The application discloses a high-density NAND storage medium adaptive
repair method, which comprises the following steps: a master control
chip separates a target
feature vector representing a real aging trend of a storage unit from original read data containing random physical
noise; the master control
chip deduces the target
feature vector by using a full integer recursive prediction model to obtain a health
state prediction result of the storage unit in a future preset time period; wherein the health
state prediction result comprises a best read reference
voltage offset and an estimated
bit error rate growth curve; and the master control
chip adjusts the charge distribution form and the
programming voltage parameter of data on the storage unit in the data writing stage according to the health
state prediction result. In the above manner, the
firmware pipeline blockage and performance
jitter problems caused by
floating point operation and
large model parameter loading can be eliminated in a restricted hardware environment where the master control chip only supports integer operation and the on-chip cache is extremely small.