The invention is suitable for the technical field of
semiconductor testing, and provides a
data acquisition method and device based on a DDIC
chip, and
testing equipment, and the
data acquisition method comprises the steps: receiving a test pattern, controlling the DDIC
chip to output a corresponding gray scale
voltage signal, and achieving the comprehensive testing of the response capability of the
chip in a full gray scale range; secondly, a
target acquisition link composed of functional units including impedance conversion, single-ended to differential conversion, programmable
gain amplification, filtering, analog-to-
digital conversion and the like is utilized, so that the
signal driving capability and the anti-interference capability are effectively improved, meanwhile, high-
frequency noise and
nonlinear distortion are reduced, and the basic quality of sampled data is guaranteed; on the basis, sampling optimization
processing is carried out on the sampling data based on the FPGA unit, and the
data stability is improved. According to the scheme, through high-precision transmission of the
signal link, the
data acquisition precision of the DDIC chip is improved, and then the technical requirements of high-precision DDIC chip testing are met.