267 results about "Test light" patented technology

A method of predicting a lifespan of a display device includes preparing a test panel including a test light emitting element including a first and second test light emitting layers, measuring a luminance of the first and second color of the test panel to acquire first and second deterioration data of the first and second color, calculating a lifespan of a pixel based on the first and second deterioration data, and a first and second color component ratio of first emission light for a thickness of a wavelength conversion layer. The pixel includes a light emitting element emitting the first emission light and mixed light of the first and second color, and the wavelength conversion layer, and a light emitting layer of the light emitting element includes a first light emitting layer emitting light of the first color, and a second light emitting layer emitting light of the second color.

The invention discloses a backlight module preparation method and device. The backlight module preparation method comprises the steps that LED test light bars are arranged according to the model size of a display module; adjusting a driving electrical parameter of the LED test light bar to enable the display of the whole machine to reach a target color point value, and obtaining a first electrical parameter; working current data of a single LED lamp bead is calculated according to the first electrical parameter, and luminous flux and color coordinates of various LED lamp beads are obtained; constructing a colorimetric mixing formula and calculating a white light color point theoretical value of the backlight module; and according to the theoretical value of the white light color point, in combination with the pre-selected wavelength of the blue light chip, the fluorescent powder and the glue type, obtaining the proportion of the fluorescent powder, and preparing the backlight module according to the proportion of the fluorescent powder. The whole machine is tested in advance, and the target color point value of the white light LED device is calculated according to the test data, so that the preparation accuracy of the white light LED device is improved, repeated test verification is avoided, the development period of a liquid crystal display is shortened, and the development cost is effectively reduced.

The invention provides a method and a device for testing optical fiber coupling efficiency in space optical communication, and belongs to the field of space optical communication. Comprising a light source generation module used for generating a test light beam; the turbulence simulation module is used for simulating the influence of external field turbulence on light beam transmission; the phase difference correction module is used for correcting a low-order phase difference caused by system installation and adjustment or platform vibration and the like and compensating other phase differences caused by phase differences of optical devices; the optical fiber coupling module is used for coupling the spatial light to an optical fiber and determining optical power; and the control module is used for controlling the turbulence simulation module and the phase difference correction module and determining the optical fiber coupling efficiency according to the optical power of the test light beam. By means of the device, a quantitative relation model between the single influence factor and the optical fiber coupling efficiency can be determined with high precision.

The application discloses a photoelectric detection chip testing system and method. The system comprises a light source assembly, a power supply assembly, a fiber assembly, a conversion assembly, a coupling assembly and a testing assembly. The light source assembly is used for providing a test light signal. The power supply assembly provides a bias voltage for a to-be-tested photoelectric detection chip. The fiber assembly is used for receiving the test light signal and transmitting the test light signal to the to-be-tested photoelectric detection chip. The conversion assembly is used for receiving a photoelectric current signal output by the to-be-tested photoelectric detection chip, converting the photoelectric current signal into a voltage signal and providing the voltage signal to the coupling assembly. The coupling assembly is used for controlling the fiber assembly to move based on the voltage signal provided by the conversion assembly, so that the to-be-tested photoelectric detection chip is coupled to the most test light signals. The testing assembly is used for testing the performance of the to-be-tested photoelectric detection chip in the case that the to-be-tested photoelectric detection chip is coupled to the most test light signals.

The invention belongs to the field of optical measurement and detection, and particularly relates to a coherence tomography wavefront measurement device and method based on optical fiber interconnection and point diffraction, the measurement device separates a fundamental mode and a high-order mode of test light through a few-mode optical fiber, the fundamental mode generates a reference spherical wave through point diffraction to serve as reference light, and the high-order mode serves as the test light; after the test light and the reference light are subjected to optical fiber coupling interference, an interference pattern is obtained by a detector, and wavefront error measurement and optimization are realized through wavefront calculation and correction. The method has high precision and high stability, and can realize rapid closed-loop feedback correction.

The utility model relates to a light emitting diode test fixture, and relates to the technical field of test fixtures, and the light emitting diode test fixture comprises a bottom plate, the bottom plate is used for supporting the light emitting diode test fixture, a sub-fixture is installed on the bottom plate, a light emitting diode is placed on the sub-fixture, one side of the sub-fixture is provided with a pressing plate, and the pressing plate is arranged on the other side of the sub-fixture. The pressing plate is used for fixing a light-emitting diode on the sub-clamp; a fixing assembly is arranged on the bottom plate and used for connecting and fixing the bottom plate, the sub-clamps and the pressing plate. The light-emitting diode mechanical energy testing device can test mechanical energy of any light-emitting diode, so that when impact and vibration tests are carried out on the light-emitting diode, a wholebatch of light-emitting diodes do not need to be reached for testing, the testing period of the light-emitting diode is shortened, the testing cost is reduced, and the working efficiency of an enterprise is improved.

The utility model relates to a device and a system for automatically measuring the lighting effect of a lamp, the device comprises a cabinet body for placing the lamp and a drawer which can be folded in the cabinet body or extend out of the cabinet body, and an optical measuring instrument which can be moved to a proper test position to obtain the optical data of the lamp is arranged in the cabinet body. The device is designed to be of a drawer type structure and has certain sealing performance, light rays of a tested lamp are not interfered by non-measurement light, the lighting effect measurement precision of the lamp is improved, and the detection, verification and correction efficiency of lamp products can be greatly improved by combining the device with a system.

The utility model discloses a battery piece testing device and a battery piece manufacturing system, and the device comprises a testing box which is used for placing a to-be-tested battery piece and a standard battery piece, and is provided with a testing lamp which is used for irradiating the to-be-tested battery piece and the standard battery piece; the dustproof cover is located in the test box and used for covering the standard battery piece, a light-transmitting inclined plane is formed on the dustproof cover, an included angle is formed between the light-transmitting inclined plane and the horizontal plane, and the test lamp is suitable for irradiating the standard battery piece from the light-transmitting inclined plane; and the blowing device is provided with an air outlet, and the air outlet directly faces the light-transmitting inclined plane and is used for blowing air to the light-transmitting inclined plane. According to the battery piece testing device provided by the embodiment of the utility model, the cleanliness above the standard battery piece can be ensured, so that the accuracy of short-circuit current detected by the battery piece to be tested is ensured, the testing effect is improved, meanwhile, the automation can be improved, the human interference is reduced, the testing efficiency is improved, the production cost is reduced, the use effect is better, and the application range is wider.

The application provides a light source calibration method and device for optical chip testing and an optical chip testing system. The method comprises the following steps: obtaining a linear relationship between a light source voltage parameter and a light source brightness in a preset measurable voltage range; selecting a quasi-voltage parameter based on a preset rule, obtaining a measured value and a theoretical value of the light source brightness under the quasi-voltage parameter to obtain a variation corresponding to each quasi-voltage parameter, and judging whether each variation meets a preset accuracy requirement; taking the quasi-voltage parameter meeting the preset accuracy requirement as a calibrated light source parameter, and constructing a corresponding light source based on the calibrated light source parameter to participate in the testing of the optical chip. The application is based on the idea of the gradient descent algorithm, and stability and high efficiency are taken into account. No matter in any accuracy requirement environment, the light source calibration can be completed in a short time, the calibration frequency is low, the calibration efficiency is high, the light source calibration is accurately and efficiently realized, and the chip testing efficiency is improved.

The application relates to the technical field of optical measurement, and discloses a semiconductor structure doping concentration distribution measuring system, which comprises an excitation module for generating excitation light; a light splitting module located on the light path of the excitation light and used for splitting the excitation light into first power light and second power light, wherein the first power light is used for irradiating a sample to be measured; a measuring module located on the light path of the second power light and used for measuring the power of the second power light; and a collecting module used for collecting the spectrum signal of test light generated by the sample to be measured under the excitation of the first power light. The embodiment of the application can realize non-contact and nondestructive measurement of the doping concentration distribution of a semiconductor structure.

A kind of telescope active optical correction system correction accuracy testing device, including laser interferometer, multidimensional adjusting table, wave aberration measurement component and plane mirror, laser interferometer is placed in the outside of optical telescope for emitting test light to the inside of optical telescope, to detect the wave aberration data of multiple fields of view;Multidimensional adjusting table is used to adjust the position, angle of optical element in optical telescope, to simulate the situation that telescope imaging quality drops;Wave aberration measurement component is set at the image plane of telescope for measuring the wave aberration after optical telescope imaging quality drops, and plane mirror is used to reflect test light.The present application relates to a kind of telescope active optical correction system correction accuracy testing method, the displacement amount and rotation angle of optical element when comparing when simulating image quality drop and when correcting judge the correction accuracy of active optical correction system, compare wave aberration before simulating image quality drop and after correction, judge whether the image quality after correction reaches the image quality before simulating image quality drop.

The invention relates to an avionics system optical fiber communication link health management technology, and provides an airborne communication link fault positioning method and system based on an embedded OFDR, and the method comprises the steps: integrating an embedded OFDR function unit in an airborne network switching module, outputting frequency linear scanning continuous wave test light, and dividing the test light into detection light and reference light; the detection light is sequentially injected into each to-be-detected optical fiber link through the switch exchange matrix, and returned backward Rayleigh scattering light is received and interferes with the reference light to generate a beat frequency signal; a Rayleigh scattering distance map is obtained through analog-to-digital conversion and fast Fourier transform and is compared with a pre-stored health reference map in a differential mode, an abnormal event is recognized, and the position of a fault point is accurately positioned. According to the method, on-line monitoring with sub-millimeter resolution and no blind area can be achieved under the conditions of low power and no communication interruption, multi-link automatic polling, fault link switching and maintenance information reporting are supported, and the requirements for high reliability and BIT autonomous diagnosis of an airborne system are met.

A photoelectric converter sensitivity adjusting device and method, comprising a light source module, a shielding cage, an optical fiber bundle, an optical power meter, a power supply, a photoelectric converter and a voltmeter, the light source module is used to generate test light, one end of the shielding cage is provided with a small hole for receiving the test light, the other end is provided with an optical fiber bundle connector connected with the optical fiber bundle, the test light entering the shielding cage from the small hole enters one end of the optical fiber bundle from the optical fiber bundle connector, the optical power meter is used to test the optical power emitted from the other end of the optical fiber bundle, the photoelectric converter has an optical fiber bundle connector and an output signal line, the optical fiber bundle connector is used to be detachably connected to the other end of the optical fiber bundle, and the voltmeter tests the output voltage of the photoelectric converter; the photoelectric converter is provided with a sensitivity adjusting resistor, and the output voltage can be changed under the same light intensity excitation. The device can shield the interference of environmental light in ordinary experimental environment, accurately adjust the sensitivity of the photoelectric converter, and has the advantages of low cost, high detection efficiency and convenient operation.

The utility model discloses a high light transmittance acrylic plate light transmittance testing device, relates to the light transmittance testing technical field, and comprises a work bench, four corners of the lower end of the work bench are fixedly connected with support columns, two sides of the upper end of the work bench are respectively provided with two first telescoping grooves and two second telescoping grooves, and the two first telescoping grooves and the two second telescoping grooves are connected with the support columns. A telescopic mechanism connected with the two first telescopic grooves is arranged at the lower end of the workbench, a moving plate is arranged above the two second telescopic grooves in a sliding mode, a sliding groove is formed in one side of the upper end of the workbench, and a driving mechanism for driving the moving plate to move is arranged in the sliding groove; the upper end and the lower end of the workbench are fixedly connected with a receiving device and a transmitting device respectively. According to the utility model, the automatic ejection of the acrylic plate after testing is realized, the operation process is simplified, an automatic solution for smoothly and accurately moving a sample among different positions is also provided, and the testing efficiency and accuracy are obviously improved.

The application belongs to the technical field of wavelength measurement, and is especially a high-resolution speckle wavelength measurement device and method. The device comprises a shell, a first optical fiber incident port and a second optical fiber incident port are arranged on the outer wall of the shell, an optical switch, a light splitting coupler, a calibration light source and a test light path are arranged in the shell, and the test light path is composed of a multimode optical fiber, an optical fiber mode enhancement device and a surface array detector. The application enhances the coupling and phase delay between different modes by applying mechanical disturbance to the scattering medium, increases the number of excited modes, and solves the problems that the resolution of the speckle wavelength meter is limited by the light path length of the transmission medium and the insufficient information density of the speckle per unit area. The method can improve the wavelength resolution, and effectively improve the sampling speed of the speckle wavelength meter by reducing the size of the photosensitive camera target surface.

The invention discloses an array optical waveguide detection system and method, and the system comprises a light source which is used for transmitting a test light beam, transmitting the test light beam to a waveguide substrate, enabling the test light beam to enter an array optical waveguide through a first surface and then to be transmitted to an array spectroscope, the light is emitted to the second surface after passing through the array spectroscope; the detection assembly is used for receiving the test light beam emitted from the second surface so as to detect the parallelism of the array spectroscope; the incident angle of the test light beam emitted to the waveguide substrate is theta, theta = arcsin (n.sint), t meets: t is the refraction angle of the test light beam entering the waveguide substrate through the first surface, n is the refractive index of the waveguide substrate, and alpha is the included angle between the array spectroscope and the first surface. According to the array optical waveguide detection system, the measurement precision of the detection system can be improved.

This application provides a key parameter testing system and method for fiber-optic single-photon avalanche diodes (SPADs). The system uses a testing module to drive multiple SPADs under test, generates laser trigger signals based on parameter testing requests, and acquires pulse parameters for each SPAD under test under different testing modes with and without light source illumination. A laser generation module generates an initial pulse signal based on the laser trigger signal; a laser adjustment and transmission module adjusts the light attenuation value of the initial pulse laser and separates it into multiple test light sources with equal laser power; a control module monitors the laser power of the laser generation module and configures the laser adjustment parameters of the laser adjustment and transmission module; and the system determines the key parameters of each SPAD under test based on the pulse parameters. The system provided in this application can quickly detect the key parameters of multiple SPADs while ensuring detection accuracy, and the parameter testing process is simple and intuitive.

The application belongs to the technical field of optical fiber preparation automation, and specifically discloses a femtosecond laser-based optical fiber grating automatic processing and sorting system and method. The system comprises a sorting unit, a processing unit and a detection unit. The sorting unit comprises a feeder for automatically feeding optical fibers during processing, a winding machine connected with the feeder through an optical fiber and used for packaging and winding the finished optical fibers, and an industrial robot used for sorting the packaged finished optical fibers. The processing unit is arranged between the feeder and the winding machine and is used for processing optical fiber gratings. The detection unit comprises a test light source, an optical circulator, an optical spectrum analyzer and a loss module. The optical circulator is connected with the test light source, the optical spectrum analyzer and the optical fiber on the feeder. The loss module is arranged between the processing unit and the winding machine and blocks the propagation of test laser emitted by the test light source in the optical fiber through a bent optical fiber. The control unit is in communication connection with the processing unit, the sorting unit and the detection unit and is used for realizing optical fiber grating automatic processing and sorting.

The present application relates to a perovskite test device and a battery production system. The perovskite test device comprises a box body (100), an object placement platform (200), a first test mechanism (300) and a second test mechanism (400); the object placement platform (200) is arranged in the box body (100) and is used for placement of a sample; the first test mechanism (300) is used for emitting first test light, and acquiring the fluorescence spectrum of the first test light passing through the sample; the second test mechanism (400) is used for emitting second test light, and acquiring absorption and scattering spectra of the second test light passing through the sample. The battery production system comprises the perovskite test device. With regard to the perovskite test device and the battery production system, the test device meets different spectral test requirements, simplified design of the overall structure of the test device is facilitated, and the space utilization rate of the test device is optimized.

The objective of the present invention is to provide a measuring device and a measuring method capable of measuring a statistical characteristic of backward crosstalk in an uncoupled multi-core optical fiber.　A backward crosstalk measuring device 301 according to the present invention is a device for measuring backward crosstalk in bidirectional communication in an uncoupled multi-core optical fiber 50, and includes: a light source 31 that inputs test light of different wavelengths into any one core at one end of the multi-core optical fiber 50; a transmitted light receiver 34 that receives transmitted light, which is the test light that has passed through the core, at the other end of the multi-core optical fiber 50; a scattered light receiver 35 that receives backscattered light output from another core other than said core, at said one end of the multi-core optical fiber 50; and an arithmetic circuit 36 that calculates, as backward crosstalk, the ratio of the light intensity of the backscattered light to the light intensity of the transmitted light for each wavelength of the test light.

The application discloses a light source color resolution evaluation method, device and equipment and a storage medium, and relates to the technical field of light source quality testing. The spectral power distribution of a test light source is acquired under multiple exit angles, and the bidirectional reflectance factor of a test color sample is combined to calculate three stimulus values and white point three stimulus values. The hue angle, brightness value and saturation value of each test color sample under the exit angle are calculated according to the three stimulus values and the white point three stimulus values. The comprehensive color error value of the test light source relative to a reference light source under the exit angle is obtained according to the aforementioned three parameters. The color resolution index of the test light source is obtained according to the neutral density index of the test light source and the comprehensive color error value corresponding to each exit angle. The spectral power distribution is collected under multiple exit angles, the color rendering performance of the light source in the front is considered, and the spectral output difference under different angles is also considered, so that the color rendering consistency and the directional characteristics of the light source in the spatial distribution can be comprehensively reflected.

The invention discloses a device and a method for testing spectral performance of a laser film in a variable vacuum humidity environment, and belongs to the technical field of laser film spectral measurement. The equipment comprises an optical test cavity, a vacuum acquisition and regulation module, a humidity regulation module and a control system, the optical test cavity is butted with a test light path of the spectrophotometer and is used for placing a sample to be tested; the vacuum obtaining and regulating module regulates the vacuum degree in the cavity, the humidity regulating module regulates the humidity in the cavity, and the control system coordinates all the modules to work. According to the invention, by efficiently coupling the variable vacuum humidity test cavity and the spectrophotometer, the in-situ test of the multi-band transmittance of the laser film in different vacuum degrees and different humidity environments is realized, and the problem that the traditional atmospheric environment test cannot truly reflect the performance of the film in a variable vacuum and variable humidity composite environment is solved; and a key technical support is provided for design optimization and reliability evaluation of the laser film.

The invention provides a photoelectric detector responsivity testing device, a photoelectric detector responsivity testing method and a wafer. The responsivity of a to-be-tested photoelectric detector can be accurately and rapidly tested with low testing cost. In the responsivity testing device, a first reference photoelectric detector and a to-be-tested photoelectric detector are respectively connected to different output ends of a 1 * N optical splitter, and a light current testing module respectively tests light currents of the first reference photoelectric detector and the to-be-tested photoelectric detector and outputs the light currents to a responsivity calculation module. The responsivity calculation module calculates the responsivity of the to-be-detected photoelectric detector based on the reference responsivity of the first reference photoelectric detector, the corresponding light splitting proportions of different output ends of the 1 * N light splitter, and the ratio of the photocurrent of the to-be-detected photoelectric detector to the photocurrent of the first reference photoelectric detector.

The present application relates to the field of optical testing and calibration technology, and more particularly to a kind of multiple range measurement device and method of optical fiber device characteristics, to be measured object accesses measurement access detection module, forms circulating test optical path;Low coherence demodulation detection module generates reference light and test light, reference light returns after being scanned by reflection dynamic scanning module spatial optical path, test light enters measurement access detection module after being scanned by the module, and multiple range circulating transmission is completed with to-be-measured object, and the output of test light after transmission returns low coherence demodulation detection module after being scanned by the module again;The module interferes with the received reference light and test light, and obtains measurement result.The present application is tested by multiple range optical fiber ring test structure, integrates commonly used optical fiber and device characteristics, perfects access mode, cooperates calibration correction model, realizes multiple types, multiple parameters, high precision, high reliability and low cost test target.

An optical inspection device designed for testing an optical component such as a protective glass, an optical transmission system of a welding laser beam having a laser wavelength, comprising:a light source designed to emit a test light,receiving means designed to receive at least a portion of the test light and to quantify at least one quantity of the received light,means for holding the optical component designed to position the optical component between the light source and the receiving means, characterized in that:the portion of the test light received by the receiving means has a wavelength at ±20% of the laser wavelength.

A control device 50 and an adjustment device 10 provided to an adjustment system 1 communicate with each other through a transmission path 2 formed of an optical fiber comprising a plurality of core wires. The control device 50 is provided with a termination unit 51 that multiplexes a test light to an optical signal transmitted by one core wire of the plurality of core wires, and a communication unit 53 that transmits the line number of the core wire to which the test light is multiplexed to the adjustment device 10. The adjustment device 10 comprises: a communication unit 18 that receives the line number of the core wire to which test light is multiplexed from the control device 50; a monitoring unit 11 that monitors an optical signal transmitted by each core wire of the transmission path 2, and identifies a port number of the core wire in which the test light is detected when the test light is sensed; and a controller 16 that refers to line number data for associating a line number for identifying the core wire of the optical fiber with a port number of the monitoring unit 11 connected to the core wire, and confirms coincidence between the line number identified from the port number identified by the monitoring unit 11 and the line number received by the communication unit.

An object of the present invention is to provide an optical transmission line test apparatus and a test method capable of measuring a cumulative crosstalk of an optical transmission line in which a plurality of uncoupled multi-core fibers are connected in series from one end side with an OTDR.An optical transmission line test apparatus 301 according to the present invention measures a cumulative crosstalk of an optical transmission line 50 in which a plurality of uncoupled multi-core fibers 50-i are connected in series. The optical transmission line test apparatus 301 includes a test light input unit 10 that inputs optical pulses to each of cores of the uncoupled multi-core fiber 50-1 at one end 50a of the optical transmission line 50; a reception unit 20 that receives backscattered light for each of the cores output from one end 50a; and a calculation unit 30 that acquires a loss distribution occurring in each of the cores from the backscattered light, and calculates the cumulative crosstalk from a connection loss at a connection point zj of the uncoupled multi-core fiber obtained from the loss distribution and a known inter-core mode coupling of each of the uncoupled multi-core fibers 50-i.

An optical property evaluation device 20 according to the present disclosure comprises: a test light generation unit 30 that generates test light; an input / output unit 40 that inputs the test light from one end of an optical fiber 10 under test in any polarization state, and acquires and outputs, from the one end, backscattered light from each point of the optical fiber 10 under test; a backscattered light complex electric field amplitude acquisition unit 50 that acquires, for each point of the optical fiber 10 under test, a complex electric field amplitude of the backscattered light output from the input / output unit 40; and an arithmetic processing unit 60 that converts the complex electric field amplitude into a matrix for each point of the optical fiber 10 under test, and evaluates polarization dependent loss using a singular value of the matrix.

The application discloses a solar cell testing method, system, device, equipment and medium. The solar cell includes a sub-cell, and the testing method includes: applying bias light corresponding to a characteristic absorption light wavelength of the sub-cell to the solar cell to obtain first photovoltaic characteristic data of the sub-cell under the bias light; applying specified test light and bias light corresponding to the characteristic absorption light wavelength of the sub-cell to the solar cell to obtain a target short-circuit current density of the sub-cell; and obtaining second photovoltaic characteristic data of the sub-cell under the specified test light based on the first photovoltaic characteristic data and the target short-circuit current density. Thus, the testing accuracy of the solar cell is improved.

The utility model discloses a camera module testing arrangement, including base, the base has the front and back, the front is provided with circuit board, the surface of circuit board is equipped with the board material, is provided with multiple sets of test lamp on the board material, has the probe row in the both sides of board material, two the probe row is symmetrically set up, be equipped with the conductive connection structure of test lamp electric connection with setting on the circuit board board material, to make multiple sets of test lamp energization simultaneously to realize simultaneous test action, the utility model discloses can through the setting of conductive connection structure, make multiple sets of test lamp energization simultaneously to realize simultaneous test action, and compared with each test lamp group in prior art all need to set the exclusive power supply circuit, and the application need not consider this problem.