The present invention provides a method and device for automatic QC of SOC chips, wherein the device includes a QC
motherboard, the QC
motherboard includes a PMU power supply, an MCU main controller, a SOCKET socket, a QC sub-board, a combination switch, a TEST button, a DEBUG button, a
functional module, and a result display module; the method is implemented on the device, and includes the following contents: the MCU main controller is connected to the SOC
chip to be tested through the SWD
bus, and then the CHIPID pre-burned in the SOC
chip is read; according to the CHIPID, the MCU main controller loads the required QC code into the SOC
chip to be tested according to the set priority order and controls it to perform
functional testing; if the test passes, the result display module displays PASS information, and if the test fails, the result display module displays FAIL information; when FAIL occurs, the MCU main controller can also debug the SOC chip to be tested to quickly locate the fault position. The present invention proposes a method and device for automatic QC of SOC chips, which can realize fast
automatic testing of SOC chips, effectively shorten the test time, and improve the
test efficiency.