The invention relates to the technical field of IGBT (Insulated Gate Bipolar Translator) structures, and discloses a soft-recoverable IGBT structure, which comprises an MOS (
Metal Oxide Semiconductor) gate structure positioned on the front surface of a device, a
diode anode structure, an n drift layer for bearing the withstand
voltage of the device, and a field stop layer positioned below the n drift layer and used for optimizing an internal
electric field of the device, a gradually-doped n-type adjusting layer, an IGBT part, a
diode part, a p-type collector region and an n-type
cathode region are arranged between the n drift layer and the field stop layer, the IGBT part and the
diode part are arranged in anti-parallel, the p-type collector region is located on the back surface of the device and serves as the IGBT part, and the n-type
cathode region is located on the back surface of the device and serves as the diode part. By introducing the n-type adjusting layer, excellent soft
recovery characteristic and dynamic robustness are realized, low overall loss is maintained, and the device has strong
recovery capability under extreme conditions (high VCC, high
forward current and high temperature). And the tradeoff and tradeoff triangular relationship limitation among the traditional total loss,
reverse recovery softness and diode (FWD)
recovery safety working area is broken through.