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Twin port calibration method for nonlinearity vector network analyzer

A technology of vector network analysis and calibration method, which is applied in the field of dual-port calibration of nonlinear vector network analyzers, and can solve the problems of single calibration scheme and difficult self-checking of calibration results.

Inactive Publication Date: 2013-03-20
HARBIN INST OF TECH
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  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The present invention proposes a dual-port calibration method for nonlinear vector network analyzers in order to solve the problem that the existing NVNA dual-port calibration technology has a single calibration scheme and the calibration results are difficult to self-check.

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  • Twin port calibration method for nonlinearity vector network analyzer
  • Twin port calibration method for nonlinearity vector network analyzer
  • Twin port calibration method for nonlinearity vector network analyzer

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specific Embodiment approach 1

[0072] Specific embodiment one: the non-linear vector network analyzer dual-port calibration method described in this embodiment includes the following steps:

[0073] Step 1: Use the two ports of the nonlinear vector network analyzer to perform open-circuit, short-circuit and load calibration respectively, use the open-circuit standard to perform open-circuit calibration, and obtain the equation group according to the nominal value and actual measurement value of the open-circuit standard:

[0074] e 00 + Γ Open Γ Open 1 M e 11 - Γ Open Δx = Γ Open 1 M

[0075] e 33 + Γ ...

specific Embodiment approach 2

[0100] Specific embodiment two: Another kind of nonlinear vector network analyzer dual-port calibration method described in this embodiment includes the following steps:

[0101] Step 1: Use the two ports of the nonlinear vector network analyzer to perform open-circuit, short-circuit and load calibration respectively, and use the open-circuit standard to perform open-circuit calibration, and obtain the equation group according to the nominal value and actual measurement value of the open-circuit standard:

[0102] e 00 + Γ Open Γ Open 1 M e 11 - Γ Open Δx = Γ Open 1 M

[0103] e 33 + ...

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Abstract

The invention discloses a twin port calibration method for a nonlinearity vector network analyzer, relates to the technical field of microwave millimeter wave measurement and solves the problems that twin port calibration technology of existing nonlinearity vector network analyzers is single, and self-checking of a calibration result is difficult. Two ports of the nonlinearity vector network analyzer are utilized to perform open circuit, short circuit, loading, power, phase position and through calibrations respectively to obtain a nominal value and an actual measured value of a calibrated workpiece, eight error models are determined according to all obtained coefficients, and the calibration for the nonlinearity vector network analyzer is achieved. The twin port calibration method for the nonlinearity vector network analyzer is applicable to signal analysis and the most in-depth analysis for characteristics of non-linear devices.

Description

technical field [0001] The invention relates to a dual-port calibration method for a nonlinear vector network analyzer. Background technique [0002] The current nonlinear vector network analyzer, referred to as NVNA, is a new generation of microwave and millimeter wave measurement technology and a nonlinear characterization platform for RF power devices. However, the calibration principle and scheme of NVNA have not achieved breakthroughs, and are still used in Maury's 2003 The relative and absolute calibration technology and process of the large signal network analyzer launched in 2010, referred to as LSNA, has not been deeply researched and developed for the characteristics of NVNA itself and the difference with the measurement principle of LSNA. The existing NVNA dual-port calibration technology has a single calibration scheme, and the calibration results are difficult to self-check. Contents of the invention [0003] The present invention aims to solve the problems t...

Claims

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Application Information

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IPC IPC(8): G01R35/00
Inventor 张亦弛林茂六苟元潇
Owner HARBIN INST OF TECH
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