The invention relates to the field of test and analysis of
impurity element content of primary
magnesium ingots, in particular to a method for testing
impurity element content of primary
magnesium ingots by ICP (
inductively coupled plasma) spectrometry, which comprises the following steps: firstly adding H2O2 into a
magnesium ingot sample to infiltrate the sample, then adding HCl at an interval of less than 1 minute to carry out first reaction, carrying out first heating after the reaction is finished, and then carrying out second heating, cooling to 20-30 DEG C, transferring to a
volumetric flask, and fixing the volume by using third-level water to obtain a sample solution; establishing a working curve by using an ICP
spectrometer and a
standard solution; testing the sample solution; the ratio of the
mass of the magnesium
ingot sample to the volume of H2O2 to the volume of HCl is 1: (3-10): (30-54), the method fills the standard vacancy of ICP spectrometry analysis of the
silicon element in the primary magnesium
ingot, a reliable basis is provided for chemical
component analysis of the primary magnesium ingot, the test result is surface, and the method for testing the
mass fraction of the
impurity elements in the primary magnesium ingot provided by the invention has the advantages of high analysis precision, simple operation, high accuracy and high reliability. The analysis period is short, and related chemical varieties are few.