The invention relates to a precision optical
measuring instrument calibration technology, and discloses a parameter calibration method and
system for a four-
photoelastic modulator type Mueller matrix polarization
system, and the method comprises the steps: carrying out a polarization experiment; introducing an analysis arm base vector and a polarization arm base vector containing dynamic parameters, and establishing a calculation model of the
light intensity signals, the base vectors and a
light intensity projection matrix; through a polarization experiment and a calculation model, dynamic parameters in base vectors of a polarization detection arm and a polarization starting arm are calibrated by using a
nonlinear regression method, and the dynamic parameters comprise the peak retardation, the modulation frequency and the
initial phase of the
photoelastic modulator. Furthermore, a matrix containing static parameters of the
system is obtained through a characteristic value calibration method and is directly used for measurement, and the static parameters comprise the
azimuth angle of the polarization element and the static
delay amount of the
photoelastic modulator. According to the method, the base vector is introduced, the
light intensity is detected through
nonlinear regression projection, the calibration of dynamic parameters is realized, then the static parameters are calibrated by using the characteristic values, the operation is simple and convenient, and the calibration precision is high.