An apparatus (20) for carrying out a
quality control on industrial production lines (10), comprising one or more apparatuses (30, 40, 50) for the measurement of properties of a product sample (C) of the aforesaid industrial production lines (10), which supply respective one or more measurement signals, the apparatus (20) comprising a
processing module configured for
processing the one or more measurement signals and obtaining properties of the product sample (C), the
quality control being carried out as a function of said properties of the product sample (C), said one or more apparatuses (30, 40, 50) for the measurement of properties of a product sample (C) comprising: an x-
ray fluorescence apparatus (30) that comprises an x-
ray source (331), which emits a first x-
ray beam (XB, XBC) towards the product sample (C) in a measurement environment, and a
particle detector (335), which is configured for receiving a second x-ray beam (XBR) scattered by the product sample (C) and generating a first received
signal supplied within the set of said respective one or more measurement signals. The apparatus (20) further comprises an optical-
spectroscopy apparatus, preferably operating in the near
infrared (40), which comprises a
radiation source operating in the near
infrared (NIR), which emits a first optleal-
radiation beam towards a product sample (C), and an optical sensor for receiving a second optleal-
radiation beam scattered by the product sample (C) and generating a second received
signal supplied within the set of said respective one or more measurement signals.