A kit (110) comprising at least one
spectrometer device (112) for obtaining
spectroscopy information about at least one sample (114) and at least one external calibration target (116) wherein the external calibration target (116) has a
reflectivity is disclosed. The
spectrometer device (112) comprises:-at least one
detector (118) for detecting the detection light (120) from the sample (114, 116); -at least one
optical filter (124) configured for passing incident light in at least one selected
wavelength range onto the
detector (118); -at least one
light source (128) configured for emitting illumination light (130) in at least one optical spectral range; -at least one sample interface (134) configured for allowing the illumination light (130) to illuminate a sample (114) held by the sample interface (134) and configured for allowing light from the sample (114, 116) held by the sample interface (134) to propagate via the
optical filter (124) to the
detector (118); -at least one
first light path (136), where the
first light path (136) is configured for allowing the illumination light (130) to propagate via the
optical filter (124) to the detector (118) by at least
one pass through the sample interface (134); -at least one internal calibration target (122), the at least one internal calibration target having a
reflectivity; -at least one second light path (138), where the second light path (138) is configured for allowing the illumination light (130) to propagate via the optical filter (124) to the detector (118) by at least one interaction with the internal calibration target (122); wherein the
spectrometer device (112) is configured for performing at least one initial calibration of the second
optical path (138) by holding the external calibration target (116) as a sample by the sample interface (134), and wherein a
reflectivity of the external calibration target (116) and a reflectivity of the internal calibration target (122) are proportional to each other, where (I), where is a constant. , (I)