278 results about "Focused beams" patented technology

A laser leveling assembly includes a level to indicate level along a variety of planes for a worker. A pair of first laser emitters is integrated into opposing ends of the level to emit a focused beam of light outwardly from the level onto a surface. A pair of clamps is provided which each has a first gripping element and a second gripping element. The first gripping element associated with each of the pair of clamps receives the level for attaching the pair of clamps to the level to receive a support object thereby facilitating the level to be affixed to the support object. A pair of second laser emitters is each integrated into a respective one of the pair of clamps to emit a focused beam of light outwardly from the respective clamp onto the surface for assisting the worker with visually identifying a level mark on the surface.

The invention belongs to the technical field of oil stain detection, and particularly relates to a water surface oil stain detection method, system and equipment, the water surface oil stain detection system comprises a flexible circuit board FPC, an InGaAs infrared sensor, an infrared narrow-band filter and an optical lens, light enters a visible light camera and the optical lens through an external lens, the visible light camera collects visible light images, and the visible light images are transmitted to the InGaAs infrared sensor; the optical lens focuses a light beam, then light with a specific wavelength is screened out through the near-infrared narrow-band filter, the screened light is received by the InGaAs infrared sensor, and the InGaAs infrared sensor is connected with the FPC; the method has the advantages that visible light imaging and short wave infrared spectrum analysis technologies are ingeniously fused, so that the accuracy and the reliability of oil stain detection are remarkably improved. Under the current background that environmental protection and water resource management are increasingly severe, powerful technical support is undoubtedly provided for water surface pollution monitoring.

The invention discloses a diffuse transmission spectrum nondestructive testing method and a portable device for large thick-peel melons and fruits, belongs to the field of nondestructive testing of fruit quality, and provides a real-time and portable internal quality nondestructive testing method and device suitable for the large thick-peel melons and fruits. The system comprises a camera obscura, a shading sucker, an annular shading sponge, a light source module, a spectrum detection module, a collimating lens, an optical fiber, a Raspberry Pi controller and a touch screen. During working, the halogen light source emits a focused light beam to penetrate through melons and fruits, the focused light beam is converted into an electric signal by the spectrum detection module after being scattered and transmitted, and the Raspberry Pi analyzes in real time to obtain and display indexes such as hardness, pH, soluble solids and the like. A 220V industrial power supply is adopted to drive a high-power light source, a cooling fan and a shading sucker structure are combined to reduce environmental interference, and an annular shading sponge ensures that a light path is closed. An integrated portable device of a high-power light source is realized, and the device can be used for on-site rapid nondestructive detection of key quality indexes of large thick-peel melons and fruits such as Hami melons and the like.

A laser machining system comprises a laser generator (202) producing ultrafast laser pulses, a galvanometric scanner mirror (102, 204) for precision deflection of the laser beam (101), and a main unit (100) comprising a folded optical system with focusing optics (207, 210, 212, 214) capable of delivering the laser beam focused waist onto the surface of a elongated thin workpiece (103), for example, cylindrically-shaped, or having quadrilateral or mullitlateral or elliptic perpendicular cross-section. The main unit (100) is attached directly to the scanning mirror subsystem (102) and they both comprise the optical path, which is separated into several, e.g., four, equal paths terminating on the workpiece (103) surface from orthogonal directions covering the workpiece from opposite sides. The optical path in the main unit (100) is arranged in such a way that the paraxial optical mode remains valid at all reflecting mirrors, mitigating the optical aberrations of the focused beam onto the surface of the workpiece (103). With controlled deflection of the scanner mirror (204), the laser beam can access the full area of the outer surface of the workpiece (103) and process the workpiece (103) using controlled laser ablation or surface treatment using direct laser writing (DLW). The workpiece (103) is mounted into a translation stage perpendicularly to the laser beam, allowing free-form laser processing onto a cylindrically- or multilaterally-round elongated shape, by synchronized deflection (204) of the laser beam, and longitudinal translation of the workpiece (103) by the translation stage.

Disclosed systems and techniques are directed to interferometry-based sample thickness metrology in manufacturing systems. For example, the disclosed techniques include directing a focused beam to a plurality of locations of a sample and detecting an interference pattern (IP) associated with a light departing from the respective location and generated upon interaction of the focused beam with the sample. The techniques further include determining, based on a first IP associated with a first light departing from a first location and a second IP associated with a second light departing from a second location, a magnitude and a sign of a difference between a first thickness of the sample at the first location and a second thickness of the sample at the second location.

The invention discloses a method for solving powder collapse in the electron beam printing process, and relates to the technical field of additive manufacturing. Comprising the following steps that firstly, a vacuum bin is vacuumized; step 2, repeatedly preheating the substrate in the forming area by using an electronic gun; step 3, spreading the powder on the heated substrate; 4, continuously heating the graphite plate; fifthly, the powder layer is subjected to secondary preheating through the electron gun; and sixthly, selective forming is conducted on the powder layer in the false sintering state through the focused beam till printing of the current layer is finished, and then the actions of powder laying, graphite plate heating, preheating and selective forming are conducted after one layer descends. According to the method for solving powder collapse in the electron beam printing process, the vacuum heat radiation principle is used for indirectly heating the powder layer, the risk that cold powder particles make direct contact with electron beams in the printing process is completely avoided, and the powder blowing defect is completely eradicated.

The invention discloses a high-beam-quality 193nm ultraviolet laser generating device, and relates to the technical field of laser electronics. The device comprises a 1064nm picosecond pumping laser source and a 2053nm picosecond laser source which are used for generating pumping laser; the frequency doubling crystal, the frequency quadruplicating crystal, the 213nm sum frequency crystal and the 193nm sum frequency crystal are used for nonlinear frequency conversion; the temperature control device is used for controlling the temperature of the crystal; the dichroic mirror is used for separating the laser; the cylindrical mirror is used for beam shaping; and a lens for focusing the light beam. According to the device, a 1064nm light source is used for performing quadruplicated frequency to obtain 213nm laser, and the obtained 213nm laser and 2053nm laser are input into a nonlinear frequency conversion module to obtain 193nm laser. The device ensures high power of laser output, has good stability and excellent light beam quality, is simple in structure, and is suitable for the fields of photoetching, spectroscopy, medicine and the like.

An optoelectronic apparatus includes an array of emitters configured to emit beams of optical radiation. Refractive optics focus the emitted beams with a first optical power. An optical metasurface splits the focused beams to form a pattern of spots and applies a vergence to the spots with a second optical power so as to project the pattern of spots toward a target.

Anti-deviation intelligent welding equipment for metal parts belongs to the technical field of metal part welding and comprises a base, a fixing plate and a metal pipe body, supporting frames are symmetrically and fixedly connected to the top of the base at equal intervals, and supporting rings are rotationally connected to the sides, close to each other, of the two supporting frames in each set. During welding, a laser head focuses a light beam to heat and melt a seam to form a molten pool, metallurgical bonding is achieved, aiming at an annular seam, the laser head synchronously moves along with rotation of a pipe body, parameters are adjusted to guarantee welding seam forming, meanwhile, a welding path is formed through a symmetrical attaching rod and a fixing cylinder, the laser head dynamically moves, and the welding position is kept at the center of the seam; and the rotating handle can be rotated to drive the scraping plate to scrape an oxide layer and burrs on the surface of the joint, laser energy waste is avoided, efficiency is guaranteed, in addition, the protruding block is matched with the reciprocating rod, the air blowing cylinder cleans dust and residues on the joint, and welding quality and cleaning efficiency are guaranteed.

The invention discloses an ultra-long depth-of-field reflective scanning super-resolution optical microscopic system and method. The system comprises a sample displacement module, an optical microscopic imaging module, an annular focusing light beam generation module, a light beam scanning module, a super-resolution focusing illumination and collection module, a super-resolution optical imaging module and a computer. By utilizing the advantages of annular focusing light beam illumination, high focusing efficiency of a traditional objective lens and high light beam scanning speed, efficient super-long-focal-depth super-resolution focusing illumination is realized, and then quick super-long-depth-of-field super-resolution optical microscopic imaging can be realized by adopting a traditional optical lens. The method can be applied to non-labeled super-resolution microscopic rapid imaging of biological samples, and can also be applied to the fields of industrial related super-resolution microscopic detection and the like.

A sliding cover for a liquid delivery device, such as a cap (100) for a pen injector (200), incorporates a set of sensors including an optical sensor (110) with an output which changes during uncapping or capping motions on passing of a plunger (220) of the pen injector. This output is used together with a position sensor (120) to determine the position of the plunger along a cylinder (210) of the liquid delivery device. By monitoring changes in the plunger position, the quantity of dosages delivered by the liquid delivery device can be determined, displayed, stored and / or transmitted to an external device for further data processing or storage. Preferred implementations of the invention employ optical sensors with a converging beam (115), and / or position sensors employing linear potentiometer strips (132).

A method of producing cytopathologic cell samples, the method including insonating a target tissue by ultrasound energy with a focused beam at that generates shear waves within the tissue. A method of producing cytopathologic cell samples, the method including insonating a target tissue by ultrasound energy at a first intensity level during a first period, insonating the target tissue by ultrasound energy at a second intensity level during a second period, wherein the first intensity level is higher than the second intensity level. Related apparatus and methods are also described.

The invention relates to the technical field of laser, and discloses a high-power infrared spatial optical fiber coupling device and method, and the device comprises a light beam stabilizing system, a power adjusting unit, a core coupling light path, and an optical fiber fixing unit. The light beam stabilizing system is used for carrying out pointing stabilization and collimation processing on the incident high-power infrared space light; the power adjusting unit is arranged on the light output side of the light beam stabilizing system, the light input end of the power adjusting unit corresponds to the light output end of the light beam stabilizing system, and the power adjusting unit is used for receiving the stabilized light beam output by the light beam stabilizing system and adjusting the laser power entering the core coupling light path; the core coupling light path is used for accurately focusing the stabilized light beam to the end face of the optical fiber; the optical fiber fixing unit is arranged on the output end side of the core coupling light path and used for stably clamping an optical fiber and enabling the end face of the optical fiber to be located at a focusing light spot; the optical fiber fixing unit is arranged on the light output side of the core coupling light path and used for clamping the optical fiber to be coupled so as to receive the focused light beam output by the core coupling light path.

The invention discloses a visual inspection image acquisition device for a lens module, and relates to the technical field of visual inspection systems. The lens module visual inspection image acquisition device comprises a beam splitter prism, a condensation irradiation module, an annular irradiation module and a camera module, wherein the camera module is used for photographing the lens module; the annular irradiation module is arranged between the camera module and the lens module, and the annular irradiation module generates irradiation light; the beam splitter prism is arranged between the camera module and the annular irradiation module; the condensation irradiation module generates a focusing light beam; the focused light beam is emitted to the lens module after passing through the beam splitter prism, the irradiation light is emitted to the lens module, the lens module reflects the irradiation light and the focused light beam, and the reflected irradiation light and focused light beam are emitted to the camera module after passing through the beam splitter prism. According to the lens module visual inspection image acquisition device provided by the invention, visual inspection image acquisition of the lens module can be completed at one time, and the detection efficiency is improved.

The invention discloses a reflective scanning super-resolution optical microscopy system and method based on light cone illumination. The system comprises a sample displacement module, an optical microscopy imaging module, an annular focusing light beam generation module, a light beam scanning module, a super-resolution focusing illumination and collection module, a super-resolution optical imaging module and a computer. By utilizing the advantages of annular focusing light beam illumination, high focusing efficiency of a traditional lens and high light beam scanning speed, high-efficiency long-focal-depth super-resolution focusing illumination is realized, and rapid super-resolution optical microscopic imaging can be realized by adopting a traditional optical lens; non-marking far-field super-resolution two-dimensional microscopic rapid imaging is realized through two-dimensional light beam scanning; non-label far-field super-resolution two-dimensional microscopic imaging is carried out on samples at different axial positions, super-resolution two-dimensional microscopic imaging of different cross sections of the samples is obtained, and then three-dimensional chromatography is achieved. The method can be applied to non-labeled super-resolution microscopic rapid imaging of biological samples, and can also be applied to the fields of industrial related super-resolution microscopic detection and the like.

The invention provides a measurement system, method, device and equipment, a medium and a product, and belongs to the technical field of optics. The system comprises a beam expander used for generating a first transmission light beam and a first reflection light beam when a light beam after beam expansion reaches a tested sample at a first preset position; a beam compressor; the receiver is positioned at a first position and is used for receiving the first transmission light beam to generate a first interferogram of the detected sample; the receiver is positioned at a second position and is used for receiving the first reflected light beam to generate a second interferogram of the detected sample; the first microscope objective is used for generating a second transmission light beam and a second reflection light beam by enabling the focused light beam to reach a detected sample at a second preset position; a second microscope objective; the receiver is positioned at a third position and is used for receiving the second transmission light beam to generate a third interference pattern of the detected sample; and the receiver at the second position is also used for receiving the second reflected light beam to generate a fourth interferogram of the tested sample.

The invention provides an optical system calibration method and system, and the method comprises the steps: carrying out the focal plane calibration through detecting the position of a focusing beam segment focus of a focus adjustment assembly on an optical axis under different combined focal lengths under the condition that the incident light of the focus adjustment assembly is parallel light; and under the condition that the focal plane calibration is completed, the light spot size is calibrated through the light spot adjusting assembly. According to the invention, by providing a mode of combining the light spot adjusting assembly with the focus adjusting assembly to adjust the light spot size and the focus, equal-proportion adjustment of the light spots in a certain size range of the focal plane is realized, and the precision of the light spots is improved while the consistency of the focal plane under different combined focal lengths of the focus adjusting assembly is realized; and the optical system can meet the high-precision requirement occasion. Besides, a sectional calibration mode is adopted, so that the problems of incapability of finding a focal plane position by a light spot adjusting assembly and difficulty in correction caused by superposition of a plurality of variables in integrated correction of the whole set of light path system can be avoided, and the calibration difficulty is reduced.

An EUV microscope apparatus utilizing a source of EUV light. The light is sent to a collector which creates a first focused EUV beam. A monochromator module receives the first focused EUV beam and produces a second focused EUV beam that is passed to an illumination module. The output of the illumination module is reflected off a mask. The reflected beam from the mask is sent to a zone-plate and a detector to produce an image.

A laser scribing method for perovskite thin-film solar cells is provided, in which a linearly polarized Gaussian beam is emitted by a laser, and converted into a circularly polarized beam through a quarter-wave plate. The circularly polarized beam is expanded to a target diameter by a beam expander system to obtain a target expanded beam. The target expanded beam is adjusted by an optical path adjustment system to enter a diffractive optical element (DOE) shaping module for beam shaping to obtain a shaped beam. The shaped beam is focused by an optical focusing module to obtain a focused beam with the focus on a surface film of a to-be-processed product, and the to-be-processed product is moved such that a groove is scribed thereon. A laser scribing device is also provided.

A battery cell inspection system and method are disclosed. The system performs an ultrasound interrogation session of a cell by directing ultrasound at different frequencies at target points across surfaces of the cell, detecting ultrasound at the target points that is transmitted through and / or reflected from the cell, generating response signals from the detected ultrasound at each of the target points, and determining characteristics of the cell including defects, anomalies and cell capacity based upon the response signals. During the session, the transducers are not in contact with the surfaces of the cell, and the transducers and the cell are immersed in an electrically non-conductive fluid. The system can also configure the ultrasound transmitted at the target points into focused beams. Alternatively, an inspection system can be configured to determine characteristics of a cell during a formation stage of the cell.

The invention belongs to the technical field of optical microscopic imaging, and relates to a laser focal depth characteristic-based confocal microscopic imaging system, which comprises a laser emission module, a collimating lens group, a light beam modulation module, a space scanning module and an information receiving module, and is characterized in that the light beam modulation module comprises a polarization beam splitter and a quarter-wave plate; the space scanning module comprises a biaxial galvanometer and a 4f telecentric light path assembly. The laser emission module, the collimating lens group, the polarization beam splitter 4 and the quarter-wave plate are coaxially arranged. The double-shaft galvanometer is obliquely arranged relative to the quarter-wave plate; the 4f telecentric light path assembly is configured to form a preset focal depth range by utilizing the focal depth characteristic of incident laser and scan a sample in the preset focal depth range by utilizing a focused light beam emitted by the 4f telecentric light path assembly; and the information receiving module is arranged beside the polarization beam splitter. According to the invention, the mechanical motion dependence of the optical imaging system is eliminated, the structural complexity of the optical imaging system is reduced, and the resolution and efficiency of laser scanning imaging are improved.

The utility model discloses a projection module, a three-dimensional scanning system and a focusing device.The projection module comprises an LED light source, a collimating lens, an optical mask and a projection lens which are arranged in sequence, and the LED light source is arranged on the focal plane of the collimating lens and used for emitting divergent beams; the collimating lens is arranged on a light emitting path of the LED light source and is used for focusing the divergent light beam emitted by the LED light source to obtain a focused light beam; the optical mask comprises a substrate engraved with a preset pattern, and the preset pattern on the substrate is arranged on a focal plane of the projection lens and is used for shaping the focused light beam to obtain a structured light pattern; and the projection lens is used for amplifying the structured light pattern and projecting the structured light pattern to a target area to form a structured light field. The projection module provided by the utility model can realize short-distance object recognition, and is low in development and manufacturing cost.

The invention discloses a method for manufacturing a wafer based on a green laser, and relates to the technical field of chips, in particular to the technical field of wafer manufacturing. According to the specific implementation scheme, a to-be-cut crystal ingot is subjected to modification treatment based on a green laser to form at least one modification layer; and performing wafer stripping based on the modified layer formed by the to-be-cut crystal ingot to obtain at least one wafer. Namely, the crystal ingot to be cut is subjected to modification treatment, the used laser is a green laser which is short in wavelength and has permeability to the crystal ingot, the focusing capacity of laser beams emitted by the green laser is high, light spots after focusing are small, the influence of input heat is small, and loss brought to materials is small.

A scanning probe microscope and method of operating a scanning probe microscope includes selecting a preferred focal position of a focused optical beam on a probe of the scanning probe microscope by adjusting a focal position of a focused optical beam on the probe relative to a tip of the probe and then measuring at least one of a response of the probe and optical radiation scattered from the probe as a function of the position of the focused optical beam. The preferred focal position of the focused optical beam on the probe is based on the measurement of at least one of the response of the probe and optical radiation scattered from the probe.

High speed, accurate, scalable, and dimension-insensitive additive manufacturing of a Three-Dimensional (3D) object may use incrementally solidifying light-sensitive resin layers. A new layer is formed by supplying the resin liquid via a cavity in the formed 3D object, and curing the supplied resin by a focused light beam, such as a laser beam. The added layers are formed by supplying, 2024 / 184876 using a pump, the light-cured resin fluid to one or more bottom openings to be output from the top opening (or to multiple openings) via a vertical cavity (or multiple cavities) of the 3D object. The curing is by focusing a light beam to the area of the resin output from the top opening, while keeping the top opening non-cured, so that resin can be passed via the cavity. Such 3D printing may be directly applied to any surface, such as a floor, wall, wing structure, or machined part.

Disclosed in the present invention are a conical optical illumination-based reflective scanning super-resolution optical microscopy system and method. The system comprises a sample displacement module, an optical microscopic imaging module, an annular focused beam generation module, a beam scanning module, a super-resolution focused illumination and collection module, a super-resolution optical imaging module and a computer. By means of using the advantages of annular focused beam illumination, high focusing efficiency of traditional lenses, and high beam scanning speed, high-efficiency super-resolution focused illumination with an extended depth of focus is achieved, and further traditional optical lenses can be used to achieve fast super-resolution optical microscopic imaging; fast label-free far-field super-resolution two-dimensional microscopic imaging is implemented by means of two-dimensional beam scanning; by means of performing label-free far-field super-resolution two-dimensional microscopic imaging on samples at different axial positions, super-resolution two-dimensional microscopic images of different cross sections of samples are obtained, thereby achieving three-dimensional tomography. The present invention can be applied to fast label-free super-resolution microscopic imaging of biological samples, and can also be applied to other fields such as industrial super-resolution microscopic inspection.

The invention discloses a low-power laser-assisted hydrogen reduction ironmaking method, which comprises the following steps: irradiating an iron-containing ore sample at an angle of 10-90 degrees by using low-power 200W laser or solar focusing light beams under a vacuum condition, and carrying out thermal reduction to generate elemental Fe and other compounds. 4-6 red copper blocks are placed above the sample table to collect volatile matters, and a circulating water cooling device is placed below the sample table to cool and collect smelted samples. And finally, metal Fe is obtained through magnetic separation, and the green metallurgy purpose of zero carbon emission in the whole ironmaking process is achieved. The zero-carbon-emission low-power laser ironmaking method under the atmosphere condition is simple, easy to operate and environmentally friendly, has the potential of large-scale continuous production, and is expected to be applied to the technical field of intelligent, clean and efficient ironmaking in the future.

An optical module includes: a diffraction grating configured to rotate and focus a beam, which is incident thereon from an incident path, onto a Fourier plane, a digital micromirror array (DMD) configured to assign a frequency for each wavelength of the focused beam received at the Fourier plane, and perform a Fourier transform for each frequency, and a first optical fiber configured to receive a beam that is reflected back from the DMD back and the diffraction grating, and along the incident path.

According to the method for controlling the vertical incidence angle of the laser through the GIL pipeline inner wall girth welding vector, a binocular camera is installed on a laser scanning welding head, the pipeline inner wall is pre-scanned, and image information is collected. The distance and angle between a laser head focus lens and the inner wall of the pipeline and the incident angle and the three-dimensional space position of a laser focusing beam are calculated through a specific formula. And the position and angle of a welding head are automatically adjusted during girth welding, so that vertical incidence and constant focal length of laser are ensured. And continuous monitoring and adjustment are achieved in the welding process, and the welding quality and efficiency are guaranteed. The method has the advantages of being accurate in control, high in automation degree, high in reliability, good in flexibility and the like, and the GIL pipeline inner wall girth welding quality can be effectively improved. According to the method, through accurate calculation and automatic adjustment, vertical incidence and constant focal length of the laser focusing light beam can be achieved during girth welding of the inner wall of the GIL pipeline, and therefore the welding quality and reliability are remarkably improved.

An additive manufacturing system may include an additive manufacturing machine and a control system. The additive manufacturing machine may include one or more irradiation devices respectively including a beam source configured to emit an energy beam, an optical assembly that has one or more optical elements configured to focus the energy beam emitted by the beam source, a beam source sensor configured to determine a beam source sensor value from a source measurement beam representative of the energy beam prior to the energy beam passing through one or more optical elements of the optical assembly, and an optics sensor configured to determine an optics sensor value from an optics measurement beam representative of the energy beam downstream from the one or more optical elements of the optical assembly. The control system may include an irradiation control module configured to provide one or more control commands to the additive manufacturing machine based at least in part on the beam source sensor value and / or based at least in part on the optics sensor value.