This invention discloses an
atomic fluorescence spectrometer and an automated sample measurement
system, belonging to the field of
atomic fluorescence spectrometer technology. This invention effectively ensures stable instrument operation and efficient atomization reactions through a comprehensive self-checking mechanism combined with
adaptive matching of different
analyte types and detection
modes. Simultaneously, through precise cup positioning, automatic
sample sequence configuration, and orderly scheduling of the detection process, coupled with reference light baseline correction, multi-level blank measurement, and
standard curve fitting to establish quantitative correlations, it fully covers the entire detection chain from automatic sample introduction,
signal acquisition,
signal optimization
processing to concentration calculation and correction, effectively improving the accuracy and
repeatability of sample measurement results. It achieves
fully automated operation of the entire process—including power-on self-check, parameter matching, automatic measurement,
data calibration, result calculation, and standardized
report generation—without extensive manual intervention, adapting to the needs of multi-element, multi-
wavelength simultaneous detection and improving the intelligence,
standardization, and
automation level of
atomic fluorescence detection.