141 results about "Matched pair" patented technology

A relatively low cost, lightweight and thermal stress-free mechanical fastener system having particular application for reliably joining together high temperature structural members (e.g., a pair of flat fiber-reinforced ceramic composite plates). The mechanical fastener system includes a ceramic composite fastener having a semi-circular head at one end to be countersunk in the structural members to be joined together and a dove tail retention feature formed in the shank or root at the opposite end. The composite fastener has a 2-dimensional (i.e., flat) profile that facilitates an economic manufacture thereof from densified ceramic composite material. A matched pair of thread forms having external threads and an internal dove tail relief to match the dove tail retention feature at the root of the composite fastener is held in face-to-face mating engagement with one another so as to establish a mechanical interlock around the root of the composite fastener. A 2-dimensional ceramic backing washer has a rectangular center hole dimensioned to receive the root of the composite fastener therethrough. A nut having internal threads that correspond to the external threads of the pair of thread forms is rotated into surrounding engagement with the thread forms to prevent a removal of the composite fastener and a separation of the structural members.

An electronically tuned, absorptive, low-loss notch filter with high RF power handling capability is obtained using a four-port quadrature hybrid coupler connected to a matched pair of band pass resonator devices and resistive terminations. The notch filter design uses series-only tuning elements for the band pass resonator devices to raise the RF power handling of the band pass resonators far above conventional techniques while also being tunable at high speeds. The notch filter architecture and method can be used for interference cancellation in a wide range of wireless technologies, such as cellular phone, wireless routers, hand-held radios, satellite communications, and any other environments where there are a number of wireless technologies in close signal proximity.

A method is provided for improving layer to layer overlay of a second layer pattern on a first layer pattern formed in a substrate. A plurality of first reference marks is placed inside a pattern area on a first layer mask which is used to form the first layer pattern. A plurality of second reference marks is placed on a second layer mask which is used to form the second layer pattern and in which one second reference mark is matched with a first reference mark having the same (x,y) coordinates. Reference mark placement in the resulting first and second layer patterns is determined by metrology to determine an x-deviation and a y-deviation for each matched pair of reference marks. A correction algorithm is then used to calculate adjustments in exposure tool settings for improved overlay of the second layer pattern on the first layer pattern in subsequent exposures.