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A high-density NAND storage media adaptive repair method

ActiveCN121601011BEliminate blockingEliminate performance jitter issuesStatic storageState predictionFloating point
The application discloses a high-density NAND storage medium adaptive repair method, which comprises the following steps: a master control chip separates a target feature vector representing a real aging trend of a storage unit from original read data containing random physical noise; the master control chip deduces the target feature vector by using a full integer recursive prediction model to obtain a health state prediction result of the storage unit in a future preset time period; wherein the health state prediction result comprises a best read reference voltage offset and an estimated bit error rate growth curve; and the master control chip adjusts the charge distribution form and the programming voltage parameter of data on the storage unit in the data writing stage according to the health state prediction result. In the above manner, the firmware pipeline blockage and performance jitter problems caused by floating point operation and large model parameter loading can be eliminated in a restricted hardware environment where the master control chip only supports integer operation and the on-chip cache is extremely small.
Owner:深圳华芯星半导体有限公司