49results about "Light polarisation measurement" patented technology

This suppresses the generation of ghosting in the optical path from the polarization controller to the multiplexing optical coupler. [Solution] The extinction ratio monitoring type polarization rotation system 10 is installed in the optical path between a third optical coupler 3 that is incident on the measurement light from the light source and emits reflected light L2 reflected by the optical circuit under test, and a fourth optical coupler 4 that combines the reference light L1 and the reflected light L2. It includes a polarization controller 11 that can change the polarization state of the incident light in various ways and controls the emitted light to a predetermined polarization state, a branching unit 12, a polarizer unit 13, and a monitor unit 14 that monitors the extinction ratio. Based on the output of the monitor unit 14, the set values ​​of the polarization controller 11 that result in the output of the maximum light intensity and the output of the minimum light intensity where the polarization states are orthogonal are stored in the memory unit. After switching these settings, the intensity of each beat signal is measured using a differential amplifier 7, making it possible to detect defective parts of the optical circuit X under test without false detection.

The application relates to the technical field of atomic magnetometer and discloses a detection device and method of orthogonal light beams, the detection device of the orthogonal light beams comprising a substrate; a polarization beam combination device used for combining pump light and detection light received in an atomic magnetometer, rotating the pump light or the detection light by 90 degrees, and making the pump light and the detection light exit after being combined; a detector used for collecting a light spot image of the combined pump light and detection light, the light spot image comprising a first light spot generated based on the pump light and a second light spot generated based on the detection light; and a processing unit used for acquiring the light spot image, extracting the center coordinates of the first light spot and the second light spot in the light spot image, and determining the orthogonal state of the pump light and the detection light according to the center distance between the center coordinates of the two light spots. The application can realize quantitative evaluation of the orthogonal state of the pump light and the detection light, thereby providing intuitive and accurate feedback for optical alignment, reducing assembly errors, and improving the overall performance of the atomic magnetometer.

This invention discloses a method for preparing quasi-one-dimensional indium tin sulfide (ITS) nanowire semiconductor materials and their applications, belonging to the field of semiconductor materials and devices. The method includes: weighing high-purity nanoscale In, Sn, and S powders and an iodine transport agent in a specific molar ratio under an inert atmosphere; encapsulating the powders under high vacuum; and then performing chemical vapor deposition (CVD) growth in a dual-temperature zone tube furnace. After cleaning and annealing, high-quality quasi-one-dimensional ITS nanowires are obtained. Furthermore, a single nanowire photodetector can be constructed using dry transfer and standard micro / nano processes. This device utilizes the in-plane optical anisotropy of the ITS nanowires to achieve direct polarization-sensitive detection and imaging in the 265nm solar-blind ultraviolet band without the need for an external polarizer, exhibiting microsecond-level fast light response. This invention solves the problem of the difficult and controllable preparation of high-quality ITS single crystals, providing a new solution for a simplified and low-cost polarization imaging device, with significant application prospects in environmental monitoring, security defense, and other fields.

This application provides a method, apparatus, device, and medium for detecting polarization aberration in a projection lens. The method includes: sequentially arranging a polarization state generator, a projection lens, a polarization state analyzer, and a detector along the optical path propagation direction to establish a Mueller matrix model corresponding to the projection lens; determining the projection lens Mueller matrix under the characteristic parameters of each component based on the Mueller matrix model; and for each characteristic parameter, changing its value within a preset parameter range based on the Mueller matrix model, while keeping other characteristic parameters at preset values, and calculating the detection deviation of each element in the projection lens Mueller matrix under the current conditions. This method and apparatus significantly improve the accuracy and reliability of polarization aberration detection.

The application belongs to the technical field of precision optical instruments, and specifically discloses a general calibration method for system parameters of an ellipsometer not based on a model, which comprises the following steps: selecting standard samples of multiple categories as reference samples, placing the reference samples in an ellipsometer for polarization experiments, and collecting light intensity signals corresponding to the reference samples; obtaining light intensity matrices or light intensity coefficient matrices corresponding to the reference samples according to the light intensity signals of the reference samples; solving an analysis matrix describing an analyzing arm of the ellipsometer system and a modulation matrix describing a modulating arm of the ellipsometer system through multi-parameter joint optimization, and simultaneously obtaining characteristic parameters of the reference samples by using a nonlinear regression optimization method; applying the calibrated analysis matrix and the modulation matrix to a to-be-tested sample, and calculating based on a light intensity matrix or a light intensity coefficient matrix of the to-be-tested sample to solve optical parameters of the to-be-tested sample. The application can realize the generality and simplicity of the ellipsometer calibration process.

The present invention relates to a polarimetric (PT) measurement device for anisotropic quantities of a medium (M), comprising a spectrally structured light source (SSS) delivering a series of pulses with reference spectral grooves, spectral polarization coding means (MPG) configured to spectrally polarize each of the reference pulses delivered by the light source with a measurement phase delay identical to the reference phase delay, a light detector (D) configured to capture the light intensity reflected by the medium (M) for each of the reference pulses delivered by the light source, and a measurement unit configured to determine the anisotropic quantities of the medium (M) from the images captured by the detector. Figure 3

The application discloses a polarization multiplexed spectral imaging system based on an acousto-optic tunable filter and belongs to the technical field of spectral imaging. The system comprises, which are connected in sequence, a convergent incidence module, a spectral modulation module, a diffracted light separation correction module and an imaging module; the convergent incidence module converges and incides light into the spectral modulation module to obtain diffracted light and transmitted light with orthogonal polarization states containing specific spectra; the diffracted light separation correction module spatially separates the diffracted light and the transmitted light and shields the transmitted light, and compensates chromatic aberration and corrects inconsistency caused by polarization of the two beams of diffracted light through two branch lenses which are independent in parameters; and the imaging module combines and images the two beams of corrected diffracted light on the same pixel of a photoelectric detector, thereby solving the problem of large energy loss of a traditional acousto-optic tunable filter spectral imaging system caused by a front polarizer and realizing high-light-flux spectral imaging.

Provided are an image-capturing method and program which can obtain a wavelength image with high wave reproducibility maintained. The image-capturing method captures subjects with a multi-spectrum camera that includes a processor, wherein the processor executes: a data acquisition step (step S10) for acquiring first spectrum data of a first subject, second spectrum data of a second subject, and third spectrum data of a third subject; a wavelength selection step (step S11) for selecting a plurality of wavelengths from wavelength bands of the acquired first to third spectrum data; and an image-capturing step (step S12) for selecting a plurality of wavelengths by obtaining at least two calculation amounts that are determined, in the wavelength selection step (step S11), as the difference or ratio between feature amounts of two pieces among the first spectrum data, the second spectrum data, or the third spectrum data, and capturing subjects including at least one among the first subject, the second subject, or the third subject in the plurality of wavelengths.

The application discloses a kind of optical signal polarization state tracking chips, comprising: first end face coupler, for receiving arbitrary complete polarization state input light;First direct current drive light phase shifter, for adjusting the light phase of input light;First polarization dependent mode converter, for mode conversion to phase-adjusted input light;Dual-mode beam splitter, for mode-converted input light is split into two optical signals;Second direct current drive light phase shifter, for regulating the phase difference between two optical signals;Dual-mode combiner, for the two optical signals of phase difference regulation are combined into a light signal;Second polarization dependent mode converter, for the inverse transformation of mode to the optical signal of combination is executed;Third direct current drive light phase shifter, for adjusting the light phase difference between orthogonal polarization state light of inverse-transformed optical signal;Polarization-insensitive beam splitter, for the first optical signal and second optical signal of phase difference adjusted optical signal are divided.

The application discloses a preparation method of a metalized chiral COF and application of the metalized chiral COF in electrochemical circular polarization light detection, and the preparation method of the metalized chiral COF comprises the following steps: taking 1,3,5-triformylphloroglucinol, trimethylaniline, a chiral inducer and 2,2'-bipyridine-5,5'-diamine as raw materials, and synthesizing a chiral COF through a solvothermal reaction; then, a coordination reaction is carried out with a metal salt in an alcohol solvent to obtain a metalized chiral COF material; the metalized chiral COF material is used as a photoanode material, spin polarization induced by circular polarization light (CPL) is coupled with a spin-selective oxygen evolution reaction (OER), and a nonlinear characteristic of OER reaction kinetics is used to amplify a micro-spin signal; the material has excellent photoelectric current anisotropy factor (g Iph ) and stability, and solves the problem of low sensitivity of an existing solid-state CPL detector.

The application discloses a high-precision linear polarization information measuring device, and relates to the technical field of semiconductor linear polarization light information measurement. The device comprises a detection unit module, a voltage processing module and a calculation and output module. Two groups of four detectors are connected in series through a circuit, and the maximum polarization sensitive directions of the two groups of detectors are 45 degrees apart. When linear polarization light irradiation occurs under a certain power supply bias, the detection unit module generates two voltage signals, and the generated voltage signals are only related to a polarization angle. The two voltage signals pass through the voltage processing module, and a voltage signal filtered from common mode interference is obtained through a programmed gain voltage amplifier and a difference processing circuit. Finally, the processed voltage signal is transmitted to the calculation and output module. A calculation unit in the module processes and transmits the processed voltage signal to a display device through communication, so that visual linear polarization information is obtained.

Semiconductor image sensor device (100) with: a semiconductor layer (102) with one or more sensor areas (104) configured to detect radiation; a lattice structure (116) above the semiconductor layer (102), wherein the lattice structure (116) has one or more cells (118) which are each oriented towards the one or more sensor areas (104); and a polarization grating structure (610) in one or more cells of the grating structure (116), wherein the polarization grating structure (610) is configured to polarize light entering the semiconductor image sensor, wherein the polarization grating structure (610) comprises grating elements (600) with an upper antireflective layer arranged over a lower metal layer.

The present invention relates to a system for encoding and correcting BB84 protocol polarisation states that implements a method for measuring polarisation error based on performing said measurement prior to the information transmission step, applicable to any system where quantum key distribution (QKD) is to be implemented.

To provide methods and systems for performing simultaneous spectroscopic measurement of semiconductor structures at ultraviolet, visible and infrared wavelengths.SOLUTION: Wavelength errors are reduced by orienting a direction of wavelength dispersion on a detector 141 surface perpendicularly to the projection of a plane of incidence onto the detector 141 surface. A broad range of infrared wavelengths are detected by the detector 141 that includes multiple photosensitive areas having different sensitivity characteristics. Collected light is linearly dispersed on the detector 141 surface according to the wavelength. Each different photosensitive area is arranged on the detector 141 to sense a different range of incident wavelengths. In this manner, a broad range of infrared wavelengths are detected with a high signal-to-noise ratio by a single detector. These features enable high throughput measurement of high aspect ratio structures with high throughput, precision and accuracy.SELECTED DRAWING: Figure 1

The film of the present application is a film for circularly polarized light detection, characterized by comprising: a plurality of inorganic layers forming a layered structure and / or a plurality of inorganic chains forming a chain structure, which are formed of a perovskite substance; and a chiral molecule contained in at least a part of a boundary portion between adjacent inorganic layers and / or between adjacent inorganic chains, wherein only one of an S-type chiral molecule or an R-type chiral molecule is present in the chiral molecule, or the presence ratio of either one of the S-type chiral molecule or the R-type chiral molecule is higher than that of the other, and a crystal structure of the perovskite substance is oriented in a prescribed direction.

Disclosed herein systems and methods of performing spoof resistant object recognition. In certain embodiments, a system for object recognition includes: an illumination device configured to illuminate an object; a sensor device, wherein the sensor device receives illumination light reflected off the object which includes polarization information; a processor; memory including programming executable by the processor to: calculate the polarization information from the illumination light; use the polarization information to determine whether the object is a real 3D object. It has been discovered that polarization information may be utilized to determine whether an object is a 3D object or a flat (2D) object. Thus, the polarization information may be utilized to differentiate from an image of a 3D object and a photograph of an object.

This invention relates to a method and apparatus for testing the polarization deflection angle of a semiconductor laser, belonging to the field of semiconductor laser performance testing technology. It solves the technical problems of low efficiency and cumbersome calculations in testing the polarization deflection angle of semiconductor lasers. The testing method includes the following steps: installing and starting the semiconductor laser; testing the power of the light emitted after passing through the Glan-Taylor prism PBS and the power of the light emitted without passing through the Glan-Taylor prism PBS; adjusting the fixture to a fixed angle and testing the power of the light emitted through and without passing through the Glan-Taylor prism PBS; and calculating the polarization deflection angle of the semiconductor laser based on the power of the emitted light at different angles. The testing apparatus includes a fixture, a convex lens, a Glan-Taylor prism PBS, and an optical power meter. The laser sequentially enters the convex lens and the Glan-Taylor prism PBS, and the optical power meter is used to test the power of the light emitted after and without passing through the Glan-Taylor prism PBS.

Magneto-optical sensors for process or process chamber condition monitoring are described. In an example, a system includes a process chamber. The system also includes a laser source to provide a laser beam having an initial polarization, the laser beam to be directed through a first polarizer and then into the process chamber. The system also includes a magnet surrounding the process chamber, the magnet to provide a Faraday rotation of the laser beam, the laser beam to exit the process chamber and enter a second polarizer and then a detector to provide a detected polarization rotation for lock-in detection.

The photoelectric conversion device includes an electron emitting member. The electron emitting member has a metasurface that emits electrons in response to the incidence of electromagnetic waves. The metasurface includes a first antenna portion, a first bias portion, a second antenna portion, and a second bias portion. The first antenna portion extends in a first direction and emits electrons in response to the incidence of electromagnetic waves. The first bias portion faces the first antenna portion and is configured to generate an electric field having a component in the first direction between the first antenna portion and the first antenna portion. The second antenna portion extends in a second direction intersecting the first direction and emits electrons in response to the incidence of electromagnetic waves. The second bias portion faces the second antenna portion and is configured to generate an electric field having a component in the second direction between the second antenna portion and the second antenna portion.

The self-calibrating polarization state measurement device and method based on the trust-domain reflection method belongs to the field of precision instrument manufacturing and measurement technology. The device includes an incident optical fiber, a collimator, a magneto-optical crystal module, a quarter-wave plate, an analyzer, an output optical fiber, and a packaging shell. The method obtains 16 output optical powers by changing the rotation angle of the four magneto-optical crystal modules. It uses an optical power meter to measure and processes the data using a trust-domain reflection optimization mathematical model and algorithm. It can realize the self-calibration of the polarization state measurement device and analyze the polarization state of the input light, and can overcome the influence of temperature, wavelength, assembly and measurement errors, and noise on the measurement accuracy.

The application relates to an application of a spectrum coding device in spectrum and polarization reconstruction and a preparation method, the spectrum coding device comprises an image sensor and a plurality of composite curved surface films, the inner wall surface of the composite curved surface film is arranged towards the image sensor, the composite curved surface film comprises a first curved surface film and a second curved surface film, the inner wall surface of the second curved surface film is attached to the outer wall surface of the first curved surface film, and the refractive indexes of the first curved surface film and the second curved surface film are different; incident light is incident from the outer wall surface of the second curved surface film to form a characteristic pattern at the image sensor, and the characteristic pattern is reconstructed to obtain at least polarization information corresponding to the incident light.

An imaging ellipsometer includes a light source configured to irradiate incident light on a sample surface; a polarizer on an optical path of the incident light on the sample surface, being rotatable at a first angle to adjust a polarization direction of the incident light; an analyzer on an optical path of light reflected from the sample surface, being rotatable at a second angle to adjust a polarization direction of reflected light; a light detector configured to receive light passing through the analyzer to collect image data; a controller configured to control operations of the polarizer and the analyzer to obtain an image signal from the sample at combination of rotations by the first angle of the polarizer and the second angle of the analyzer; and a processor configured to generate at least a portion of a Mueller matrix and analyze elements of the Mueller matrix to evaluate asymmetry.

The present description relates to a system (10) for determining an estimated degree of polarization of a reflected radiation (Er) by a scene (Sc), comprising a first light source (16) of a first electromagnetic radiation (E→yfα) at ​​a first frequency and linearly polarized along a first direction, a second light source (20) of a second electromagnetic radiation (E→xfβ) at a second frequency strictly greater than the first frequency and linearly polarized along a second direction not parallel to the first direction, and an acquisition device (12) of an image of the radiation reflected by the scene comprising first pixels configured to capture the reflected radiation, each first pixel being covered with a linear polarizer (22) along a third direction not perpendicular to the first direction.

The present invention relates to a method for making a matched pair of polarizing filters, the method comprising the steps of: mounting a first linear polarizer and a second linear polarizer in a light beam; rotating the second linear polarizer to obtain maximum extinction of the light beam; inserting a first quarter-wave optical retarder in the light beam; rotating the first quarter-wave optical retarder to obtain maximum extinction of the light beam; then rotating the first quarter-wave optical retarder through a 45-degree angle; inserting a second quarter-wave optical retarder; and rotating the second quarter-wave optical retarder through a second angle to obtain maximum extinction of the light beam before fixing the first linear polarizer and the first quarter-wave optical retarder and the second linear polarizer and the second quarter-wave optical retarder. The present invention also relates to a method and apparatus for analyzing a sample containing birefringent particles suspended in a fluid (e.g., suspended in a liquid) using a matched pair of polarizing filters.

The application relates to the field of solar magnetic field detection, in particular to a snapshot spatial solar spectrum magnetic imager integrated based on an F-P cavity and a superlens, which comprises, along an optical path, a front filter assembly, a front telescope system, a band-pass filter, a tunable F-P resonant cavity filter, an F-P resonant cavity polarization enhancer and a surface array detector. The polarization enhancer comprises a fixed F-P resonant cavity and a polarization beam splitting superlens embedded in the cavity, the superlens is composed of an anisotropic subwavelength nanostructure array, the anisotropic subwavelength nanostructure array is used for implementing differential phase regulation on light beams of different polarization states, target polarization state light beams are efficiently transmitted by meeting the cavity resonance condition, and non-target polarization state light beams are reflected and suppressed, and the spatial separation and focusing of four polarization components are simultaneously completed in a single exposure. The application can significantly improve the system integration and mechanical stability, effectively suppress the polarization error of the instrument, and improve the adaptability and measurement accuracy of the system in the space environment.

This invention relates to the field of optical design, and more particularly to a method for obtaining polarization aberrations in an optical system. The method includes: S1: Tracing N rays using a three-dimensional polarization ray tracing algorithm to extract the corresponding biaxial attenuation-related Jones matrices and phase delay-related Jones matrices; S2: Fitting the Jones matrices and the Jones matrices using N directional Zernike polynomials to obtain the components of biaxial attenuation and phase delay, and reconstructing the biaxial attenuation and phase delay to obtain the polarization aberration distribution across the entire pupil of the optical system. This invention requires only a small number of rays to accurately obtain the polarization aberrations across the entire pupil, significantly reducing computational complexity. It also overcomes the limitations of existing simplified methods on the optical system structure, making it applicable to various complex optical systems.

The application discloses a high-dimensional light field detection method based on physical feature decoupling, and belongs to the technical field of optical measurement. The method comprises the following steps: S1, collecting a speckle pattern of a to-be-detected high-dimensional light field encoded and output by a multimode interference medium; S2, performing light field physical feature separation and denoising processing on the speckle pattern, projecting a plurality of light field parameters of the to-be-detected high-dimensional light field into respective corresponding low-dimensional feature subspaces, and obtaining low-dimensional features corresponding to the plurality of light field parameters of the to-be-detected high-dimensional light field; and S3, inputting a feature vector composed of the low-dimensional features into a decoding module based on a physical feature subspace which is pre-established and trained, and obtaining the plurality of light field parameters of the to-be-detected high-dimensional light field. The application further discloses a high-dimensional light field detection device based on physical feature decoupling. The application can effectively improve the detection sensitivity and stability of subtle changes in the light field, reduce the demand for training data and the complexity of the model, and reduce the training and reasoning time.

The present invention provides a polarimeter in which the configuration of the detection unit is simplified even when detecting multiple polarized light sources in parallel over time. [Solution] The polarimeter 1 according to the present disclosure comprises: an optical element 20 including a wave plate 21 into which a first portion L1 of the light L to be measured is incident; a polarizer array 30 including a plurality of polarizers into which the first portion L1 that has passed through the wave plate 21 and the other portion of the light L that has not passed through the wave plate 21 is incident and which have different polarization transmission axes in at least three directions; a reflecting unit 40 including a plurality of mirrors that operate independently of each other with drive signals associated with the polarization-operated light that has passed through the polarizer array 30; a single detection unit 60 that detects the polarization-operated light reflected by the reflecting unit 40; and a control unit 74 that separates the detection signal of the detection unit 60 for each polarization-operated light according to the drive signal and calculates polarization information of the light L.