The invention discloses a
surface mounting detection
system in
semiconductor packaging, which relates to the field of automatic detection, and comprises a
data acquisition module, a preprocessing module, a
data processing module, a display module, a display module, a display module, a display module, a display module and a display module, and is characterized in that the
data acquisition module acquires temperature information, a morphology image and a reflected light image of the surface of the
semiconductor packaging in real time and simultaneously collects historical data of the
semiconductor packaging; the
system comprises a data preprocessing module for preprocessing collected temperature information, morphology images and reflected light images, a data fusion module for fusing the preprocessed information and images to form a multi-
modal feature vector, a three-dimensional reconstruction module for generating a three-dimensional image of semiconductor packaging through a three-dimensional
reconstruction algorithm and a multi-
modal data set, a defect identification module for identifying defects of the semiconductor packaging, and a detection module for detecting the defects of the semiconductor packaging. And establishing a defect identification model based on the multi-
modal feature vector, and outputting a defect identification result. Through CNN multi-scale analysis, defects under different scales can be captured, the weight of each mode is dynamically adjusted through a self-attention mechanism, it is ensured that a detection strategy can be flexibly adjusted according to the actual situation, and the accuracy and flexibility of defect recognition are improved.