278 results about "Plane of incidence" patented technology

An atomic magnetometer includes a cell containing an atomic group, a pump light source, a probe light source, a mirror, and a detector. The cell is disposed between the pump light source and the mirror and between the probe light source and the detector. A pump beam emitted from the pump light source is circularly polarized light. The pump beam passes through the cell and is reflected by the mirror and then passes through the cell again. The probe beam emitted from the probe light source is linearly polarized light. An optical path of the probe beam is parallel to the plane of incidence of the pump beam and is also parallel to the surface of the mirror. The optical path of the probe beam crosses the optical path of the pump beam in the cell. The probe beam which has passed through the cell enters the detector.

A sensor and method for determining the optical properties of a sample material is disclosed. The sensor comprises a light source that generates a linearly polarized light beam having a predetermined polarization orientation with respect to the plane of incidence. The linearly polarized light beam is reflected off the sample and is split into second and third light beams where the second and third light beam consist of the combined projections of mutually orthogonal components of the first light beam. A signal processor measures the intensity difference between the second and third light beams to calculate the phase difference induced by the sample material.

In one embodiment, a system to inspect a surface comprises an assembly to direct a first radiation beam onto a surface in a first plane of incidence, a first detector to generate a first signal from a portion of the radiation reflected from the first radiation beam, a first spatial filter interposed between the surface and the first detector, a first ellipsoidal mirror to collect scattered light, a second detector to generate a second signal from the scattered portion of the beam, and a processor to generate, from the first and second signals, a data set representing one or more characteristics of the surface using the first and second signals.

An optical device with a first incidence plane configured to enter rays coming from a first direction, a second incidence plane configured to enter rays coming from a second direction different from the first direction, the rays which entered the first incidence plane being reflected by the second incidence plane, the rays which entered the second incidence plane being reflected by the first incidence plane, and an emission plane configured to mix the rays reflected by the first and second incidence planes and to emit the mixed rays in a predetermined direction different from the first and second directions.

A focusing lens for an LED, which concentrates light emitted from the LED so as to have directionality parallel to an optic axis, comprises: a transparent body; a first lens part formed in the body; and a second lens part covering the first lens part, and wherein the first lens part comprises: a first and second aspheric lens surfaces which are convex with different sizes and form on plat surfaces symmetric with each other. The second lens comprises a plane of incidence formed to protrude from an outer circumference of the first aspheric lens surface, the plane of incidence into which the LED is inserted and which is configured to allow the light emitted from the LED to be incident and refracted; a plane of reflection formed to have a convex curved surface which extend and slopes to be progressive wider from the plane of incidence towards the second aspheric lens surface, the plane of reflection which is configured to allow the light emitted from the LED to be totally reflected; and a plane of emission formed to have a concave curved surface which extends and slopes from the plane of reflection towards the second aspheric lens surface, the plane of emission which is configured to allow the light emitted from the LED to be refracted and emitted as light being parallel to the optic axis.

Systems and methods for inspecting an edge of a specimen are provided. One system includes an illumination subsystem configured to direct light to the edge of the specimen at an oblique angle of incidence. The plane of incidence of the light is substantially perpendicular to a plane substantially tangent to the edge of the specimen. The system also includes a detection subsystem configured to collect light scattered from the edge and to generate signals responsive to the scattered light. One method includes directing light to the edge of the specimen at an oblique angle of incidence. The plane of incidence is substantially perpendicular to a plane substantially tangent to the edge of the specimen. The method also includes collecting light scattered from the edge and generating signals responsive to the scattered light. The signals described above can be used to detect defects on the edge of the specimen.