455 results about "Test light" patented technology

The invention discloses a light source color preference degree evaluation method and device, equipment and a storage medium, and relates to the technical field of light source quality testing. The method comprises the following steps: acquiring a color temperature parameter of a test light source and spectral power distribution in a preset wavelength range, acquiring an associated reference light source based on the color temperature parameter, and calculating reference spectral power distribution; a color quality index is then calculated based on the plurality of test color samples according to the color temperature parameter, the spectral power distribution, and the reference spectral power distribution. Calculating a color gamut space area formed by the test color sample under the test light source according to the spectral power distribution, calculating a color resolution index according to the color gamut space area, and finally calculating a color preference index of the test light source according to the color quality index and the color resolution index. Therefore, the color preference index is calculated according to the color temperature parameter and the reference light source, the calculation process is associated with visual feelings such as visual discrimination, and a basis is provided for accurate evaluation or comparison of the color development quality of different color temperature test light sources through quantitative calculation of the color preference.

An apparatus includes a first light source for illuminating a chart including an index surface on which an index is provided, an objective lens for guiding index light emitted from the chart to an optical system, a first element for receiving the index light reflected on an optical surface in the optical system, an interferometer configured to include a second light source and a second element, and acquire a wavefront of measurement light, the measurement light being test light reflected on the target surface, and a reduction unit for reducing an intensity of a signal of light reflected on an optical surface other than the target surface, of the test light reflected on the plurality of optical surfaces and received by the second element.

The invention discloses a multi-mode perovskite and laminated cell comprehensive test system and method. The system comprises a darkroom, a test platform, an LED light source module, a CCD camera, a laser, an adjustable constant current source, an electronic load and an upper computer. The darkroom is used for shielding external ambient light and providing a dark test environment; the test platform is installed in the darkroom, and a to-be-tested battery is placed on the test platform; the LED light source module is used for providing a test light source; the CCD camera is used for capturing an optical signal generated by the battery to be tested in the testing process; the laser is used for emitting a laser beam to excite the to-be-detected battery to generate a specific optical response; the adjustable constant current source and the electronic load module can be electrically connected with a to-be-tested battery on the test platform, the adjustable constant current source is used for supplying current to the to-be-tested battery, and the electronic load module is used for simulating different load conditions; and the upper computer is used for realizing intelligent control of the test process and processing and display of test data.

The embodiment of the utility model provides a test chip for testing the optical performance of a wafer-level optical waveguide and a packaging structure thereof, and the test chip comprises a light inlet end face which enables test light to enter the test chip in a coupling manner; the waveguide is used for transmitting the test light to the transmitting end grating; the transmitting end grating is used for coupling the test light rays into the receiving end grating of the wafer to be tested, coupling the test light rays into a waveguide pattern area to be tested of the wafer to be tested through the receiving end grating of the wafer to be tested and then conducting the test light rays to the transmitting end grating of the wafer to be tested; the light passing through the to-be-tested waveguide pattern area is coupled by the transmitting end grating of the to-be-tested wafer and is incident to the receiving end grating of the test chip; and the receiving end grating couples the received light into the waveguide of the test chip and then emits the light through the end face of the light outlet, and the emitted light is used for determining optical performance parameters. The utility model also provides a packaging structure for realizing the test function of the test chip. According to the scheme, the optical performance test of the wafer-level optical waveguide is realized.

The invention provides an optical element laser thermal effect and light beam quality integrated measurement device and method, and the device combines key assemblies, such as a pump laser, a real-time power monitoring module, an energy transmission optical fiber, a multi-surface reflector, a beam splitter, a monochromatic optical filter, a CCD camera, an infrared thermal imager, a blackbody radiation calibration module, a Fizeau interferometer and the like. And the thermal effect of the transflective element can be measured at a specific angle. The device combines pump light and test light into one beam through the beam combiner and irradiates the surface of a sample at the same time, after transmission, the beam splitter divides the laser into two paths, one path is used for collecting far-field light spots to calculate the quality of the light beams, the other path forms an interference image to calculate thermal distortion, and meanwhile, the thermal infrared imager monitors the temperature of the sample. According to the invention, non-contact lossless integrated synchronous measurement is realized with high integration level and high flexibility, the device is suitable for temperature, thermal distortion and light beam quality measurement of an optical element under continuous or pulse laser, and thermal response characteristics of a sample are comprehensively and accurately evaluated.

A head-mounted display system includes a left display assembly configured to provide left-side display light and left-side test light. A left waveguide incouples the left-side display light and outcouples the left-side display light for viewing. A left optical sensor is positioned to measure the left-side test light. A left inertial measurement unit (IMU) is configured to measure an orientation of the left display assembly. A right display assembly is configured to provide right-side display light and right-side test light. A right waveguide incouples the right-side display light and outcouples the right-side display light for viewing. A right optical sensor is positioned to measure the right-side test light. A right IMU is configured to measure an orientation of the right display assembly. A logic machine is configured to assess a stereo alignment for the left- and right-side display light.

According to the large-size wafer morphology measuring device provided by the invention, the parallel light beams emitted by the light source are split to form the reference light and the test light, the reference light enters the beam combiner after being reflected by the reference reflector, and the test light enters the beam combiner after being reflected by the surface of one side of the measured wafer; the beam combiner combines the incident reference light and test light and then converges the light to the detector to generate an interference fringe image, and the control unit controls the movement of the tested wafer and / or the reference reflector to change the optical path difference between the tested wafer and the reference reflector so as to determine the surface topography of the wafer. And the test yield and precision of the large warping sheet are improved.

The invention provides a system and a method for detecting geometric parameters of an optical fiber with a longitudinal periodic structure. The system comprises an optical fiber clamp used for fixing a test part of the optical fiber to be detected in optical fiber refractive index matching oil in a space image imaging device; the light source is used for emitting test light to the collecting lens through the optical fiber bundle, and the test light is focused into a focused light spot through the collecting lens and then is sequentially emitted to the space image imaging device and the detection device; the space image imaging device is used for moving along the axis direction of the to-be-tested optical fiber based on a preset moving speed after the test light passes through a test part in the optical fiber refractive index matching oil so as to form an optical imaging signal corresponding to the test part; and the detection device is used for acquiring geometric parameters of the periodic structure in the to-be-detected optical fiber according to the optical imaging signal. According to the invention, the detection device can accurately obtain the periodic structure geometric parameters of the to-be-detected optical fiber, and the detection precision and reliability are improved.

A method of predicting a lifespan of a display device includes preparing a test panel including a test light emitting element including a first and second test light emitting layers, measuring a luminance of the first and second color of the test panel to acquire first and second deterioration data of the first and second color, calculating a lifespan of a pixel based on the first and second deterioration data, and a first and second color component ratio of first emission light for a thickness of a wavelength conversion layer. The pixel includes a light emitting element emitting the first emission light and mixed light of the first and second color, and the wavelength conversion layer, and a light emitting layer of the light emitting element includes a first light emitting layer emitting light of the first color, and a second light emitting layer emitting light of the second color.

The invention discloses a comprehensive measurement system for a two-photon fluorescent material. The comprehensive measurement system comprises a laser, a tunable attenuator, a beam splitter, a reference light integrating sphere, a reference light spectrograph, a focus lens, a test light integrating sphere, a test light integrating sphere, a transmission light integrating sphere, a transmission light spectrograph, a stepping motor controller, a computer and the like. By means of the comprehensive measurement system, comprehensive measurement of multiple key performance parameters of the two-photon fluorescent material is achieved, the accuracy and reliability of measurement are improved, and powerful technical support is provided for research and application of the two-photon fluorescent material.

The embodiment of the specification provides a spectrum test lens clamp, comprising: a substrate on which a test lens is placed, the substrate being provided with a chute; the positioning part is used for positioning the test lens, the positioning part comprises a positioning block, and the positioning block can slide relative to the substrate; the clamping part is used for clamping and fixing the test lens, the clamping part comprises a fixing piece, an elastic piece and a clamping piece, the fixing piece is fixedly installed on the substrate, the first end of the elastic piece is connected with the fixing piece, the second end of the elastic piece is connected with the clamping piece, and the clamping piece slides in the sliding groove. The test lens is positioned through the positioning part, the lens is clamped and fixed through the clamping piece, the clamping and fixing effect on the test lens is guaranteed, and during testing, under the condition that it is guaranteed that the substrate is perpendicular to test light, only the test lens needs to be tightly attached to the substrate, and therefore the lens within a certain size range and with a certain thickness can be precisely measured.

According to the parallel detection method, the CIS test board card and the semiconductor test equipment provided by the invention, the probe station is controlled to move so as to connect the probe connector on the probe station with the pin of the chip to be tested, and the light source system is controlled to provide the test light source for the chip to be tested; controlling a switching circuit to switch a signal detected by the probe station to an image test system or a DC test system; acquiring detection information of the chip to be tested acquired by the image test system or the DC test system; and testing the to-be-tested chip based on the detection information, so that automatic testing can be realized, and the testing time can be saved.

The invention discloses a backlight module preparation method and device. The backlight module preparation method comprises the steps that LED test light bars are arranged according to the model size of a display module; adjusting a driving electrical parameter of the LED test light bar to enable the display of the whole machine to reach a target color point value, and obtaining a first electrical parameter; working current data of a single LED lamp bead is calculated according to the first electrical parameter, and luminous flux and color coordinates of various LED lamp beads are obtained; constructing a colorimetric mixing formula and calculating a white light color point theoretical value of the backlight module; and according to the theoretical value of the white light color point, in combination with the pre-selected wavelength of the blue light chip, the fluorescent powder and the glue type, obtaining the proportion of the fluorescent powder, and preparing the backlight module according to the proportion of the fluorescent powder. The whole machine is tested in advance, and the target color point value of the white light LED device is calculated according to the test data, so that the preparation accuracy of the white light LED device is improved, repeated test verification is avoided, the development period of a liquid crystal display is shortened, and the development cost is effectively reduced.

The invention discloses a compact high-precision pinhole phase shift point diffraction interference measurement device and method, and relates to the technical field of optical interference measurement, the compact high-precision pinhole phase shift point diffraction interference measurement device comprises a shell, the side wall of the shell is provided with a through hole, and the through hole is provided with a spherical lens; a diffracted light processing unit is obliquely mounted on the inner side wall of the upper end of the shell, a reflected light processing unit is obliquely mounted on the inner side wall of the lower end of the shell, and a unit to be tested is mounted outside the shell; the diffracted light processing unit emits to-be-tested light and reference light, the to-be-tested light irradiates a to-be-tested unit through the spherical lens, and the reference light and test light reflected by the to-be-tested unit irradiate the reflected light processing unit; and the diffracted light processing unit and the reflected light processing unit are electrically connected with the computer. According to the compact high-precision small hole phase shift point diffraction interference measuring device and method, high-precision absolute detection of the measured optical element is achieved, real-time visual monitoring can be achieved, and damage to human eyes during debugging is reduced.

An object of the present disclosure is to make it possible to isolate whether an abnormality has occurred in any one of sections of an optical fiber and a device.The present disclosure provides an optical power feeding system including: a light source that outputs power feeding light to an optical fiber; a plurality of optical nodes connected in series to the optical fiber; and an optical tester that transmits test light from the light source side of the optical fiber toward the plurality of optical nodes and detects reflected light of the test light, in which each optical node includes: a photoelectric conversion element that converts the power feeding light into electricity; a power storage unit that stores electric power converted by the photoelectric conversion element; an optical switch that switches an output destination of the power feeding light propagated through the optical fiber between the photoelectric conversion element included in the optical node and another optical node connected to the optical fiber; a control unit that switches connection of the optical switch in accordance with a control signal superimposed on the power feeding light; and a test light cut filter that reflects, toward the optical tester, the test light output from the optical switch to the photoelectric conversion element.

The application provides a test device comprising a test bench comprising a box body and a windshield, the windshield is installed on the box body to form a closed space, and the windshield is used for receiving test light; the head-up display device is arranged in the closed space; the constant temperature device is used for keeping the temperature in the closed space constant; the testing mechanism is electrically connected with the head-up display device to obtain temperature information of the head-up display device, through the setting mode, on one hand, sunlight backflow testing is conducted on the head-up display device before daily use of the head-up display device, so that it is ensured that the performance of the head-up display device in the aspect of sunlight backflow meets the use requirement; on the other hand, the head-up display device is tested in a closed and constant-temperature environment, so that errors of test results caused by different environment temperatures are avoided, and the accuracy of the test results is improved.

The invention provides a method and a device for testing optical fiber coupling efficiency in space optical communication, and belongs to the field of space optical communication. Comprising a light source generation module used for generating a test light beam; the turbulence simulation module is used for simulating the influence of external field turbulence on light beam transmission; the phase difference correction module is used for correcting a low-order phase difference caused by system installation and adjustment or platform vibration and the like and compensating other phase differences caused by phase differences of optical devices; the optical fiber coupling module is used for coupling the spatial light to an optical fiber and determining optical power; and the control module is used for controlling the turbulence simulation module and the phase difference correction module and determining the optical fiber coupling efficiency according to the optical power of the test light beam. By means of the device, a quantitative relation model between the single influence factor and the optical fiber coupling efficiency can be determined with high precision.

The invention relates to the field of optical axis parallelism measurement, and provides an optical axis parallelism measurement method, which comprises the following steps of: adjusting a collimator so that the center of a cross cursor of the collimator is aligned with the center of a cross cursor of a test card; a reflecting prism is placed on the mounting surface of the adjustable workbench, and the reflecting surface of the reflecting prism is perpendicular to the mounting surface; the adjustable workbench is adjusted, so that the reflecting prism reflects the test light path of the collimator back to the center of the test hole of the collimator, and the mounting surface is calibrated to a first state parallel to the reference line; taking away the reflecting prism from the mounting surface and replacing the reflecting prism with the optical device; the adjustable workbench is adjusted, so that the center of a cross cursor of the test card shot by the optical device coincides with the cross center of a monitoring display picture of the optical device, and the mounting surface is in a second state parallel to the optical axis of the optical device; the optical device is taken away from the mounting surface and replaced with the reflecting prism, and the deviation measured by the collimator is the optical axis parallelism of the optical device. The measurement is simple, rapid and accurate.

The present application discloses a panel dust and defect detection method, device, equipment and storage medium, which relates to the field of image recognition. The AOI machine is used to shoot the illumination image of the panel to be tested under the test light source and the light-free image of the panel to be tested under no light source, and all suspected defect points contained in the illumination image of the panel to be tested are identified; then the illumination sub-image to be tested and the light-free sub-image to be tested are cropped from the two illumination images, and threshold binarization processing is performed to extract the defect contour from the binarized image; the suspected dust points are screened according to the pixel area of ​​the defect contour in the light-free sub-image to be tested, and the defect contours corresponding to the suspected dust points in the two sub-images to be tested are similarly matched, and the dust points and the real defect points are determined according to the matching results. Through the image feature comparison and geometric morphology matching mechanism under multi-light source conditions, combined with the pixel area screening of the defect contour and the cross-light source similarity analysis, the false defects caused by environmental interference and the defects of the panel itself can be effectively distinguished.

The invention relates to a laser radar rotating mirror testing device and method, and the device employs a double-light-path design: a testing light source is subjected to beam splitting through a spectroscope, is reflected by a reflector I and a rotating mirror to form a testing light spot, is reflected by a reflector II to form a reference light spot, and is synchronously projected to a testing plate; a high-precision camera is used for capturing light spot displacement, a reference mark is combined to calibrate a coordinate system, and sub-milliradian level detection of rotating mirror angle drift is achieved. A sealed heat preservation cover is linked with temperature control equipment, so that the temperature control precision of + / -0.1 DEG C is realized; the integrated clamp synchronously fixes the rotating mirror and the reflecting mirror II to eliminate relative displacement errors of parts; the damping optical platform thoroughly isolates ground vibration; the same test light source reduces test errors. According to the testing method, a drift curve is automatically generated through temperature circulation (-40 DEG C to 85 DEG C), the angle drift amount is calculated according to a formula, a temperature compensation model is output, and rotating mirror temperature drift characteristic evaluation and compensation parameters are provided for the high-precision laser radar.

The embodiment of the invention provides a light reflection detection device and a light reflection detection method, which are applied to the technical field of optical communication. The device comprises a light reflectometer, a calibration piece and a signal processor. The calibration member has a preset reflection intensity or a preset Rayleigh scattering intensity. The output end of the light reflectometer is connected with the calibration piece and is used for being connected with the test optical fiber through the calibration piece. The light reflectometer is used for transmitting a test light signal based on the output end of the light reflectometer and receiving an echo light signal of the test light signal. And the signal processor is used for outputting signal insertion loss at different positions of the test optical fiber according to the echo optical signal. The light reflection detection device provided by the embodiment of the invention can realize the purpose of accurately detecting the insertion loss of the near end of the test optical fiber.

The invention discloses a method for distinguishing red copper LED supports and brass LED supports, and relates to the technical field of semiconductor devices. According to the invention, the to-be-tested base material support is used as the lamp bead support to prepare the to-be-tested LED lamp bead, and the brightness of the to-be-tested LED lamp bead and the brightness of the reference LED lamp bead are tested under the specific conditions by using the large brightness difference between the brass lamp bead and the red copper lamp bead under the specific test mode, the specific test current and the specific test time. According to the distinguishing method, the brightness of the red copper LED support and the brightness of the brass LED support are compared, the LED supports made of the red copper and the brass LED support can be rapidly and accurately distinguished, quality guarantee is provided for subsequent LED lamp bead preparation, distinguishing can be conducted by means of existing conditions in an LED lamp bead preparation enterprise through the distinguishing method, cost is low, and the distinguishing method is suitable for large-scale popularization and application. The problems of difficulty in accurate distinguishing in traditional naked eye observation and high cost and long time consumption in component analysis of a detection mechanism are solved.

A non-dispersive near infrared light is used for detecting analyte gases in a testing zone. A sample obtained from the testing zone is irradiated with a reference light and with test lights. The test lights are emitted in sequence and modulated to be out of phase with the reference light. Frequencies of the test lights are in the absorption bands of particular analyte gases, with the reference light frequency being outside of the absorption bands. Analyte presence in the sample is identified by sensing changes in differences over time of test light and reference light intensity. Before irradiating the sample, the lights are optically conditioned by aligning them on the same path, and splitting the bandwidth of some lights for detecting analytes with overlapping absorption bands.

The invention discloses a sulfur precipitation testing device for exploitation of a high-sulfur gas field, and belongs to the technical field of gas field exploitation. Comprising a box body, a light source testing mechanism and a high-voltage electron microscope, a protective door is arranged on the front side of the box body, a closed testing cavity is formed between the protective door and the box body, and a filter cartridge assembly, an experimental sample cartridge assembly and a sample cartridge restraint frame assembly which are used for pretreatment are arranged in the testing cavity; the light source testing mechanism comprises a testing light source emitter and a testing signal receiver, the light source testing mechanism and the experiment sample cylinder assembly are arranged in a matched mode, and the high-voltage electron microscope and the sample cylinder restraint frame assembly are arranged in a matched mode. Based on the characteristics of a high-sulfur-content natural gas sample, a stable and safe test environment is provided for a sulfur precipitation test through specific arrangement in the box body; meanwhile, the high-power microscopy is cooperated with the light source test mechanism to complete the test, so that the accuracy, the stability and the comprehensiveness of the sulfur precipitation test are ensured, and an effective theoretical basis is provided for gas field exploitation design, production parameter optimization and the like.

The invention relates to a solar cell detection method and a solar cell detection system. The method comprises the following steps: in response to an electroluminescence test instruction, obtaining a first photoluminescence spectrum of a to-be-tested sub-cell; first exciting light is applied to the laminated cell, at least the to-be-tested sub-cell and the associated sub-cell are excited to be in a light-emitting state, and the associated sub-cell and the to-be-tested sub-cell are sequentially and adjacently arranged in the sub-cell current transmission direction corresponding to the test electric signal; applying a first test electric signal to the laminated cell to obtain a test emergent light spectrum of the to-be-tested sub-cell; and determining the electroluminescence spectrum of the to-be-tested sub-cell according to the first photoluminescence spectrum of the to-be-tested sub-cell and the test emergent light spectrum. The laminated cell can be subjected to an electroluminescence test and a photoluminescence test, and the accuracy of the electroluminescence test of the laminated cell is effectively improved.

The utility model relates to the technical field of lamp test benches, in particular to a light source three-axis adjustable and target plate angle adjustable lamp test bench which comprises a mounting rack, a flat shaft, a longitudinal shaft, a transverse shaft and an optical detection mechanism, the flat shaft is arranged on the mounting rack, the longitudinal shaft is slidably arranged on the flat shaft, the transverse shaft is slidably arranged on the longitudinal shaft, and the optical detection mechanism is arranged on the mounting rack. A fixing support is slidably arranged on the transverse shaft and used for installing a test lamp, and the optical detection mechanism is used for adjusting the lamp irradiation angle and testing irradiation area parameters. The light source three-axis adjustable and target plate angle adjustable lamp test bench comprises a driving assembly for driving the longitudinal shaft, the transverse shaft and the fixed support to slide. The device has the effect of being capable of testing the interior lamps of different vehicle types.

The application discloses a photoelectric detection chip testing system and method. The system comprises a light source assembly, a power supply assembly, a fiber assembly, a conversion assembly, a coupling assembly and a testing assembly. The light source assembly is used for providing a test light signal. The power supply assembly provides a bias voltage for a to-be-tested photoelectric detection chip. The fiber assembly is used for receiving the test light signal and transmitting the test light signal to the to-be-tested photoelectric detection chip. The conversion assembly is used for receiving a photoelectric current signal output by the to-be-tested photoelectric detection chip, converting the photoelectric current signal into a voltage signal and providing the voltage signal to the coupling assembly. The coupling assembly is used for controlling the fiber assembly to move based on the voltage signal provided by the conversion assembly, so that the to-be-tested photoelectric detection chip is coupled to the most test light signals. The testing assembly is used for testing the performance of the to-be-tested photoelectric detection chip in the case that the to-be-tested photoelectric detection chip is coupled to the most test light signals.

The invention belongs to the field of optical measurement and detection, and particularly relates to a coherence tomography wavefront measurement device and method based on optical fiber interconnection and point diffraction, the measurement device separates a fundamental mode and a high-order mode of test light through a few-mode optical fiber, the fundamental mode generates a reference spherical wave through point diffraction to serve as reference light, and the high-order mode serves as the test light; after the test light and the reference light are subjected to optical fiber coupling interference, an interference pattern is obtained by a detector, and wavefront error measurement and optimization are realized through wavefront calculation and correction. The method has high precision and high stability, and can realize rapid closed-loop feedback correction.

The utility model relates to a light emitting diode test fixture, and relates to the technical field of test fixtures, and the light emitting diode test fixture comprises a bottom plate, the bottom plate is used for supporting the light emitting diode test fixture, a sub-fixture is installed on the bottom plate, a light emitting diode is placed on the sub-fixture, one side of the sub-fixture is provided with a pressing plate, and the pressing plate is arranged on the other side of the sub-fixture. The pressing plate is used for fixing a light-emitting diode on the sub-clamp; a fixing assembly is arranged on the bottom plate and used for connecting and fixing the bottom plate, the sub-clamps and the pressing plate. The light-emitting diode mechanical energy testing device can test mechanical energy of any light-emitting diode, so that when impact and vibration tests are carried out on the light-emitting diode, a wholebatch of light-emitting diodes do not need to be reached for testing, the testing period of the light-emitting diode is shortened, the testing cost is reduced, and the working efficiency of an enterprise is improved.

The utility model relates to a device and a system for automatically measuring the lighting effect of a lamp, the device comprises a cabinet body for placing the lamp and a drawer which can be folded in the cabinet body or extend out of the cabinet body, and an optical measuring instrument which can be moved to a proper test position to obtain the optical data of the lamp is arranged in the cabinet body. The device is designed to be of a drawer type structure and has certain sealing performance, light rays of a tested lamp are not interfered by non-measurement light, the lighting effect measurement precision of the lamp is improved, and the detection, verification and correction efficiency of lamp products can be greatly improved by combining the device with a system.