The present invention relates to an intelligent test device for a substrate, comprising a main case, a detection turntable, a feeding mechanism, a contact detection mechanism for testing the OFF-pressure of contacts from spring pieces, a discharging mechanism and an electric control box, the detection turntable, the feeding mechanism, the contact detection mechanism and the discharging mechanism being all ON-connected to the electric control box. The test device of the present invention can complete the OFF-pressure detection of the longitudinal and transverse contacts of the substrate automatically without requiring any manual operation, thus the test device of the present invention is easy to use, and the detection accuracy and the detection efficiency are high. Furthermore, the ex-factory pass rate of products is guaranteed, the cost is reduced and defective substrates can be classified and sorted automatically.