The application provides an adaptive atomic force
microscope (AFM) imaging method based on block
compressed sensing, and comprises the following steps: step S1: a plurality of sub-blocks with the same size are divided on the surface of an AFM sample by using an overlapping block mode; step S2: each sub-block is pre-scanned, a row direction is taken as a
fast scanning direction, a lower left corner is taken as a starting point of pre-scanning, and a pre-scanning sampling rate is calculated; step S3: a BP neural network is used to
train a sample
database, a relationship between a characteristic parameter and a required minimum sampling rate is obtained, and a suitable total sampling rate of each sub-block is adaptively obtained; step S4: a required number of sampling points are randomly selected on the surface of a current sub-block, and adaptive scanning is performed by using a continuous random scanning mode; and step S5: after all sampling points of a sub-block are collected, TVAL3
reconstruction algorithm is combined to perform reconstruction, and finally, all reconstructed sub-blocks are combined together; and the
block effect is eliminated by using the overlapping block mode, so that each sample can obtain high and uniform
imaging quality.