The present invention provides a
photodetector that can accurately and easily position a sample at the focal point of a predetermined measurement light. [Solution] The
photodetector 100 includes a
photodetector having an
electron emission unit 3 including a metasurface 32 that emits electrons in response to the incidence of electromagnetic
waves W, and an
electron multiplication unit 4 that multiplies the electrons emitted from the
electron emission unit 3, and a
voltage application unit 2 that applies a
voltage to an object to be applied to, which includes at least one of the metasurface 32 and the
electron multiplication unit 4. The
voltage application unit 2 applies a voltage to the object to be applied to such that the potential on the metasurface side of the
electron multiplication unit 4 is less than or equal to the potential of the metasurface 32, so as to allow first electrons, which are field-emitted in response to the incidence of electromagnetic
waves W to the metasurface 32, to reach the
electron multiplication unit 4, while preventing second electrons, which are generated due to factors other than the incidence of electromagnetic
waves W to the metasurface 32, from reaching the electron multiplication unit 4.