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895 results about "Junction temperature" patented technology

Junction temperature, short for transistor junction temperature, is the highest operating temperature of the actual semiconductor in an electronic device. In operation, it is higher than case temperature and the temperature of the part's exterior. The difference is equal to the amount of heat transferred from the junction to case multiplied by the junction-to-case thermal resistance.

Power management chip high-low side driving signal time sequence optimization method and system

The invention provides a power management chip high-low side driving signal time sequence optimization method and system. The method comprises the following steps: acquiring temperature data of a power management chip under a switch switching transient working condition through an infrared thermal imaging technology, and synchronously acquiring three-dimensional temperature field distribution of junction temperatures on the surface and inside a packaging layer; based on the space continuity of a temperature field, extracting the temperature change characteristics of a power device area, converting the temperature gradient into Seebeck voltage by using a thermoelectric material embedded in a hot spot area, and constructing a dynamic thermoelectric feedback network; according to Seebeck voltage data, a coupling relation between hot carrier concentration and driving signal phase deviation is established, and disturbance of hot carrier mobility change on MOSFET switching delay is quantified; the rising / falling edge slope of the grid voltage is adjusted based on the coupling relation, the phase deviation caused by the hot carrier effect is eliminated through dynamic compensation, and the switching performance is optimized. The dynamic response precision of the power management chip is improved.
Owner:ANHUI YANHUANG TAIXIN TECHNOLOGY CO LTD

Preparation method and system of high-temperature anti-aging test board for chip testing

The invention provides a method and system for preparing a high-temperature anti-aging test board for chip testing, and relates to the technical field of data energy storage and resource scheduling, and the method comprises the steps: designing a schematic circuit diagram and a PCB wiring scheme; a test plate is made of a high-temperature resistant material; bare board verification, electrical performance verification, program setting verification, high temperature verification and junction temperature measurement verification are carried out; using data is recorded, ultrasonic cleaning and drying are carried out, and a performance evaluation model is established through a hardware management system to judge whether maintenance or replacement is needed. According to the invention, the accuracy of chip testing in a high-temperature environment is improved, and the service life of the test board is prolonged.
Owner:XINFENGYANG TECHNOLOGY (SUZHOU) CO LTD

Temperature control and noise reduction method and temperature control and noise reduction system for analog optical module

The invention discloses a temperature control and noise reduction method for an analog optical module, and relates to the technical field of data processing. The method comprises the following steps: collecting and preprocessing an original temperature signal, environment temperature time sequence data and an optical wavelength original detection value of an optical module; improving the LSTM model, constructing a junction temperature dynamic prediction model, and outputting prediction data; a pre-trained BP neural network is utilized to calculate the temperature compensation amount according to the real-time wavelength offset, and a PPO reinforcement learning algorithm is adopted to optimize with the temperature stability, the wavelength offset and the TEC power consumption as multiple targets to obtain an optimal PID parameter mapping table; and finally, predicting, compensating and optimizing parameters are fused, and control output for driving the TEC is generated through a multi-mode intelligent decision. The problems of insufficient control precision and response lag are effectively solved, cooperative high-precision control over the junction temperature and the emission wavelength of the laser is achieved, transmission noise is remarkably reduced, and meanwhile system energy consumption and the self-adaptive capacity are considered.
Owner:SHENZHEN FIBERTOP TECH CO LTD

Elevator inverter fault pre-diagnosis and fault-tolerant control system and method based on digital twinning

The invention relates to the technical field of elevator control and fault diagnosis, and discloses an elevator inverter fault pre-diagnosis and fault-tolerant control system and method based on digital twinning, and the system comprises a high-fidelity digital twinning body building module which is used for building a digital twinning body of an elevator inverter, the digital twin integrates an electric-thermal-stress coupling model, a device-level aging model, a parasitic parameter influence model and a driving circuit and protection logic model; wherein the electric-thermal-stress coupling model is used for simulating loss, junction temperature fluctuation and thermal stress circulation of a power device, and the device-level aging model is used for representing a time-varying degradation rule of device parameters. Through deep fusion of a digital twin technology, fault diagnosis and fault-tolerant control, a closed-loop system of'perception-pre-diagnosis-decision-control 'is constructed, the safety, reliability and economical efficiency of the elevator inverter are comprehensively improved, and the method has important significance in promoting transformation of the elevator industry to intelligent and unmanned maintenance.
Owner:XIANGMAI INTELLIGENT TECHNOLOGY (SHAANXI) CO LTD

CPLD-driven IGBT short-circuit current dynamic monitoring method and system

The invention discloses a CPLD-driven IGBT short-circuit current dynamic monitoring method and system, and relates to the technical field of power electronics, and the method comprises the specific steps of S100 real-time data acquisition, S200 dynamic threshold calculation, S300 short-circuit state judgment, S400 rapid protection execution, and S500 fault data recording and uploading. Accurate and prospective judgment of the short circuit state of the IGBT is achieved, two stress parameters including the direct-current bus voltage and the junction temperature serve as independent variables, when the bus voltage rises, the voltage stress borne by the IGBT in the turn-off period is increased, meanwhile, the current peak at the short circuit moment is more remarkable, early warning is conducted in advance by dynamically lowering the threshold value, and therefore the short circuit state of the IGBT is accurately judged. According to the mechanism, the monitoring system does not simply respond to the occurred overcurrent, but can pre-judge the safety boundary of the device under the current working condition, so that intervention is implemented before the current really reaches a dangerous peak value, and a protection blind area under a severe working condition is effectively avoided.
Owner:INNER MONGOLIA LONGYUAN NEW ENERGY DEV CO LTD

IGBT junction temperature real-time decoupling modeling method and system based on dynamic electric heating compensation

The invention discloses an IGBT junction temperature real-time decoupling modeling method and system based on dynamic electric heating compensation, and relates to the technical field of state monitoring of power electronic devices. At present, junction temperature estimation is not accurate due to IGBT on-state voltage drop measurement distortion and chip internal thermal gradient in a high-voltage environment. The method comprises the following steps: in an offline stage, constructing an ideal electrothermal characteristic database of an IGBT, a dynamic temperature gradient compensation database in a chip and Foster thermal network model parameters; in the on-line stage, synchronous sampling and preprocessing are carried out on IGBT module operation parameters; combining online real-time parameters with an offline database by using an adaptive Kalman filter, and iteratively and cooperatively estimating the real-time junction temperature and loss of the IGBT; and finally, outputting and applying the estimated accurate junction temperature and loss data. According to the technical scheme, the hot spot effect in the chip is accurately decoupled, the junction temperature estimation precision and the robustness of online monitoring are improved, and core data support is provided for fine thermal management and early fault early warning of the flexible direct current converter valve.
Owner:STATE GRID ZHEJIANG ELECTRIC POWER CO LTD ZHOUSHAN POWER SUPPLY CO

Active temperature control method and system for chip aging test machine

The invention relates to the technical field of chip test engineering control, in particular to an active temperature control method and system for a chip aging tester, and the method comprises the steps: analyzing a test process according to test task parameters, and evaluating the expected thermal load change rate of a test chip, so as to dynamically generate a chip target junction temperature control curve; based on the chip target junction temperature control curve, the actual chip junction temperature and the current actual furnace temperature, the theoretical furnace temperature is obtained through a junction temperature closed-loop control algorithm, the furnace temperature compensation amount is calculated through a feedforward compensation algorithm in combination with the test state parameters, and the ideal furnace temperature is obtained according to the theoretical furnace temperature and the furnace temperature compensation amount; the actual temperature control quantity is obtained according to the basic temperature adjusting quantity and the temperature control compensation quantity, a preset chip target junction temperature control curve can be tracked more accurately, transient and steady state errors caused by test program switching and environment fluctuation can be more effectively restrained, and control over the chip junction temperature with higher precision and faster response is achieved.
Owner:SHANGHAI QITAI FENHUA SEMICON TECH CO LTD

High-precision power supply output correction method based on digital pre-distortion technology

The invention discloses a high-precision power supply output correction method based on a digital pre-distortion technology, and relates to the technical field of power electronics, and the method comprises the steps: integrating an electricity-heat-magnetism real-time combined observer, and inputting parameters including a power supply output voltage, a current, a power device junction temperature, a magnetic element surface temperature, an environment temperature, and an input voltage ripple; using a hierarchical memory depth pre-distortion compensator to generate an anti-phase pre-distortion signal containing long time domain thermal constant compensation and short time domain capacitance energy storage compensation based on modeling engine output; based on a double-ring adaptive updating module, an inner ring updates electrical parameters, including on resistance and dead time, by taking a switching period as a reference, and an outer ring updates thermomagnetic parameters, including thermal resistance and a magnetic core saturation point, in a minute-level period; and the DAC is connected in series with a pre-distortion signal output end through an anti-interference execution channel, and comprises a noise shaping DAC and a driving stage for delay matching. According to the invention, through an electric-thermal-magnetic three-field combined observation architecture, the limitation of traditional single physical field monitoring is broken through.
Owner:TAIYUAN YONGMING HENGDONGYUAN ELECTRONICS CO LTD +1

Intelligent calculation method and system for loss of semiconductor device

The invention provides an intelligent calculation method and system for the loss of a semiconductor device, and the method comprises the steps: firstly collecting the operation electrical parameters of the semiconductor device and the temperature parameters of a plurality of temperature measurement points of a surrounding environment in real time, and forming a synchronous operation data set with a timestamp; a parameterized body loss model is established based on a semiconductor physical principle, and a relationship between conduction loss and switching loss along with changes of electrical parameters and junction temperature is described. A parameterized thermal coupling effect model is established according to the physical layout and the heat transfer path of the control cabinet, and a thermal resistance parameter to be identified is used to describe the heat transfer relationship between the device and other heat sources. And identifying and updating model parameters by adopting a parameter identification algorithm and utilizing the synchronous operation data set to obtain a self-adaptive model parameter set reflecting the current working condition and the coupling state. And in combination with the synchronous operation data set and the adaptive model parameter set, a real-time loss value of the semiconductor device is calculated through the body loss model and the thermal coupling effect model, and accurate loss evaluation under the actual working condition is realized.
Owner:WUHAN NEW ENERGY INST OF ACCESS EQUIP & TECH

Chip integrated heat dissipation system and preparation method thereof

The invention relates to a chip integrated heat dissipation system and a preparation method thereof, and belongs to the technical field of heat dissipation of semiconductor devices. The chip integrated heat dissipation system comprises a nano-diamond transition layer attached to a chip. A micro-column array supporting layer is arranged on one side, far away from the chip, of the nano-diamond transition layer; the micro-column array supporting layer is in contact with one surface of the diamond film, and the other surface of the diamond film is attached to the three-dimensional micro-channel heat dissipation layer. The invention also provides a preparation method of the chip integrated heat dissipation system. The chip integrated heat dissipation system provided by the invention has the advantage of efficient heat dissipation, and through the combination of the three-dimensional structure and the high heat conduction characteristic of diamond, the heat dissipation power density is remarkably improved, the junction temperature of the chip is reduced, and the heat dissipation requirement of a high-power device is met. The heat dissipation performance reliability is high, the thermal stress is eliminated through the gradient structure design, the interlayer binding force is improved, and the stable performance is still kept after multiple thermal cycles. And the preparation process is good in compatibility and convenient for large-scale production.
Owner:SHANDONG INSPUR SCI RES INST CO LTD

Intelligent semiconductor chip and thermal management method thereof

The invention provides an intelligent semiconductor chip and a thermal management method thereof, and the method comprises the steps: extracting the gradient features of the interlayer temperature of each semiconductor chip from the temperature information of each barrier layer of a three-dimensional stacked chip in a high-power-consumption module under a current working condition; constructing a temperature coupling field of the high-power-consumption module in the current working condition through each gradient feature and the heat dissipation feature of the packaging layer; a plurality of heat flux concentration areas of the high-power-consumption module in the current working condition are positioned based on the temperature coupling field and the specified sampling frequency, and thermal runaway risk points in the high-power-consumption module are screened out from all the heat flux concentration areas through peak characteristics in junction temperature information of all the heat flux concentration areas; and determining the vector distribution characteristics of the heat flux density in each thermal runaway risk point, and performing layered heat dissipation on the three-dimensional stacked chip in the high-power-consumption module through the vector distribution characteristics of the heat flux density in each thermal runaway risk point. Based on the scheme, thermal field reconstruction of dynamic thermal management in the three-dimensional stacked chip can be realized.
Owner:深圳一睿科技有限公司

LED lamp adaptive speed regulation heat dissipation method and system based on real-time junction temperature monitoring and medium

The invention provides an LED lamp adaptive speed regulation heat dissipation method and system based on real-time junction temperature monitoring. The method comprises the following steps: S100, acquiring a PWM signal or an analog signal of an LED driving command signal in real time; s200, on the basis of the change of the driving instruction signal, feedforward prediction is carried out by using a dynamic thermal inertia mapping model, and a feedforward fan control quantity is generated; s300, LED junction temperature is monitored in real time through a forward voltage method, and feedback fan control quantity is generated through a feedback controller according to the deviation between the real-time junction temperature and the target junction temperature; and S400, synthesizing the feedforward control quantity and the feedback control quantity to generate a fan PWM control signal, outputting the fan PWM control signal to a fan driving circuit, and adjusting the rotating speed of the cooling fan. According to the method, driving signals and junction temperature information are processed in parallel, and feedforward and feedback control is combined, so that self-adaptive accurate regulation and control are realized, thermal load change is quickly responded, system lag is effectively inhibited, and LED heat dissipation performance is optimized.
Owner:YUEYING INNOVATION TECH (GUANGDONG) CO LTD

Active filter harmonic suppression and dynamic compensation system based on IGBT (Insulated Gate Bipolar Translator) multi-mode regulation

The invention relates to the technical field of reactive power compensation of a power system, and discloses an active filter harmonic suppression and dynamic compensation system based on IGBT (Insulated Gate Bipolar Translator) multi-mode regulation and control. The system comprises a control module; the high-frequency harmonic detection module is electrically connected with the control module and is configured to detect a power grid harmonic signal in real time at a sampling rate of 200kHz and transmit the power grid harmonic signal to the control module; the IGBT gate driving compensation circuit is electrically connected with the control module and a preset IGBT module, and the control module dynamically adjusts the dead time and the switching frequency of the IGBT module through the IGBT gate driving compensation circuit; the IGBT junction temperature observer is electrically connected with the IGBT module and the control module and is configured to monitor the junction temperature of the IGBT module in real time and trigger the control module to start a derating protection mechanism when the junction temperature exceeds 125 DEG C; wherein the control module generates a PWM (Pulse Width Modulation) compensation waveform through a model prediction control algorithm unit based on a detection signal of the high-frequency harmonic detection module, so as to drive the IGBT module to execute harmonic compensation through the IGBT gate driving compensation circuit.
Owner:SHENZHEN ZHONGKE XINGRUI ELECTRIC CO LTD

Rapid thermal simulation method and system for semiconductor power assembly

The invention discloses a rapid thermal simulation method and system for a semiconductor power assembly, and relates to the technical field of semiconductors, and the method comprises the steps: collecting a voltage V (t) signal and a current I (t) signal of the semiconductor power assembly in real time through a voltage and current sampling circuit, constructing a power pulse input sequence A, and carrying out the hot carrier accumulation analysis according to the power fluctuation change amplitude; introducing a transient thermal resistance function Zth (t), fitting the transient thermal resistance function Zth (t) with a hot carrier pulse response index Mcx after numerical integration to analyze junction temperature change caused by power pulse, and evaluating an equivalent junction temperature dynamic change rate; when the analysis result is that the thermal drift out-of-control trend exists, thermal risk analysis is carried out, and thermal risk state assessment is generated; the simulation model optimizes thermal model parameters and outputs thermal control suggestions through a rollback correction path, and the working state of the semiconductor power assembly is automatically adjusted. According to the method, real-time monitoring and effective prevention and control of thermal runaway can be realized, and the reliability and safety of the semiconductor power assembly are improved.
Owner:SHENZHEN LEEHOM SCIENCE & TECHNOLOGY DEVELOPMENT CO LTD

LED display screen brightness uniformity correction method and system based on current feedback

The invention discloses an LED display screen brightness uniformity correction method and system based on current feedback, and relates to the technical field of brightness correction.The method comprises the steps that firstly, a vertical blanking period time sequence empty window is utilized, high-low double-amplitude detection current is injected into LED pixels, and voltage responses in different excitation states are obtained on the premise that normal display is not interfered; then, constructing a state decoupling model based on a reference I-V-T characteristic spectrum, and deeply analyzing coupled electrical signals into independent real-time junction temperature and aging factors by using differential sensitivity characteristics of voltage to temperature and aging; and then, on the basis of the physical state parameters, reverse compensation operation is performed in combination with an original gray instruction and a reference L-I brightness model, and target driving current capable of counteracting thermal quenching and aging attenuation is dynamically deduced. In this way, the correction problem caused by deep coupling of temperature drift and device aging can be effectively solved, and therefore self-adaptive high-precision brightness uniformity correction in the full life cycle of the display screen is achieved.
Owner:SHENZHEN G ENERGY TECH CO LTD

Wide-voltage light source intelligent control method integrated with step-down regulation strategy

The invention relates to the technical field of novel illumination, and discloses a wide-voltage light source intelligent control method integrated with a step-down regulation strategy, which comprises the following steps: establishing a mapping table of a voltage interval and a basic compensation slope; indexing a basic slope according to the real-time input voltage; extracting a load voltage direct current component representing the LED junction temperature to generate a thermal drift correction coefficient; dynamically reducing the target slope to match the natural attenuation characteristic of the inductive current; according to the invention, the junction temperature is reversely deduced through the voltage signal, a parameter self-calibration closed loop of a physical level is constructed, the phase margin of a control loop of a whole temperature range is locked under the condition of zero newly-added hardware cost, the problem of dynamic response hysteresis under a high-temperature working condition is solved, and the reliability of the system is improved. And the optical consistency of precise illumination is ensured.
Owner:SHENZHEN LINGBENYANG TECHNICAL CO LTD

Magnetofluid type silicon controlled rectifier radiator and heat dissipation control method thereof

The invention discloses a magnetofluid type silicon controlled rectifier radiator and a heat dissipation control method thereof. The radiator comprises a silicon controlled rectifier, a magnetic fluid chamber is attached to the outer side of the silicon controlled rectifier, the magnetic pole array is installed in the magnetic fluid chamber, and cooling fins are assembled outside the magnetic fluid chamber. When alternating current is introduced into the cavity where the magnetic fluid liquid chamber is located, the alternating current and the magnetic field interact to generate Lorentz force, the Lorentz force drives the magnetic fluid to form directional eddy current so as to achieve convective heat exchange on the silicon controlled rectifier, and heat absorbed by the magnetic fluid and air are subjected to heat exchange through the cooling fins. Junction temperature out-of-control caused by local hot spots of the silicon controlled rectifier can be solved, secondary damage of mechanical vibration of a heat dissipation system to welding spots is eliminated, and the highest junction temperature area of the silicon controlled rectifier is focused and cooled according to needs.
Owner:THREE GORGES JINSHAJIANG CHUANYUN HYDROPOWER DEV CO LTD

Silicon carbide power module packaging structure with low thermal resistance and low stress

The invention discloses a silicon carbide power module packaging structure with low thermal resistance and low stress, and belongs to the technical field of semiconductor devices. The packaging structure comprises a metal substrate; the insulating ceramic layer is arranged on the metal substrate; the circuit layer is arranged on the insulating ceramic layer; the lower surface of the silicon carbide chip is connected with the circuit layer through a first interface layer; the composite heat dissipation stress buffer layer is arranged on the upper surface of the silicon carbide chip through a second interface layer; the copper clamp is connected with the upper surface of the composite heat dissipation stress buffer layer through a third interface layer; and the composite heat dissipation stress buffer layer is made of a copper-graphite composite material. According to the invention, the junction temperature of the silicon carbide chip can be greatly reduced, the overall thermal resistance is reduced, the surface stress of the chip is reduced, the warping phenomenon of the chip in the working process is effectively improved, and the long-life reliability of the power module under the long-term thermal cycle working condition is ensured.
Owner:SHANDONG UNIV

Network construction transient control method and device for string type network construction type energy storage converter

The invention provides a network construction transient control method for a string type network construction type energy storage converter, which comprises the following steps of: identifying a power grid control instruction, and issuing a network construction operation control instruction and selecting a network construction type after judging a network construction requirement; in response to the networking operation control instruction, starting a thermal management system and executing a function screening control strategy; on the basis of the real-time electrical parameters and thermal parameters acquired by the information acquisition system, network construction over-temperature prediction is executed, and predicted junction temperature and predicted loss under the network construction working condition are obtained; according to the result of the network construction over-temperature prediction, whether network construction operation parameters need to be optimized is judged, if yes, a parameter optimization control instruction is generated, and if not, network construction function operation monitoring is started; and on the basis of the parameter optimization control instruction, virtual impedance is adjusted to reduce the output voltage and the output current of the converter so as to control the loss and the junction temperature, and the adjustment of the virtual impedance is calculated based on the difference value between the predicted junction temperature and the threshold junction temperature.
Owner:SHENZHEN SINEXCEL ELECTRIC

Silicon carbide power module with low stray inductance and double-sided heat dissipation

The invention discloses a novel ultra-low stray inductance and double-sided heat dissipation silicon carbide power module. The novel ultra-low stray inductance and double-sided heat dissipation silicon carbide power module comprises a power module assembly, a plastic package body and a double-sided heat dissipation assembly, the power module assembly is formed by connecting a lower bridge assembly and an upper bridge assembly which are oppositely and symmetrically arranged through a molybdenum block. During working, stray inductance in the upper bridge arm and stray inductance in the lower bridge arm are counteracted, and the stray inductance of the whole module is reduced. The power module assembly is divided into an upper layer heat dissipation water channel and a lower layer heat dissipation water channel through the two double-sided heat dissipation assemblies, so that the contact area between cooling liquid and the module is doubled, the heat dissipation capacity of the module is improved, the maximum junction temperature of the silicon carbide module is effectively reduced, and the working efficiency of the silicon carbide module is improved. The heat dissipation columns which are small in area and are distributed more densely are arranged at the bottom of the high-heat chip, the heat dissipation columns which are large in area and small in number are arranged in the low-heat area, the heat dissipation columns are reasonably arranged according to the arrangement of the chip, the situation that the overall heat exchange efficiency is affected due to excessive temperature rise of local cooling liquid is avoided, and therefore the overall heat dissipation effect is guaranteed.
Owner:ZHEJIANG CUIZHAN MICROELECTRONICS CO LTD

Color calibration processing method and electronic equipment

The invention provides a color calibration processing method and electronic equipment. The method comprises the following steps: acquiring primary color information of light-emitting equipment; determining the theoretical brightness of each channel corresponding to the target color; determining the current duty ratio of each channel under the current junction temperature according to the current junction temperature, the reference junction temperature brightness of each channel and the theoretical brightness of each channel corresponding to the target color, and obtaining a color mixing output result; determining new reference junction temperature brightness of each channel and junction temperature offset of each channel; obtaining a new maximum brightness and a new current duty ratio of each channel under the current junction temperature, and lightening the light-emitting device again based on each new current duty ratio to obtain a new color mixing output result; and if the new color mixing output result meets the preset error range, taking the junction temperature offset of each channel as the calibration junction temperature offset of each channel of the light-emitting equipment, and taking the new reference junction temperature brightness of each channel as the calibration reference junction temperature brightness of each channel. And the color mixing precision of the light-emitting equipment in the whole working temperature range is improved.
Owner:NINGBO PREH JOYSON AUTOMOTIVE ELECTRONICS

Multi-string battery pack voltage acquisition and protection linkage method and device and computer equipment

The invention relates to the technical field of battery pack linkage, and discloses a multi-string battery pack voltage collection and protection linkage method and device and computer equipment, and the method comprises the steps: carrying out the data collection of each series unit in a multi-string battery pack, and obtaining basic monitoring data; performing junction temperature calculation on power loss and thermal resistance characteristics of the MOSFET devices in each series unit to obtain real-time junction temperature data; carrying out oscillation frequency detection on the grid voltage change of the MOSFET device in each series unit to obtain grid oscillation frequency data, and carrying out thermal resistance oscillation coupling detection to obtain a dynamic protection threshold parameter; performing temperature compensation and cross interference elimination on the voltage acquisition channel of each series unit to obtain target voltage data; according to the anti-oscillation locking protection method, the problem that the MOSFET fails due to overheating is effectively prevented, the coordinated protection among the series units is ensured, and the influence of single-point failure on the whole battery pack is avoided.
Owner:SHENZHEN SHANGHUI POWER TECHNOLOGY CO LTD

Graphene integrated electrode LED epitaxial structure and chip preparation method

ActiveCN121174739AQuantum wellOhmic contact
The invention discloses a graphene integrated electrode LED epitaxial structure and a chip preparation method. The epitaxial structure sequentially comprises a GaAs substrate, an n-type GaAs buffer layer, an n-type limiting layer, a non-doped quantum well structure, a p-type spacer layer, a p-type electron barrier layer and a p-type GaP ohmic contact layer from bottom to top. The preparation method comprises the steps of epitaxial structure growth, p-type ITO transparent conductive layer preparation, bonding and substrate removal, mesa structure preparation, passivation isolation, graphene interconnection layer preparation and n-type electrode preparation. Graphene is used for replacing a traditional n-type GaAs ohmic contact layer and an ITO electrode, the problems of poor red light absorption, poor heat dissipation and mechanical brittleness of a traditional structure are solved, the red light transmittance of the chip is improved, the junction temperature under 3 currents is greatly reduced, the chip can bear tensile strain larger than 20%, the chip is suitable for flexible scenes, and the chip is suitable for high-performance large-scale production of red light Micro LEDs.
Owner:WEIJIU (SUZHOU) OPTOELECTRONICS TECHNOLOGY CO LTD

Photovoltaic inverter heat dissipation adjustment control system

The invention relates to the technical field of power electronics, in particular to a photovoltaic inverter heat dissipation adjustment control system. Comprising a multi-mode state prediction module which is used for receiving environment data collected in real time and historical working state data of an inverter and predicting predicted junction temperatures in one or more time steps in the future; the collaborative optimization decision module is used for receiving the predicted junction temperature and obtaining an optimal control parameter combination and an expected steady-state junction temperature; the feed-forward control execution module is used for receiving the optimal control parameter combination and setting the optimal fan rotating speed in the optimal control parameter combination as a reference set value of the cooling system rotating speed controller; the feedback correction module is used for obtaining a fan rotating speed correction value; and the instruction synthesizing and sending module is used for sending the final target rotating speed instruction to a bottom-layer speed controller of the fan. According to the system, the problems of temperature overshoot and frequent start and stop of a heat dissipation system caused by traditional passive response type control are avoided, and the stability of system operation is improved.
Owner:厦门海索科技有限公司

IGBT module junction temperature estimation method and system

The invention relates to an IGBT module junction temperature estimation method and system, and the method comprises the following steps: obtaining a performance curve set of an IGBT module under different working conditions, and carrying out the fitting optimization, and obtaining an optimal performance curve set; constructing a transient thermal resistance curve model according to a transient thermal resistance principle, and constructing a second-order Foster thermal network model based on the transient thermal resistance curve model; performing Laplace transformation and discretization processing based on a backward difference method on the second-order Foster thermal network model to obtain a junction temperature estimation model; collecting a phase current instantaneous value, and calculating the total power loss of the IGBT module in real time in combination with the optimal performance curve set; and finally, the junction temperature of the IGBT module is obtained in real time by using the total power loss of the IGBT module obtained through real-time calculation and the junction temperature estimation model, and junction temperature estimation is completed. According to the method, the effect of improving the power loss precision of the IGBT module is achieved by optimizing the performance curve, and then the junction temperature estimation precision is improved.
Owner:GUANGDONG UNIV OF TECH

Packaging substrate with temperature detection function, power semiconductor module and manufacturing method thereof

The invention discloses a packaging substrate with a temperature detection function, a power semiconductor module and a manufacturing method thereof, and the packaging substrate with the temperature detection function comprises an integrated ceramic insulating layer which is provided with a first surface and a second surface which are opposite to each other; the temperature sensor comprises a ceramic insulating layer, a sensor mounting groove, an independent temperature sensor chip, an insulating filling body and a three-dimensional interconnection structure, and is configured to lead an electric signal of the temperature sensor chip to an external bonding pad on the second surface or the side surface of the ceramic insulating layer, the packaging substrate has the advantages that high-precision and quick response measurement of junction temperature of a power chip can be achieved, temperature rise decoupling deviation is eliminated, excellent high-voltage electrical isolation reliability is ensured while direct thermal coupling is achieved, the dielectric breakdown risk is avoided, the manufacturing method is flexible, the reliability of a power semiconductor module is improved, and the manufacturing cost is reduced. The comprehensive cost is reduced, and the long-term stability of temperature monitoring can be ensured while the rapid and accurate electrothermal response characteristic of the sensing unit is ensured.
Owner:WEIHAI XINJIA ELECTRONICS

Converter power device junction temperature real-time estimation method

The invention belongs to the technical field of junction temperature measurement of converter power electronic devices, and particularly relates to a converter power device junction temperature real-time estimation method. In order to overcome one or more defects of insufficient measurement precision, repeated parameter adjustment and incapability of adapting to system parameter changes of an existing junction temperature prediction method, the invention adopts the following technical scheme: the converter power device junction temperature real-time estimation method comprises the following steps: obtaining device loss at a current sampling moment according to real-time operation parameters, and obtaining shell temperature information; as the input of an adaptive Kalman filter, the adaptive Kalman filter obtains an estimated junction temperature according to a thermal impedance model prediction method and device loss, and the adaptive Kalman filter also performs adaptive estimation on a measurement noise covariance matrix and a process noise covariance matrix; and the estimated junction temperature of the model is fed back and corrected in real time in combination with the measured junction temperature. The method has the advantages that the Kalman filter is improved in a self-adaptive mode, and the adaptability to system operation parameter changes is enhanced.
Owner:ELECTRIC POWER RES INST OF STATE GRID ZHEJIANG ELECTRIC POWER COMAPNY

Heat dissipation enhancement type semiconductor packaging method

The invention discloses a heat dissipation enhanced semiconductor packaging method, which comprises the following steps of: performing deep silicon etching to form a vertical through hole; insulation and metallization are carried out; thinning the wafer; performing hybrid bonding and stacking of multiple layers of chips; a heat dissipation design is adopted to form a vertical heat dissipation path; a three-dimensional thermal through hole network: adding pure copper thermal through holes in a non-functional area; performing microfluid cooling integration; molding and packaging; and thermal performance verification: verifying that the junction temperature can be controlled within 85 DEG C through infrared thermal imaging and finite element simulation. The TSV with the depth-to-width ratio of 10: 1 can be realized by adopting the Bosch process; a three-dimensional integrated TSV array supporting HBM and other high-speed memories is embedded into diamond or graphene heat dissipation columns, a low-heat-resistance vertical heat dissipation path is formed by combining a three-dimensional pure copper heat through hole network, and local hot spots are effectively dispersed; the high-thermal-conductivity epoxy molding compound and the embedded copper block enhance the overall mechanical strength and thermal diffusivity, so that the product can dissipate heat efficiently, and the overall area is not easy to influence.
Owner:JIANGSU PANGU SEMICONDUCTOR TECHNOLOGY CO LTD

Online estimation method and system for junction temperature of crimping IGBT half-bridge module

The invention belongs to the field of crimping IGBT junction temperature estimation, and particularly discloses a crimping IGBT half-bridge module junction temperature online estimation method and system, and the method comprises the steps: carrying out the decoupling of a double-side thermal network model based on a multi-heat-flow path of a crimping IGBT half-bridge module, and achieving the junction temperature estimation of the crimping IGBT half-bridge module; wherein the establishment method of the double-sided thermal network model comprises the step of constructing the double-sided thermal network model based on the double-sided junction-to-case thermal resistance, the water-cooled radiator thermal resistance, the circulating water equivalent thermal resistance and the coupling thermal resistance of the crimping IGBT half-bridge module by taking the water inlet temperature of the water-cooled radiator as the reference temperature and combining the power loss of each crimping IGBT in the crimping IGBT half-bridge module. The method has research value and application prospect for junction temperature estimation and reliability evaluation of the converter valve crimping IGBT.
Owner:HUAZHONG UNIV OF SCI & TECH

Online monitoring system adaptive to recycling scene of SiC power device

The invention relates to the field of rail transit, and discloses an online monitoring system adapted to a SiC power device recycling scene, and the system comprises the steps: collecting key operation parameters of a SiC power device in real time, and when the collected parameters exceed a preset warning threshold value, judging whether the subsequent failure trend prediction needs to be carried out or not; constructing a device performance change curve based on the collected operation parameters, analyzing the curve type and the fluctuation trend, judging whether the device has a potential failure risk or not, and judging whether key monitoring or load regulation and control need to be performed on a specific module or not by combining the parallel operation state of the device and a historical abnormal fluctuation event; the influence degree of the potential failure trend is determined by analyzing the relevance among on-resistance sudden change, junction temperature fluctuation, welding layer cavity expansion and bonding interface aging, and according to the influence degree of the potential failure trend and a warning threshold value, an online early warning signal is output and a regulation and control instruction is executed. The method has the advantage of finding the potential failure trend in advance.
Owner:JIANGSU SAILI KEBO SEMICONDUCTOR CO LTD