478 results about "Reference measurement" patented technology

Systems and methods for processing sensor data and self-calibration are provided. In some embodiments, systems and methods are provided which are capable of calibrating a continuous analyte sensor based on an initial sensitivity, and then continuously performing self-calibration without using, or with reduced use of, reference measurements. In certain embodiments, a sensitivity of the analyte sensor is determined by applying an estimative algorithm that is a function of certain parameters. Also described herein are systems and methods for determining a property of an analyte sensor using a stimulus signal. The sensor property can be used to compensate sensor data for sensitivity drift, or determine another property associated with the sensor, such as temperature, sensor membrane damage, moisture ingress in sensor electronics, and scaling factors.

A system for determining a reference baseline of regularly retrieved patient information for automated remote patient care is presented. A medical device having a sensor for monitoring at least one physiological measure of an individual patient regularly records and stores measures sets relating to patient information during an initial time period. A database collects one or more patient care records by organizing one or more patient care records and storing the collected measures set into such a patient care record for the individual patient. A server receives the collected device measures set from the medical device, processes the collected device measures set into a set of reference measures representative of at least one of measured or derived patient information, and stores the reference measures set into the patient care record as data in a reference baseline indicating an initial patient status.

Systems and methods for processing sensor data and self-calibration are provided. In some embodiments, systems and methods are provided which are capable of calibrating a continuous analyte sensor based on an initial sensitivity, and then continuously performing self-calibration without using, or with reduced use of, reference measurements. In certain embodiments, a sensitivity of the analyte sensor is determined by applying an estimative algorithm that is a function of certain parameters. Also described herein are systems and methods for determining a property of an analyte sensor using a stimulus signal. The sensor property can be used to compensate sensor data for sensitivity drift, or determine another property associated with the sensor, such as temperature, sensor membrane damage, moisture ingress in sensor electronics, and scaling factors.

Systems and methods for processing sensor data and self-calibration are provided. In some embodiments, systems and methods are provided which are capable of calibrating a continuous analyte sensor based on an initial sensitivity, and then continuously performing self-calibration without using, or with reduced use of, reference measurements. In certain embodiments, a sensitivity of the analyte sensor is determined by applying an estimative algorithm that is a function of certain parameters. Also described herein are systems and methods for determining a property of an analyte sensor using a stimulus signal. The sensor property can be used to compensate sensor data for sensitivity drift, or determine another property associated with the sensor, such as temperature, sensor membrane damage, moisture ingress in sensor electronics, and scaling factors.

System for monitoring an electrical system of a facility includes one or more local sensing devices, each of which is adapted to be connected to the electrical system of the facility in proximity to a respective load that receives power from the electrical system so as to make local measurements of a voltage across the load continuity measurements of electrical-power presence at one or more points in the electrical system of said facility. A processing unit is adapted to receive and compare the local measurements to reference measurements of the voltage supplied to the facility, in order to detect a fault in the electrical system.

A system and method for geolocating a mobile unit from a single base station is described. Communication signals and pilot signal information from a mobile unit are received at a base station with randomly-located antennas. Certain parameters of the signals are detected and a set of real-time, but ambiguous, location measurements is determined. The real-time measurements are compared to reference measurements previously stored in a database, indexed by range and bearing from the base station, to find the best match and thereby the geolocation of the mobile unit. A time history of the mobile unit's position is stored and compared with static information from maps and other geomorphological data to further refine the geolocation of the mobile unit.

An alignment target includes periodic patterns on two elements. The periodic patterns are aligned when the two elements are properly aligned. By measuring the two periodic patterns with an incident beam having a single polarization state and detecting the intensity of the resulting polarized light, it can be determined if the two elements are aligned. The same polarization state may be detected as is incident or different polarization states may be used. A reference measurement location may be used that includes a third periodic pattern on the first element and a fourth periodic pattern on the second element, which have a designed in offset, i.e., an offset when there is an offset of a known magnitude when the first and second element are properly aligned. The reference measurement location is similarly measured with a single polarization state.

Method and apparatus for providing real-time data indicative of the isotopic composition of formation fluids during drilling. The method includes the steps of: (a) providing a reference fluid having a known isotopic composition in a reference cell; (b) capturing a sample of formation; (c) providing at least one laser beam; (e) passing a beam through the reference fluid, measuring the reference-measurement beam before and after it passes through the reference fluid; (f) and passing a beam through the sample, measuring the beam before and after it passes through the sample, and calculating a first isotope concentration from those measurements. The measurements can provide information relating to the carbon isotopic composition of individual compounds in hydrocarbon gas mixtures, with the individual compounds including methane, ethane, propane, iso- or normal butane, or iso- or normal pentane.

A system and a corresponding method for determining a spatial relationship between a surface having a predetermined pattern and an apparatus are disclosed. A portion of the surface may be imaged and compared with the predetermined pattern. The comparison produces at least one reference measurement that may be used to determine a spatial relationship expressed in at least parameters that define an orientation of the surface. By using knowledge of the predetermined pattern together with an algebraic model of the image formation by the apparatus, a numerical adaptation can be performed. Parameters obtained from the adaptation can then be used to calculate the spatial relationship between the apparatus and the surface in terms of, for example, a distance between the apparatus and the surface or an angle between the surface and an axis extending through the apparatus.

A method and apparatus for use in respect of samples which are assessed for quality prior to testing in a clinical analyzer. The method and apparatus identify parameters such as gel level and height of fluid above the gel in blood samples, where appropriate, for the purposes of positioning the specimen for determination of interferents. Such interferents include hemoglobin (Hb), total bilirubin and lipids. These interferents are determined by measurement of absorption of different wavelengths of light in serum or plasma, or other specimens, which are then compared with values obtained through calibration using reference measurements for the respective interferents in serum or plasma or other type of specimen. Determinations of temperature of the specimen, as well as specimen type, for example whether the specimen is urine or plasma or serum, may also be carried out.

A mobile soil mapping system includes an implement for traversing a field to be mapped, and a reflectance module carried by the implement for collecting spectroscopic measurements of soil in the field. The reflectance module has a light source, an optical receiver for transmitting light to a spectrometer, and a shutter system that alters the optical path between the light source and the optical receiver. The shutter system allows the system to automatically collect a dark reference measurement and a known reference material measurement at timed intervals to compensate for drift of the spectrometer and the light source. A self-cleaning window on the reflectance module has a lower surface maintained in firm contact with the soil during operation. External reference blocks are used to calibrate the system to ensure standardized, repeatable data. Additional sensors are carried by the implement to collect other soil data, such as electrical conductivity and temperature.

Methods and apparatuses in which two or more types of attributes from an information stream are identified. Each of the identified attributes from the information stream is encoded. A time ordered indication is assigned with each of the identified attributes. Each of the identified attributes shares a common time reference measurement. A time ordered index of the identified attributes is generated.

A mobile soil mapping system includes an implement for traversing a field to be mapped, and a reflectance module carried by the implement for collecting spectroscopic measurements of soil in the field. The reflectance module has a light source, an optical receiver for transmitting light to a spectrometer, and a shutter system that alters the optical path between the light source and the optical receiver. The shutter system allows the system to automatically collect a dark reference measurement and a known reference material measurement at timed intervals to compensate for drift of the spectrometer and the light source. A self-cleaning window on the reflectance module has a lower surface maintained in firm contact with the soil during operation. External reference blocks are used to calibrate the system to ensure standardized, repeatable data. Additional sensors are carried by the implement to collect other soil data, such as electrical conductivity and temperature.

An alignment target includes periodic patterns on two elements. The periodic patterns are aligned when the two elements are properly aligned. By measuring the two periodic patterns at multiple polarization states and comparing the resulting intensities of the polarization states, it can be determined if the two elements are aligned. A reference measurement location may be used that includes third periodic pattern on the first element and a fourth periodic pattern on the second element, which have a designed in offset, i.e., an offset when there is an offset of a known magnitude when the first and second element are properly aligned. The reference measurement location is measured at two polarization states. The difference in the intensities of the polarization states at reference measurement location and is used to determine the amount of the alignment error.

A robot system which requires no manual teaching operation in acquiring calibration values for coordinate transformation, and improves the calibration accuracy includes a robot body, a camera, and a control apparatus. The control apparatus measures, via the camera, a calibration plate at each position and orientation of a first position and orientation group including a reference measurement position and orientation and a position and orientation within a first offset range, calculates a first calibration value based on the measurement value, measures, via the camera, the calibration plate at each position and orientation of a second position and orientation group including a reference operation position and orientation different from the reference measurement position and orientation, and a position and orientation within a second offset range, calculates a second calibration value based on the measurement value, and activates the robot body by using the first and second calibration values.

A system and method for measuring the displacement of a surface relative to a base reference, as well as for mapping the displacement of the surface relative to the base reference. A laser scanner generates point cloud data in respect of a measure of the spatial orientation of a distal surface relative to a reference point to define a three-dimensional image of the surface. Reference data is stored in respect of the spatial orientation of a base reference relative to the surface. processing means to process said point cloud data and said base reference data to determine the relative displacement of said surface with respect to said base reference. A system comprising: data processing means to obtain point cloud data defining a surface in a co-ordinate system coinciding with a base reference and to generate displacement data in respect of the displacement between each point of said point cloud and a related point of said base reference; comparison means to compare the displacement data against a prescribed threshold; and display means to graphically display the result of the comparison.

Method and apparatus for providing real-time data indicative of the isotopic composition of formation fluids during drilling. The method includes the steps of: (a) providing a reference fluid having a known isotopic composition in a reference cell; (b) capturing a sample of formation; (c) providing at least one laser beam; (e) passing a beam through the reference fluid, measuring the reference-measurement beam before and after it passes through the reference fluid; (f) and passing a beam through the sample, measuring the beam before and after it passes through the sample, and calculating a first isotope concentration from those measurements. The measurements can provide information relating to the carbon isotopic composition of individual compounds in hydrocarbon gas mixtures, with the individual compounds including methane, ethane, propane, iso- or normal butane, or iso- or normal pentane.

The present invention provides a photometric reference member comprising PTFE and glass. The member exhibits an absorbance change of less than 0.0001 absorbance units per degree C. over a range of temperatures, preferably from about 20° C. to about 40° C., and over wavelengths from about 600 nm to about 1650 nm, preferably about 600 nm to about 1050 nm. The invention also pertains to methods of using the photometric reference member to correct for temperature variations or drift in absorbance measurements.

Methods of reducing the effects of measurement device artifacts on a measurement of a sample are presented. A number of reference measurements performed with the measurement device are observed to identify reference independent components of the reference measurements. The variations of the reference independent components are used as surrogates for possible artifacts of the measurement device. A number of measurements of subjects similar to the sample are observed, and similarity components of the subject measurements that vary in a manner similar to the reference independent components may be identified. The sample measurement is then adjusted to remove at least part of the similarity components that correspond to the variations in the reference independent components. The adjustment of the sample measurement is thereby improved by reducing the effects of artifacts of the measurement device.

A scanning probe microscopy (SPM) inspection and / or modification system which uses SPM technology and techniques. The system includes various types of microstructured SPM probes for inspection and / or modification of the object. The components of the SPM system include microstructured calibration structures. A probe may be defective because of wear or because of fabrication errors. Various types of reference measurements of the calibration structure are made with the probe or vice versa to calibrate it. The components of the SPM system further include one or more tip machining structures. At these structures, material of the tips of the SPM probes may be machined by abrasively lapping and chemically lapping the material of the tip with the tip machining structures.

Methods and systems for matching critical dimension measurement applications at high precision across multiple optical metrology systems are presented. In one aspect, machine parameter values of a metrology system are calibrated based on critical dimension measurement data. In one further aspect, calibration of the machine parameter values is based on critical dimension measurement data collected by a target measurement system from a specimen with assigned critical dimension parameter values obtained from a reference measurement source. In another further aspect, the calibration of the machine parameter values of a target measurement system is based on measurement data without knowledge of critical dimension parameter values. In some examples, the measurement data includes critical dimension measurement data and thin film measurement data. Calibration of machine parameter values based on critical dimension data enhances application and tool-to-tool matching among systems for measurement of critical dimensions, film thickness, film composition, and overlay.

A method for creating an artistically coordinated image display. A digital template is provided for said image display and it includes of openings for placing images each having at least one required attribute for an image. A programmed computer system automatically searches a database of images for images to be placed in the openings and each of the images satisfy the openings required image attributes. One or more vertical and horizontal lines are demarcated in the so that subjects in the image can be placed on the lines or their intersecting points by modifying and shifting the image appropriately. A subject of the image can also be measured and its size can be set as a reference measurement unit to assist in aesthetically placing subjects proportionally within the image.

A method for surveying a borehole is disclosed which uses first and second gravity measurement devices disposed at corresponding first and second positions in the borehole and a supplemental reference measurement device disposed at the first position. Exemplary supplemental reference measurement devices include magnetometers and gyroscopes. The method includes determining a reference borehole azimuth at the first position using the supplemental reference measurement device, determining a change in borehole azimuth between the first and second positions using the first and second gravity measurement devices and determining the borehole azimuth at the second position by applying the change in borehole azimuth the reference azimuth. A system adapted to execute the disclosed method and a computer system including computer-readable logic configured to instruct a processor to execute the disclosed method are also provided.

The present invention relates generally a device for locating an indwelling catheter relative to its initial location. The system of the invention is based on emitting light from an optical probe placed on the patient to an optical marker on the tip of the catheter. The reflected light from the optical marker is then detected by the optical probe and the reading is recorded to memory as the reference measurement. The position of the optical probe on the patient is marked so that future measurements are taken from the same location. These future measurements will be compared to the reference measurement and from this comparison the displacement of the tip of the catheter is found and can be corrected. This system is fast, non-invasive, radiation free, and accurate to within 2-3 mm.

Systems and methods for processing sensor data and self-calibration are provided. In some embodiments, systems and methods are provided which are capable of calibrating a continuous analyte sensor based on an initial sensitivity, and then continuously performing self-calibration without using, or with reduced use of, reference measurements. In certain embodiments, a sensitivity of the analyte sensor is determined by applying an estimative algorithm that is a function of certain parameters. Also described herein are systems and methods for determining a property of an analyte sensor using a stimulus signal. The sensor property can be used to compensate sensor data for sensitivity drift, or determine another property associated with the sensor, such as temperature, sensor membrane damage, moisture ingress in sensor electronics, and scaling factors.

A scanning probe microscopy (SPM) inspection and / or modification system which uses SPM technology and techniques. The system includes various types of microstructured SPM probes for inspection and / or modification of the object. The components of the SPM system include microstructured calibration structures. A probe may be defective because of wear or because of fabrication errors. Various types of reference measurements of the calibration structure are made with the probe or vice versa to calibrate it. The components of the SPM system further include one or more tip machining structures. At these structures, material of the tips of the SPM probes may be machined by abrasively lapping and chemically lapping the material of the tip with the tip machining structures.

An alignment target includes periodic patterns on two elements. The periodic patterns are aligned when the two elements are properly aligned. By measuring the two periodic patterns at multiple polarization states and comparing the resulting intensities of the polarization states, it can be determined if the two elements are aligned. A reference measurement location may be used that includes third periodic pattern on the first element and a fourth periodic pattern on the second element, which have a designed in offset, i.e., an offset when there is an offset of a known magnitude when the first and second element are properly aligned. The reference measurement location is measured at two polarization states. The difference in the intensities of the polarization states at reference measurement location and is used to determine the amount of the alignment error.