598 results about "Test light" patented technology

The invention discloses a light source color preference degree evaluation method and device, equipment and a storage medium, and relates to the technical field of light source quality testing. The method comprises the following steps: acquiring a color temperature parameter of a test light source and spectral power distribution in a preset wavelength range, acquiring an associated reference light source based on the color temperature parameter, and calculating reference spectral power distribution; a color quality index is then calculated based on the plurality of test color samples according to the color temperature parameter, the spectral power distribution, and the reference spectral power distribution. Calculating a color gamut space area formed by the test color sample under the test light source according to the spectral power distribution, calculating a color resolution index according to the color gamut space area, and finally calculating a color preference index of the test light source according to the color quality index and the color resolution index. Therefore, the color preference index is calculated according to the color temperature parameter and the reference light source, the calculation process is associated with visual feelings such as visual discrimination, and a basis is provided for accurate evaluation or comparison of the color development quality of different color temperature test light sources through quantitative calculation of the color preference.

An apparatus includes a first light source for illuminating a chart including an index surface on which an index is provided, an objective lens for guiding index light emitted from the chart to an optical system, a first element for receiving the index light reflected on an optical surface in the optical system, an interferometer configured to include a second light source and a second element, and acquire a wavefront of measurement light, the measurement light being test light reflected on the target surface, and a reduction unit for reducing an intensity of a signal of light reflected on an optical surface other than the target surface, of the test light reflected on the plurality of optical surfaces and received by the second element.

The invention discloses a multi-mode perovskite and laminated cell comprehensive test system and method. The system comprises a darkroom, a test platform, an LED light source module, a CCD camera, a laser, an adjustable constant current source, an electronic load and an upper computer. The darkroom is used for shielding external ambient light and providing a dark test environment; the test platform is installed in the darkroom, and a to-be-tested battery is placed on the test platform; the LED light source module is used for providing a test light source; the CCD camera is used for capturing an optical signal generated by the battery to be tested in the testing process; the laser is used for emitting a laser beam to excite the to-be-detected battery to generate a specific optical response; the adjustable constant current source and the electronic load module can be electrically connected with a to-be-tested battery on the test platform, the adjustable constant current source is used for supplying current to the to-be-tested battery, and the electronic load module is used for simulating different load conditions; and the upper computer is used for realizing intelligent control of the test process and processing and display of test data.

The embodiment of the utility model provides a test chip for testing the optical performance of a wafer-level optical waveguide and a packaging structure thereof, and the test chip comprises a light inlet end face which enables test light to enter the test chip in a coupling manner; the waveguide is used for transmitting the test light to the transmitting end grating; the transmitting end grating is used for coupling the test light rays into the receiving end grating of the wafer to be tested, coupling the test light rays into a waveguide pattern area to be tested of the wafer to be tested through the receiving end grating of the wafer to be tested and then conducting the test light rays to the transmitting end grating of the wafer to be tested; the light passing through the to-be-tested waveguide pattern area is coupled by the transmitting end grating of the to-be-tested wafer and is incident to the receiving end grating of the test chip; and the receiving end grating couples the received light into the waveguide of the test chip and then emits the light through the end face of the light outlet, and the emitted light is used for determining optical performance parameters. The utility model also provides a packaging structure for realizing the test function of the test chip. According to the scheme, the optical performance test of the wafer-level optical waveguide is realized.

The invention provides an optical element laser thermal effect and light beam quality integrated measurement device and method, and the device combines key assemblies, such as a pump laser, a real-time power monitoring module, an energy transmission optical fiber, a multi-surface reflector, a beam splitter, a monochromatic optical filter, a CCD camera, an infrared thermal imager, a blackbody radiation calibration module, a Fizeau interferometer and the like. And the thermal effect of the transflective element can be measured at a specific angle. The device combines pump light and test light into one beam through the beam combiner and irradiates the surface of a sample at the same time, after transmission, the beam splitter divides the laser into two paths, one path is used for collecting far-field light spots to calculate the quality of the light beams, the other path forms an interference image to calculate thermal distortion, and meanwhile, the thermal infrared imager monitors the temperature of the sample. According to the invention, non-contact lossless integrated synchronous measurement is realized with high integration level and high flexibility, the device is suitable for temperature, thermal distortion and light beam quality measurement of an optical element under continuous or pulse laser, and thermal response characteristics of a sample are comprehensively and accurately evaluated.

The invention relates to the technical field of material science, and particularly discloses a method for testing photoelectric and thermal characteristics of a semiconductor device, which comprises the following steps of: acquiring crystal impurity evaluation parameters of the semiconductor device to perform crystal impurity evaluation of the semiconductor device, and acquiring a crystal impurity interference correction value, the method comprises the steps of obtaining a thermal characteristic parameter set and a light characteristic parameter set of a semiconductor device, determining a test temperature array and a test light intensity array, determining a plurality of photo-thermal coupling test schemes based on the test temperature array and the test light intensity array, applying each photo-thermal coupling test scheme to the semiconductor device and obtaining an electrical characteristic tested data set, according to the method, the electrical characteristic tested value is calculated based on the electrical characteristic tested data set corresponding to each photo-thermal coupling test scheme, the optimal photo-thermal coupling test scheme is determined, the rationality and adaptability of formulating the photo-thermal coupling test scheme are improved, and it is ensured that the test result can reflect the characteristic performance of the semiconductor device in various environments.

A head-mounted display system includes a left display assembly configured to provide left-side display light and left-side test light. A left waveguide incouples the left-side display light and outcouples the left-side display light for viewing. A left optical sensor is positioned to measure the left-side test light. A left inertial measurement unit (IMU) is configured to measure an orientation of the left display assembly. A right display assembly is configured to provide right-side display light and right-side test light. A right waveguide incouples the right-side display light and outcouples the right-side display light for viewing. A right optical sensor is positioned to measure the right-side test light. A right IMU is configured to measure an orientation of the right display assembly. A logic machine is configured to assess a stereo alignment for the left- and right-side display light.

According to the large-size wafer morphology measuring device provided by the invention, the parallel light beams emitted by the light source are split to form the reference light and the test light, the reference light enters the beam combiner after being reflected by the reference reflector, and the test light enters the beam combiner after being reflected by the surface of one side of the measured wafer; the beam combiner combines the incident reference light and test light and then converges the light to the detector to generate an interference fringe image, and the control unit controls the movement of the tested wafer and / or the reference reflector to change the optical path difference between the tested wafer and the reference reflector so as to determine the surface topography of the wafer. And the test yield and precision of the large warping sheet are improved.

The invention provides a system and a method for detecting geometric parameters of an optical fiber with a longitudinal periodic structure. The system comprises an optical fiber clamp used for fixing a test part of the optical fiber to be detected in optical fiber refractive index matching oil in a space image imaging device; the light source is used for emitting test light to the collecting lens through the optical fiber bundle, and the test light is focused into a focused light spot through the collecting lens and then is sequentially emitted to the space image imaging device and the detection device; the space image imaging device is used for moving along the axis direction of the to-be-tested optical fiber based on a preset moving speed after the test light passes through a test part in the optical fiber refractive index matching oil so as to form an optical imaging signal corresponding to the test part; and the detection device is used for acquiring geometric parameters of the periodic structure in the to-be-detected optical fiber according to the optical imaging signal. According to the invention, the detection device can accurately obtain the periodic structure geometric parameters of the to-be-detected optical fiber, and the detection precision and reliability are improved.

A method of predicting a lifespan of a display device includes preparing a test panel including a test light emitting element including a first and second test light emitting layers, measuring a luminance of the first and second color of the test panel to acquire first and second deterioration data of the first and second color, calculating a lifespan of a pixel based on the first and second deterioration data, and a first and second color component ratio of first emission light for a thickness of a wavelength conversion layer. The pixel includes a light emitting element emitting the first emission light and mixed light of the first and second color, and the wavelength conversion layer, and a light emitting layer of the light emitting element includes a first light emitting layer emitting light of the first color, and a second light emitting layer emitting light of the second color.

The invention discloses a comprehensive measurement system for a two-photon fluorescent material. The comprehensive measurement system comprises a laser, a tunable attenuator, a beam splitter, a reference light integrating sphere, a reference light spectrograph, a focus lens, a test light integrating sphere, a test light integrating sphere, a transmission light integrating sphere, a transmission light spectrograph, a stepping motor controller, a computer and the like. By means of the comprehensive measurement system, comprehensive measurement of multiple key performance parameters of the two-photon fluorescent material is achieved, the accuracy and reliability of measurement are improved, and powerful technical support is provided for research and application of the two-photon fluorescent material.

The embodiment of the specification provides a spectrum test lens clamp, comprising: a substrate on which a test lens is placed, the substrate being provided with a chute; the positioning part is used for positioning the test lens, the positioning part comprises a positioning block, and the positioning block can slide relative to the substrate; the clamping part is used for clamping and fixing the test lens, the clamping part comprises a fixing piece, an elastic piece and a clamping piece, the fixing piece is fixedly installed on the substrate, the first end of the elastic piece is connected with the fixing piece, the second end of the elastic piece is connected with the clamping piece, and the clamping piece slides in the sliding groove. The test lens is positioned through the positioning part, the lens is clamped and fixed through the clamping piece, the clamping and fixing effect on the test lens is guaranteed, and during testing, under the condition that it is guaranteed that the substrate is perpendicular to test light, only the test lens needs to be tightly attached to the substrate, and therefore the lens within a certain size range and with a certain thickness can be precisely measured.

According to the parallel detection method, the CIS test board card and the semiconductor test equipment provided by the invention, the probe station is controlled to move so as to connect the probe connector on the probe station with the pin of the chip to be tested, and the light source system is controlled to provide the test light source for the chip to be tested; controlling a switching circuit to switch a signal detected by the probe station to an image test system or a DC test system; acquiring detection information of the chip to be tested acquired by the image test system or the DC test system; and testing the to-be-tested chip based on the detection information, so that automatic testing can be realized, and the testing time can be saved.

The invention discloses a backlight module preparation method and device. The backlight module preparation method comprises the steps that LED test light bars are arranged according to the model size of a display module; adjusting a driving electrical parameter of the LED test light bar to enable the display of the whole machine to reach a target color point value, and obtaining a first electrical parameter; working current data of a single LED lamp bead is calculated according to the first electrical parameter, and luminous flux and color coordinates of various LED lamp beads are obtained; constructing a colorimetric mixing formula and calculating a white light color point theoretical value of the backlight module; and according to the theoretical value of the white light color point, in combination with the pre-selected wavelength of the blue light chip, the fluorescent powder and the glue type, obtaining the proportion of the fluorescent powder, and preparing the backlight module according to the proportion of the fluorescent powder. The whole machine is tested in advance, and the target color point value of the white light LED device is calculated according to the test data, so that the preparation accuracy of the white light LED device is improved, repeated test verification is avoided, the development period of a liquid crystal display is shortened, and the development cost is effectively reduced.

The invention discloses a compact high-precision pinhole phase shift point diffraction interference measurement device and method, and relates to the technical field of optical interference measurement, the compact high-precision pinhole phase shift point diffraction interference measurement device comprises a shell, the side wall of the shell is provided with a through hole, and the through hole is provided with a spherical lens; a diffracted light processing unit is obliquely mounted on the inner side wall of the upper end of the shell, a reflected light processing unit is obliquely mounted on the inner side wall of the lower end of the shell, and a unit to be tested is mounted outside the shell; the diffracted light processing unit emits to-be-tested light and reference light, the to-be-tested light irradiates a to-be-tested unit through the spherical lens, and the reference light and test light reflected by the to-be-tested unit irradiate the reflected light processing unit; and the diffracted light processing unit and the reflected light processing unit are electrically connected with the computer. According to the compact high-precision small hole phase shift point diffraction interference measuring device and method, high-precision absolute detection of the measured optical element is achieved, real-time visual monitoring can be achieved, and damage to human eyes during debugging is reduced.

The embodiment of the utility model discloses a distance measuring module and cleaning equipment, the distance measuring module comprises a light emitting part, a light adjusting part and a light receiving part, the light adjusting part is used for adjusting initial light emitted by the light emitting part, so that test light emitted by the light adjusting part comprises at least two detection areas with different light powers; wherein the light adjusting part at least covers partial area of the light emitting part. The part with relatively high optical power in the test light can be used for navigation application, and the relatively high optical power can ensure the requirement on distance measurement in the navigation application; and the part with lower optical power is used for obstacle avoidance application, and the problem of multi-path effect introduced by the surface projection laser light source can be effectively reduced due to the lower optical power. According to the distance measuring module provided by the embodiment of the invention, the distance measuring capability of the distance measuring module can be ensured only by carrying one light adjusting part on one light emitting part, and the multi-path effect can be effectively weakened.

The invention provides a simulation and automatic test system for vehicle-mounted LED control software. The simulation and automatic test system comprises a vehicle lamp driving control panel and a PC terminal, a simulation system and a test system are installed on the PC terminal. The PC end is in communication connection with the vehicle lamp driving control panel through the IO device, and the vehicle lamp driving control panel is further connected with the hardware fault injection unit FIU, the power module, the temperature measuring device and the LED testing lamp box. A PC terminal sends a simulation instruction to a vehicle lamp driving control panel through IO equipment and receives simulation data of the vehicle lamp driving control panel at the same time; a test case script is written on a test system, and a hardware fault injection unit FIU, an LED test lamp box and a temperature measurement device are utilized to simulate test conditions of a vehicle lamp driving control panel, when a PC end outputs an analog signal to the vehicle lamp driving control panel, the vehicle lamp driving control panel distinguishes the analog signal, and a test result is obtained. And a hardware fault injection unit FIU and temperature measurement equipment are controlled through a PC end to provide simulation conditions for the vehicle lamp driving control panel.

An object of the present disclosure is to make it possible to isolate whether an abnormality has occurred in any one of sections of an optical fiber and a device.The present disclosure provides an optical power feeding system including: a light source that outputs power feeding light to an optical fiber; a plurality of optical nodes connected in series to the optical fiber; and an optical tester that transmits test light from the light source side of the optical fiber toward the plurality of optical nodes and detects reflected light of the test light, in which each optical node includes: a photoelectric conversion element that converts the power feeding light into electricity; a power storage unit that stores electric power converted by the photoelectric conversion element; an optical switch that switches an output destination of the power feeding light propagated through the optical fiber between the photoelectric conversion element included in the optical node and another optical node connected to the optical fiber; a control unit that switches connection of the optical switch in accordance with a control signal superimposed on the power feeding light; and a test light cut filter that reflects, toward the optical tester, the test light output from the optical switch to the photoelectric conversion element.

The application provides a test device comprising a test bench comprising a box body and a windshield, the windshield is installed on the box body to form a closed space, and the windshield is used for receiving test light; the head-up display device is arranged in the closed space; the constant temperature device is used for keeping the temperature in the closed space constant; the testing mechanism is electrically connected with the head-up display device to obtain temperature information of the head-up display device, through the setting mode, on one hand, sunlight backflow testing is conducted on the head-up display device before daily use of the head-up display device, so that it is ensured that the performance of the head-up display device in the aspect of sunlight backflow meets the use requirement; on the other hand, the head-up display device is tested in a closed and constant-temperature environment, so that errors of test results caused by different environment temperatures are avoided, and the accuracy of the test results is improved.

The invention provides a method and a device for testing optical fiber coupling efficiency in space optical communication, and belongs to the field of space optical communication. Comprising a light source generation module used for generating a test light beam; the turbulence simulation module is used for simulating the influence of external field turbulence on light beam transmission; the phase difference correction module is used for correcting a low-order phase difference caused by system installation and adjustment or platform vibration and the like and compensating other phase differences caused by phase differences of optical devices; the optical fiber coupling module is used for coupling the spatial light to an optical fiber and determining optical power; and the control module is used for controlling the turbulence simulation module and the phase difference correction module and determining the optical fiber coupling efficiency according to the optical power of the test light beam. By means of the device, a quantitative relation model between the single influence factor and the optical fiber coupling efficiency can be determined with high precision.

The purpose of the present invention is to provide: a method for measuring a power coupling coefficient in consideration of asymmetry between cores; and a device therefor.　The device according to the present invention comprises: a measurement apparatus 11 that causes, at one end of a multi-core optical fiber, test light to be incident on an incident core that is one of the cores, and measures, at the one end of the multi-core optical fiber, the back-scattered light intensity of back-scattered light output from the incident core and an adjacent core adjacent thereto; and a calculation unit 12 that calculates a ratio between the back-scattered light intensity of the incident core and the back-scattered light intensity of the adjacent core from a distant position at which the back-scattered light intensity ratio becomes stationary in the longitudinal direction from the one end of the multi-core optical fiber, and calculates a power coupling coefficient between the cores by substituting, to a calculation formula, the ratio and the back-scattered light intensities of the incident core and the adjacent core at an arbitrary point in the longitudinal direction from the one end of the multi-core optical fiber.

The invention relates to the field of optical axis parallelism measurement, and provides an optical axis parallelism measurement method, which comprises the following steps of: adjusting a collimator so that the center of a cross cursor of the collimator is aligned with the center of a cross cursor of a test card; a reflecting prism is placed on the mounting surface of the adjustable workbench, and the reflecting surface of the reflecting prism is perpendicular to the mounting surface; the adjustable workbench is adjusted, so that the reflecting prism reflects the test light path of the collimator back to the center of the test hole of the collimator, and the mounting surface is calibrated to a first state parallel to the reference line; taking away the reflecting prism from the mounting surface and replacing the reflecting prism with the optical device; the adjustable workbench is adjusted, so that the center of a cross cursor of the test card shot by the optical device coincides with the cross center of a monitoring display picture of the optical device, and the mounting surface is in a second state parallel to the optical axis of the optical device; the optical device is taken away from the mounting surface and replaced with the reflecting prism, and the deviation measured by the collimator is the optical axis parallelism of the optical device. The measurement is simple, rapid and accurate.

The present application discloses a panel dust and defect detection method, device, equipment and storage medium, which relates to the field of image recognition. The AOI machine is used to shoot the illumination image of the panel to be tested under the test light source and the light-free image of the panel to be tested under no light source, and all suspected defect points contained in the illumination image of the panel to be tested are identified; then the illumination sub-image to be tested and the light-free sub-image to be tested are cropped from the two illumination images, and threshold binarization processing is performed to extract the defect contour from the binarized image; the suspected dust points are screened according to the pixel area of ​​the defect contour in the light-free sub-image to be tested, and the defect contours corresponding to the suspected dust points in the two sub-images to be tested are similarly matched, and the dust points and the real defect points are determined according to the matching results. Through the image feature comparison and geometric morphology matching mechanism under multi-light source conditions, combined with the pixel area screening of the defect contour and the cross-light source similarity analysis, the false defects caused by environmental interference and the defects of the panel itself can be effectively distinguished.

The invention relates to an LED lamp aging test device, which belongs to the technical field of lamp test devices, and comprises a test box body, a cover body is slidably clamped on the test box body, a test platform is installed in the test box body through a support part, the test platform is provided with regularly arranged air holes, and the bottom of the test platform is provided with a sliding groove. A sliding groove is formed in the cover body, two power supply assemblies are clamped in the sliding groove in a sliding mode, a downward pressing mechanism used for limiting the position of a tested lamp is fixed to the top of the cover body, each power supply assembly comprises a sliding block clamped in the sliding groove in a sliding mode, a clamping seat is fixed to the bottom of each sliding block, and an extension arm is rotationally clamped to each clamping seat. According to the LED lamp aging test platform, adaptive power supply can be carried out on LED lamps of different specifications and sizes, the tested LED lamp can be better fixed in cooperation with the downward pressing mechanism, a pin fixing assembly in the test platform can carry out a fixed test on the pin type LED lamp inserted into the insertion hole, and the test environment can be changed according to requirements in the aging test so as to accelerate the test speed.

The invention provides a rotary blade aerodynamic force and flow field synchronous test system, which relates to the technical field of wind driven generators, and adopts the scheme that a test smooth surface is formed by a PIV laser, a first light guide arm and a second light guide arm, and a smoke generation device is controlled to generate smog-shaped tracer particles at an air inlet of wind tunnel test equipment; after the wind tunnel testing equipment is started, tracer particles are applied to a flow field testing section where a tested blade is located, when the tested blade passes through a testing light surface, a camera is adopted to conduct flow field testing on the tested blade, a testing result is sent to the testing device, and the testing device obtains the testing result of the camera and sends the testing result to the testing device. And aerodynamic force and flow field tests are carried out on the tested blade based on the test result of the camera to obtain the lift force and the resistance borne by the tested blade, so that the aerodynamic force and surface flow field conditions of the tested blade are obtained.

The invention relates to a laser radar rotating mirror testing device and method, and the device employs a double-light-path design: a testing light source is subjected to beam splitting through a spectroscope, is reflected by a reflector I and a rotating mirror to form a testing light spot, is reflected by a reflector II to form a reference light spot, and is synchronously projected to a testing plate; a high-precision camera is used for capturing light spot displacement, a reference mark is combined to calibrate a coordinate system, and sub-milliradian level detection of rotating mirror angle drift is achieved. A sealed heat preservation cover is linked with temperature control equipment, so that the temperature control precision of + / -0.1 DEG C is realized; the integrated clamp synchronously fixes the rotating mirror and the reflecting mirror II to eliminate relative displacement errors of parts; the damping optical platform thoroughly isolates ground vibration; the same test light source reduces test errors. According to the testing method, a drift curve is automatically generated through temperature circulation (-40 DEG C to 85 DEG C), the angle drift amount is calculated according to a formula, a temperature compensation model is output, and rotating mirror temperature drift characteristic evaluation and compensation parameters are provided for the high-precision laser radar.

The embodiment of the invention provides a light reflection detection device and a light reflection detection method, which are applied to the technical field of optical communication. The device comprises a light reflectometer, a calibration piece and a signal processor. The calibration member has a preset reflection intensity or a preset Rayleigh scattering intensity. The output end of the light reflectometer is connected with the calibration piece and is used for being connected with the test optical fiber through the calibration piece. The light reflectometer is used for transmitting a test light signal based on the output end of the light reflectometer and receiving an echo light signal of the test light signal. And the signal processor is used for outputting signal insertion loss at different positions of the test optical fiber according to the echo optical signal. The light reflection detection device provided by the embodiment of the invention can realize the purpose of accurately detecting the insertion loss of the near end of the test optical fiber.

The invention discloses a method for distinguishing red copper LED supports and brass LED supports, and relates to the technical field of semiconductor devices. According to the invention, the to-be-tested base material support is used as the lamp bead support to prepare the to-be-tested LED lamp bead, and the brightness of the to-be-tested LED lamp bead and the brightness of the reference LED lamp bead are tested under the specific conditions by using the large brightness difference between the brass lamp bead and the red copper lamp bead under the specific test mode, the specific test current and the specific test time. According to the distinguishing method, the brightness of the red copper LED support and the brightness of the brass LED support are compared, the LED supports made of the red copper and the brass LED support can be rapidly and accurately distinguished, quality guarantee is provided for subsequent LED lamp bead preparation, distinguishing can be conducted by means of existing conditions in an LED lamp bead preparation enterprise through the distinguishing method, cost is low, and the distinguishing method is suitable for large-scale popularization and application. The problems of difficulty in accurate distinguishing in traditional naked eye observation and high cost and long time consumption in component analysis of a detection mechanism are solved.

An object of the present invention is to provide an optical transmission line test apparatus and a test method capable of measuring a cumulative crosstalk of an optical transmission line in which a plurality of uncoupled multi-core fibers are connected in series from one end side with an OTDR.An optical transmission line test apparatus 301 according to the present invention measures a cumulative crosstalk of an optical transmission line 50 in which a plurality of uncoupled multi-core fibers 50-i are connected in series. The optical transmission line test apparatus 301 includes a test light input unit 10 that inputs optical pulses to each of cores of the uncoupled multi-core fiber 50-1 at one end 50a of the optical transmission line 50; a reception unit 20 that receives backscattered light for each of the cores output from one end 50a; and a calculation unit 30 that acquires a loss distribution occurring in each of the cores from the backscattered light, and calculates the cumulative crosstalk from a connection loss at a connection point zj of the uncoupled multi-core fiber obtained from the loss distribution and a known inter-core mode coupling of each of the uncoupled multi-core fibers 50-i.

A non-dispersive near infrared light is used for detecting analyte gases in a testing zone. A sample obtained from the testing zone is irradiated with a reference light and with test lights. The test lights are emitted in sequence and modulated to be out of phase with the reference light. Frequencies of the test lights are in the absorption bands of particular analyte gases, with the reference light frequency being outside of the absorption bands. Analyte presence in the sample is identified by sensing changes in differences over time of test light and reference light intensity. Before irradiating the sample, the lights are optically conditioned by aligning them on the same path, and splitting the bandwidth of some lights for detecting analytes with overlapping absorption bands.