An interference measuring device 1A comprises a
light source 10, an interference optical
system 20A, a
photomultiplier tube 30, an interference intensity measuring unit 40, a unit 50 for calculating the
electric field amplitude, and an analysis unit 60. The
light source 10 emits light in a band (a light band containing terahertz
waves) to which the
photomultiplier tube 30 is sensitive. The
photomultiplier tube 30 is sensitive in a light band containing terahertz
waves and outputs an electrical
signal with a value corresponding to the intensity of the incident light.The unit 50 for calculating the
electric field amplitude converts a value of intensity V of interference light, measured by the interference intensity measuring unit 40, into a value of
electric field amplitude E, based on a relationship between a value of the
electric field amplitude of light incident on the photomultiplier tube 30 and a value of the electrical
signal output by the photomultiplier tube 30. It obtains the value of the
electric field amplitude E of the interference light for each value of a
time difference Δt, which corresponds to an
optical path length difference Δd. Thus, an interference measuring device and an interference measurement method are realized that can perform Fourier
spectroscopy by interference measurement using a terahertz wave quickly and accurately.