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4460 results about "Test equipment" patented technology

Test scheduling system for electric power material detection task cooperation and data acquisition

The invention relates to the field of electric power material quality detection, and discloses a test scheduling system for detection task collaboration and data acquisition, which comprises a task construction module, a state collaboration module, a graph reasoning module and a data acquisition module. And the task construction module generates a standardized test task packet including a task identifier, a project code, a target equipment identifier, an environment requirement parameter and a two-dimensional code according to the test rule base and the resource configuration state, and pushes the standardized test task packet to corresponding test equipment through a Web Service interface. And the state collaboration module receives an equipment state feedback event, constructs an event time sequence flow graph based on the task identifier and generates a task state sequence with a timestamp. The atlas reasoning module takes the state sequence and the environmental parameters as input, constructs a test atlas structure and generates an optimization execution path. And the data acquisition module controls the test equipment to complete a detection task according to the path, acquires test data and environmental parameters, and encapsulates the test data and the environmental parameters to form a structured task data packet, thereby realizing data collection and task tracing.
Owner:XINJIANG XINNENG POWER GRID CONSTR SERVICE CO LTD

Vehicle testing apparatus for full vehicle performance testing as well as vehicle testing of individual on-board systems / software, sensors and combinations of sensors, and method thereof

A system for accidentology-based measuring of accident risk-indexing score values for a motor vehicle to be tested providing a measured accident probability value for an occurrence of an accident event having a physical impact to the tested motor vehicle. The system includes a driving scenario module, a test setting module, and a scoring module. The driving scenario module is configured for determining various driving scenarios for the motor vehicle by defining a set of measurable scenario characteristics, which include at least one ADAS variable. The test setting module is configured for determining a test setting in form of a multi-dimensional test matrix, which includes testing protocols for each of the measurable scenario characteristics for providing measured values of measurable scenario characteristics of the various driving scenarios. The scoring module is configured for generating the risk-indexing score by receiving the multi-dimensional test result signal and a historical data information signal.
Owner:SWISS REINSURANCE CO LTD

Multi-dimensional intelligent analysis and fault traceability system for ACU final detection test data

The invention discloses a multi-dimensional intelligent analysis and fault traceability system for ACU final test data, and relates to the technical field of data analysis. The multi-source heterogeneous data acquisition module is used for acquiring operation parameters, function test data and assembly data through a CAN bus, test equipment and a production system, and is provided with a high-precision timestamp; the data cleaning and preprocessing module is used for standardizing data, filtering and denoising, synchronizing time and complementing missing values; the multi-dimensional feature extraction module is used for extracting features from a time domain, a frequency domain, a time sequence and a space; the intelligent fault diagnosis module is used for classifying faults by using a random forest and a D-S evidence theory and evaluating severity; the fault traceability reasoning module is used for constructing a fault propagation graph and positioning root causes through a Bayesian network; and the visual display and early warning module is used for generating a three-dimensional fault tree and a thermodynamic diagram and triggering graded early warning. According to the invention, the fault detection rate and traceability efficiency are improved, the false alarm rate is reduced, early warning is realized, the ACU test process is optimized, and the product quality and safety are guaranteed.
Owner:YIKAIBIN AUTOMOBILE INTELLIGENT CONTROL SYSTEM (NINGBO) CO LTD

Tendon rope transmission system performance integrated test equipment and transmission system test method

The invention discloses tendon rope transmission system performance integrated testing equipment and a transmission system testing method, and belongs to the technical field of robot part testing. The equipment comprises a rack and a performance testing device, wherein the performance testing device comprises a mounting plate provided with an arc-shaped guide rail chute, a core shaft used for simulating a bending radius, a position adjusting mechanism used for accurately positioning the core shaft and clamping a tendon rope jacket, at least one linear driving mechanism capable of adjusting an angle along the chute, and a counterweight mechanism. A clamp of the linear driving mechanism clamps one end of an inner core of the tendon rope, the counterweight mechanism is connected with the other end of the inner core, the middle part of the tendon rope bypasses the mandrel, and the reciprocating motion applied by the linear driving mechanism is matched with the constant tension applied by the counterweight mechanism so as to simulate the working condition of the tendon rope under a specific bending radius and angle.
Owner:SHENZHEN JDD TECH NEW MATERIAL CO LTD

Method and system for predicting stability of integrated circuit test equipment, equipment and medium

The invention discloses a method, a system and equipment for predicting the stability of integrated circuit test equipment and a medium, and belongs to the technical field of integrated circuit test. The method comprises the following steps: firstly, carrying out preprocessing and feature selection on historical data in an FT test stage, and adopting a Gaussian mixture model (GMM) to cluster and identify different operation condition clusters of a test machine; then, establishing a health state GMM reference for each working condition cluster, calculating a KL divergence value of a normal sample and the reference, and setting a dynamic anomaly detection threshold by 99.73% quantile of the KL divergence value; and finally, in real-time monitoring, calculating a KL divergence value of real-time data and a corresponding working condition cluster benchmark, and comparing the KL divergence value with a dynamic threshold value to realize accurate anomaly marking. The method effectively solves the problem of abnormal detection of the test data of the integrated circuit under complex and changeable working conditions, and improves the monitoring accuracy and working condition adaptability.
Owner:ANQING NORMAL UNIV

Picture defect test equipment control system and method

The invention relates to the technical field of visual control, in particular to a picture defect test equipment control system and method, and the system comprises a difference tensor construction module, a space-time constraint construction module, a strain response judgment module, a coupling focusing mapping module and a boundary stability evaluation module. According to the method, the multi-dimensional difference incidence relation is constructed by extracting the pixel gray difference value, the brightness gradient and the chrominance phase angle, and fine brightness fluctuation and color shift in a picture can be captured. The superposition of the time-space change rate enables the dynamic performance of image defects to be distinguished, and continuous and transient anomalies can be effectively recognized. And in combination with tensor strain ratio and difference amplitude analysis, an abnormal region can be adaptively recognized, and neglect of a traditional method on a complex scene is avoided. The weighted aggregation of the local energy response improves the stability of the defect boundary, ensures the accurate positioning and judgment consistency of the image defect, and significantly improves the reliability and accuracy of the detection result especially in dynamic change and complex illumination environments.
Owner:厦门特仪科技有限公司

Heating aging test tool

The invention relates to the technical field of wafer test equipment, in particular to a heating aging test tool which comprises a storage rack and further comprises a wafer clamp placed on the storage rack. The detection assembly comprises a plurality of elastic probes located on one side of the storage rack and a heating disc; and the hot air guide assembly comprises a ventilation male head arranged on one side of the heating disc, an air guide pipe is arranged on the side, away from the ventilation male head, of the heat conduction cover, the air amount in the cavity is gradually decreased from near to far away from the air guide pipe, and the air flow speed is gradually decreased. A hot air flow guide assembly is arranged on a conveying frame, heat of a heating disc is guided to the position above a wafer through airflow through a heat conduction cover, the space above the wafer is divided into a plurality of cavities, the space size and the space shape of each cavity are set, the air flow speed and the contained hot air amount of each space are adjusted, and therefore the heat conduction efficiency of the wafer is improved. The influence of heat loss in the air flow process is reduced, so that the heating effects of all parts of the wafer are similar, and the detection effect is improved.
Owner:上海芯诣电子科技有限公司

Deep learning-based deep energy level defect identification method, system and device, and medium

The invention belongs to the technical field of semiconductor defect detection, and relates to a deep learning-based deep energy level defect identification method, system and device, and a medium. According to the method, transient curve data of an external capacitor is modulated to obtain a time sequence feature vector containing time, temperature and bias voltage information, then a multi-defect-induced weighted capacitor feature vector is obtained through calculation and modulation of a neural network model, and the time sequence feature vector and the multi-defect-induced weighted capacitor feature vector are trained after being spliced. Until the neural network model converges, the trained neural network model predicts a defect parameter vector, defect weight distribution and transient capacitance response at the (i + 1) th moment at the ith moment; according to the method, DLTS test data is modeled and analyzed in combination with a deep learning algorithm and a semiconductor deep energy level defect kinetic model, precise recognition and quantification of a complex defect system are achieved, the problem that defect recognition precision is insufficient in an existing DLTS test method is solved, and meanwhile the method is low in requirement for test equipment and high in applicability.
Owner:XIDIAN UNIV

Chip mass production test environment recovery method and device and electronic equipment

The invention is suitable for the technical field of semiconductor testing, and provides a chip mass production testing environment recovery method and device and electronic equipment, and the chip mass production testing environment recovery method is used for carrying out anomaly detection on a second module used for executing a chip testing task. After an exception is found, a first module used for user interaction and monitoring triggers recovery in an overtime tolerance interval, at least a second module is restarted, and a mass production test environment context stored by the first module is injected, so that the second module quickly returns to a runnable state with existing batch parameters and a process state; and then the second module is automatically reconnected with the ATE test equipment, marks the current tested chip as retestable and sends the retestable chip to the chip processing equipment, so that the chip processing equipment confirms the test process and switches to the next to-be-tested chip, and the second module continues to execute the test task. According to the scheme, the continuity and the stability of the chip mass production test in the abnormal scene are realized.
Owner:SHENZHEN CZTEK

Thermal mechanical composite fatigue test equipment for turbine blade in rotating environment

The invention belongs to the technical field of aero-engine high-temperature part test, and particularly relates to a thermal mechanical composite fatigue test device in a turbine blade rotation environment, which comprises a high-temperature gas system, a stator system, a rotor system, a support system, a test system, an auxiliary system and a turbine rotor blade test piece, the high-temperature fuel gas system is used for providing a fuel gas environment for a turbine rotor blade test piece and controlling the high-low temperature circulation state of fuel gas, a combustion chamber is arranged at the front end of the high-temperature fuel gas system and provided with a double-oil-way nozzle, a fuel gas flowing system is arranged at the rear end of the high-temperature fuel gas system, and a blade grid structure is designed for the fuel gas flowing system according to the geometrical shape of a turbine rotor blade. And a spray cooling section is arranged at the rear part of the test section. The device is composed of six core systems including a high-temperature fuel gas system, a stator system, a rotor system, a supporting system, a testing system and an auxiliary system, all the systems work cooperatively, and integrated simulation of the high-temperature fuel gas environment, rotating centrifugal loads and heat-force synchronous circulation is achieved.
Owner:SHENYANG AVIATION FUEL TECH CO LTD

Fracture characteristic calculation method based on resistivity tomography and resistivity static sounding

The invention relates to the field of field engineering characteristic evaluation, in particular to a fracture characteristic calculation method based on resistivity tomography and resistivity static sounding. The method comprises the steps that firstly, in-situ site resistivity parameter calibration is carried out through a resistivity static sounding (RCPTU) test technology, and a resistivity index background value of a target site is obtained; then, acquiring an initial value of the electrical resistivity of the whole area of the target site by adopting a three-dimensional electrical resistivity tomography (ERT) technology; and finally, according to the resistivity-fracture inversion model, identifying the fracture distribution condition of the whole region of the target site, and giving a fracture rate evaluation model of the target site. According to the method, the precision problem of single in-situ test equipment is solved, the test precision of site three-dimensional resistivity parameters is improved, the reliability of three-dimensional inversion calculation is improved, and the three-dimensional space distribution of the soil body fractures can be evaluated quickly, nondestructively and accurately.
Owner:NANJING TECH UNIV

Test equipment for descent control device

The utility model relates to the technical field of descent control devices, and particularly discloses a test device of a descent control device, which comprises a machine body; the descent control device is fixedly mounted at the upper end of the machine body; and the guide wheels are arranged on two sides of the lower end of the descent control device. According to the test equipment of the descent control device, in the process of testing the rope on the descent control device, through the arrangement of the test assembly, the height of the friction piece can be adjusted, the contact angle of the rope and the friction piece can be changed, the wear resistance test of the rope can be conveniently carried out at multiple angles, and the simulation of the wear resistance of the rope due to different installation heights of the descent control device by different users is realized. The contact angle between the rope and the windowsill is changed during use, so that the test effect of the descent control device is improved; meanwhile, the friction pieces are detachably mounted, so that the wear resistance of the rope can be conveniently tested according to the friction pieces made of different materials; in addition, through the arrangement of the swing assembly, the abrasion resistance test condition between the rope and the friction piece in the swing process is achieved, and the test effect of the descent control device is improved.
Owner:GE SPECIAL PINZHI (SUZHOU) SAFETY TECHNOLOGY CO LTD

Waterproof test equipment for electronic product

The invention relates to the technical field of electronic component rain test, and discloses electronic product waterproof test equipment, which comprises a test box body, a cylinder and a water pipe, a turntable is arranged in the test box body, a rotating shaft is mounted on the turntable, a cavity is formed in the test box body, and a servo motor is fixedly mounted in the cavity. An electric push rod is fixedly mounted at the output end of the servo motor, and an electronic component is further arranged on the turntable; a support is fixedly installed in the test box body, a water storage frame rotationally connected with the support is installed on the support, and a wave making mechanism is further arranged in the water storage frame. According to the electronic product waterproof test equipment, through the collaborative design of a triangular arc-shaped protruding block and a wave making floating body, a soaking test is upgraded from static water level simulation to dynamic wave impact; the arc-shaped protruding blocks intermittently impact the rolling wheels, rapid resetting of the floating body is achieved through the spring mechanism, the dynamic hydraulic action of water fluctuation on electronic components in the natural environment can be reproduced, and the limitation that traditional equipment can only achieve static soaking is overcome.
Owner:NINGBO COMEN ELECTRONICS TECH

POL power supply automatic test method based on modular design

The invention discloses a POL power supply automatic test method based on modular design, and belongs to the technical field of power supply test. The method comprises the following steps: firstly, under the control of an upper computer, automatically reading POL power supply basic parameters including key characteristic parameters such as input / output voltage, rated current and frequency from a preset Excel table, and establishing a judgment reference for testing; then, instrument initialization is completed, communication connection with test equipment such as an oscilloscope, an electronic load and a direct-current power supply is established, and configuration of initialization function parameters is completed; then, executing a measurement task of each core parameter of the POL power supply to be tested, and in the test process, executing a parallel measurement management mechanism, namely configuring each instrument parameter and channel state in real time according to a specific test item, and triggering a retry or interrupt logic under the conditions of communication abnormality, data timeout and the like until the test recovers a running state; and finally, after the test is completed, performing Excel storage and interaction on the standardized test data and the waveform screenshot, and finally safely exiting. According to the POL power supply automatic test method based on the modular design, the whole test process is divided into a plurality of serial or parallel function processing units such as parameter reading, instrument initialization, test execution and test management, data storage and interaction and the like, and high efficiency and usability of a test system are achieved.
Owner:HOHAI UNIV

MicroLED wafer array testing device and method

PendingCN121531985AOptical powerHemt circuits
The invention discloses a device and a method for testing a MicroLED wafer array. The device comprises a wafer slide holder, a MicroLED test device and a photometric integrating sphere, a MicroLED wafer is arranged on the wafer slide holder; the MicroLED wafer is provided with a MicroLED wafer array, and the MicroLED wafer array is provided with a plurality of The MicroLED wafer array is composed of a plurality of MicroLEDs which are distributed in an array form; the MicroLED test equipment comprises a flexible electrode and a TFT (Thin Film Transistor) addressing circuit; the wafer slide holder is used for enabling a MicroLED wafer to be aligned with the MicroLED test equipment so as to enable the MicroLED to be lightened, and visible light emitted after the MicroLED is lightened is transmitted to the photometric integrating sphere through the MicroLED test equipment; the photometric integrating sphere is used for testing optical parameters of the MicroLED; the optical parameters comprise optical power and wavelength; and the TFT addressing circuit is used for providing current, voltage and position parameters of the MicroLED. According to the device and the method, the optical parameters and the position of each MicroLED in the MicroLED wafer array can be rapidly tested in a lossless and high-throughput manner.
Owner:SHANGHAI MINGKUN SEMICONDUCTOR CO LTD

Temperature-rise-resistant electric energy metering box and temperature rise test equipment thereof

The invention relates to the technical field of temperature-rise-resistant electric energy metering box testing, in particular to a temperature-rise-resistant electric energy metering box and temperature rise testing equipment thereof, and the temperature-rise-resistant electric energy metering box comprises a box body, a heat dissipation module, a first sensing module and an automatic control module. Through real-time data feedback of the first temperature sensor and the first humidity sensor, the automatic control module can automatically trigger heat dissipation mode switching, and in a high-humidity environment, the first electric push rod drives the inverted-U-shaped cover plate to seal an outer air inlet and an outer heat dissipation opening to form a closed space; through cooperation with an inner circulation path of an air inducing flow channel, an inner air inducing opening, an air compression cooling unit, an air inducing barrel and an inner air outlet, external humid air can be isolated, the wiring terminal is prevented from being oxidized and corroded, and efficient cooling can be achieved through air compression cooling; in a low-humidity and high-temperature environment, the cover plate moves upwards to start external circulation, external air enters the box after dust is filtered out through the filter screen, and heat is taken away through rapid airflow circulation of the outer air inlet, the induced air flow channel and the outer heat dissipation opening.
Owner:ZHEJIANG SUNAN ELECTRIC CO LTD

Test equipment for measuring high-temperature stability of asphalt mixture

The invention belongs to the technical field of asphalt mixed material experiments, and particularly relates to test equipment for measuring the high-temperature stability performance of an asphalt mixed material, the test equipment comprises a test platform, an environment control module and a data acquisition module, the test platform comprises a test bracket, samples to be tested are uniformly arranged on an inclined adjusting plate on the test bracket, and the environment control module is connected with the data acquisition module; the data acquisition module comprises a laser displacement sensor, and the laser displacement sensor is arranged at the position, corresponding to the to-be-tested sample, of the adjusting plate; according to the invention, the laser displacement sensor located in the protection box is started at regular time, and the relative displacement change between the laser displacement sensor and the to-be-tested sample is calculated according to the change of the reflected laser, so that the actual deformation displacement of the to-be-tested sample is accurately measured and recorded and is transmitted to external computer equipment; and real-time and accurate data acquisition of the deformation degree of the to-be-tested sample is realized.
Owner:SHAANXI TRANSPORTATION VOCATIONAL & TECH COLLEGE

Control system and method for full-automatic probe platform

The invention discloses a control system and method for a full-automatic probe platform, and relates to the technical field of semiconductor manufacturing and testing equipment, and the system comprises a contact event sensing and processing module which is connected with a signal output interface of a testing machine, applies a DC bias voltage to a selected testing channel, continuously monitors a loop current at a high sampling rate, and transmits the current to the testing machine; generating an electrical feedback signal, calculating the current change rate of the electrical feedback signal in real time, and calibrating a preset threshold value based on background noise for comparison and analysis; a contact starting event is judged by capturing current in real time, the control mode is switched immediately, the system can actively respond but not passively bear the change of the contact state, intelligent and self-adaptive control of the contact process is achieved, the control mode switching adopts a direct force control mode as a main control strategy of the contact process, and the control mode switching speed is high. The overall contact pressure is ensured not to exceed a safety threshold value, and overpressure damage and poor contact are effectively prevented.
Owner:JINGWEI OPTICAL TECH (SU ZHOU) LTD CO

Multi-dimensional power consumption testing method and device for solid state disk and storage medium

The invention discloses a multi-dimensional power consumption test method and device for a solid state disk and a storage medium, and the method comprises the steps: controlling a test environment parameter and the solid state disk to enter a preset initial state in response to a test start instruction; based on a test matrix which predefines a plurality of temperature and capacity occupation combinations, controlling a test device to apply a multi-dimensional dynamic working load to the solid state disk, and synchronously acquiring power consumption data, internal state data and performance data; performing time synchronization and data fusion on the collected multi-source data to form an associated data set; and performing intelligent analysis on the data set, extracting power consumption characteristics of the solid state disk, and generating a power consumption evaluation report based on the power consumption characteristics. According to the method, the problems of single test dimension, incomplete test condition coverage, failure in effective fusion of multi-source data and lack of intelligent analysis in the prior art are solved, and comprehensive, accurate and automatic evaluation of the power consumption of the solid state disk is realized.
Owner:SHENZHEN JINGCUN TECH CO LTD

Fatigue testing device and method for bending-torsion coupling transmission shaft

The invention relates to a bending-torsion coupling transmission shaft fatigue test device and method, and relates to the technical field of test equipment. Comprising a test bench, a bending loading device arranged at one end of the test bench, a torque loading device arranged at the other end of the test bench, and a test piece bearing device arranged between the bending loading device and the torque loading device, the test piece bearing device comprises a guide rail which is arranged on the test bed and extends from the bending loading device to the torque loading device, a positioning seat which is in sliding connection with the guide rail, and a bearing plate which is arranged on the positioning seat and can be lifted, so that a simulation test of a coupling effect can be carried out on bending and torsion of a transmission shaft, and the test piece bearing device can also be used for bearing the transmission shaft. And the bending test can be carried out under the condition that the transmission shaft is supported at a specific position.
Owner:HEFEI UNIV OF TECH

LED lamp test method and device, test equipment, test system and storage medium

The invention relates to the technical field of LED lamp testing, and discloses an LED lamp testing method and device, testing equipment, a testing system and a storage medium, and the method comprises the steps: generating a corresponding adjustment parameter based on a preset adjustment instruction, and transmitting the adjustment parameter to a to-be-tested device, the to-be-tested equipment is used for adjusting the LED lamp and the camera according to the adjusting parameters; sending a shooting instruction to the to-be-tested equipment, so that the to-be-tested equipment irradiates the standard color card with light emitted by the adjusted LED lamp, and shooting the standard color card through the adjusted camera to obtain a target image; and obtaining a test result corresponding to the LED lamp according to the target image. According to the invention, through synchronous adjustment and collection of cooperative output of illumination and imaging under a controllable condition, integrated performance evaluation of the LED lamp on the to-be-tested device is realized, and a single LED lamp does not need to be disassembled to be tested, so that the test process is simplified.
Owner:SHENZHEN EMEET TECH CO LTD

High-voltage wiring harness connector terminal fretting wear test equipment

The invention discloses high-voltage wiring harness connector terminal fretting wear test equipment which comprises an equipment base, a high-frequency vibration exciter and a lifting platform are mounted on the equipment base, and a mounting platform is arranged at the top of the lifting platform; a left test piece mounting loading mechanism and a right test piece mounting force measuring device are arranged on the mounting platform. The device can realize a multi-physics field coupling test, current-carrying friction and arc erosion of an electric contact surface in a real working condition are simulated by combining a current load with high-frequency mechanical wear, and the electric-mechanical coupling wear characteristic of a new energy automobile charging terminal is accurately reproduced. The device supports the dynamic adjustment of normal load, simulates the contact pressure change of the left and right test samples of the test terminal in the plugging process through the test sample pin and the test sample jack, can be used for researching the relevance between the fretting wear and the contact resistance of the test terminal under different loads, and realizes the test of the terminal under complex working conditions in a laboratory environment. The test process is convenient, efficient and accurate, and the test cost and the test period are greatly reduced.
Owner:LANZHOU ZHONGKE KAIHUA TECH DEV CO LTD +1

Multi-modal sense artificial synaptic device based on frame material and preparation method and application of multi-modal sense artificial synaptic device

The invention discloses a multi-modal sensory artificial synaptic device based on a framework material and a preparation method and application thereof. The artificial synaptic device comprises a substrate and a channel, wherein the channel is arranged on the surface of the substrate; the channel is an amorphous organic metal framework film which responds to light and gas stimulation; the metal electrode is arranged on the surface of the channel; the metal electrode comprises a source electrode and a drain electrode. Compared with the prior art, the framework material with excellent photoelectric response performance is adopted, and a novel artificial synapse device with multi-mode sensing ability is constructed by fully utilizing the regular pore structure, large specific surface area and good photoresponse characteristic of the MOF material. The two electrodes of the device are connected into electrical test equipment, the conductivity of the amorphous MOF thin film can be changed under the stimulation of optical pulse signals, and finally simulation based on photoresponse synaptic plasticity is achieved. The device is placed in different gas environments, and the conductivity of the MOF film can be changed by capturing and releasing target gas molecules through the porous characteristic of the amorphous MOF material, so that simulation based on gas response synaptic plasticity is realized.
Owner:SHENZHEN UNIV

Intelligent mowing robot test equipment

The utility model discloses intelligent mowing robot test equipment, which comprises a workbench, a button test assembly, two sets of collision test assemblies and a three-axis electrical parameter module, the workbench is provided with a test base, a mowing robot is placed on the test base, the button test assembly is arranged on one side of the test base, and the two sets of collision test assemblies are connected with the three-axis electrical parameter module. The collision testing assemblies are arranged at the front end and the rear end of the testing base respectively, the three-axis electrical parameter module is arranged on the testing base, the button testing assembly is used for testing whether a button of the mowing robot can be normally started or not, and the collision testing assemblies are used for testing the collision function of the mowing robot. The three-axis electrical parameter module is used for testing information of a wheel set and a cutter head of the mowing robot. According to the scheme, the mowing robot is tested in sequence through the button testing assembly, the two collision testing assemblies and the three-axis electrical parameter module, so that the testing efficiency of the mowing robot is effectively improved, and the testing process of the mowing robot is simplified.
Owner:ZHEJIANG SAFUN IND

Wafer offset detection method and system, electronic equipment and storage medium

The invention provides a wafer offset detection method and system, electronic equipment and a storage medium, and the method comprises the steps: testing each chip on a target wafer through testing equipment, and obtaining a wafer graph of the target wafer; the edge yield of each preset edge in the wafer graph is calculated, the distance between the center of the wafer graph and the center of the target wafer is calculated, and whether the target wafer deviates or not is determined by combining the edge yield of each preset edge in the wafer graph and the distance between the center of the wafer graph and the center of the target wafer. According to the invention, the wafer offset can be accurately detected, and mistaken placement and abnormal material mixing of the picked chips are avoided.
Owner:JINGLONG TECH SUZHOU

FAKRA wire harness error code testing device and method

The invention discloses an FAKRA wire harness error code testing device and method, and relates to the technical field of error code testing. The method comprises the following steps of preparation before test, basic electrical test, limit plugging test, vibration test, stability test and test result analysis. According to the method, the initial bit error rate of the to-be-tested FAKRA wire harness is tested by using the bit error tester after the test equipment is calibrated, then the connectors at the two ends and the matched connector are subjected to the limit plugging test, then the vibration test is performed, and the simulation degree of the vibration test is evaluated, so that whether vibration simulation optimization is performed or not is determined; according to the method and the device, firstly, the fluctuation condition of the bit error rate is monitored in the test period, so that whether a clock optimization measure is taken or not is determined, finally, all test data are collected, the stability of the bit error test is ensured, and the problem that the bit error test accuracy is reduced due to the fact that the vibration test simulation degree is not high enough and the simulation quality is unstable in the prior art is solved.
Owner:YILIAN TECH (GUANGZHOU) CO LTD

On-line monitoring method and system for strong electromagnetic pulse damage of radio frequency device

According to the radio frequency device strong electromagnetic pulse damage on-line monitoring method and system, the incident power, the output power and the reflection power of the tested radio frequency device are monitored in real time, then whether the tested radio frequency device is damaged or not is judged through comprehensive comparison and analysis, and the function of monitoring the state of the tested radio frequency device on line in real time is achieved. The device is used for monitoring the damage state of the radio frequency device under the strong electromagnetic pulse injection test in real time, the test efficiency is improved, the damage probability to the strong electromagnetic pulse injection source after the radio frequency device is damaged is reduced, and the test range of a traditional off-line measurement method of the test is expanded. The device is used for on-line damage monitoring during the strong electromagnetic pulse injection test of the radio frequency device, the test efficiency can be improved, test equipment can be protected, the defects of traditional off-line detection can be overcome, and the device has important significance in carrying out the strong electromagnetic pulse injection effect test of the radio frequency device and obtaining the damage threshold value of the radio frequency device.
Owner:CHINA SHIP DEV & DESIGN CENT

Cable defect early warning method and device, terminal equipment and storage medium

The invention discloses a cable defect early warning method and device, terminal equipment and a storage medium, and belongs to the technical field of cable defect early warning, and the method comprises the steps: carrying out the frequency sweeping test of an equivalent circuit model, generating a reflection coefficient spectrum, separating a low-frequency component from the reflection coefficient spectrum, and taking the low-frequency component as a head-end reflection coefficient, through combination of the head end reflection coefficient, the internal resistance of the test equipment and the cable impedance, equivalent impedance at the joint of the test fixture and the head end of the cable is obtained through quantification, and an original reflection coefficient spectrum is corrected according to the equivalent impedance, so that impedance mismatch of the test fixture in the test process is eliminated. The corrected reflection coefficient spectrum can reflect the impedance of the cable body more accurately, so that the subsequently obtained time domain response can reflect the defect condition of the cable body more truly, and the accuracy of cable defect early warning is improved. The problem that the accuracy of cable defect early warning is low due to the fact that the original reflection coefficient spectrum cannot be corrected in the prior art can be solved.
Owner:GUANGZHOU POWER SUPPLY BUREAU GUANGDONG POWER GRID CO LTD

Analog circuit frequency response flatness digital compensation calibration method

The invention aims to provide the analog circuit frequency response flatness digital compensation calibration method which can reduce the hardware device requirement, the production process requirement and the production cost and meet the frequency response flatness requirement of low-frequency alternating current test equipment. The method comprises the following specific steps: S1, setting a frequency band range and extracting a plurality of groups of original data; s2, setting a sampling rate and an order; s3, generating a target frequency range, and setting a plurality of target frequency points; s4, extrapolating a frequency response curve and obtaining a frequency response value of a specific frequency; step S5, calculating frequency response characteristics according to the original data extracted in the step S1, and performing frequency response interpolation calculation of a plurality of target frequency points in a target frequency range based on a linear difference method to obtain a frequency response curve; s6, carrying out reciprocal processing on the frequency response curve to obtain a compensation curve; and S7, calculating calibration parameters according to the compensation curve. The method is applied to the technical field of electric signal processing.
Owner:成都市运泰利自动化设备有限公司

Equipment scheduling method and device, equipment and storage medium

The invention relates to the field of automobile design, in particular to an equipment scheduling method and device, equipment and a storage medium, and aims to realize reasonable scheduling of test equipment. The method comprises the following steps: receiving an equipment use application sent by a user, wherein the equipment use application comprises a user identity code, an equipment identity code of target equipment and a reserved time grid; according to the device identity code and the time grid, determining whether the reservation time of a plurality of different users corresponding to the target device has conflicts; determining a priority weight corresponding to the equipment use application according to the user identity code of each user under the condition that the reservation time has a conflict; and according to the priority weight corresponding to each equipment use application and the time grid corresponding to each user, distributing the use right of the target equipment to the corresponding user.
Owner:CHONGQING SELIS PHOENIX INTELLIGENT INNOVATION TECH CO LTD