof to the input thereof so that currents equal to each other flow in differential pair transistors, respectively. While, in order that currents equal to each other may flow in the differential pair transistors, respectively, for compensating the difference in threshold voltages in the differential pair transistors, a voltage lower by a certain voltage difference than the voltage applied to the gate terminal of the transistor must be applied to the gate terminal of the transistor. From this, the switching of switches, when a virtual short circuit occurs, can make the output voltage of the operational amplifier circuit become a signal in which positive and negative rectangular ripples, with the values thereof being proportional to the value of the certain voltage difference, are superimposed on a true value.

An optical amplifier having a two-stage construction using an erbium doped fiber (EDF) as a gain medium. The erbium dopant concentration is 1000 ppm, and the unsaturated absorption coefficient of the signal beam at 1550 nm is 1 dB / m. The length of the EDF 14-8 is 10 m, and the length of the EDF 14-12 is 70 m. The excitation light sources 14-6 and 14-10 are semiconductor lasers of 1.53 mum, and the excitation light power is 100 mW. Multiplexers 14-7 and 14-11 are inductive multi-layer film filters, and the gain equalizer 14-4 is a Fourier filter. The peak loss of the Fourier filter is 17 dB. The gain of the EDF 14-8 is 25 dB, and the gain of the EDF 14-12 is 15 dB. Two optical isolators are installed on a pre-stage amplifier, and one on a post-stage amplifier in order to prevent laser oscillation.